JPS6131827B2 - - Google Patents

Info

Publication number
JPS6131827B2
JPS6131827B2 JP54008217A JP821779A JPS6131827B2 JP S6131827 B2 JPS6131827 B2 JP S6131827B2 JP 54008217 A JP54008217 A JP 54008217A JP 821779 A JP821779 A JP 821779A JP S6131827 B2 JPS6131827 B2 JP S6131827B2
Authority
JP
Japan
Prior art keywords
power supply
hanger
furnace body
furnace
conveyor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54008217A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55101062A (en
Inventor
Eiji Fukawa
Juji Miura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP821779A priority Critical patent/JPS55101062A/ja
Publication of JPS55101062A publication Critical patent/JPS55101062A/ja
Publication of JPS6131827B2 publication Critical patent/JPS6131827B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP821779A 1979-01-29 1979-01-29 Method and device for testing environment of electronic equipment Granted JPS55101062A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP821779A JPS55101062A (en) 1979-01-29 1979-01-29 Method and device for testing environment of electronic equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP821779A JPS55101062A (en) 1979-01-29 1979-01-29 Method and device for testing environment of electronic equipment

Publications (2)

Publication Number Publication Date
JPS55101062A JPS55101062A (en) 1980-08-01
JPS6131827B2 true JPS6131827B2 (enrdf_load_stackoverflow) 1986-07-23

Family

ID=11687042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP821779A Granted JPS55101062A (en) 1979-01-29 1979-01-29 Method and device for testing environment of electronic equipment

Country Status (1)

Country Link
JP (1) JPS55101062A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103675496A (zh) * 2012-09-14 2014-03-26 联创汽车电子有限公司 电子设备环境测试系统
CN103808522A (zh) * 2013-11-12 2014-05-21 陕西国力信息技术有限公司 一种amt系统高温贮存试验方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57151842A (en) * 1981-03-13 1982-09-20 Daifuku Co Ltd Truck for testing and test facility using the same
JPS59147278A (ja) * 1983-02-14 1984-08-23 Tsubakimoto Chain Co 電子部品の負荷試験装置
JPS59184871A (ja) * 1983-04-05 1984-10-20 Tsubakimoto Chain Co 電子部品の負荷試験装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103675496A (zh) * 2012-09-14 2014-03-26 联创汽车电子有限公司 电子设备环境测试系统
CN103675496B (zh) * 2012-09-14 2016-12-21 联创汽车电子有限公司 电子设备环境测试系统
CN103808522A (zh) * 2013-11-12 2014-05-21 陕西国力信息技术有限公司 一种amt系统高温贮存试验方法

Also Published As

Publication number Publication date
JPS55101062A (en) 1980-08-01

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