JPS6127681B2 - - Google Patents
Info
- Publication number
- JPS6127681B2 JPS6127681B2 JP11560380A JP11560380A JPS6127681B2 JP S6127681 B2 JPS6127681 B2 JP S6127681B2 JP 11560380 A JP11560380 A JP 11560380A JP 11560380 A JP11560380 A JP 11560380A JP S6127681 B2 JPS6127681 B2 JP S6127681B2
- Authority
- JP
- Japan
- Prior art keywords
- speckle pattern
- movement
- distortion
- determined
- deformation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 claims description 15
- 238000005314 correlation function Methods 0.000 claims description 7
- 238000006243 chemical reaction Methods 0.000 claims 2
- 238000005259 measurement Methods 0.000 abstract description 8
- 239000000463 material Substances 0.000 abstract description 2
- 238000000691 measurement method Methods 0.000 description 3
- 229910001369 Brass Inorganic materials 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000004567 concrete Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 239000000123 paper Substances 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000005060 rubber Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000009864 tensile test Methods 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern
- G01B9/02095—Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11560380A JPS5740603A (en) | 1980-08-22 | 1980-08-22 | Distortion measurement of object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11560380A JPS5740603A (en) | 1980-08-22 | 1980-08-22 | Distortion measurement of object |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5740603A JPS5740603A (en) | 1982-03-06 |
| JPS6127681B2 true JPS6127681B2 (zh) | 1986-06-26 |
Family
ID=14666709
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11560380A Granted JPS5740603A (en) | 1980-08-22 | 1980-08-22 | Distortion measurement of object |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5740603A (zh) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB8613635D0 (en) * | 1986-06-05 | 1986-07-09 | Tyrer J R | Optical inspection |
| JP2692599B2 (ja) * | 1994-07-27 | 1997-12-17 | 株式会社島津製作所 | レーザー非接触伸び計 |
-
1980
- 1980-08-22 JP JP11560380A patent/JPS5740603A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5740603A (en) | 1982-03-06 |
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