GB2021825A - Improvements in or relating to semi conductor circuits - Google Patents

Improvements in or relating to semi conductor circuits

Info

Publication number
GB2021825A
GB2021825A GB7917664A GB7917664A GB2021825A GB 2021825 A GB2021825 A GB 2021825A GB 7917664 A GB7917664 A GB 7917664A GB 7917664 A GB7917664 A GB 7917664A GB 2021825 A GB2021825 A GB 2021825A
Authority
GB
United Kingdom
Prior art keywords
chip
relating
conductor circuits
semi conductor
chips
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB7917664A
Other versions
GB2021825B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aubusson R C
Original Assignee
Aubusson R C
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aubusson R C filed Critical Aubusson R C
Priority to GB7917664A priority Critical patent/GB2021825B/en
Publication of GB2021825A publication Critical patent/GB2021825A/en
Application granted granted Critical
Publication of GB2021825B publication Critical patent/GB2021825B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/006—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation at wafer scale level, i.e. wafer scale integration [WSI]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 

Abstract

Each chip in a circuit of the wafer scale integrated kind can store a plurality of bits of information, and all the chips can be accessed in parallel for write or read operations, all chips being provided with means for feeding in clock pulses and power. Each chip may be provided, in the electrical connections thereto, with resistor means which limits the current which can flow in any chip which is faulty without substantially affecting the functioning of a good chip. <IMAGE>
GB7917664A 1978-05-25 1979-05-21 Semi conductor circuits Expired GB2021825B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB7917664A GB2021825B (en) 1978-05-25 1979-05-21 Semi conductor circuits

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB2263778 1978-05-25
GB7917664A GB2021825B (en) 1978-05-25 1979-05-21 Semi conductor circuits

Publications (2)

Publication Number Publication Date
GB2021825A true GB2021825A (en) 1979-12-05
GB2021825B GB2021825B (en) 1982-10-27

Family

ID=26256037

Family Applications (1)

Application Number Title Priority Date Filing Date
GB7917664A Expired GB2021825B (en) 1978-05-25 1979-05-21 Semi conductor circuits

Country Status (1)

Country Link
GB (1) GB2021825B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1983002357A1 (en) * 1981-12-21 1983-07-07 Burroughs Corp Improvements in or relating to wafer scale integrated circuits
US4493055A (en) * 1980-12-12 1985-01-08 Burroughs Corporation Wafer-scale integrated circuits
EP0240864A2 (en) * 1986-04-03 1987-10-14 Hewlett-Packard Company High-yield semiconductor memory devices
EP0413590A2 (en) * 1989-08-18 1991-02-20 Fujitsu Limited Wafer scale integrated circuit device
EP0459316A2 (en) * 1990-05-31 1991-12-04 Oki Electric Industry Co., Ltd. Semiconductor memory device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4493055A (en) * 1980-12-12 1985-01-08 Burroughs Corporation Wafer-scale integrated circuits
WO1983002357A1 (en) * 1981-12-21 1983-07-07 Burroughs Corp Improvements in or relating to wafer scale integrated circuits
EP0240864A2 (en) * 1986-04-03 1987-10-14 Hewlett-Packard Company High-yield semiconductor memory devices
EP0240864A3 (en) * 1986-04-03 1989-05-24 Hewlett-Packard Company High-yield semiconductor memory devices
EP0413590A2 (en) * 1989-08-18 1991-02-20 Fujitsu Limited Wafer scale integrated circuit device
EP0413590A3 (en) * 1989-08-18 1991-07-31 Fujitsu Limited Wafer scale integrated circuit device
EP0459316A2 (en) * 1990-05-31 1991-12-04 Oki Electric Industry Co., Ltd. Semiconductor memory device
EP0459316A3 (en) * 1990-05-31 1992-07-22 Oki Electric Industry Co., Ltd. Semiconductor memory device
US5321658A (en) * 1990-05-31 1994-06-14 Oki Electric Industry Co., Ltd. Semiconductor memory device being coupled by auxiliary power lines to a main power line
US5517444A (en) * 1990-05-31 1996-05-14 Oki Electric Industry Co., Ltd. Semiconductor memory device with resistive power supply connection

Also Published As

Publication number Publication date
GB2021825B (en) 1982-10-27

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Legal Events

Date Code Title Description
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PE20 Patent expired after termination of 20 years

Effective date: 19990518