JPS61237357A - 質量分析装置 - Google Patents
質量分析装置Info
- Publication number
- JPS61237357A JPS61237357A JP60078137A JP7813785A JPS61237357A JP S61237357 A JPS61237357 A JP S61237357A JP 60078137 A JP60078137 A JP 60078137A JP 7813785 A JP7813785 A JP 7813785A JP S61237357 A JPS61237357 A JP S61237357A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- ion
- slit
- ions
- mass spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000002500 ions Chemical class 0.000 claims abstract description 89
- 239000002184 metal Substances 0.000 claims abstract description 18
- 238000003384 imaging method Methods 0.000 claims abstract description 17
- 238000004458 analytical method Methods 0.000 claims description 19
- 238000001514 detection method Methods 0.000 claims description 12
- 230000007717 exclusion Effects 0.000 claims description 7
- 238000000105 evaporative light scattering detection Methods 0.000 claims 1
- 239000002245 particle Substances 0.000 abstract description 7
- 230000004075 alteration Effects 0.000 description 22
- 230000003287 optical effect Effects 0.000 description 6
- 238000004364 calculation method Methods 0.000 description 4
- 239000006185 dispersion Substances 0.000 description 4
- 238000010884 ion-beam technique Methods 0.000 description 4
- 230000005684 electric field Effects 0.000 description 3
- 238000004949 mass spectrometry Methods 0.000 description 3
- 101700004678 SLIT3 Proteins 0.000 description 2
- 102100027339 Slit homolog 3 protein Human genes 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 102100025490 Slit homolog 1 protein Human genes 0.000 description 1
- 101710123186 Slit homolog 1 protein Proteins 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60078137A JPS61237357A (ja) | 1985-04-11 | 1985-04-11 | 質量分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60078137A JPS61237357A (ja) | 1985-04-11 | 1985-04-11 | 質量分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61237357A true JPS61237357A (ja) | 1986-10-22 |
JPH0572701B2 JPH0572701B2 (enrdf_load_stackoverflow) | 1993-10-12 |
Family
ID=13653489
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60078137A Granted JPS61237357A (ja) | 1985-04-11 | 1985-04-11 | 質量分析装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61237357A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10206272A (ja) * | 1997-01-23 | 1998-08-07 | Ulvac Japan Ltd | 漏洩検知用磁場偏向型質量分析管の分解能向上方法 |
-
1985
- 1985-04-11 JP JP60078137A patent/JPS61237357A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10206272A (ja) * | 1997-01-23 | 1998-08-07 | Ulvac Japan Ltd | 漏洩検知用磁場偏向型質量分析管の分解能向上方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH0572701B2 (enrdf_load_stackoverflow) | 1993-10-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS62264546A (ja) | 質量分析器 | |
EP2943970B1 (en) | Mass spectrometer with optimized magnetic shunt | |
CN112305002B (zh) | 光谱学和成像系统 | |
US6984821B1 (en) | Mass spectrometer and methods of increasing dispersion between ion beams | |
JP7555428B2 (ja) | 高性能荷電粒子検出のための装置および方法 | |
US4864130A (en) | Photo ion spectrometer | |
JPH0352180B2 (enrdf_load_stackoverflow) | ||
US11101123B2 (en) | Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device | |
EP2943971B1 (en) | Mass spectrometer with improved magnetic sector | |
US20240038521A1 (en) | Axially progressive lens for transporting charged particles | |
US4800273A (en) | Secondary ion mass spectrometer | |
US7750312B2 (en) | Method and apparatus for generating ions for mass analysis | |
EP4281993B1 (en) | Systems and methods for fourier transform electrostatic ion trap with microchannel plate detector | |
JPS61237357A (ja) | 質量分析装置 | |
JPS61237358A (ja) | 質量分析装置 | |
JP3153386B2 (ja) | 質量分析装置 | |
Daolio et al. | Quadrupole secondary ion mass spectrometer for simultaneous detection of positive and negative ions | |
JPH0349177B2 (enrdf_load_stackoverflow) | ||
JPS61237359A (ja) | 質量分析装置 | |
Goto et al. | New type of compact electrostatic energy analyzer adequate to measurement of charge exchange neutral particles with a low counting yield | |
JPS6188444A (ja) | 質量分析装置 | |
JPH0351051B2 (enrdf_load_stackoverflow) |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |