JPS56157875A - Testing jig for semiconductor - Google Patents

Testing jig for semiconductor

Info

Publication number
JPS56157875A
JPS56157875A JP6086580A JP6086580A JPS56157875A JP S56157875 A JPS56157875 A JP S56157875A JP 6086580 A JP6086580 A JP 6086580A JP 6086580 A JP6086580 A JP 6086580A JP S56157875 A JPS56157875 A JP S56157875A
Authority
JP
Japan
Prior art keywords
head
data
light
aging
comparison
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6086580A
Other languages
Japanese (ja)
Inventor
Osamu Hasegawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP6086580A priority Critical patent/JPS56157875A/en
Publication of JPS56157875A publication Critical patent/JPS56157875A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests

Abstract

PURPOSE:To facilitate the detection of aging through the comparison of measured data with those previous by providing a magnetic memory capable of recording measured results on a semiconductor holder. CONSTITUTION:Power is supplied from a power supply terminal 3 and electric connection is made to respective electrode contact parts 4 upon the test and measuring respectively of light-emitting diodes. Measuring is made with a testing jig 1 transferred at one pitch each time rightwards in drawing and the light output values of the respective light-emitting diodes are written in and erased from a magnetic memory 2 by a demagnetizing head 9, a reproducing head 10 and a recording head 11. Previous-measured values written in the memory 2 are read if any by the head 10 on the transfer of the jig. The data can be displayed and the information of the data of aging can be given through the comparison with those present which are inputted to a computer.
JP6086580A 1980-05-08 1980-05-08 Testing jig for semiconductor Pending JPS56157875A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6086580A JPS56157875A (en) 1980-05-08 1980-05-08 Testing jig for semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6086580A JPS56157875A (en) 1980-05-08 1980-05-08 Testing jig for semiconductor

Publications (1)

Publication Number Publication Date
JPS56157875A true JPS56157875A (en) 1981-12-05

Family

ID=13154703

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6086580A Pending JPS56157875A (en) 1980-05-08 1980-05-08 Testing jig for semiconductor

Country Status (1)

Country Link
JP (1) JPS56157875A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61147979U (en) * 1985-03-05 1986-09-12

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61147979U (en) * 1985-03-05 1986-09-12

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