JPS61149816A - 振動する物体の表面検査装置 - Google Patents
振動する物体の表面検査装置Info
- Publication number
- JPS61149816A JPS61149816A JP28050684A JP28050684A JPS61149816A JP S61149816 A JPS61149816 A JP S61149816A JP 28050684 A JP28050684 A JP 28050684A JP 28050684 A JP28050684 A JP 28050684A JP S61149816 A JPS61149816 A JP S61149816A
- Authority
- JP
- Japan
- Prior art keywords
- receiving element
- tracking
- light
- light receiving
- reflected light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28050684A JPS61149816A (ja) | 1984-12-24 | 1984-12-24 | 振動する物体の表面検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28050684A JPS61149816A (ja) | 1984-12-24 | 1984-12-24 | 振動する物体の表面検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61149816A true JPS61149816A (ja) | 1986-07-08 |
| JPH0569164B2 JPH0569164B2 (https=) | 1993-09-30 |
Family
ID=17626039
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP28050684A Granted JPS61149816A (ja) | 1984-12-24 | 1984-12-24 | 振動する物体の表面検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61149816A (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6417484B1 (en) | 1998-12-21 | 2002-07-09 | Micron Electronics, Inc. | Laser marking system for dice carried in trays and method of operation |
| US6524881B1 (en) | 2000-08-25 | 2003-02-25 | Micron Technology, Inc. | Method and apparatus for marking a bare semiconductor die |
| US7169685B2 (en) | 2002-02-25 | 2007-01-30 | Micron Technology, Inc. | Wafer back side coating to balance stress from passivation layer on front of wafer and be used as die attach adhesive |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52112304A (en) * | 1976-03-17 | 1977-09-20 | Victor Co Of Japan Ltd | Contactless pick-up |
| JPS5932804A (ja) * | 1982-08-18 | 1984-02-22 | Chino Works Ltd | 長さ測定装置 |
-
1984
- 1984-12-24 JP JP28050684A patent/JPS61149816A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52112304A (en) * | 1976-03-17 | 1977-09-20 | Victor Co Of Japan Ltd | Contactless pick-up |
| JPS5932804A (ja) * | 1982-08-18 | 1984-02-22 | Chino Works Ltd | 長さ測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0569164B2 (https=) | 1993-09-30 |
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