JPS61255031A - Semiconductor bonding device - Google Patents
Semiconductor bonding deviceInfo
- Publication number
- JPS61255031A JPS61255031A JP9687985A JP9687985A JPS61255031A JP S61255031 A JPS61255031 A JP S61255031A JP 9687985 A JP9687985 A JP 9687985A JP 9687985 A JP9687985 A JP 9687985A JP S61255031 A JPS61255031 A JP S61255031A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor
- bonding
- substrate
- vibration
- pressure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/75—Apparatus for connecting with bump connectors or layer connectors
- H01L2224/7525—Means for applying energy, e.g. heating means
- H01L2224/75251—Means for applying energy, e.g. heating means in the lower part of the bonding apparatus, e.g. in the apparatus chuck
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、半導体と回路基板とを一括してボンディング
する半導体ボンディング装置に関するも〔発明の概要〕
本発明は半導体ボンディング装置において、半導体装置
台を振動させる振動負荷機構全役けることにより、半導
体と回路基板を確実にボンディングを行なえるようにし
たものである。Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a semiconductor bonding device for collectively bonding a semiconductor and a circuit board. By fully utilizing the vibration load mechanism that vibrates the semiconductor and the circuit board, it is possible to reliably bond the semiconductor and the circuit board.
従来の半導体と回路基板とを一括してボンディングする
方法としては、第2ryJK示すように、半導体装置台
1上に配線パッドに金バンプをつけた半導体装置き、基
板3つまりポリイミドテープ3aの上に形成され金メツ
Φを施こされた銅箔回路パターンのフィンガー3bと半
導体2の配線パッドとを位置合わせをして加熱したボン
ディングツール4を押圧してボンディングを行なってい
た。As shown in the 2nd RYJK, the conventional method of bonding a semiconductor and a circuit board all at once is to place a semiconductor device with gold bumps on wiring pads on a semiconductor device stand 1, and place it on a substrate 3, that is, a polyimide tape 3a. The fingers 3b of the formed copper foil circuit pattern and the wiring pads of the semiconductor 2 are aligned and pressed with a heated bonding tool 4 to perform bonding.
また、半導体や基板を高温にしたくない場合や、ボンデ
ィング性を向上させるために半導体をヒーター5により
て予備加熱を行ないボンディングを行なりていた。Further, in cases where it is not desired to heat the semiconductor or substrate to a high temperature, or in order to improve bonding properties, the semiconductor is preheated using a heater 5 to perform bonding.
〔発明が解決しようとする間層点及び目的〕1、かL&
がら3従来のボンディングでけボンディング性を向上さ
せるためにボンディングツール圧力は高めになりまた、
半導体の予備加熱についても高温になるという問題点を
有している〇そこで、本発明は上記問題点を解決するも
ので、その目的とするところは、ボンディング条件を軽
減する良好な半導体ボンディング装置を提供することに
ある。[Interlayer point and purpose to be solved by the invention] 1.
However, in order to improve the bonding performance in conventional bonding, the bonding tool pressure is increased, and
Preheating of semiconductors also has the problem of high temperatures. Therefore, the present invention is intended to solve the above problems, and its purpose is to provide a good semiconductor bonding device that reduces bonding conditions. It is about providing.
本発明は、半導体と回路基板とを一括してボンディング
する半導体ボンディング装置において、半導体装置台を
振動させる振動負荷機構を設けたことを特徴とする。The present invention is characterized in that a semiconductor bonding apparatus for collectively bonding a semiconductor and a circuit board is provided with a vibration load mechanism that vibrates a semiconductor device stand.
本発明の構成によれば、ボンディング時に半導体装置台
を振動させることにより半導体に振動を伝えることがで
きるため、その振動エネルギーによってボンディングツ
ール圧力や半導体の予備加熱温度を低くすることができ
る。According to the configuration of the present invention, vibration can be transmitted to the semiconductor by vibrating the semiconductor device stand during bonding, so that the pressure of the bonding tool and the preheating temperature of the semiconductor can be lowered by the vibration energy.
〔実施例〕
第1図は本発明の実施例における半導体ボンデインク装
置である。[Embodiment] FIG. 1 shows a semiconductor bonding device in an embodiment of the present invention.
基台20の上に半導体装置台30が固定されている。こ
の半導体装置台30は半導体40を挾持したり解除した
りする爪31.半導体を載せるセラミックス等の絶縁板
でできたステージ32.その下に半導体を予備加熱する
ヒーターブロック33゜さらに上板34と下板35の間
の板ばね36とから構成されている。また、この半導体
装置台30の上板34には磁気作用により発振する磁歪
振動子50が取り付けられている。基台20はX、Y。A semiconductor device stand 30 is fixed on the base 20. This semiconductor device stand 30 has claws 31 for holding and releasing the semiconductor 40. A stage 32 made of an insulating plate such as ceramics on which a semiconductor is placed. It is comprised of a heater block 33° below which preheats the semiconductor, and a leaf spring 36 between an upper plate 34 and a lower plate 35. Further, a magnetostrictive vibrator 50 that oscillates due to magnetic action is attached to the upper plate 34 of this semiconductor device stand 30. The base 20 is X, Y.
2軸に移動可能に構成され、ボンディングツール60と
半導体40とのボンディング位置合せができるようにな
っている。It is configured to be movable in two axes so that bonding positioning between the bonding tool 60 and the semiconductor 40 can be performed.
次に作用について説明する。Next, the effect will be explained.
半導体と基板をボンディングする際、ヒートブロック3
3の加熱により半導体40が加熱され、基台20の移動
によシ半導体40とボンディングツール60の位置合せ
及び基板との位置合せが行なわれる。ボンディング時に
は、第2図の従来の半導体ボンディング方法の概略断面
図と同様に、加熱したボンディングツール60が図示し
ていないがその下に配置される基板のフィンガーおよび
半導体40を押圧してボンディングが行なわれるが、こ
の時、磁歪振動子50が発振し、この振動は板ばね36
の作用により減衰することなく半導体40にまで伝達さ
れる。この振動を負荷する時間はボンディングツールが
押圧している間で、通常1〜3秒であるがボンディング
ツールの押圧時間に関係なく任意に設定できる。また、
本実施例では振動負荷機構の発振源として磁歪振動子を
用いたが、圧電振動子を用いてもよい。Heat block 3 when bonding semiconductor and substrate
3, the semiconductor 40 is heated, and the movement of the base 20 aligns the semiconductor 40 with the bonding tool 60 and the substrate. At the time of bonding, similar to the schematic cross-sectional view of the conventional semiconductor bonding method shown in FIG. 2, a heated bonding tool 60 (not shown) presses the fingers of the substrate and the semiconductor 40 disposed below, thereby performing bonding. However, at this time, the magnetostrictive vibrator 50 oscillates, and this vibration is caused by the leaf spring 36.
The signal is transmitted to the semiconductor 40 without being attenuated due to the action of . The time during which this vibration is applied is usually 1 to 3 seconds while the bonding tool is pressing, but it can be set arbitrarily regardless of the pressing time of the bonding tool. Also,
In this embodiment, a magnetostrictive vibrator is used as the oscillation source of the vibration load mechanism, but a piezoelectric vibrator may also be used.
以上述べたように本発明によれば、半導体装置台を振動
させる振動負荷機構を設けたことによシ半導体に振動を
伝えることができるため、その振動エネルギーによりて
ボンディング圧力や半導体の予備加熱温度を低くするこ
となどボンディング条件を軽減し半導体を熱や圧力から
保護することができ、しいてはボンディングの信頼性に
もつなもつ金属間のボンディングに対しては振動を与え
ることにより、この酸化被膜が破壊されボンディングし
やすくなるという効果も有する。As described above, according to the present invention, by providing a vibration load mechanism that vibrates the semiconductor device stand, vibration can be transmitted to the semiconductor, and the vibration energy can be used to increase the bonding pressure and the preheating temperature of the semiconductor. By reducing the bonding conditions, such as by lowering the It also has the effect of destroying and making bonding easier.
第1図は本発明の一実施例を示す半導体ボンデインク装
置の斜視図。
第2図は従来の半導体ボンディング方法の概略断面図。
30・・・・・・・・・半導体装置台
33・・・・・・・・・ヒートブロック36・・・・・
・・・・板ばね
50・・・・・・・・・磁歪振動子
60・・・・・・・・・ボンディングツーツ以上FIG. 1 is a perspective view of a semiconductor bonding device showing an embodiment of the present invention. FIG. 2 is a schematic cross-sectional view of a conventional semiconductor bonding method. 30... Semiconductor device stand 33... Heat block 36...
・・・・・・Plate spring 50・・・・・・Magnetostrictive vibrator 60・・・・・・Bonding tools or more
Claims (3)
半導体ボンディング装置において、半導体装置台を振動
させる振動負荷機構を設けたことを特徴とする半導体ボ
ンディング装置。(1) A semiconductor bonding apparatus for collectively bonding a semiconductor and a circuit board, characterized in that a vibration load mechanism for vibrating a semiconductor device stand is provided.
いたことを特徴とする特許請求の範囲第1項に記載の半
導体ボンディング装置。(2) The semiconductor bonding apparatus according to claim 1, wherein a magnetostrictive vibrator is used as a vibration oscillation source of the vibration load mechanism.
いたことを特徴とする特許請求の範囲第1項に記載の半
導体ボンディング装置。(3) The semiconductor bonding apparatus according to claim 1, wherein a piezoelectric vibrator is used as a vibration oscillation source of the vibration load mechanism.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9687985A JPS61255031A (en) | 1985-05-08 | 1985-05-08 | Semiconductor bonding device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9687985A JPS61255031A (en) | 1985-05-08 | 1985-05-08 | Semiconductor bonding device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61255031A true JPS61255031A (en) | 1986-11-12 |
Family
ID=14176699
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9687985A Pending JPS61255031A (en) | 1985-05-08 | 1985-05-08 | Semiconductor bonding device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61255031A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63187640A (en) * | 1987-01-30 | 1988-08-03 | Toshiba Corp | Die base device for inner lead bonder |
JPH02205334A (en) * | 1989-02-03 | 1990-08-15 | Orient Watch Co Ltd | Manufacture of semiconductor device |
-
1985
- 1985-05-08 JP JP9687985A patent/JPS61255031A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63187640A (en) * | 1987-01-30 | 1988-08-03 | Toshiba Corp | Die base device for inner lead bonder |
JPH02205334A (en) * | 1989-02-03 | 1990-08-15 | Orient Watch Co Ltd | Manufacture of semiconductor device |
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