JPS61137257U - - Google Patents
Info
- Publication number
- JPS61137257U JPS61137257U JP2006585U JP2006585U JPS61137257U JP S61137257 U JPS61137257 U JP S61137257U JP 2006585 U JP2006585 U JP 2006585U JP 2006585 U JP2006585 U JP 2006585U JP S61137257 U JPS61137257 U JP S61137257U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- semiconductor detector
- rowland circle
- tangent
- fluorescence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
- 239000013078 crystal Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000192 extended X-ray absorption fine structure spectroscopy Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
第１図は、本考案による螢光Ｘ線強度計測装置
の略示図、第２図は、従来の螢光ＥＸＡＦＳを測
定する光学系を示す図である。
１１……入射Ｘ線、１２……試料、１３……螢
光Ｘ線、１４……ローランド円、１５……湾曲結
晶、１６……半導体検出器。
FIG. 1 is a schematic diagram of a fluorescence X-ray intensity measuring device according to the present invention, and FIG. 2 is a diagram showing a conventional optical system for measuring fluorescence EXAFS. 11... Incident X-ray, 12... Sample, 13... Fluorescent X-ray, 14... Rowland circle, 15... Curved crystal, 16... Semiconductor detector.
Claims (1)
試料と反対側に半導体検出器を設置し、試料と半
導体検出器とを結ぶ直径に直交するローランド円
上の位置に、等しいローランド半径を有する一対
の湾曲結晶を備えたことを特徴とする螢光Ｘ線強
度計測装置。 Tangent to the Rowland circle whose tangent is the sample surface,
Fluorescence, characterized in that a semiconductor detector is installed on the opposite side of the sample, and a pair of curved crystals having equal Roland radii are provided at positions on a Rowland circle perpendicular to the diameter connecting the sample and the semiconductor detector. X-ray intensity measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006585U JPS61137257U (en) | 1985-02-15 | 1985-02-15 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006585U JPS61137257U (en) | 1985-02-15 | 1985-02-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61137257U true JPS61137257U (en) | 1986-08-26 |
Family
ID=30510210
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006585U Pending JPS61137257U (en) | 1985-02-15 | 1985-02-15 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61137257U (en) |
-
1985
- 1985-02-15 JP JP2006585U patent/JPS61137257U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS61137257U (en) | ||
| JPS61137256U (en) | ||
| JPS61174684U (en) | ||
| JPS6294905U (en) | ||
| JPH03117749U (en) | ||
| JPS61149329U (en) | ||
| JPS6292431U (en) | ||
| JPS622250U (en) | ||
| JPS60169561U (en) | Angle-resolved X-ray diffraction device | |
| JPS6179314U (en) | ||
| JPS6284721U (en) | ||
| JPH0363124U (en) | ||
| JPH01141427U (en) | ||
| JPS62108814U (en) | ||
| JPS61188124U (en) | ||
| JPS61131681U (en) | ||
| JPH02133655U (en) | ||
| JPH0336945U (en) | ||
| JPS58172858U (en) | optical sample stage | |
| JPS62121550U (en) | ||
| JPS62111601U (en) | ||
| JPS6335952U (en) | ||
| JPS61197514U (en) | ||
| JPS63142721U (en) | ||
| JPS6259810U (en) |