JPS6130041A - Semiconductor device assembling apparatus - Google Patents
Semiconductor device assembling apparatusInfo
- Publication number
- JPS6130041A JPS6130041A JP15060884A JP15060884A JPS6130041A JP S6130041 A JPS6130041 A JP S6130041A JP 15060884 A JP15060884 A JP 15060884A JP 15060884 A JP15060884 A JP 15060884A JP S6130041 A JPS6130041 A JP S6130041A
- Authority
- JP
- Japan
- Prior art keywords
- case
- working
- inversion
- rail
- cavity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Die Bonding (AREA)
Abstract
Description
【発明の詳細な説明】 〔技術分野〕 装置に関する。[Detailed description of the invention] 〔Technical field〕 Regarding equipment.
従来の装置では、半導体パッケージ(以後ケースと略す
)の供給、収納はすべてケースが上向きの状態で行なわ
れていた。これは、ケースの作業面(ダイボンディング
、ワイヤーボンディングが行表われる面)が上向きであ
るので当然の事と思われていた。しかし、ケースが上向
きの状態では、作業中にケースのキャビティ内に発生す
る半導体ペレット(以後ダイと略す)のシリコンぐず、
混入するワイヤのくず、及び作業待ち時間中に混入する
異物がそのままの状態で残ってしまう。今日、ダイ表面
上のパターン配線は更に微細化、高密度化し、電極パッ
ドと外部リードを接続する各ワイヤ間隔もよシ狭くなっ
てきている。In conventional devices, semiconductor packages (hereinafter referred to as cases) are supplied and stored with the cases facing upward. This was thought to be natural since the work surface of the case (the surface where die bonding and wire bonding are performed) faces upward. However, when the case is facing upward, the silicon waste of semiconductor pellets (hereinafter abbreviated as die) generated inside the case cavity during work.
Wire scraps that get mixed in and foreign objects that get mixed in during the work waiting time remain as they are. Today, pattern wiring on the surface of a die is becoming finer and denser, and the distance between each wire connecting an electrode pad and an external lead is also becoming narrower.
従って、ケースのキャビティ内にダイのシリコンくず、
ワイヤのぐず及び異物が入った状態はダイ表面、各ワイ
ヤ間の短絡、ワイヤの裂傷等の原因とな夛、製品として
の品質、信頼性が著しく低下する。Therefore, there is silicon debris from the die inside the cavity of the case.
The state in which wire crumbs and foreign matter are present causes short circuits between the die surfaces, wires, and tearing of the wires, and the quality and reliability of the product are significantly reduced.
本発明の目的はケース供給部と作業部(ダイボ/ディ/
グ部、ワイヤボンディング部)との間と作業部とケース
収納部との間にケース反転機構を設け、作業部以外では
ケースを下向きに置くことによ〕、作業待ち時間に異物
が混入することを防止すると共に1作業時に発生、混入
する、ダイのくず、ワイヤのくずを落下させ、ケースキ
ャビティ内から異物を除去する仁とによシ、高信頼性、
高品質の製品を製造することを可能とした半導体装置組
立装置を提供することKある。The object of the present invention is to provide a case supply section and a working section (die body/die/
By installing a case reversing mechanism between the working part and the wire bonding part) and between the working part and the case storage part, and placing the case face down in areas other than the working part, foreign objects will not get mixed in while waiting for work. It is highly reliable, prevents die scraps and wire scraps that are generated or mixed in during one operation, and removes foreign objects from the case cavity.
It is an object of the present invention to provide a semiconductor device assembly device that makes it possible to manufacture high-quality products.
本発明によると半導体パッケージのキャビティ内に半導
体ペレットを接着するダイボンダと、その接着された半
導体ペレットO電極パ、ドとケースのキャビティ内のリ
ードを金属ワイヤで接合するワイヤボンダとを含む半導
体装置組立装置において、前記半導体パッケージが供給
側から収納側に到る間に反転される機構を付加した事t
−特徴とする半導体装置組立装置が得られる。According to the present invention, a semiconductor device assembly apparatus includes a die bonder for bonding a semiconductor pellet in a cavity of a semiconductor package, and a wire bonder for bonding the bonded semiconductor pellet O electrode pads and leads in a cavity of a case with a metal wire. In this method, a mechanism is added for inverting the semiconductor package while it is being transferred from the supply side to the storage side.
- A semiconductor device assembly apparatus with characteristics can be obtained.
次に本発明の実施例を図面を用いて説明する。 Next, embodiments of the present invention will be described using the drawings.
第1図は本発明の一実施例のうち反転機構の構成図、第
2図は本発明の構成を示す概略図で、aはケース供給部
、Cはケース収納部、bは作業部(ダイボンディング部
又はワイヤーボンディング部)、d 、 d/はケース
反転部、7.7’、8.8’はケース搬送用レール(レ
ール)である。Fig. 1 is a block diagram of a reversing mechanism in one embodiment of the present invention, and Fig. 2 is a schematic diagram showing the structure of the present invention, in which a is a case supply section, C is a case storage section, and b is a working section (die (bonding part or wire bonding part), d and d/ are case reversing parts, and 7.7' and 8.8' are case transport rails.
第1図、第2図においてケース収納部C(第2図)に下
向き(作業面が下)K配置されているケース10は順次
取出され図示し表いケース送シ機構によシレール8上を
通って反転部1に達する。In FIGS. 1 and 2, the cases 10 that are placed in the case storage section C (FIG. 2) facing downward (with the work surface facing downward) are taken out one by one and are shown on the top of the rail 8 by the case feeding mechanism. and reaches the reversing section 1.
反転部1は真空吸着口2(配管は図示せず)を持ち、こ
れKよシケース10は固定される。ケース10が反転部
l内へ入ると図示しないセンサ系によ)モータ6が回転
し、モータ軸3の延長上にあるスリ、トカム4のスリ、
トがセンサ5に入るとモータ6は止まる。このことKよ
)、ケース1゜は180度回転、すなわち反転させられ
、作業面が上のケース9となる。The reversing section 1 has a vacuum suction port 2 (piping not shown), and a case 10 is fixed across the vacuum suction port 2 (piping not shown). When the case 10 enters the reversing part l, the motor 6 rotates by a sensor system (not shown), and the pickpocket on the extension of the motor shaft 3, the pickpocket on the tocam 4,
When the electric current enters the sensor 5, the motor 6 stops. (K), case 1° is rotated 180 degrees, that is, reversed, and becomes case 9 with the working surface facing upward.
この後、ケース9は作業部(第2図b)で作業終了後、
レール7′(第2図)を通って反転部d/(第2図)で
再び反転され下向きのケース1oの状態で、収納部a(
第2図)K収納される。After this, case 9 is placed in the work section (Fig. 2b) after the work is completed.
Passing through the rail 7' (Fig. 2), the case 1o is turned over again at the reversing part d/ (Fig. 2), and the housing part a (
Fig. 2) K is stored.
以上のように1本発明は、作業待ち時間に異物がケース
中ヤビティ内に混入することを防止すると共に、作業時
に発生、又は混入するダイのくずやワイヤのくずを落下
させ、ケースキャビティ内からこれら異物を除去させ高
信頼性、高品質の半導体製品の製造が可能となる効果が
ある。As described above, the present invention prevents foreign matter from entering the cavity in the case while waiting for work, and also allows die scraps and wire scraps generated or mixed during work to fall out from inside the case cavity. This has the effect of removing these foreign substances and making it possible to manufacture highly reliable and high quality semiconductor products.
第1図は本発明の一実施例の機構の うち反転用機構部
の構成図、第2図は本発明の一実施例の構成概略図であ
る。
1・・・・・・反転部、2・・・・・・真空吸着口、3
・・団・駆動軸、4・・・・・・スリ、トカム、5・・
・・・・センサ、6・・・・・・モータ、7.8.7’
、8’−・・・・・搬送用レール、9,1゜・・・・・
・ケース、
a・・・・・・収納部、b・・・・・・作業部、C・・
・・・・供給部%d。
d′・・・・・・反転機構部。FIG. 1 is a block diagram of a reversing mechanism part of a mechanism according to an embodiment of the present invention, and FIG. 2 is a schematic diagram of the structure of an embodiment of the present invention. 1... Reversing part, 2... Vacuum suction port, 3
... Group, drive shaft, 4... Pickpocket, Tokam, 5...
...Sensor, 6...Motor, 7.8.7'
, 8'-... Conveyance rail, 9,1°...
・Case, a...Storage section, b...Working section, C...
...Supply part %d. d'...Reversing mechanism section.
Claims (1)
着するダイボンダと、その接着された半導体ペレットの
電極パッドとケースのキャビティ内のリードを金属ワイ
ヤで接合するワイヤボンダとを含む半導体装置組立装置
において、前記半導体パッケージが供給側から収納側に
到る間に反転される機構を付加した事を特徴とする半導
体装置組立装置。A semiconductor device assembly apparatus including a die bonder for bonding a semiconductor pellet in a cavity of a semiconductor package, and a wire bonder for bonding an electrode pad of the bonded semiconductor pellet to a lead in a cavity of a case with a metal wire, wherein the semiconductor package is A semiconductor device assembly device characterized by adding a mechanism for reversing the device from the supply side to the storage side.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15060884A JPS6130041A (en) | 1984-07-20 | 1984-07-20 | Semiconductor device assembling apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15060884A JPS6130041A (en) | 1984-07-20 | 1984-07-20 | Semiconductor device assembling apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6130041A true JPS6130041A (en) | 1986-02-12 |
JPH0322698B2 JPH0322698B2 (en) | 1991-03-27 |
Family
ID=15500600
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15060884A Granted JPS6130041A (en) | 1984-07-20 | 1984-07-20 | Semiconductor device assembling apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6130041A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5994614A (en) * | 1996-09-12 | 1999-11-30 | Uni-Charm Corporation | Absorbent article |
US6129717A (en) * | 1996-07-02 | 2000-10-10 | Uni-Charm Corporation | Absorbent article and method for producing the same |
US6156078A (en) * | 1991-09-16 | 2000-12-05 | Sgs-Thomson Microelectronics Sdn. Bhd. | Testing and finishing apparatus for integrated circuit package units |
US7425366B2 (en) | 2004-01-15 | 2008-09-16 | Kabushiki Kaisha Toshiba | Tape member or sheet member, and method of producing tape member or sheet member |
-
1984
- 1984-07-20 JP JP15060884A patent/JPS6130041A/en active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6156078A (en) * | 1991-09-16 | 2000-12-05 | Sgs-Thomson Microelectronics Sdn. Bhd. | Testing and finishing apparatus for integrated circuit package units |
US6129717A (en) * | 1996-07-02 | 2000-10-10 | Uni-Charm Corporation | Absorbent article and method for producing the same |
US5994614A (en) * | 1996-09-12 | 1999-11-30 | Uni-Charm Corporation | Absorbent article |
US7425366B2 (en) | 2004-01-15 | 2008-09-16 | Kabushiki Kaisha Toshiba | Tape member or sheet member, and method of producing tape member or sheet member |
EP2204821A1 (en) * | 2004-01-15 | 2010-07-07 | Kabushi Kaisha Toshiba | Tape member or sheet member, and method of producing tape member or sheet member |
Also Published As
Publication number | Publication date |
---|---|
JPH0322698B2 (en) | 1991-03-27 |
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