JPS6139287Y2 - - Google Patents

Description

[Detailed Description of the Invention] The present invention relates to a thickness measuring device, and particularly to a plate thickness measuring device suitable for performing flaw detection on the entire surface of a wide floor surface such as the bottom plate of an oil tank.

Conventionally, the thickness of a board has been measured by manually applying a single probe or a two-piece probe at regular intervals, or by scanning mechanically to measure the thickness of the entire floor surface. Ta. The former has poor reliability and recordability;
The latter had the disadvantage of slow thickness measurement speed.

SUMMARY OF THE INVENTION An object of the present invention is to provide a thickness measuring device that eliminates the above-mentioned drawbacks, has excellent reliability, recordability, and sensitivity, and has a fast thickness measuring speed.

An embodiment of the present invention will be described below with reference to FIGS. 1 to 5.

The ultrasonic probe section 1 shown in FIG. 1 includes a rotor 4.
2 and 43 are rotatably housed as shown by arrows 44 and 45, and the rotor 42 houses the wave transmitting vibrator 2, and the other rotor 43 houses the wave receiving vibrator 3. 4 is a sound insulating material.

Now, when an ultrasonic beam is transmitted from the transmitting transducer 2 (T ₁ in Fig. 4), the ultrasonic beam propagates through the liquid medium 5, is reflected by the surface of the specimen, and is transmitted to the receiving transducer 3 ( The ultrasonic beam 7 that is received by R ₁ ) in Figure 4, and the ultrasonic beam 8 that once penetrates into the subject, are reflected at the bottom surface, and are received by the receiving transducer R ₁ . It can be divided into Therefore, thickness can be measured by measuring the time difference between the surface echo and the bottom echo.

2 is a view of the ultrasonic wave radiation surface of the ultrasonic probe part for the thickness measuring device of the present invention. _T1 and _R1 are the above-mentioned transmitting and receiving transducers 2 and 3, and T2 _{and R2} provided next to this pair are the transmitting and receiving transducers 9 and 10 in FIG.
The reference numerals 2, 9, and 1 in FIG. 2 correspond to a pair of transducers for transmitting and receiving waves to measure the thickness at the following positions.
1, 13, 15, 17, 19, 21, 23, 25
are the transducers for transmitting waves, and T ₁ , T ₂ , T ₃ , T ₄ ,
These correspond to the transducers _T5 , _T6 , _T7 , _T8 , _T9 , and _T10 for transmitting waves, and form the transducer array 33 in FIG.
0, 22, 24, and 26 are receiving transducers,
These correspond to the receiving transducers _R1 , _R2 , _{R3 , R4, R5, R6, R7, R8 , R9 , and R10 ,} and correspond to the transducer array 35 in FIG. 4. And _T3 , _R3 , _T4 , _R4 , ..., _T10 ,
Reference numeral _R10 denotes a pair of transducers for transmitting and receiving waves arranged in the width direction of the subject. As with the transducers 2 and 3, each of these transducers in the transducer arrays 33 and 35 is supported by separate rotors 42 and 43. When measuring thickness, each pair is electrically switched to transmit and receive ultrasonic waves.

FIG. 3 is a side view of the ultrasonic probe section for the thickness measuring device of the present invention.

FIG. 4 is a block diagram of the thickness measuring device of the present invention. In the figure, 30 is a synchronizing signal generation circuit, 31 is a pulser, and 32 is a switching circuit, which sequentially switches the wave transmitting oscillators T ₁ to _{T o} (n=10 in the example in FIG. 2). Excite. 34 is a sequential signal generation circuit, and when the switching circuit 32 selects the transmitting transducer _T1 , the switching circuit 36 selects the receiving transducer _R1 . Wave receiving oscillator R ₁ ~
The signal obtained at R _o (n=10 in the example of FIG. 2) is amplified by an amplifier circuit 37, detected by a detection circuit 38, and sent out as a luminance signal to a display section 39. 40 is a sawtooth wave generation circuit, and Y on the display section 39
41 is a staircase wave generation circuit, and the display section 3
Deflect the X axis of 9.

FIG. 5 is a time chart of the thickness measuring device of the present invention. 30' is the output signal of the synchronization signal generation circuit 20, and when C ₁ , C ₂ , C ₃ , ..., _Co , the oscillator
T ₁ , R ₁ , T ₂ , R ₂ , T ₃ , R ₃ , ..., T _o , _Ro operate. 40' and 41' are Y-axis and X-axis deflection signals of the display section 39.

Although the present invention has been explained with reference to the case where a liquid medium such as water is mainly used as the acoustic coupling medium between the sound wave emitting surface and the subject, the use of a solid medium is also included in the present invention.

In addition, when the thickness of the test object 6 changes, the rotors 42 and 43 are rotated to remove one row of transducers at a time.
By changing the inclination angles of R ₁ to R ₁₀ and T ₁ to _{T 10} and changing the input incident angle θ ₁ of the ultrasonic beam, sensitivity can be set to optimal conditions.

According to this proposal, the thickness is measured by arranging flat plate vibrators in two rows and electrically scanning them, which has major advantages such as improved reliability and the ability to measure thickness at high speed and over a wide range. .

Furthermore, since the transducer can be rotated to set the optimum angle of incidence, the plate thickness can be measured with high sensitivity even if the plate thickness changes.

[Brief explanation of the drawing]

Fig. 1 is a sectional view of the ultrasonic probe section for the thickness measuring device of the present invention, Fig. 2 is a view of the ultrasonic radiation surface of the ultrasonic probe section of the thickness measuring device of the present invention, and Fig. 3 is the ultrasonic radiation surface view of the ultrasonic probe section of the proposed thickness measuring device. FIG. 4 is a side view of the ultrasonic probe section for the thickness measuring device, FIG. 4 is a block diagram of the thickness measuring device of the present invention, and FIG. 5 is a time chart of the thickness measuring device of the present invention. 6... Subject, T ₁ , T ₂ , T ₃ , T ₄ , T ₅ , T ₆ ,
T ₇ , T ₈ , T ₉ , T ₁₀ ... Transmission transducer, R ₁ , R ₂ ,
R ₃ , R ₄ , R ₅ , R ₆ , R ₇ , R ₈ , R ₉ , R ₁₀ ... wave receiving vibrator, 42, 43 ... rotor.

Claims (1)

[Scope of utility model registration request] The ultrasonic waves emitted from the transmitting transducer provided in the ultrasonic flaw detector section toward the test object are received by the receiving transducer provided in the ultrasonic flaw detector section and paired with the transmitting transducer. In a thickness measuring device for measuring the thickness of an object, a plurality of pairs of transmitting and receiving transducers are arranged along the cross section where the thickness is to be measured, and a pair of rotors rotatably provided in the ultrasonic flaw detector section are arranged. It is characterized by comprising a row of the wave transmitting transducers on one side and a row of the wave receiving transducers on the other side, and a switching means for switching the transmitting/receiving operation of each of the plurality of pairs of transmitting/receiving vibrators for each pair. Thickness measuring device.