JPS61147979U - - Google Patents
Info
- Publication number
- JPS61147979U JPS61147979U JP3210385U JP3210385U JPS61147979U JP S61147979 U JPS61147979 U JP S61147979U JP 3210385 U JP3210385 U JP 3210385U JP 3210385 U JP3210385 U JP 3210385U JP S61147979 U JPS61147979 U JP S61147979U
- Authority
- JP
- Japan
- Prior art keywords
- life test
- semiconductor
- measurement
- section
- semiconductor elements
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims description 13
- 239000004065 semiconductor Substances 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3210385U JPS61147979U (cg-RX-API-DMAC7.html) | 1985-03-05 | 1985-03-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3210385U JPS61147979U (cg-RX-API-DMAC7.html) | 1985-03-05 | 1985-03-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61147979U true JPS61147979U (cg-RX-API-DMAC7.html) | 1986-09-12 |
Family
ID=30533307
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3210385U Pending JPS61147979U (cg-RX-API-DMAC7.html) | 1985-03-05 | 1985-03-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61147979U (cg-RX-API-DMAC7.html) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53142259A (en) * | 1977-05-18 | 1978-12-11 | Toshiba Corp | Threshold condition testing system |
| JPS56157875A (en) * | 1980-05-08 | 1981-12-05 | Fujitsu Ltd | Testing jig for semiconductor |
-
1985
- 1985-03-05 JP JP3210385U patent/JPS61147979U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53142259A (en) * | 1977-05-18 | 1978-12-11 | Toshiba Corp | Threshold condition testing system |
| JPS56157875A (en) * | 1980-05-08 | 1981-12-05 | Fujitsu Ltd | Testing jig for semiconductor |