JPS6143239Y2 - - Google Patents

Info

Publication number
JPS6143239Y2
JPS6143239Y2 JP1979152963U JP15296379U JPS6143239Y2 JP S6143239 Y2 JPS6143239 Y2 JP S6143239Y2 JP 1979152963 U JP1979152963 U JP 1979152963U JP 15296379 U JP15296379 U JP 15296379U JP S6143239 Y2 JPS6143239 Y2 JP S6143239Y2
Authority
JP
Japan
Prior art keywords
turntable
positioning
adapter
probe
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1979152963U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5670568U (h
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1979152963U priority Critical patent/JPS6143239Y2/ja
Publication of JPS5670568U publication Critical patent/JPS5670568U/ja
Application granted granted Critical
Publication of JPS6143239Y2 publication Critical patent/JPS6143239Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1979152963U 1979-11-02 1979-11-02 Expired JPS6143239Y2 (h)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1979152963U JPS6143239Y2 (h) 1979-11-02 1979-11-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1979152963U JPS6143239Y2 (h) 1979-11-02 1979-11-02

Publications (2)

Publication Number Publication Date
JPS5670568U JPS5670568U (h) 1981-06-10
JPS6143239Y2 true JPS6143239Y2 (h) 1986-12-06

Family

ID=29383792

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1979152963U Expired JPS6143239Y2 (h) 1979-11-02 1979-11-02

Country Status (1)

Country Link
JP (1) JPS6143239Y2 (h)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5819273U (ja) * 1981-07-31 1983-02-05 富士通株式会社 位置合せ機構

Also Published As

Publication number Publication date
JPS5670568U (h) 1981-06-10

Similar Documents

Publication Publication Date Title
KR100187559B1 (ko) 전기적특성의 측정방법 및 그의 측정장치
KR100261957B1 (ko) 수평 반송 테스트 핸들러
JPS6362245A (ja) ウエハプロ−バ
JPH05166893A (ja) プローブカード検査装置
CN112648990B (zh) 一种石英音叉敏感结构在片测试装置与方法
CN118050317A (zh) 一种电子级硅棒外观自动检测与标识设备及其检测工艺
CN115372672A (zh) 探针设备的工作台、探针设备、控制方法及探针测试方法
JPS6143239Y2 (h)
US6128074A (en) Method and apparatus for inspection of pin grid array packages for bent leads
JPH0441495B2 (h)
JPH02213701A (ja) ディスク内径検査方法及びその装置
JP2971491B2 (ja) 検査装置
JP2638556B2 (ja) プローブカードチェッカー
KR20050067759A (ko) 반도체 검사장치
JP2533881Y2 (ja) 回路基板検査装置におけるピンボード構造
JPH0719817B2 (ja) プロ−ブカ−ド自動交換方法
JP2007095753A (ja) プローバ、プローブ接触方法及びそのためのプログラム
JPH04340241A (ja) 半導体ウエハの検査装置
JPH0758168A (ja) プローブ装置
KR20050067760A (ko) 반도체 검사장치
JPH0333022Y2 (h)
JPH022901A (ja) 配線基板端子ピンの長さ検査機構
JPH0441342Y2 (h)
JPH0477871B2 (h)
JPH07107909B2 (ja) ウエハプローバ