JPS6144803B2 - - Google Patents

Info

Publication number
JPS6144803B2
JPS6144803B2 JP59178202A JP17820284A JPS6144803B2 JP S6144803 B2 JPS6144803 B2 JP S6144803B2 JP 59178202 A JP59178202 A JP 59178202A JP 17820284 A JP17820284 A JP 17820284A JP S6144803 B2 JPS6144803 B2 JP S6144803B2
Authority
JP
Japan
Prior art keywords
crucible
bath
silicon
output
level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59178202A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60108311A (ja
Inventor
Motorefu Misheru
Berue Kurisuchan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JENERARU DEREKUTORISHITE CO
NASHIONARU ERUFU AKITEENU PURODEYUKUSHION SOC
Original Assignee
JENERARU DEREKUTORISHITE CO
NASHIONARU ERUFU AKITEENU PURODEYUKUSHION SOC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by JENERARU DEREKUTORISHITE CO, NASHIONARU ERUFU AKITEENU PURODEYUKUSHION SOC filed Critical JENERARU DEREKUTORISHITE CO
Publication of JPS60108311A publication Critical patent/JPS60108311A/ja
Publication of JPS6144803B2 publication Critical patent/JPS6144803B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00—Manufacture or treatment of devices covered by this subclass
    • H10F71/121—The active layers comprising only Group IV materials
    • H10F71/1221—The active layers comprising only Group IV materials comprising polycrystalline silicon
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C3/00—Apparatus in which the work is brought into contact with a bulk quantity of liquid or other fluent material
    • B05C3/02—Apparatus in which the work is brought into contact with a bulk quantity of liquid or other fluent material the work being immersed in the liquid or other fluent material
    • B05C3/12—Apparatus in which the work is brought into contact with a bulk quantity of liquid or other fluent material the work being immersed in the liquid or other fluent material for treating work of indefinite length
    • B05C3/125—Apparatus in which the work is brought into contact with a bulk quantity of liquid or other fluent material the work being immersed in the liquid or other fluent material for treating work of indefinite length the work being a web, band, strip or the like
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/002—Continuous growth
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/007—Pulling on a substrate
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/60—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape characterised by shape
    • C30B29/605—Products containing multiple oriented crystallites, e.g. columnar crystallites
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
    • H10F77/162—Non-monocrystalline materials, e.g. semiconductor particles embedded in insulating materials
    • H10F77/164—Polycrystalline semiconductors
    • H10F77/1642—Polycrystalline semiconductors including only Group IV materials
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/546—Polycrystalline silicon PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Silicon Compounds (AREA)
  • Coating With Molten Metal (AREA)
  • Photovoltaic Devices (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
JP59178202A 1983-08-29 1984-08-27 炭素リボン上に多結晶ケイ素層を連続的に堆積させるための装置 Granted JPS60108311A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR8313834 1983-08-29
FR8313834A FR2551233B1 (fr) 1983-08-29 1983-08-29 Dispositif pour deposer en regime continu une couche de silicium polycristallin sur un ruban de carbone
FR8319212 1983-12-01

Publications (2)

Publication Number Publication Date
JPS60108311A JPS60108311A (ja) 1985-06-13
JPS6144803B2 true JPS6144803B2 (enrdf_load_html_response) 1986-10-04

Family

ID=9291853

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59178202A Granted JPS60108311A (ja) 1983-08-29 1984-08-27 炭素リボン上に多結晶ケイ素層を連続的に堆積させるための装置

Country Status (2)

Country Link
JP (1) JPS60108311A (enrdf_load_html_response)
FR (1) FR2551233B1 (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0291310U (enrdf_load_html_response) * 1988-12-28 1990-07-19

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1026043C2 (nl) * 2004-04-26 2005-10-27 Stichting Energie Werkwijze en inrichting voor het fabriceren van metalen folies.
FR3008329A1 (fr) * 2013-07-11 2015-01-16 Solarforce Dispositif pour la formation d'une couche de silicium sur un ruban de carbone

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3730962A (en) * 1971-08-24 1973-05-01 Airco Inc Electron beam furance with material-evaporant equilibrium control
US3738312A (en) * 1971-12-28 1973-06-12 Bethlehem Steel Corp Molten metal bath level maintenance system
US3998598A (en) * 1973-11-23 1976-12-21 Semimetals, Inc. Automatic diameter control for crystal growing facilities
GB1532424A (en) * 1975-09-15 1978-11-15 Pilkington Brothers Ltd Controlled method for the production of clad glass rod
JPS5429843A (en) * 1977-08-10 1979-03-06 Nippon Steel Corp Controlling method for composition and thickness of plated multicomponent alloy films
US4217165A (en) * 1978-04-28 1980-08-12 Ciszek Theodore F Method of growing a ribbon crystal particularly suited for facilitating automated control of ribbon width
US4242589A (en) * 1979-01-15 1980-12-30 Mobil Tyco Solar Energy Corporation Apparatus for monitoring crystal growth

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0291310U (enrdf_load_html_response) * 1988-12-28 1990-07-19

Also Published As

Publication number Publication date
FR2551233B1 (fr) 1985-10-25
FR2551233A1 (fr) 1985-03-01
JPS60108311A (ja) 1985-06-13

Similar Documents

Publication Publication Date Title
US3740563A (en) Electroptical system and method for sensing and controlling the diameter and melt level of pulled crystals
US4589773A (en) Position detecting system
US4577588A (en) Device for process-type deposition of polycrystalline silicon on carbon film
RU96110900A (ru) Устройство и способ лазерного спекания
US3730962A (en) Electron beam furance with material-evaporant equilibrium control
RU96112154A (ru) Устройство и способ лазерного спекания
GB2145543A (en) Film thickness in a vacuum deposition processes
EP0077988B1 (en) Image density detecting unit for image formation apparatus
US4242589A (en) Apparatus for monitoring crystal growth
RU2200776C2 (ru) Устройство для выращивания кристаллов и способ выращивания кристаллов
JPS6144803B2 (enrdf_load_html_response)
US4277441A (en) Apparatus for monitoring crystal growth
US3590777A (en) Ingot feed drive
US4239583A (en) Method and apparatus for crystal growth control
CN208796113U (zh) 太阳跟踪系统及装置
GB1570590A (en) Zone refining
US4319901A (en) Electro-optic fiber monitor
JP2787133B2 (ja) 照明光学装置
US5239359A (en) Absorbance monitor
JPS60184241A (ja) 複写機
GB1561112A (en) Zone melting
JP3303916B2 (ja) 電子線マイクロアナライザの原理を用いた試料面マッピング装置
JPH04188030A (ja) 赤外線放射温度測定装置
JPS6042294A (ja) メルト表面位置測定装置
SU742705A1 (ru) Способ контрол линейных размеров микрообъектов