JPS61235740A - 表面欠陥検査方法 - Google Patents

表面欠陥検査方法

Info

Publication number
JPS61235740A
JPS61235740A JP7679285A JP7679285A JPS61235740A JP S61235740 A JPS61235740 A JP S61235740A JP 7679285 A JP7679285 A JP 7679285A JP 7679285 A JP7679285 A JP 7679285A JP S61235740 A JPS61235740 A JP S61235740A
Authority
JP
Japan
Prior art keywords
inspected
reflected light
inspection
contact
difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7679285A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0462332B2 (enrdf_load_stackoverflow
Inventor
Keiji Inoue
恵司 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nok Corp
Original Assignee
Nok Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nok Corp filed Critical Nok Corp
Priority to JP7679285A priority Critical patent/JPS61235740A/ja
Publication of JPS61235740A publication Critical patent/JPS61235740A/ja
Publication of JPH0462332B2 publication Critical patent/JPH0462332B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP7679285A 1985-04-12 1985-04-12 表面欠陥検査方法 Granted JPS61235740A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7679285A JPS61235740A (ja) 1985-04-12 1985-04-12 表面欠陥検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7679285A JPS61235740A (ja) 1985-04-12 1985-04-12 表面欠陥検査方法

Publications (2)

Publication Number Publication Date
JPS61235740A true JPS61235740A (ja) 1986-10-21
JPH0462332B2 JPH0462332B2 (enrdf_load_stackoverflow) 1992-10-06

Family

ID=13615474

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7679285A Granted JPS61235740A (ja) 1985-04-12 1985-04-12 表面欠陥検査方法

Country Status (1)

Country Link
JP (1) JPS61235740A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0212646U (enrdf_load_stackoverflow) * 1988-07-06 1990-01-26

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0212646U (enrdf_load_stackoverflow) * 1988-07-06 1990-01-26

Also Published As

Publication number Publication date
JPH0462332B2 (enrdf_load_stackoverflow) 1992-10-06

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