JPS6132376Y2 - - Google Patents
Info
- Publication number
- JPS6132376Y2 JPS6132376Y2 JP13153781U JP13153781U JPS6132376Y2 JP S6132376 Y2 JPS6132376 Y2 JP S6132376Y2 JP 13153781 U JP13153781 U JP 13153781U JP 13153781 U JP13153781 U JP 13153781U JP S6132376 Y2 JPS6132376 Y2 JP S6132376Y2
- Authority
- JP
- Japan
- Prior art keywords
- cylindrical body
- suction head
- cylinder
- inspected
- groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000007689 inspection Methods 0.000 claims description 16
- 230000006837 decompression Effects 0.000 claims description 4
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000007779 soft material Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13153781U JPS5837574U (ja) | 1981-09-04 | 1981-09-04 | 素子検査装置用吸着ヘツド |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13153781U JPS5837574U (ja) | 1981-09-04 | 1981-09-04 | 素子検査装置用吸着ヘツド |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5837574U JPS5837574U (ja) | 1983-03-11 |
| JPS6132376Y2 true JPS6132376Y2 (enrdf_load_stackoverflow) | 1986-09-20 |
Family
ID=29925110
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13153781U Granted JPS5837574U (ja) | 1981-09-04 | 1981-09-04 | 素子検査装置用吸着ヘツド |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5837574U (enrdf_load_stackoverflow) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60153783U (ja) * | 1984-03-21 | 1985-10-14 | 株式会社貝印刃物開発センター | 庖丁の柄 |
| JP7101565B2 (ja) * | 2018-08-21 | 2022-07-15 | エイブリック株式会社 | 接続端子および半導体装置の検査方法 |
-
1981
- 1981-09-04 JP JP13153781U patent/JPS5837574U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5837574U (ja) | 1983-03-11 |
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