JPS61223721A - Manufacture of liquid crystal display device - Google Patents

Manufacture of liquid crystal display device

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Publication number
JPS61223721A
JPS61223721A JP60061857A JP6185785A JPS61223721A JP S61223721 A JPS61223721 A JP S61223721A JP 60061857 A JP60061857 A JP 60061857A JP 6185785 A JP6185785 A JP 6185785A JP S61223721 A JPS61223721 A JP S61223721A
Authority
JP
Japan
Prior art keywords
liquid crystal
film
substrate
insulating layer
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60061857A
Other languages
Japanese (ja)
Inventor
Kyozo Ide
井出 恭三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP60061857A priority Critical patent/JPS61223721A/en
Publication of JPS61223721A publication Critical patent/JPS61223721A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

PURPOSE:To facilitate the manufacturing step and to mass-produce by forming an insulating layer on an optical stopping film contacting with a liquid crystal cell, with an oxidation. CONSTITUTION:The thin film transistor TFT and the display picture element electrode 7 are arranged on the substrate 1 in a matrix state to form the first electrode substrate and the insulating film 8 is coated on the first electrode substrate, and then a metal such as a aluminium is vapor-deposited and is etched to a pattern so as to cover an upper part of TFT, to form the optical stopping film 9 contacting with the liquid crystal 13. The formation of the insulting layer on the optical stopping film 9 is performed by the oxidative treatment according to the anodic oxidation resulting in the formation of the oxidation film 10. Accordingly, the method as mentioned above, makes the step very easy and improves the mass production, on comparing with the earlier method in which the insulating layer is formed with the vapor-deposition or the sputtering method.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明はアクティブ素子として例えば薄膜トランジスタ
(以下TPTと称す)を用いたアクティブマ) +7ツ
クス形の液晶表示装置の製造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a method for manufacturing an active material type liquid crystal display device using, for example, a thin film transistor (hereinafter referred to as TPT) as an active element.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

最近、液晶やエレクトロルミネセンス(EL)を用いた
表示装置は、テレビ表示やグラフィックディスプレイ等
を指向した大容量、高密度のアクティブマトリックス形
表示装置の開発、実用化が盛んである。このような表示
装置では、クロストークのない高コントラストの表示が
行えるようI:、各画素の駆動、制卸を行う手段として
アクティブ素子が用いられる。そのアクティブ素子とし
ては、単結晶St基板上に形成されたMOf9FET 
や、最近では、透過型表示が可能であり大面積化も容易
である等の理由から、透明絶縁基板上ミニ形成されたT
PT等が用いられる。
Recently, as for display devices using liquid crystals or electroluminescence (EL), large-capacity, high-density active matrix display devices aimed at television displays, graphic displays, etc. have been actively developed and put into practical use. In such display devices, active elements are used as means for driving and controlling each pixel so as to perform high contrast display without crosstalk. The active element is a MOf9FET formed on a single crystal St substrate.
Recently, mini T formed on a transparent insulating substrate has been developed because it enables transmissive display and it is easy to increase the area.
PT etc. are used.

このようなアクティブ素子の中で、TPTは半導体母材
としてアモルファスシリコン(以下a−8iと称す)、
CdSe及びCd8等を用いた電界効果型のものが多い
。そしてこれらの半導体母材は可視光に対して吸収係数
が大きい。そこで外光を透過或いは反射′させて用いる
液晶表示装置の場合は、TPTの能動領域に光が入射し
て常に導通状態になるのを防ぐためC:、例えば逆スタ
ガード形TPTでは、液晶に接する方の側に元を遮蔽す
るマスクとして絶縁層を介して金属薄膜を設けることが
ある。
Among such active elements, TPT uses amorphous silicon (hereinafter referred to as a-8i) as a semiconductor base material,
Many of them are of field effect type using CdSe, Cd8, etc. These semiconductor base materials have a large absorption coefficient for visible light. Therefore, in the case of a liquid crystal display device that transmits or reflects outside light, in order to prevent light from entering the active area of the TPT and causing it to be constantly in a conductive state, for example, in an inverted staggered TPT, the active area of the TPT is A thin metal film may be provided on one side with an insulating layer in between as a mask to shield the source.

ただしこのときは液晶C:対し直流的に絶縁するためε
:、更僅二光を遮蔽するマスクである金属薄膜を覆うよ
うに、蒸着或いはスパッタリングといった手段で、絶縁
層を形成する必要があり、製造工程が複雑になって量産
性を損なっていた。
However, in this case, liquid crystal C: ε
However, it is necessary to form an insulating layer by vapor deposition or sputtering to cover the thin metal film that serves as a mask for blocking light, which complicates the manufacturing process and impairs mass productivity.

〔発明の目的〕[Purpose of the invention]

本発明はこのような点に鑑みなされたものであり、従”
来より工程を容易1:することの可能な液晶表示装置の
製造方法の提供を目的とする。
The present invention has been made in view of these points, and
An object of the present invention is to provide a method for manufacturing a liquid crystal display device that allows the process to be made easier than ever before.

〔発明の概要〕 即ち本発明は、複数のTFT lニーより選択駆動され
る複数の表示画素電極をマ) IJックス状償:配列形
成したアクティブマトリックス形の液晶表示装置の製造
方法において、TFT上に絶縁層を介して金属からなる
光阻止膜を形成し、この光阻止膜の表面を酸化すること
を特徴とする。
[Summary of the Invention] That is, the present invention provides a method for manufacturing an active matrix type liquid crystal display device in which a plurality of display pixel electrodes are selectively driven by a plurality of TFTs. The method is characterized in that a light blocking film made of metal is formed via an insulating layer, and the surface of this light blocking film is oxidized.

〔発明の実施例〕[Embodiments of the invention]

以下本発明の詳細を図面を参照して説明する。 The details of the present invention will be explained below with reference to the drawings.

第1図は本発明の一実施例を示す図である。この実施例
はまず第1図(a)に示すように、基板(1)例えばガ
ラス基板の一主面上に例えばアルミニウムからなるゲー
ト電極(2)を形成した後、これを覆うように基板(1
)上に例えば厚さ約4000人の窒化シリコとからなる
ゲート絶縁膜(3)を形成する。次に第1図(b)に示
すように、ゲート絶縁膜(3)上のゲート電極(2)に
対応する部分−二、例えば厚さ約4000人のa−8i
からなる半導体薄膜(4)を形成した後、これに一部が
接触するよう1ニゲート絶縁膜(3)上に例えば厚さ約
1ooo人のITOからなるドレイン電極(5)、ソー
ス電極(6)及びこれと一体の表示画素電極(7)を形
成する。なおドレイン及びソース電極(5)、 (6)
の半導体薄膜(4)との接触部分には、充分なオーミッ
クコンタクトを得るために、リンを添加したa−8i膜
を介在させることがある。こうして形成されたTPTと
表示画素電極(7)は基板(1)上にマ) IJックス
状に配列されており、第1の電極基板が得られる。
FIG. 1 is a diagram showing an embodiment of the present invention. In this embodiment, first, as shown in FIG. 1(a), a gate electrode (2) made of aluminum, for example, is formed on one main surface of a substrate (1), for example a glass substrate, and then a substrate (2) is formed to cover this gate electrode (2). 1
), a gate insulating film (3) made of, for example, silicon nitride is formed to a thickness of about 4,000 yen. Next, as shown in FIG. 1(b), a part-2 corresponding to the gate electrode (2) on the gate insulating film (3), for example, a-8i with a thickness of about 4000
After forming a semiconductor thin film (4) made of ITO, a drain electrode (5) and a source electrode (6) made of, for example, ITO with a thickness of about 100 mm are formed on the 1-gate insulating film (3) so as to be partially in contact with the semiconductor thin film (4). A display pixel electrode (7) is formed integrally therewith. Note that the drain and source electrodes (5), (6)
In order to obtain sufficient ohmic contact, an a-8i film doped with phosphorus may be interposed at the contact portion with the semiconductor thin film (4). The thus formed TPTs and display pixel electrodes (7) are arranged in a matrix on the substrate (1) to obtain a first electrode substrate.

次(:第1図(C)に示すように、第1の電極基板上爲
例えば厚さ約1μmのポリイミドからなる絶縁層(8)
を塗布法とキュア工程を経て形成した後、この絶縁層(
8)上音:金属例えばアルミニウムを約100OAの厚
さに蒸着し、TPTの上部を覆うようなパターン蛎二エ
ツチングして光阻止膜(9)を形成する。次に第1図(
d)に示すよう:二、光阻止膜(9)の表面を例えば陽
極化成法により酸化処理し、酸化皮膜(11を300〜
500Aの厚さに形成した後1、表示画素電極(力の上
部の絶縁層(8)は選択エツチングにより除去する。
Next (: As shown in FIG. 1(C), an insulating layer (8) made of polyimide and having a thickness of about 1 μm is formed on the first electrode substrate.
This insulating layer (
8) Upper layer: A metal such as aluminum is deposited to a thickness of about 100 OA and etched in a pattern covering the top of the TPT to form a light blocking film (9). Next, Figure 1 (
As shown in d): 2. The surface of the light blocking film (9) is oxidized by, for example, an anodization method, and the oxide film (11 is
After being formed to a thickness of 500A, the insulating layer (8) on top of the display pixel electrode (1) is removed by selective etching.

こうして光阻止膜(9)がTFT上に絶縁層(8)を介
して形成され、しかもこの表面は酸化される。一方、透
明基板aυ例えばガラス基板の一主面上には、透明導電
膜からなる対向電極αのが形成されでおり、第2の電極
基板が得られる。そして第1図(e)に示すように、第
1及び第2の電極基板を図示しないスペーサを介して対
向し、この間には液晶α騰が挾持されでいる。こうして
所望の液晶表示装置が得られる。
In this way, a light blocking film (9) is formed on the TFT via the insulating layer (8), and this surface is oxidized. On the other hand, a counter electrode α made of a transparent conductive film is formed on one main surface of a transparent substrate aυ, for example, a glass substrate, and a second electrode substrate is obtained. As shown in FIG. 1(e), the first and second electrode substrates are opposed to each other with a spacer (not shown) interposed therebetween, and the liquid crystal α is sandwiched between them. In this way, a desired liquid crystal display device is obtained.

第2図はこの実施例における光阻止膜(9)のパターン
の形状を示す平面図である。同図かられかるよう1:、
光阻止膜(9)のパターンは表示画素電極(月間にあっ
て格子状である。
FIG. 2 is a plan view showing the shape of the pattern of the light blocking film (9) in this example. From the same figure 1:,
The pattern of the light blocking film (9) is in the form of a lattice on the display pixel electrode.

この実施例では、通常データ線としで用いられる列選択
線X1(i=1.2.・・・、m)と、通常アドレス線
として用いられる行選択線Yj(j=1s2.・・・、
幣)が存在して、列選択線Xtと行選択線Yjの各交点
位置にTPTが設けられている。またTPTのドレイン
電極(5)は列ととC:列選択線Xiに接続され、ゲー
ト電極(2)は行ごとに行選択線Yj+二接続されでい
る。そしてこの実施例の動作は次のよう(:行われる。
In this embodiment, a column selection line X1 (i=1.2..., m) which is normally used as a data line, and a row selection line Yj (j=1s2..., m) which is normally used as an address line.
A TPT is provided at each intersection of the column selection line Xt and the row selection line Yj. Further, the drain electrode (5) of the TPT is connected to the column selection line Xi, and the gate electrode (2) is connected to the row selection line Yj+2 for each row. The operation of this embodiment is as follows.

即ちフレーム走査周期をT、とすると、行選択線Y」は
アドレス信号により順次走査駆動され、TPTは行ごと
CTy/n 期間ずつ順次導通状態にもたらされる。一
方この行選択線Yj  の走査と同期して列選択線Xi
  には例えばm並列画像信号電圧を供給する。これ1
:よって信号電圧は行ごとに順次表示画素電極(7)に
導かれ、対向電極αのとの間に挾持された液晶(131
が励起されて画像表示がなされる。
That is, when the frame scanning period is T, the row selection line Y'' is sequentially scanned and driven by the address signal, and the TPT is brought into a conductive state sequentially for each row by CTy/n periods. On the other hand, in synchronization with the scanning of row selection line Yj, column selection line Xi
For example, m parallel image signal voltages are supplied. This 1
:Therefore, the signal voltage is sequentially guided to the display pixel electrode (7) row by row, and the liquid crystal (131) held between the opposing electrodes α.
is excited and an image is displayed.

この実施例では、光阻止膜(9)上に絶縁層を形成する
代わ各月;、光阻止膜(9) (:酸化処理を施こすの
で、従来より製造工程が容易C:なる。また仮に酸化皮
膜(10の代わりC:絶縁層を形成する場合、光阻止膜
(9)のステップカバレージ等を考慮して、有機絶縁層
例えばポリイミドならば厚さ1〜2μm1無機絶縁層例
えばSiNならば厚さ4000〜5000人に形成する
必要がある。故C;この実施例では、基板(1)上の段
差が低減されて、配向処理が従来より楽4二なる。
In this embodiment, instead of forming an insulating layer on the light blocking film (9), an oxidation treatment is performed on the light blocking film (9), making the manufacturing process easier than before. Oxide film (C in place of 10: When forming an insulating layer, take into account the step coverage of the light blocking film (9), etc.) If the organic insulating layer is made of polyimide, the thickness is 1 to 2 μm; if the inorganic insulating layer is made of SiN, the thickness is It is necessary to form 4,000 to 5,000 people.C: In this embodiment, the level difference on the substrate (1) is reduced, making the alignment process 42 times easier than in the past.

〔発明の他の実施例〕[Other embodiments of the invention]

第3図は本発明の他の実施例の一工程を示す図であり、
第1図と対応する部分には同一の符号を付しである。こ
の実施例では第3図に示すよう6二、光阻止膜(9)を
第1図(d)に示した絶縁層(8)を除去するパターン
ト逆のパターン(:エッチングした後に、この表面を例
えば陽極化成法により酸化処理し、酸化皮膜α1を30
0〜500)厚さに形成する。そして表示画素電極(力
の上部の絶縁層(8)を、酸化皮膜α〔をマスクとして
、例えば酸素雰囲気中での反応性プラズマエツチングに
より除去する。なおこれ以外の工程は、第1図(=示し
たものとほぼ同様であり、所望の液晶表示装置が得られ
る。
FIG. 3 is a diagram showing one step of another embodiment of the present invention,
Components corresponding to those in FIG. 1 are given the same reference numerals. In this example, as shown in FIG. 3, the photo-blocking film (9) is etched into a reverse pattern (: after etching the surface For example, by anodizing, the oxide film α1 is 30%
0 to 500) thickness. Then, the insulating layer (8) on the top of the display pixel electrode is removed by, for example, reactive plasma etching in an oxygen atmosphere using the oxide film α as a mask. This is almost the same as shown, and a desired liquid crystal display device can be obtained.

この実施例は第1図に示した実施例と同様の効果がある
ばかりでなく、表示画素電極(7)上の絶縁層(8)を
除去する際のPEP工程がなくなるので、より製造工程
の簡易化がはかられる。
This embodiment not only has the same effect as the embodiment shown in FIG. 1, but also eliminates the PEP process when removing the insulating layer (8) on the display pixel electrode (7), making the manufacturing process easier. Simplification is possible.

なお光阻止膜(9)の材料としては酸化容易であるも、
のが望ましく、アルミニウム以外にはチタン、クロム、
タンタル、タングステン等がよい。また光阻止膜(9)
の酸化方法も陽極化成性以外に、酸素雰囲気中での熱酸
化及びプラズマ酸化、化学化成法、純水または蒸留水中
での煮沸等の方法であってもよい。
Although the material for the light blocking film (9) is easily oxidized,
In addition to aluminum, titanium, chromium,
Tantalum, tungsten, etc. are good. Also, light blocking film (9)
In addition to anodic formation, the oxidation method may be thermal oxidation or plasma oxidation in an oxygen atmosphere, chemical conversion, boiling in pure water or distilled water, or the like.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明の液晶表示装置の製造方法は
、液晶と接する光阻止膜上の絶縁層を酸化処理で形成す
ることにより、従来より工程を容易6二し、液晶表示装
置の量産性を高めることができる。
As explained above, the method for manufacturing a liquid crystal display device of the present invention simplifies the process compared to the conventional method by forming the insulating layer on the light blocking film in contact with the liquid crystal by oxidation treatment, and improves mass production of the liquid crystal display device. can be increased.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す図、第2図は光阻止膜
のパターンの形状の一例を示す図、第3図は本発明の他
の実施例を示す図である。 (1)・・・基板 (7)・・・表示画素電極 (8)・・・絶縁層 (9)・・・光阻止膜 (1υ・・・透明基板 (12・・・対向電極 aQ・・・液晶 代理人 弁理士 則 近 憲 右 (ほか1名)第  
1 図
FIG. 1 is a diagram showing one embodiment of the present invention, FIG. 2 is a diagram showing an example of the shape of a pattern of a light blocking film, and FIG. 3 is a diagram showing another embodiment of the present invention. (1)...Substrate (7)...Display pixel electrode (8)...Insulating layer (9)...Light blocking film (1υ...Transparent substrate (12...Counter electrode aQ...・LCD agent Patent attorney Noriyuki Chika (and 1 other person) No.
1 figure

Claims (2)

【特許請求の範囲】[Claims] (1)基板の一主面上に薄膜トランジスタと表示画素電
極とをマトリックス状に配列形成してなる第1の電極基
板と、透明基板の一主面上に透明な対向電極を形成して
なる第2の電極基板と、前記第1及び第2の電極基板の
間に挾持した液晶とを備えた液晶表示装置の製造方法に
おいて、前記薄膜トランジスタ上に絶縁層を介して金属
からなる光阻止膜を形成し、この光阻止膜の表面を酸化
することを特徴とする液晶表示装置の製造方法。
(1) A first electrode substrate in which thin film transistors and display pixel electrodes are arranged in a matrix on one main surface of the substrate, and a first electrode substrate in which a transparent counter electrode is formed on one main surface of a transparent substrate. In the method for manufacturing a liquid crystal display device comprising a second electrode substrate and a liquid crystal sandwiched between the first and second electrode substrates, a light blocking film made of metal is formed on the thin film transistor with an insulating layer interposed therebetween. and oxidizing the surface of this light blocking film.
(2)前記金属はアルミニウム、チタン、クロム、タン
タル、タングステンのうちのいずれかからなることを特
徴とする特許請求の範囲第1項記載の液晶表示装置の製
造方法。
(2) The method for manufacturing a liquid crystal display device according to claim 1, wherein the metal is made of any one of aluminum, titanium, chromium, tantalum, and tungsten.
JP60061857A 1985-03-28 1985-03-28 Manufacture of liquid crystal display device Pending JPS61223721A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60061857A JPS61223721A (en) 1985-03-28 1985-03-28 Manufacture of liquid crystal display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60061857A JPS61223721A (en) 1985-03-28 1985-03-28 Manufacture of liquid crystal display device

Publications (1)

Publication Number Publication Date
JPS61223721A true JPS61223721A (en) 1986-10-04

Family

ID=13183188

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60061857A Pending JPS61223721A (en) 1985-03-28 1985-03-28 Manufacture of liquid crystal display device

Country Status (1)

Country Link
JP (1) JPS61223721A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174015A (en) * 1987-01-14 1988-07-18 Hitachi Ltd Thin film transistor liquid crystal display device and its manufacture
JP2001125510A (en) * 1995-11-17 2001-05-11 Semiconductor Energy Lab Co Ltd Active matrix type el display device
US6787887B2 (en) 1995-12-14 2004-09-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US6800875B1 (en) 1995-11-17 2004-10-05 Semiconductor Energy Laboratory Co., Ltd. Active matrix electro-luminescent display device with an organic leveling layer

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174015A (en) * 1987-01-14 1988-07-18 Hitachi Ltd Thin film transistor liquid crystal display device and its manufacture
JP2001125510A (en) * 1995-11-17 2001-05-11 Semiconductor Energy Lab Co Ltd Active matrix type el display device
US6800875B1 (en) 1995-11-17 2004-10-05 Semiconductor Energy Laboratory Co., Ltd. Active matrix electro-luminescent display device with an organic leveling layer
US6867434B2 (en) 1995-11-17 2005-03-15 Semiconductor Energy Laboratory Co., Ltd. Active matrix electro-luminescent display with an organic leveling layer
US6787887B2 (en) 1995-12-14 2004-09-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US7034381B2 (en) 1995-12-14 2006-04-25 Semiconductor Energey Laboratory Co., Ltd. Semiconductor device
US7202551B2 (en) 1995-12-14 2007-04-10 Semiconductor Energy Laboratory Co., Ltd. Display device having underlying insulating film and insulating films

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