JPS6121472A - Valve for vacuum and high pressure application - Google Patents

Valve for vacuum and high pressure application

Info

Publication number
JPS6121472A
JPS6121472A JP14036384A JP14036384A JPS6121472A JP S6121472 A JPS6121472 A JP S6121472A JP 14036384 A JP14036384 A JP 14036384A JP 14036384 A JP14036384 A JP 14036384A JP S6121472 A JPS6121472 A JP S6121472A
Authority
JP
Japan
Prior art keywords
gas
valve
stem
wall surface
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14036384A
Other languages
Japanese (ja)
Inventor
Kunio Suzuki
邦夫 鈴木
Mamoru Tashiro
田代 衛
Takeshi Fukada
武 深田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP14036384A priority Critical patent/JPS6121472A/en
Publication of JPS6121472A publication Critical patent/JPS6121472A/en
Pending legal-status Critical Current

Links

Classifications

    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F16ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
    • F16KVALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING
    • F16K51/00Other details not peculiar to particular types of valves or cut-off apparatus
    • F16K51/02Other details not peculiar to particular types of valves or cut-off apparatus specially adapted for high-vacuum installations

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Lift Valve (AREA)

Abstract

PURPOSE:To prevent gas before valve selection from mixing in that after being selected, by forming the inside of a wall surface to be connected by a valve into the same plane surface or the same curvature and a projection part at a time when a takeout port or an intake port of the gas is closed. CONSTITUTION:A valve is made up of installing two gas intake ports 11 and 12, a bellows 13, a driving shaft 14, a stem 17, a connection wall surface 19, an air cylinder 21, a gas takeout port 23, etc. And, opening or closing of this valve is carried out by the air cylinder 21 in a way of contacting or separating the step 17 to or from the gas takeout port 23 via the driving shaft 14. At this time, an outer wall of the connection wall surface 19 is set down to a hitting surface of the stem 17, and the stem 17 is formed in conformity with a form of this hitting surface. According to this method, when selection of a gas flow takes place, capacity at the valve rear stream side is sufficiently filled up with a gap between the stem 17 and the connection wall surface 19 whereby the clearance can be brought to zero in substance. Therefore, gas before valve selection is preventable from mixing in that after being selected.

Description

【発明の詳細な説明】 「産業上の利用分野J 本発明は、常圧もしくは真空及び高圧を必要とするよう
な気体流(ガス流)の迅速な切り換えに関する。
DETAILED DESCRIPTION OF THE INVENTION INDUSTRIAL APPLICATION J The present invention relates to the rapid switching of gas flows, such as those requiring normal pressure or vacuum and high pressure.

r従来の技術」 従来の真空もしくは高圧バルブの接続様態の例を第5図
に示す。
4. Prior Art FIG. 5 shows an example of a conventional vacuum or high-pressure valve connection mode.

この図に示、される機能においては、バルブ(53)及
び(54)は交互に開くことにより、(51)及び(5
2)で示される配管を通って流入するガスの選択を行い
、(55)で示される配管へガスを導入する働きを有し
ている。図中の矢印はガス流の方向を示しており、第5
図(a)においては、バルブ(54)は閉じられており
、バルブ(53)が開かれている状態を表す。また第5
図(b)においてはバルブ(53)は閉じており、バル
ブ(54)が開かれている状態を表す。
In the function shown and depicted in this figure, valves (53) and (54) are opened alternately, thereby causing valves (51) and (5
It has the function of selecting the gas that flows through the pipe shown in (2) and introducing the gas into the pipe shown in (55). The arrow in the figure indicates the direction of gas flow, and
In Figure (a), the valve (54) is closed and the valve (53) is open. Also the fifth
In Figure (b), the valve (53) is closed and the valve (54) is open.

第5図においては、(a)の状態から(b)の状態にガ
ス流を切り換えようとすると、(b)図の斜線部に切り
換え前のガスが残留し、又(b)の状態から(a)の状
態にガス流を切り換えようとすると(a)図の斜線部に
切り換え前のガスが残留し、切り換ぐ− 蜘春避せ壬ため、バルブ(53)及び(54)の両方を
閉じた状態により配管(55)側より一般的に真空引き
もしくは不活性ガスによる置換などを行う必要があった
In Fig. 5, when trying to switch the gas flow from state (a) to state (b), the gas before switching remains in the shaded area in Fig. (b), and from state (b) to state (b). If you try to switch the gas flow to state a), the gas from before switching will remain in the shaded area in the diagram (a). Due to the closed state, it is generally necessary to perform evacuation or replacement with inert gas from the piping (55) side.

「発明が解決しようとする問題」 このことは、(a)状態から(b)状態及び(b)状態
から(a)状態へのガス流の切り換え時間を長くする原
因となっていた。本発明はこのガス切り換え時における
真空引きもしくはガス置換などの操作を不必要とし、ガ
ス流の切り換えを混合することなしに迅速に行うことを
目的とした真空及び高圧ガスバルブ構造に関する。
"Problem to be Solved by the Invention" This has caused a long switching time for the gas flow from the (a) state to the (b) state and from the (b) state to the (a) state. The present invention relates to a vacuum and high-pressure gas valve structure which eliminates the need for operations such as evacuation or gas replacement when switching gases, and which aims to quickly switch gas flows without mixing.

「問題点を解決するための手段」 第5図に示されるように、従来のガスバルブの組合わせ
によるガスの切り換えにおいては、第5図における斜線
部の容積を無視することはできず、残留ガスの混合が起
きていた。本発明者等はこの問題を解決すべく鋭意努力
を行ってきた。本発明の特徴は、ガスバルブの形状を改
良することにより、第5図における斜線部を無視できる
構造としたところにある。
"Means for solving the problem" As shown in Figure 5, when switching gases using a combination of conventional gas valves, the volume of the shaded area in Figure 5 cannot be ignored, and the residual gas A mixture of was occurring. The inventors of the present invention have made earnest efforts to solve this problem. A feature of the present invention is that by improving the shape of the gas valve, the shaded area in FIG. 5 can be ignored.

第1図に本発明による真空及び高圧バルブの形状例を断
面図により示す。第1図(a)はバルブの閉状態、及び
第1図(b)は開状態を示している。
FIG. 1 shows a cross-sectional view of an example of the shape of a vacuum and high-pressure valve according to the present invention. FIG. 1(a) shows the valve in the closed state, and FIG. 1(b) shows the valve in the open state.

バルブはガス取り入れ口(11)及び(12) 、ベロ
ーズ(13) 、運動導入軸(14) 、ベローズ支持
体(15) 、運動導入軸の支持体(16)、ステム(
17) 、寺リング(18) 。
The valve includes gas intake ports (11) and (12), a bellows (13), a motion introduction shaft (14), a bellows support (15), a support for the motion introduction shaft (16), and a stem (
17), temple ring (18).

−接続壁面(19) 、バルブ壁面(19) 、エアシ
リンダ(21) 。
- Connection wall (19), valve wall (19), air cylinder (21).

エアシリンダ支持体(22) 、ガス取り出し口(23
)から構成されている。バルブの開閉はエアシリンダに
対する圧力制御により行われる。この図かられかる通り
、接続壁面(19)の外壁はステム(17)の当たり面
となっており、この面の形状にステム(17)の形状は
合わせである。この例では接続壁面(19)の外壁に対
し、バルブ壁面(20)の先端は溶接加工により接続さ
れているが、ガスの封止が十分行なわれる範囲でネジど
めやリヘット打ち等による接続も可能である。エアシリ
ンダ(21)の代わりにステップモータ等の能動体を使
用することにより、ステム(17)の連続的な移動設定
が行えるようになり、ガス流に対しバルブの持つコンダ
クタンスを最小限(この例ではO)から最大限まで可変
設定°できる。
Air cylinder support (22), gas outlet (23)
). The opening and closing of the valve is performed by controlling the pressure on the air cylinder. As can be seen from this figure, the outer wall of the connecting wall surface (19) is a contact surface for the stem (17), and the shape of the stem (17) matches the shape of this surface. In this example, the tip of the valve wall (20) is connected to the outer wall of the connection wall (19) by welding, but the connection may also be made by screwing or reheating as long as the gas is sufficiently sealed. It is possible. By using an active body such as a step motor instead of the air cylinder (21), the stem (17) can be set to move continuously, minimizing the conductance of the valve to the gas flow (in this example In this case, you can set it variably from O) to the maximum.

ガス取り出し口(2会)を埋めるステム(17)の斜線
部は、取り出し口において接続壁面(19)の内側から
突出していてもよい。
The diagonally shaded portion of the stem (17) filling the gas outlet (2) may protrude from inside the connecting wall surface (19) at the outlet.

「作用」 この第1図に例示されるようなバルブを用いて、第5図
のようなガス流の選択切り換えを行なわんとすると、第
2図に例示されるような構造が考えられる。第2図に示
される構造により、第5図中の斜線部分の容積はステム
(17)と接続壁面(19)の隙間を十分にうめること
により、実質的に0とすることができる。この事により
、第1図に示される従来の方法で避けられなかった切り
換え前のガスの切り換え後のガスへの混入を防ぐことが
できた。ガスバルブは2個に限らず、空間的な配置が許
す限り、3個以上のガスバルブの使用において3個以上
のガス取り出し口(2会)を有し、それらの切り換えを
互いにガスを混入することなしに連続的に行うことがで
きるように構成することも可能である。
``Operation'' If a valve as illustrated in FIG. 1 is used to select and switch the gas flow as illustrated in FIG. 5, a structure as illustrated in FIG. 2 can be considered. With the structure shown in FIG. 2, the volume of the hatched portion in FIG. 5 can be made substantially zero by sufficiently filling the gap between the stem (17) and the connecting wall surface (19). This made it possible to prevent the gas before switching from mixing with the gas after switching, which could not be avoided with the conventional method shown in FIG. The number of gas valves is not limited to two, but as long as the spatial arrangement allows, when using three or more gas valves, have three or more gas outlet ports (two ports) and switch between them without mixing gas with each other. It is also possible to configure the system so that it can be performed continuously.

「実施例」 本発明によるガスバルブを半導体製造装置ガス導入部に
使用した実施例を第3図(a)及び(b)に示す。また
、従来のバルブを用いて構成されたガス切り換え部を半
導体製造装置のガス導入部に使用した例を第3図(c)
に示す。
Embodiment FIGS. 3(a) and 3(b) show an embodiment in which a gas valve according to the present invention is used in a gas introduction section of a semiconductor manufacturing device. Furthermore, Fig. 3(c) shows an example in which a gas switching section configured using a conventional valve is used in a gas introduction section of semiconductor manufacturing equipment.
Shown below.

これらの内で、第3図(a)は本発明によるバルブを3
個使用し、ガス切り換え時の残留ガスの混入を防いでい
る。第3図(b)は(31) 、 (32) 、 (3
3)によって導入されるガスが共通配管(34)を介さ
ず、直接反応炉(35)に導入されている例を示してい
る。
Among these, FIG. 3(a) shows three valves according to the present invention.
This prevents residual gas from entering when switching gases. Figure 3(b) shows (31), (32), (3
3) shows an example in which the gas introduced in step 3) is directly introduced into the reactor (35) without going through the common pipe (34).

即ち第1図に例示されているようなガスバルブが反応炉
壁面の3個所に直接構成されている。反応炉(35)壁
面が第1図における(19)の接続壁面となっている。
That is, gas valves as illustrated in FIG. 1 are directly constructed at three locations on the wall surface of the reactor. The wall surface of the reactor (35) is the connecting wall surface (19) in FIG.

これらの第3図に示されるガス導入口を用い、なおかつ
同一のプラズマCvD半導体製造装置を用いて、アモル
ファスシリコンPIN接合ダイオードを作製した。以下
実施例を示し、説明する。
An amorphous silicon PIN junction diode was manufactured using the gas inlets shown in FIG. 3 and the same plasma CVD semiconductor manufacturing apparatus. Examples will be shown and explained below.

比較例1 第3図(c)に示されるガス導入部を用いてダイオード
を作製した。作製に際し、P、I、Nの各層の形成は配
管内のガスの混入を避けるために真空引きを介して行っ
た。P、I、N型名アモルファスシリコン層の製造条件
は異なるガスを用いること以外はまったく同一条件とし
た。真空引きは各1時間行った。この方法で作製したダ
、イオードのI−■特性のグラフを第4図中の(d)に
示す。
Comparative Example 1 A diode was manufactured using the gas introduction part shown in FIG. 3(c). During production, each layer of P, I, and N was formed through evacuation in order to avoid mixing of gas in the piping. The manufacturing conditions for the P, I, and N type amorphous silicon layers were exactly the same except that different gases were used. Vacuuming was performed for 1 hour each. A graph of the I-■ characteristics of the diode produced by this method is shown in (d) of FIG.

実施例1 第3図(a)に示されるガス導入部を用いて、ダイオー
ドを作製した。作製に際し、P、T、Nの各層の形成は
ガスの切り換えのみによって行い、真空引きは一切行な
わなかった。また半導体製造装置の操作は、P、I、N
型各層のアモルファスシリコン−条件とした。
Example 1 A diode was manufactured using the gas introduction part shown in FIG. 3(a). During fabrication, the P, T, and N layers were formed only by switching gases, and no evacuation was performed. In addition, the operation of semiconductor manufacturing equipment is P, I, N
The conditions were set as amorphous silicon for each layer of the mold.

作製したダイオードのI−V特性のグラフを第4図中の
(a)に示す。
A graph of the IV characteristics of the fabricated diode is shown in (a) in FIG.

実施例2 第3図(b)に示されるガス導入部を用いた以外は実施
例1とまったく同一の様態により作製したダイオードの
I・−V特性キ=プを第4図中の(b)に示す。
Example 2 The I/-V characteristics curve of a diode manufactured in exactly the same manner as in Example 1 except that the gas introduction part shown in FIG. 3(b) was used is shown in FIG. 4(b). Shown below.

実施例3 第3図(c)に示されるガス導入部を用いた以外は実施
例1とまったく同一の様態により作製したダイオードの
I−Vカーブを第4図中の(c)に示す。
Example 3 FIG. 4(c) shows an IV curve of a diode manufactured in exactly the same manner as in Example 1 except that the gas introduction part shown in FIG. 3(c) was used.

「発明の効果」 第4図に示される4つのグラフから、本発明によるバル
ブを用いて作製したPINダイオードの特性(a)及び
(b)は従来のガス導入部を使用し、なおかつガス切り
換え時に真空引きを行ない作製したダイオードの特性(
d)と同様であり、真空引きに要した時間が製造工程に
おいて短縮されることは明らかである。又、従来のガス
導入部を使用して、真空引きを行わずに作製したダイオ
ードの特性(c)は残留ガスの効果により(a) 、 
(b) 、 (d)の示すいずれの特性に対しても劣っ
ている。
"Effects of the Invention" From the four graphs shown in FIG. Characteristics of diode fabricated by vacuuming (
This is the same as d), and it is clear that the time required for evacuation is reduced in the manufacturing process. In addition, the characteristics (c) of a diode manufactured using a conventional gas introduction part without evacuation are as shown in (a) due to the effect of residual gas.
It is inferior to both the characteristics shown in (b) and (d).

本発明によるバルブ構造がガス切り換えの迅速化に有効
であることは明らかである。
It is clear that the valve structure according to the present invention is effective in speeding up gas switching.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による真空及び高圧バルブの断面図の例
であり、ガス取り入れ口(IIL(12)、ベローズ(
13)、運動導入軸(14)、ベローズ支持体(15L
運動導入軸の支持体(16) 、ステム(17) 、○
リング(18) 、接続壁面(19) 、バルブ壁面(
20) 、エアシリンダ(21)、エアシリンダ支持体
(22) 、ガス取り入れ口(23)から構成される。 第2図は本発明による真空及び高圧バルブを用いたガス
流の切り換えを行なう装置の例。 第3図は本発明の高圧及び真空バルブを用いたガス導入
部を持つ半導体製造装置t (a) 、 (b)及び従
来のガス導入部を持つ半導体製造装置(c)。(31)
。 (32) 、 (33)はガス導入口、 (35)は反
応炉を含む半導体製造装置。(36) 、 (37) 
、 (38)は本発明による真空及び高圧バルブ。 第4図は第3図に示される半導体製造装置を用いて作製
したPIN接合を有するアモルファスシリコンダイオー
ドの特性。 乍65図11録の カ゛゛スー=7i、t714灸辷を
裟。
FIG. 1 is an example of a cross-sectional view of a vacuum and high-pressure valve according to the present invention, including a gas intake (IIL (12)), a bellows (
13), motion introduction shaft (14), bellows support (15L
Movement introduction shaft support (16), stem (17), ○
Ring (18), connection wall (19), valve wall (
20), an air cylinder (21), an air cylinder support (22), and a gas intake port (23). FIG. 2 is an example of an apparatus for switching gas flows using vacuum and high-pressure valves according to the present invention. FIG. 3 shows a semiconductor manufacturing apparatus t (a), (b) having a gas introduction section using the high pressure and vacuum valve of the present invention, and a semiconductor manufacturing apparatus (c) having a conventional gas introduction section. (31)
. (32) and (33) are gas inlet ports, and (35) is a semiconductor manufacturing device including a reactor. (36), (37)
, (38) is a vacuum and high pressure valve according to the present invention. FIG. 4 shows the characteristics of an amorphous silicon diode having a PIN junction manufactured using the semiconductor manufacturing apparatus shown in FIG.乍65 Figure 11 record Kasu = 7i, t714 moxibustion.

Claims (1)

【特許請求の範囲】 1、気体の流れの開閉を制御するバルブにおいて、気体
の取り出し口もしくは取り入れ口、あるいはその両方が
閉状態において、バルブの接続される壁面の内側に対し
、同一平面もしくは同一曲面を構成するか、もしくは突
出部を持つことを特徴とする真空及び高圧用バルブ。 2、その気体の流れに対するコンダクタンスに、連続的
値もしくはそのうちの最大及び最小の2値及びそれらの
中間の値のうちの任意な組合わせのいずれかを持たせる
ことができることを特徴とした特許請求の範囲第1項に
記載される真空及び高圧用バルブ。 3、1乃至2以上の気体取り入れ口もしくは取り出し口
の組合わせを持つことを特 徴とする特許請求の範囲第1項に記載される真空及び高
圧用バルブ。
[Claims] 1. In a valve that controls opening and closing of a gas flow, when the gas outlet or the gas intake, or both, are in a closed state, the valve is flush with or flush with the inside of the wall surface to which the valve is connected. Vacuum and high pressure valves characterized by forming a curved surface or having a protrusion. 2. A patent claim characterized in that the conductance for the gas flow can have any combination of continuous values, maximum and minimum values, and intermediate values thereof. Vacuum and high pressure valves listed in item 1. 3. The vacuum and high pressure valve according to claim 1, characterized in that it has a combination of one to two or more gas inlets or outlets.
JP14036384A 1984-07-05 1984-07-05 Valve for vacuum and high pressure application Pending JPS6121472A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14036384A JPS6121472A (en) 1984-07-05 1984-07-05 Valve for vacuum and high pressure application

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14036384A JPS6121472A (en) 1984-07-05 1984-07-05 Valve for vacuum and high pressure application

Publications (1)

Publication Number Publication Date
JPS6121472A true JPS6121472A (en) 1986-01-30

Family

ID=15267079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14036384A Pending JPS6121472A (en) 1984-07-05 1984-07-05 Valve for vacuum and high pressure application

Country Status (1)

Country Link
JP (1) JPS6121472A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6297322A (en) * 1985-10-24 1987-05-06 Ulvac Corp Chemical vapor deposition device
CN105422940A (en) * 2015-11-19 2016-03-23 中国科学院等离子体物理研究所 Vacuum air intake regulating valve

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS556208A (en) * 1978-06-28 1980-01-17 Asahi Eng Kk Sampler for analysis
JPS5535498U (en) * 1978-08-31 1980-03-07

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS556208A (en) * 1978-06-28 1980-01-17 Asahi Eng Kk Sampler for analysis
JPS5535498U (en) * 1978-08-31 1980-03-07

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6297322A (en) * 1985-10-24 1987-05-06 Ulvac Corp Chemical vapor deposition device
CN105422940A (en) * 2015-11-19 2016-03-23 中国科学院等离子体物理研究所 Vacuum air intake regulating valve
CN105422940B (en) * 2015-11-19 2020-11-06 中国科学院等离子体物理研究所 Vacuum air inlet regulating valve

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