JPS61196175A - Automatic handler for automatically changing over kind of products - Google Patents

Abstract

PURPOSE:To contrive automation and labor saving of inspection work, by providing a printed character reader ad an automatic test adaptor board change-over mechanism for ICs/LSIs. CONSTITUTION:ICs/LSIs set on a loader mechanism 2 are supplied sequentially to a positioning mechanism 3 and when the positioning is completed, an end signal is fed to a printed character reader 6. After finishing the reading, the unit 6 sends the data read to a host CPU 8 and an automatic test adaptor board change-over mechanism 7. On the other hand, the CPU 8 in which a table of test data product names and the like for the respective ICs/LSIs product names are memorized and collates the product name sent from the unit 6 with the product names of the table to identify data corresponding to the coincident item name and stores the matched data from an external memory 10 by indexing to be processed to such a level that it is can be tested with an LSI tester 9. Then, the processed data is fed to the tester 9. The mechanism 7 processes the product name data received to automatically turn it to the corresponding test adaptor board. At the same time, the tester 9 is started to perform a test on set conditions to discriminate and the product inspected is discharged 5.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to automation of material handling such as LSI inspection, and particularly relates to an autohandler that is effective in reducing inspection man-hours and saving labor.

[Background of the invention]

For conventional autohandlers, please refer to the catalog LSI/VLSI TESTSYSTEM published by Takeda Riken@).
S ADVANTEST (October 1983) P13
The product is introduced as Handier on page 16.

These handlers require manual replacement of test heads depending on the type of IC/LSI, and IC/LSI
It is also necessary to manually enter a command to switch the inspection data corresponding to the type I from the VDT. For this reason, automatic inspection equipment is effective for IC/LSIs that have a relatively small number of products and a high production volume per product. However, in the case of high-mix, low-volume production, it is necessary to manually replace the test head and VDT each time the product changes. It is necessary to perform complicated switching of inspection data by manual key-in, which has the disadvantage that the effectiveness as an autohandler is greatly reduced.

[Purpose of the invention]

An object of the present invention is to provide an IC/LSI autohandler that automatically switches and tests inspection data and test adapter boards corresponding to each type of IC/LSI to be tested, and does not require any human intervention. It is about providing.

[Summary of the invention]

The present invention is characterized in that, in order to achieve the above object, the stamped characters of the IC/LSI to be tested are read by a stamped character reading device using, for example, an image processing method, and the results are read by a host)
The host CPU automatically performs a series of type switching operations in which the test data and test program are retrieved from the host CPU and returned to the LSI tester, and the corresponding test adapter board is set. It is something.

[Embodiments of the invention]

Hereinafter, one embodiment of the present invention will be described based on the accompanying drawings.

FIG. 1 is a block diagram of an automatic product type switching autohandler and related equipment according to the present invention. 1 is a main body of an autohandler for automatic type switching; 2 is a loader mechanism that sequentially supplies the IC/LSI; 3 is a transport positioning mechanism that transports and positions the supplied IC/LSI to a preset position; 4 is a handling mechanism that handles the IC/LSI to be tested to the test head; 5 is an unloader mechanism that determines whether the LSI that has been tested is good or bad and stores it; and 6 is an IC/LSI stamp reading device, which is an image sensor in the embodiment. It depends on the processing method. Reference numeral 7 denotes a test board switching mechanism, and related equipment includes a host CPU 8 and an LSI tester 9 having an external auxiliary storage device 10.

Next, the operation of the automatic type switching autohandler will be explained. IC/LSI set and prepared in loader mechanism 2
are sequentially supplied to the transport positioning mechanism 3 by the mechanism 2. The transport positioning mechanism 3 stops and positions the supplied IC/LSI at a predetermined position, and when the positioning is completed, transmits a completion signal to the stamped character reading device 6.

The stamped character reading device 6 starts reading after receiving and confirming the completion signal. After the reading is completed, the device 6 sends the read data as the IC/LSI product name to the host CPU 8 and the test adapter board automatic switching mechanism 7. FIG. 2 shows a table of test data names, test program names, and test adapter boards corresponding to each IC/LSI product name. This table is stored in the internal storage device of the host CPU 8, and the host CPU 8 compares and compares the product name sent from the stamped character reader 6 with the product name in the table, and stores the data in the row corresponding to the matched product name. For example, the host CPU 8 extracts the product name (n), the test data name (d), the test program name (p1), and the test adapter board (t). 8 indexed and matched data
The LSI tester 9 stores the data in its internal storage device, processes the data to a level at which the LSI tester 9 can execute the test, and then passes the processed data to the LSI tester 9.

On the other hand, the test adapter board automatic switching mechanism 7 processes the received product name data and automatically switches to the corresponding test adapter board. During this time, the IC/LSI to be tested is set on the test head by the handling mechanism 4 from the transport positioning mechanism 3, and becomes a test preparation light. At this time, L.S.
The I tester 9 is activated to start the test, and the LSI tester 9
is tested using test conditions and test data that match the IC/LSI set in the test head. After the test is completed, the unloader mechanism 5 determines whether it is good or bad and discharges it.

According to this embodiment, testing of a wide variety of IC/LSIs can be carried out fully automatically, which has the effect of improving testing efficiency.

〔Effect of the invention〕

According to the present invention, testing of IC/LSI for high-mix, low-volume production can be carried out efficiently, and it is highly effective in automating testing work and saving labor.

[Brief explanation of drawings]

FIG. 1 is a block diagram of an automatic product type switching autohandler according to an embodiment of the present invention, and FIG. 2 is a display diagram showing parameters corresponding to LSI product names in a table format. 2...Loader mechanism 5...Transfer positioning mechanism 4...Handling mechanism 5...Unloader mechanism 6...Sealed character reading device 8...Host CPU 9...LSI tester 10...・External auxiliary storage device Figure 1 Figure 2

Claims (1)

[Claims] 1. Loader mechanism that sequentially supplies LSIs and supplied LSIs
An autohandler consists of a transport positioning mechanism that transports and positions the SI to a predetermined position, a handling mechanism that handles the LSI to the test head for testing, and an unloader mechanism that determines whether the LSI is good or bad after the test and stores it. /An automatic product type switching autohandler characterized by being equipped with an LSI stamped character reading device and a test adapter board automatic switching mechanism.