JPH0351051B2 - - Google Patents
Info
- Publication number
- JPH0351051B2 JPH0351051B2 JP56149612A JP14961281A JPH0351051B2 JP H0351051 B2 JPH0351051 B2 JP H0351051B2 JP 56149612 A JP56149612 A JP 56149612A JP 14961281 A JP14961281 A JP 14961281A JP H0351051 B2 JPH0351051 B2 JP H0351051B2
- Authority
- JP
- Japan
- Prior art keywords
- mass
- field
- particles
- magnetic field
- energy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56149612A JPS5853147A (ja) | 1981-09-24 | 1981-09-24 | 荷電粒子質量エネルギ−分析器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56149612A JPS5853147A (ja) | 1981-09-24 | 1981-09-24 | 荷電粒子質量エネルギ−分析器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5853147A JPS5853147A (ja) | 1983-03-29 |
| JPH0351051B2 true JPH0351051B2 (enrdf_load_stackoverflow) | 1991-08-05 |
Family
ID=15479007
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56149612A Granted JPS5853147A (ja) | 1981-09-24 | 1981-09-24 | 荷電粒子質量エネルギ−分析器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5853147A (enrdf_load_stackoverflow) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55159557A (en) * | 1979-05-31 | 1980-12-11 | Jeol Ltd | Mass analyzer |
-
1981
- 1981-09-24 JP JP56149612A patent/JPS5853147A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5853147A (ja) | 1983-03-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5464985A (en) | Non-linear field reflectron | |
| US3445650A (en) | Double focussing mass spectrometer including a wedge-shaped magnetic sector field | |
| US4672204A (en) | Mass spectrometers | |
| JPH0346747A (ja) | 飛行時間形質量分析計用のイオンミラー装置 | |
| EP0777260B1 (en) | Mass spectrometer | |
| WO2006130149A2 (en) | Mass spectrometer and methods of increasing dispersion between ion beams | |
| Liebl | Design of a combined ion and electron microprobe apparatus | |
| JPS5836464B2 (ja) | シツリヨウブンセキソウチ | |
| Jennings et al. | [2] Mass analyzers | |
| US4952803A (en) | Mass Spectrometry/mass spectrometry instrument having a double focusing mass analyzer | |
| AU2017220662B2 (en) | Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device | |
| JP3392345B2 (ja) | 飛行時間型質量分析装置 | |
| EP0456516B1 (en) | Ion buncher | |
| JPH0351051B2 (enrdf_load_stackoverflow) | ||
| AU2017220663B2 (en) | Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device | |
| US3387131A (en) | Dual orbit mass spectrometer for analyzing ions in the mass range of 1 to 100 | |
| SU957318A1 (ru) | Квадрупольный масс-спектрометр | |
| JP3096375B2 (ja) | ハイブリッドタンデム質量分析装置 | |
| US3783278A (en) | Single magnet tandem mass spectrometer | |
| GB2631411A (en) | Mass spectrometers comprising a pre-filter | |
| JPH0572701B2 (enrdf_load_stackoverflow) | ||
| SU1605288A1 (ru) | Ионный микрозондовый анализатор | |
| JPH0624115B2 (ja) | 2重収束質量分析計 | |
| JPH0534773B2 (enrdf_load_stackoverflow) | ||
| JPS61237359A (ja) | 質量分析装置 |