JPS6114452B2 - - Google Patents
Info
- Publication number
- JPS6114452B2 JPS6114452B2 JP8085780A JP8085780A JPS6114452B2 JP S6114452 B2 JPS6114452 B2 JP S6114452B2 JP 8085780 A JP8085780 A JP 8085780A JP 8085780 A JP8085780 A JP 8085780A JP S6114452 B2 JPS6114452 B2 JP S6114452B2
- Authority
- JP
- Japan
- Prior art keywords
- rubber
- products
- molecular weight
- low molecular
- weight gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000007547 defect Effects 0.000 claims description 13
- 238000001514 detection method Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- 239000000047 product Substances 0.000 description 23
- 239000007789 gas Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- 238000007689 inspection Methods 0.000 description 3
- 230000001066 destructive effect Effects 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/36—Investigating fluid-tightness of structures by using fluid or vacuum by detecting change in dimensions of the structure being tested
- G01M3/363—Investigating fluid-tightness of structures by using fluid or vacuum by detecting change in dimensions of the structure being tested the structure being removably mounted in a test cell
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Examining Or Testing Airtightness (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8085780A JPS577533A (en) | 1980-06-17 | 1980-06-17 | Detection of internal defect |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8085780A JPS577533A (en) | 1980-06-17 | 1980-06-17 | Detection of internal defect |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS577533A JPS577533A (en) | 1982-01-14 |
| JPS6114452B2 true JPS6114452B2 (enrdf_load_stackoverflow) | 1986-04-18 |
Family
ID=13730006
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8085780A Granted JPS577533A (en) | 1980-06-17 | 1980-06-17 | Detection of internal defect |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS577533A (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008241341A (ja) * | 2007-03-26 | 2008-10-09 | Toyota Motor Corp | 被検体の検査方法 |
| JP6657746B2 (ja) | 2015-10-09 | 2020-03-04 | 三菱マテリアル株式会社 | 放電管 |
| KR102726066B1 (ko) * | 2024-01-03 | 2024-11-05 | 디에이치 주식회사 | 이차전지의 리크 검사방법 |
-
1980
- 1980-06-17 JP JP8085780A patent/JPS577533A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS577533A (en) | 1982-01-14 |
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