JPS61268017A - Pressure reducing valve structure for semiconductor - Google Patents
Pressure reducing valve structure for semiconductorInfo
- Publication number
- JPS61268017A JPS61268017A JP10938285A JP10938285A JPS61268017A JP S61268017 A JPS61268017 A JP S61268017A JP 10938285 A JP10938285 A JP 10938285A JP 10938285 A JP10938285 A JP 10938285A JP S61268017 A JPS61268017 A JP S61268017A
- Authority
- JP
- Japan
- Prior art keywords
- valve
- hole
- hermetically
- cover
- pipe body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16K—VALVES; TAPS; COCKS; ACTUATING-FLOATS; DEVICES FOR VENTING OR AERATING
- F16K41/00—Spindle sealings
- F16K41/02—Spindle sealings with stuffing-box ; Sealing rings
- F16K41/04—Spindle sealings with stuffing-box ; Sealing rings with at least one ring of rubber or like material between spindle and housing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は減圧CVD、プラズマCVD等に不可欠な減圧
系と大気系を分離するバルブ構体の改良に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an improvement in a valve structure that separates a reduced pressure system and an atmospheric system essential for reduced pressure CVD, plasma CVD, etc.
半導体製造機器としては多くの種類が開発、実用化され
ているが、その中には減圧雰囲気で稼動させる機種が割
合存在する。Although many types of semiconductor manufacturing equipment have been developed and put into practical use, a large number of them operate in a reduced pressure atmosphere.
御ち、半導体単結晶よりなる基板内に形成する機能素子
の表面安定化層として珪素酸化物ならびに窒化珪素が良
く知られているが、その形成手段としていわゆるCVD
(化学気相成長法)法が常用されている。その一種と
して減圧CVD法及びプラズマCVD法等は減圧雰囲気
に維持した反応室内で珪素酸化物や窒化珪素を化学的に
生成し、これらを半導体基板に堆積する手段が採用され
ており、従って減圧雰囲気と大気雰囲気を制御するバル
ブ構体が不可欠となる。現在このバルブ構体としては第
2図に示すようにベローズ(21)を使用する方式が一
般的である。 ゛
即ち被減圧室Aに連通ずる管体(22)を準備し、その
内壁には閉止弁(23)を0リングにより気密に設ける
。又有底筒状の容器(24)を準備しその開口部を覆う
蓋(25)を0リング(26)によって気密に設け管体
(22)端と連結する。この有底筒状の容器(24)に
はこれを区分するエア室弁(27)を設け、この区分さ
れた有底筒状の容器へは高圧エア導入口(28) (2
9)を形成する。蓋(25)のほり中央部分には孔部(
30)を設けると共に、エア室弁(27)と閉止弁(2
3)を連結する棒材(31)をOリング等によって気密
に保持する。Silicon oxide and silicon nitride are well known as surface stabilizing layers of functional elements formed in semiconductor single crystal substrates, but so-called CVD is a method for forming them.
(chemical vapor deposition) method is commonly used. One type of such methods, such as low-pressure CVD and plasma CVD, is to chemically generate silicon oxide and silicon nitride in a reaction chamber maintained in a reduced-pressure atmosphere and deposit them on a semiconductor substrate. A valve structure that controls the atmosphere is essential. Currently, this valve structure generally uses a bellows (21) as shown in FIG. That is, a pipe body (22) communicating with the depressurized chamber A is prepared, and a shutoff valve (23) is airtightly provided on its inner wall with an O-ring. A cylindrical container (24) with a bottom is prepared, and a lid (25) covering the opening thereof is airtightly provided with an O-ring (26) and connected to the end of the tube body (22). This bottomed cylindrical container (24) is provided with an air chamber valve (27) for dividing it, and a high pressure air inlet (28) (2
9). There is a hole (
30), as well as an air chamber valve (27) and a shutoff valve (2
3) is held airtight by an O-ring or the like.
閉止弁(23)と蓋(25)の間にはベローズ(21)
が設置されてバルブ構体を構成するが、管体(22)に
は真空ポンプ等の減速機構への連通孔Bが設置されてい
る。第2図の状態はA側が大気圧状態に維持されB側の
減圧機構が稼動している場1合のバルブ構体を示してお
り、この時は高圧エア導入孔(29)より高圧エアが導
入されて閉止弁(23)を押圧し管体(22)内が遮断
されている。A側を減圧状態にするには高圧エア導入孔
(28)より高圧エアを導入するとエア室弁(27)が
図の右側に移動してA、8間が連通して被減圧室A所望
の減圧状態にする。There is a bellows (21) between the shutoff valve (23) and the lid (25).
is installed to constitute the valve structure, and the pipe body (22) is provided with a communication hole B to a speed reduction mechanism such as a vacuum pump. The state in Figure 2 shows the valve structure when the A side is maintained at atmospheric pressure and the B side pressure reducing mechanism is operating, and at this time high pressure air is introduced from the high pressure air introduction hole (29). The shutoff valve (23) is pressed and the inside of the tube body (22) is shut off. To reduce the pressure on the A side, introduce high pressure air from the high pressure air introduction hole (28), the air chamber valve (27) moves to the right side in the figure, and A and 8 communicate with each other to create the desired reduced pressure chamber A. Bring to a reduced pressure state.
前述のように閉止弁(23)の稼動に伴ってベローズ(
21)も伸縮するが、その強度が弱く比較的少い回数に
よって破れることが判明した。このベローズ(21)は
現在輸入品に依存しているため非常に高価である上に入
手に時間がかきり装置の稼動率が落る難点が生じる。As mentioned above, the bellows (
21) also expands and contracts, but its strength is weak and it was found that it would break after a relatively small number of times. Since the bellows (21) currently depend on imported products, they are very expensive, and it takes time to obtain them, resulting in a reduction in the operating rate of the device.
本来、このバルブ構体では蓋(25)の孔部(30)に
取り着けた0リングによりベローズ(21)側に空気が
混入しない筈であるが、0リングの劣化に伴ってベロー
ズ(21)側に空気が混入する。この際、ベローズ(2
1)が充分にその機能を発揮すればA側に空気が洩れな
いが、前述のように破損しているとA側の減圧程度に影
響を及ぼす。Originally, in this valve structure, the O-ring attached to the hole (30) of the lid (25) should prevent air from entering the bellows (21) side, but as the O-ring deteriorates, the bellows (21) side air gets mixed in. At this time, the bellows (2
If 1) fully performs its function, air will not leak to the A side, but if it is damaged as described above, it will affect the degree of pressure reduction on the A side.
本発明は上記欠点を除去した新規な減圧バルブ構体を提
供するもので、特に簡単な構造をもちその稼動率の向上
を図ったものである。The present invention provides a new pressure reducing valve structure which eliminates the above-mentioned drawbacks, and which has a particularly simple structure and is intended to improve its operating efficiency.
本発明では被減圧室に連通ずる管体内に閉止弁を機密に
設け、これと一体化される有底筒状の容器にも二\を区
分する弁を気密に形成し、この容器開口部には蓋を配置
して管体と有底筒状の容器を気密に一体化する。この蓋
の中央部分には孔部を形成しこの周りの蓋部には環状治
具を管体方向に向けて設置し、この孔部と共に閉止弁及
び弁を連結する棒部材を気密に保持して減圧用バルブ構
体とした。In the present invention, a shutoff valve is secretly provided in the pipe communicating with the depressurized chamber, and a valve that separates the two parts is also airtightly formed in the bottomed cylindrical container that is integrated with this, and the opening of this container is The lid is arranged to airtightly integrate the tube body and the bottomed cylindrical container. A hole is formed in the center of this lid, and an annular jig is installed in the lid around this hole, facing toward the pipe body, and the stop valve and the rod member connecting the valve are held airtight together with this hole. It was made into a pressure reducing valve structure.
第1図により本発明を詳述する。 The present invention will be explained in detail with reference to FIG.
被減圧室Aに連通する管体ω及び有底筒状の容器■を準
備する。この有底筒状の容器■開口部は蓋■で覆われそ
の中央部分には孔(至)を設け、管体ω端、蓋■及び有
底筒状の容器は0リングにより気密に一体化とする。A pipe body ω communicating with the depressurized chamber A and a bottomed cylindrical container ■ are prepared. The opening of this bottomed cylindrical container is covered with a lid and a hole is provided in its center, and the end of the tube, the lid and the bottomed cylindrical container are airtightly integrated with an O-ring. shall be.
この孔に)の周りの蓋部分にはAl1製の環状治具■を
管体ω側に螺子止めして固定し結果的にはこれが管体■
内に延長される形状となる。In the lid part around this hole), an annular jig made of Al1 is fixed by screwing it to the tube body ω side, and as a result, this is the tube body ■
The shape extends inwards.
有底筒状の容器■内壁には0リングを介して高圧室弁(
0を気密に形成し、管体■内には閉止弁■を気密に取り
着け、この閉止弁ならびに弁0を連結する棒部材■は環
状治具■と孔に)にかけて設置するOリングよって気密
に保持される。高圧室弁■によって区分された有底筒状
の容器■には高圧エア導入口■(10)を設置して半導
体用減圧バルブ構体(旦)を完成する。なは管体■に形
成したBは図示しない減圧機構との連絡孔である。A cylindrical container with a bottom ■A high pressure chamber valve (
0 is formed airtight, a shutoff valve ■ is airtightly installed inside the pipe body ■, and the rod member ■ that connects this shutoff valve and valve 0 is airtight with an O ring installed by hanging it over the annular jig ■ and the hole. is maintained. A high-pressure air inlet (10) is installed in a bottomed cylindrical container (2) divided by a high-pressure chamber valve (2) to complete a semiconductor pressure reducing valve structure (10). B formed in the tube body (2) is a communication hole with a pressure reducing mechanism (not shown).
第1図に示した半導体用減圧バルブ構体(旦)は被減圧
室側が大気圧、B側が真空状態に維持されている。と言
うのは高圧エアが導入口(lO)より有底筒状の容器■
部分に導入されているため、閉止弁■が管体ω内を塞い
でいるためである。被減圧室側Aを真空状態とするには
高圧エアを導入口■より有底筒状の容器部分内に導入し
て高圧室の弁■を図面の左側に移動して閉止弁■を開き
、Aならびに8間を連通して真空状態とする。In the pressure reducing valve assembly for semiconductors shown in FIG. 1, the reduced pressure chamber side is maintained at atmospheric pressure and the B side is maintained in a vacuum state. This is because high-pressure air enters the bottomed cylindrical container from the inlet (lO).
This is because the shut-off valve (■) closes off the inside of the pipe body (ω) because it is introduced into the pipe body (ω). To bring the depressurized chamber side A into a vacuum state, introduce high pressure air into the bottomed cylindrical container part from the inlet ■, move the high pressure chamber valve ■ to the left side of the drawing, and open the shutoff valve ■. A and 8 are communicated to create a vacuum state.
このように1本発明に係る半1体用減圧バルブ構体では
従来のようにベローズを使用しなくても充分に被減圧室
側の真空度が得られ、伸縮に伴って破損する良ローズを
採用していないためにそのピンホール等に基因する高圧
エアの漏洩が起らないにのため、被減圧室即ちCVD等
による半導体処理室の真空度を所定値に維持することが
可能であり、この処理中にいわゆるスローリークが発生
する恐れが殆んどなくなるので、半導体に不可欠な処理
を確実に達成することが可能となる。In this way, the half-unit decompression valve structure according to the present invention can obtain a sufficient degree of vacuum on the side of the depressurized chamber without using bellows as in the past, and uses a good-quality rose that breaks when expanded or contracted. In order to prevent leakage of high-pressure air due to pinholes, etc., it is possible to maintain the degree of vacuum in a depressurized chamber, that is, a semiconductor processing chamber by CVD, etc., at a predetermined value. Since there is almost no possibility that so-called slow leaks will occur during processing, it becomes possible to reliably perform processing essential to semiconductors.
本発明に係る減圧用バルブ構体はOリングの保守だけで
その管理が可能であり、ベローズのようにその管理に手
間ひまが不要となるのでひいては稼動率の向上が達成さ
れた。The depressurizing valve structure according to the present invention can be managed by simply maintaining the O-ring, and unlike the case of bellows, the time and effort required for its management is not required, resulting in an improvement in the operating rate.
第1図は本発明に係る減圧用バルブ構体断面図、第2図
は従来のバルブ構体断面図である。FIG. 1 is a sectional view of a pressure reducing valve structure according to the present invention, and FIG. 2 is a sectional view of a conventional valve structure.
Claims (1)
容器開口部に設け前記管体端と気密に連結する蓋体と、
この蓋部のほゞ中央部分に形成する孔部と、この孔部を
囲む蓋部に固定し前記管体内に延長する環状治具と、前
記管体部分に設ける減圧機構連通孔と、前記管体内壁部
分に気密に設置する閉止弁と、前記有底筒状容器内壁部
分に気密に取り着けこれを区分する弁と、この区分した
前記有底筒状容器毎に設ける気体導入口と、前記環状治
具ならびに孔部に気密に保持し前記閉止弁及び弁を連結
する棒部材とを具備することを特徴とする半導体用減圧
バルブ構体。a tube communicating with a depressurized chamber, a cylindrical container with a bottom, a lid provided at the opening of the container and airtightly connected to the end of the tube;
A hole formed in a substantially central portion of the lid, an annular jig fixed to the lid surrounding the hole and extending into the tube, a decompression mechanism communication hole provided in the tube, and a communication hole for the tube. a shutoff valve airtightly installed on the inner wall of the body; a valve airtightly installed on the inner wall of the bottomed cylindrical container to divide it; a gas inlet provided for each of the divided bottomed cylindrical containers; A pressure reducing valve structure for a semiconductor, comprising an annular jig and a rod member airtightly held in a hole and connecting the shutoff valve and the valve.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10938285A JPS61268017A (en) | 1985-05-23 | 1985-05-23 | Pressure reducing valve structure for semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10938285A JPS61268017A (en) | 1985-05-23 | 1985-05-23 | Pressure reducing valve structure for semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61268017A true JPS61268017A (en) | 1986-11-27 |
Family
ID=14508820
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10938285A Pending JPS61268017A (en) | 1985-05-23 | 1985-05-23 | Pressure reducing valve structure for semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61268017A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6813955B2 (en) * | 2000-08-28 | 2004-11-09 | Mckelvey John Paul | Inflatable tensioning device |
KR100520446B1 (en) * | 1998-11-24 | 2005-12-21 | 삼성전자주식회사 | Exhaust system of epitaxial growth apparatus |
-
1985
- 1985-05-23 JP JP10938285A patent/JPS61268017A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100520446B1 (en) * | 1998-11-24 | 2005-12-21 | 삼성전자주식회사 | Exhaust system of epitaxial growth apparatus |
US6813955B2 (en) * | 2000-08-28 | 2004-11-09 | Mckelvey John Paul | Inflatable tensioning device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6949204B1 (en) | Deformation reduction at the main chamber | |
US8035209B2 (en) | Micromechanical device which has cavities having different internal atmospheric pressures | |
US6878234B2 (en) | Plasma processing device and exhaust ring | |
US20040237244A1 (en) | Purge system for product container and interface seal used in the system | |
US6063198A (en) | High pressure release device for semiconductor fabricating equipment | |
US6173938B1 (en) | Two speed air cylinder for slit valve motion control | |
US20160163570A1 (en) | System and method for forming a sealed chamber | |
JP2001002145A (en) | Container and method for sealing the container | |
JPS61268017A (en) | Pressure reducing valve structure for semiconductor | |
KR20050019129A (en) | Substrate processing apparatus and related systems and methods | |
JPH0529434A (en) | Vertical-type cvd/diffusion apparatus | |
US20040020600A1 (en) | Semiconductor device manufacturing equipment having gate providing multiple seals between adjacent chambers | |
EP0461406B1 (en) | Single ended ultra-high vacuum chemical vapor deposition (UHV/CVD) reactor | |
JP2003068713A (en) | Plasma treatment apparatus | |
JPS639785A (en) | Gas supply control valve device for semiconductor process | |
JP2002368075A (en) | Container and sealing method for container | |
JPH03241730A (en) | Film forming device | |
KR20060045576A (en) | Combined vacuum pump load-lock assembly | |
US20060032736A1 (en) | Deformation reduction at the main chamber | |
JP3319530B2 (en) | Semiconductor manufacturing equipment | |
JPS62291480A (en) | Vacuum device | |
KR0134556Y1 (en) | Process chamber for fabricating a semiconductor device | |
JPH0714642U (en) | Low pressure CVD equipment | |
KR20240029768A (en) | Cluster tools, systems and methods having one or more pressure stabilization chambers | |
JPS6073184A (en) | Bellows valve |