JPS6150007A - 表面形状測定用トレ−サ - Google Patents

表面形状測定用トレ−サ

Info

Publication number
JPS6150007A
JPS6150007A JP59172143A JP17214384A JPS6150007A JP S6150007 A JPS6150007 A JP S6150007A JP 59172143 A JP59172143 A JP 59172143A JP 17214384 A JP17214384 A JP 17214384A JP S6150007 A JPS6150007 A JP S6150007A
Authority
JP
Japan
Prior art keywords
slider
reference position
stylus
base
tracer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59172143A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0347688B2 (enExample
Inventor
Hideo Morita
英夫 森田
Kenji Abiko
安孫子　賢二
Tetsuo Nakamura
哲夫 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsutoyo Manufacturing Co Ltd
Original Assignee
Mitsutoyo Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsutoyo Manufacturing Co Ltd filed Critical Mitsutoyo Manufacturing Co Ltd
Priority to JP59172143A priority Critical patent/JPS6150007A/ja
Priority to US06/765,953 priority patent/US4611403A/en
Priority to DE3529320A priority patent/DE3529320C2/de
Priority to DE3546889A priority patent/DE3546889C2/de
Priority to GB08520629A priority patent/GB2163256B/en
Publication of JPS6150007A publication Critical patent/JPS6150007A/ja
Publication of JPH0347688B2 publication Critical patent/JPH0347688B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G01B7/012—Contact-making feeler heads therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
JP59172143A 1984-08-18 1984-08-18 表面形状測定用トレ−サ Granted JPS6150007A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP59172143A JPS6150007A (ja) 1984-08-18 1984-08-18 表面形状測定用トレ−サ
US06/765,953 US4611403A (en) 1984-08-18 1985-08-14 Surface tracer
DE3529320A DE3529320C2 (de) 1984-08-18 1985-08-16 Tastvorrichtung für Oberflächen
DE3546889A DE3546889C2 (de) 1984-08-18 1985-08-16 Tastervorrichtung für Oberflächen
GB08520629A GB2163256B (en) 1984-08-18 1985-08-16 Surface tracer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59172143A JPS6150007A (ja) 1984-08-18 1984-08-18 表面形状測定用トレ−サ

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP4121994A Division JP2628523B2 (ja) 1992-05-14 1992-05-14 表面形状測定用トレーサ

Publications (2)

Publication Number Publication Date
JPS6150007A true JPS6150007A (ja) 1986-03-12
JPH0347688B2 JPH0347688B2 (enExample) 1991-07-22

Family

ID=15936359

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59172143A Granted JPS6150007A (ja) 1984-08-18 1984-08-18 表面形状測定用トレ−サ

Country Status (4)

Country Link
US (1) US4611403A (enExample)
JP (1) JPS6150007A (enExample)
DE (1) DE3529320C2 (enExample)
GB (1) GB2163256B (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4899456A (en) * 1987-08-24 1990-02-13 Mitutoyo Corporation Surface contour measuring tracer
JP2009536325A (ja) * 2006-05-10 2009-10-08 カール ツァイス インドゥストリーレ メステクニーク ゲーエムベーハー 加工品の表面点に接触するための方法および装置

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1206842B (it) * 1987-01-15 1989-05-11 Fidia Spa Dispositivo tastatore particolarmente per macchina a copiare
US5212646A (en) * 1987-12-19 1993-05-18 Renishaw Plc Method of using a mounting for surface-sensing stylus
US5152072A (en) * 1988-02-18 1992-10-06 Renishaw Plc Surface-sensing device
JPH03502608A (ja) * 1988-10-11 1991-06-13 レニショウ パブリック リミテッド カンパニー 位置決め装置用測定プローブ
DE3842151A1 (de) * 1988-12-15 1990-06-21 Zeiss Carl Fa Tastkopf vom schaltenden typ
GB8908854D0 (en) * 1989-04-19 1989-06-07 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
US5189806A (en) * 1988-12-19 1993-03-02 Renishaw Plc Method of and apparatus for scanning the surface of a workpiece
US4907894A (en) * 1988-12-20 1990-03-13 Bnf Metals Technology Centre Surface-temperature sensing method and apparatus
US5209131A (en) * 1989-11-03 1993-05-11 Rank Taylor Hobson Metrology
GB2238126A (en) * 1989-11-03 1991-05-22 Rank Taylor Hobson Ltd Metrology
GB9001682D0 (en) * 1990-01-25 1990-03-28 Renishaw Plc Position sensing probe
US5390424A (en) * 1990-01-25 1995-02-21 Renishaw Metrology Limited Analogue probe
US5390423A (en) * 1991-01-22 1995-02-21 Renishaw Plc Analogue probe
DE4216215A1 (de) * 1992-05-06 1994-01-20 Max Hobe Tastfühler
JP3000819B2 (ja) * 1993-03-15 2000-01-17 松下電器産業株式会社 三次元測定用プローブ及び形状測定方法
US6640459B1 (en) * 2001-02-15 2003-11-04 Fast Forward Devices, Llc Multidimensional contact mechanics measurement system
GB0201845D0 (en) * 2002-01-26 2002-03-13 Renishaw Plc Analogue probe
US7538960B2 (en) * 2006-03-14 2009-05-26 Quality Vision International, Inc. Air bearing guided zoom lens for metrological measurements
CN101339083B (zh) * 2007-07-06 2010-09-29 鸿富锦精密工业（深圳）有限公司 接触式测量装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3798779A (en) * 1972-07-05 1974-03-26 Ferranti Packard Ltd Probe inspection system
DE2242355C2 (de) * 1972-08-29 1974-10-17 Fa. Carl Zeiss, 7920 Heidenheim Elektronischer Mehrkoordinatentaster
US3855901A (en) * 1973-10-15 1974-12-24 Babcock & Wilcox Co Broaching machine
GB1551218A (en) * 1975-05-13 1979-08-22 Rolls Royce Probe for use in displacement measuring apparatus
DE2718438A1 (de) * 1977-04-26 1978-12-14 Heinrich Prof Dr Ing Frohne Taster zur messung raeumlicher koordinaten
DE3135495C2 (de) * 1981-09-08 1983-11-10 Mauser-Werke Oberndorf Gmbh, 7238 Oberndorf Meßkopf für Meßeinrichtungen, Mehrkoordinatenmeßgeräte und Bearbeitungsmaschinen
DE3234471C1 (de) * 1982-09-17 1983-08-25 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4899456A (en) * 1987-08-24 1990-02-13 Mitutoyo Corporation Surface contour measuring tracer
JP2009536325A (ja) * 2006-05-10 2009-10-08 カール ツァイス インドゥストリーレ メステクニーク ゲーエムベーハー 加工品の表面点に接触するための方法および装置

Also Published As

Publication number Publication date
DE3529320C2 (de) 1994-02-10
DE3529320A1 (de) 1986-02-27
GB2163256A (en) 1986-02-19
GB8520629D0 (en) 1985-09-25
GB2163256B (en) 1988-06-15
US4611403A (en) 1986-09-16
JPH0347688B2 (enExample) 1991-07-22

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees