JPS6153741B2 - - Google Patents
Info
- Publication number
- JPS6153741B2 JPS6153741B2 JP54030253A JP3025379A JPS6153741B2 JP S6153741 B2 JPS6153741 B2 JP S6153741B2 JP 54030253 A JP54030253 A JP 54030253A JP 3025379 A JP3025379 A JP 3025379A JP S6153741 B2 JPS6153741 B2 JP S6153741B2
- Authority
- JP
- Japan
- Prior art keywords
- logic
- output
- signal
- integrated circuit
- flip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 36
- 239000002131 composite material Substances 0.000 claims 1
- 238000010998 test method Methods 0.000 claims 1
- 108010076504 Protein Sorting Signals Proteins 0.000 description 23
- 238000010586 diagram Methods 0.000 description 8
- 229920000747 poly(lactic acid) Polymers 0.000 description 8
- 230000000694 effects Effects 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- 239000011159 matrix material Substances 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 238000003491 array Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 2
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000012956 testing procedure Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3025379A JPS55123743A (en) | 1979-03-15 | 1979-03-15 | Logic integrated circuit easy to check |
| FR8005815A FR2451672A1 (fr) | 1979-03-15 | 1980-03-14 | Circuit logique integre pour l'execution de tests |
| DE3009945A DE3009945C2 (de) | 1979-03-15 | 1980-03-14 | Funktionsprüfbarer, integrierter Schaltkreis |
| GB8008774A GB2049958B (en) | 1979-03-15 | 1980-03-14 | Integrated logic circuit adapted to performance tests |
| US06/130,687 US4366393A (en) | 1979-03-15 | 1980-03-17 | Integrated logic circuit adapted to performance tests |
| GB08311223A GB2125170B (en) | 1979-03-15 | 1983-04-25 | Integrated logic circuit adapted to performance tests |
| US06/545,608 US4536881A (en) | 1979-03-15 | 1983-10-27 | Integrated logic circuit adapted to performance tests |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3025379A JPS55123743A (en) | 1979-03-15 | 1979-03-15 | Logic integrated circuit easy to check |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55123743A JPS55123743A (en) | 1980-09-24 |
| JPS6153741B2 true JPS6153741B2 (cg-RX-API-DMAC10.html) | 1986-11-19 |
Family
ID=12298539
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3025379A Granted JPS55123743A (en) | 1979-03-15 | 1979-03-15 | Logic integrated circuit easy to check |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55123743A (cg-RX-API-DMAC10.html) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4513418A (en) * | 1982-11-08 | 1985-04-23 | International Business Machines Corporation | Simultaneous self-testing system |
| US4503537A (en) * | 1982-11-08 | 1985-03-05 | International Business Machines Corporation | Parallel path self-testing system |
-
1979
- 1979-03-15 JP JP3025379A patent/JPS55123743A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS55123743A (en) | 1980-09-24 |
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