JPS61174634A - ドライエツチング方法 - Google Patents
ドライエツチング方法Info
- Publication number
- JPS61174634A JPS61174634A JP1349085A JP1349085A JPS61174634A JP S61174634 A JPS61174634 A JP S61174634A JP 1349085 A JP1349085 A JP 1349085A JP 1349085 A JP1349085 A JP 1349085A JP S61174634 A JPS61174634 A JP S61174634A
- Authority
- JP
- Japan
- Prior art keywords
- etching
- gas
- aluminum
- chlorine
- exhaust
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 19
- 238000001312 dry etching Methods 0.000 title claims description 11
- 238000005530 etching Methods 0.000 claims abstract description 68
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 34
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 34
- 229910052801 chlorine Inorganic materials 0.000 claims abstract description 27
- 239000000460 chlorine Substances 0.000 claims abstract description 27
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 claims abstract description 19
- 239000000463 material Substances 0.000 claims abstract description 16
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 abstract 1
- 238000005086 pumping Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 6
- 239000012212 insulator Substances 0.000 description 5
- 238000003672 processing method Methods 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 238000009423 ventilation Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000010849 ion bombardment Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1349085A JPS61174634A (ja) | 1985-01-29 | 1985-01-29 | ドライエツチング方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1349085A JPS61174634A (ja) | 1985-01-29 | 1985-01-29 | ドライエツチング方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61174634A true JPS61174634A (ja) | 1986-08-06 |
JPH0526331B2 JPH0526331B2 (enrdf_load_stackoverflow) | 1993-04-15 |
Family
ID=11834555
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1349085A Granted JPS61174634A (ja) | 1985-01-29 | 1985-01-29 | ドライエツチング方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61174634A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63301522A (ja) * | 1987-01-29 | 1988-12-08 | Tokyo Electron Ltd | 処理装置 |
US4897171A (en) * | 1985-11-26 | 1990-01-30 | Tadahiro Ohmi | Wafer susceptor |
JP2000299312A (ja) * | 1991-04-04 | 2000-10-24 | Hitachi Ltd | プラズマ処理方法及び半導体装置の製造方法 |
JP2000299311A (ja) * | 1991-04-04 | 2000-10-24 | Hitachi Ltd | プラズマ処理装置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54118172A (en) * | 1978-03-06 | 1979-09-13 | Nichiden Varian Kk | Method of dry etching aluminum |
JPS57133633A (en) * | 1981-02-13 | 1982-08-18 | Anelva Corp | Dry-etching device |
US4376672A (en) * | 1981-10-26 | 1983-03-15 | Applied Materials, Inc. | Materials and methods for plasma etching of oxides and nitrides of silicon |
US4412885A (en) * | 1982-11-03 | 1983-11-01 | Applied Materials, Inc. | Materials and methods for plasma etching of aluminum and aluminum alloys |
-
1985
- 1985-01-29 JP JP1349085A patent/JPS61174634A/ja active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54118172A (en) * | 1978-03-06 | 1979-09-13 | Nichiden Varian Kk | Method of dry etching aluminum |
JPS57133633A (en) * | 1981-02-13 | 1982-08-18 | Anelva Corp | Dry-etching device |
US4376672A (en) * | 1981-10-26 | 1983-03-15 | Applied Materials, Inc. | Materials and methods for plasma etching of oxides and nitrides of silicon |
US4412885A (en) * | 1982-11-03 | 1983-11-01 | Applied Materials, Inc. | Materials and methods for plasma etching of aluminum and aluminum alloys |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4897171A (en) * | 1985-11-26 | 1990-01-30 | Tadahiro Ohmi | Wafer susceptor |
JPS63301522A (ja) * | 1987-01-29 | 1988-12-08 | Tokyo Electron Ltd | 処理装置 |
JP2000299312A (ja) * | 1991-04-04 | 2000-10-24 | Hitachi Ltd | プラズマ処理方法及び半導体装置の製造方法 |
JP2000299311A (ja) * | 1991-04-04 | 2000-10-24 | Hitachi Ltd | プラズマ処理装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0526331B2 (enrdf_load_stackoverflow) | 1993-04-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR20180130596A (ko) | 플라즈마 프로세싱 챔버에서의 인-시튜 챔버 세정 효율 향상을 위한 플라즈마 처리 프로세스 | |
JPS6353268B2 (enrdf_load_stackoverflow) | ||
JPS61147531A (ja) | 反応性イオンエツチング方法 | |
JP4845269B2 (ja) | 半導体ウエーハ処理システム、コンピュータ可読媒体、及び、半導体プロセスチャンバの洗浄方法 | |
JPS61174634A (ja) | ドライエツチング方法 | |
JPH04100222A (ja) | 真空処理方法 | |
JP3118737B2 (ja) | 被処理体の処理方法 | |
JPS63111621A (ja) | エツチング処理装置 | |
JP2978857B2 (ja) | プラズマエッチング装置 | |
JP3400909B2 (ja) | プラズマ処理方法及び装置 | |
JPH0241167B2 (enrdf_load_stackoverflow) | ||
JPS61271836A (ja) | ドライエツチング装置 | |
JP3595508B2 (ja) | 半導体製造装置 | |
JPS6316467B2 (enrdf_load_stackoverflow) | ||
JPH07263427A (ja) | プラズマエッチング方法 | |
JPH0336908B2 (enrdf_load_stackoverflow) | ||
JPS6295828A (ja) | プラズマ処理装置 | |
JP2010272551A (ja) | 基板処理装置及び基板処理方法 | |
JP2001023964A (ja) | ドライエッチング方法 | |
JPS6366394B2 (enrdf_load_stackoverflow) | ||
CN119436834A (zh) | 石英件处理方法和管式炉系统 | |
JPH0323633A (ja) | ドライエッチング方法 | |
JPH08241886A (ja) | プラズマ処理方法 | |
JPS5887276A (ja) | ドライエツチング後処理方法 | |
JPH01258428A (ja) | 半導体製造装置 |