JPS61136676A - Vapor growth device - Google Patents

Vapor growth device

Info

Publication number
JPS61136676A
JPS61136676A JP25977784A JP25977784A JPS61136676A JP S61136676 A JPS61136676 A JP S61136676A JP 25977784 A JP25977784 A JP 25977784A JP 25977784 A JP25977784 A JP 25977784A JP S61136676 A JPS61136676 A JP S61136676A
Authority
JP
Japan
Prior art keywords
susceptors
susceptor
wafers
bell
jar
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP25977784A
Other languages
Japanese (ja)
Other versions
JPH037752B2 (en
Inventor
Seiichi Nakamura
誠一 中村
Satoru Nakayama
中山 了
Fuminori Higami
樋上 文範
Junichi Sakamoto
淳一 坂本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP25977784A priority Critical patent/JPS61136676A/en
Publication of JPS61136676A publication Critical patent/JPS61136676A/en
Publication of JPH037752B2 publication Critical patent/JPH037752B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To subject simultaneously many semiconductor wafers each having a large area to vapor growth by disposing many susceptors on a horizontal rotary plate provided in a bell-jar into multiple stages by using stands and imposing the wafers atop the respective susceptors. CONSTITUTION:The cylindrical bell-jar 2 is fixed on a base plate 1 and a shaft part 4a is projected through the plate 1. The rotary plate 4 is provided thereto. The plural stands 5 are erected at specified intervals in the peripheral direction on the plate 4 and the plural susceptors 6 are laminated and placed at required intervals in a vertical direction to the adjacent stands 5. The wafers 7 are placed on the respective susceptors 6 and the plate 4 is turned around the shaft 4a. A main heater 8 and auxiliary heater 9 are driven to heat the susceptors 6 and the wafers 7 to the prescribed temp. Water is supplied from a water cooling pipe 3b and a cooling gas from an introducing port 3c, respectively so that the bell-jar 2 is kept cooled. A gaseous raw material is then supplied from a gas supply pipe 10 into the bell-jar 2 and is passed between the stacked susceptors 6, by which epitaxial films are vapor-grown on the wafers 7.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は同時に多数の半導体ウェーハに対しエピタキシ
ャル成長処理が可能な気相成長装置に関するものである
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a vapor phase growth apparatus capable of epitaxially growing a large number of semiconductor wafers at the same time.

〔従来技術〕[Prior art]

この種の気相成長装置としては、従来例えば第4.5図
に示す如き装置が知られている。第4図は従来の気相成
長装置を示す模式的断面図であり、基台31を通してベ
ルジャ32内の中央に水平回転可能にサセプタ33を配
置し、このサセプタ33下には高周波加熱用のコイル3
4を配し、またサセプタ33上には複数の半導体ウェー
ハ(以下単にウェーハという)35を載置し、コイル3
4にてサセプタ33を加熱し、このサセプタ33の熱に
てウェーハ35を所定温度に加熱維持しつつサセプタ3
3の軸部33a内を通してベルジャ32内に導入開口さ
せたノズル36を通じて、所要の原料ガスを供給し、ベ
ルジャ32内を通流させ、ウェーハ35上にエピタキシ
ャル成長を行なわせ得るようになっている。
As this type of vapor phase growth apparatus, an apparatus as shown in FIG. 4.5, for example, is conventionally known. FIG. 4 is a schematic cross-sectional view showing a conventional vapor phase growth apparatus, in which a susceptor 33 is horizontally rotatably arranged in the center of a bell jar 32 through a base 31, and a high-frequency heating coil is placed below the susceptor 33. 3
A plurality of semiconductor wafers (hereinafter simply referred to as wafers) 35 are placed on the susceptor 33, and a coil 3 is placed on the susceptor 33.
4, the susceptor 33 is heated, and the wafer 35 is heated and maintained at a predetermined temperature by the heat of the susceptor 33.
A required raw material gas is supplied through a nozzle 36 introduced into the bell jar 32 through the shaft portion 33a of the No.

また第5図は従来のバレル型の気相成長装置を示す模式
的断面図であり、基板41を通してベルジャ42内に回
転可能に垂設した軸43周りに複数のサセプタ44を多
角錐形に組立てて固定し、各サセプタ44の表面には複
数のウェーハ45を、またこのサセプタ44と対応する
ベルジャ42の外周には高周波加熱用のコイル46を配
設し、軸43を回転させつつコイル46にてウェーハ4
5を加熱する一方、ベルジャ42の周壁土部に開口した
導入口47から原料ガスをベルジャ42内に導入し、ベ
ルジャ42内を通流させ、各ウェーハ45上にエピタキ
シャル成長を行なわせ得るようになっている。
Furthermore, FIG. 5 is a schematic cross-sectional view showing a conventional barrel-type vapor phase growth apparatus, in which a plurality of susceptors 44 are assembled in a polygonal pyramid shape around a shaft 43 that is rotatably suspended in a bell jar 42 through a substrate 41. A plurality of wafers 45 are placed on the surface of each susceptor 44, and a coil 46 for high frequency heating is placed on the outer periphery of the bell jar 42 corresponding to the susceptor 44. wafer 4
While heating the wafer 5, raw material gas is introduced into the bell jar 42 from an inlet 47 opened in the peripheral wall of the bell jar 42, and is allowed to flow through the bell jar 42, thereby allowing epitaxial growth to be performed on each wafer 45. ing.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところで上述した如き従来の気相成長装置にあっては、
いずれもベルジャ内空間に対するウェーハが占める密度
が小さく、処理個数が少ないことは勿論、輻射によるウ
ェーハの均熱効果も小さいなどの問題があった。このた
め従来にあっては処理個数を増大し、ベルジャ内空間に
対するウェーハの密度を高め、均熱効果を高める手段と
して、ベルジャ内に配した回転板上に、円盤状のサセプ
タを立てて軸周りに放射板に配設し、各サセプタの両面
にウェーハを固定してベルジャ内におけるウェーハ、サ
セプタ密度を大きくし、ウェーハの処理個数、輻射によ
るウェーハの均熱効果を高めるようにした気相成長装置
が提案されている(特開昭57−7899号)。
By the way, in the conventional vapor phase growth apparatus as mentioned above,
In both cases, the density of the wafers occupying the space inside the bell jar is small, and the number of wafers to be processed is small, and the heat uniformity effect of the wafers due to radiation is also small. For this reason, in the past, as a means to increase the number of wafers processed, increase the density of wafers in the space inside the bell jar, and improve the heat uniformity effect, a disk-shaped susceptor was erected on a rotating plate placed inside the bell jar. A vapor phase growth system is installed on a radiation plate and wafers are fixed on both sides of each susceptor to increase the density of wafers and susceptors in the bell jar, increasing the number of wafers processed and the uniform heating effect of the wafers due to radiation. has been proposed (Japanese Unexamined Patent Application Publication No. 57-7899).

しかしこのような装置にあってはウェーハ面積を大きく
出来るものの処理個数はたかだか第4゜5図に示す装置
の2倍程度にすぎず、大面積ウェーハを対象とした多数
処理能力を有する気相成長装置が望まれている。
However, although this type of equipment can increase the wafer area, the number of wafers processed is only about twice that of the equipment shown in Figure 4. equipment is desired.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は係る事情に鑑みてなされたものであって、その
目的とするところは基板上に複数の支柱を立設し、この
支柱間に夫々サセプタを多段に載架し、この各サセプタ
上にウェーハを載置することによって大面積のウェーハ
に対し多数同時に気相成長を行わせ得、効率が高(、し
かも輻射によるウェーハの均熱効果が得られ、エピタキ
シャル成長膜自体の品質も高め得るようにした気相成長
装置を提供するにある。
The present invention has been made in view of the above circumstances, and its object is to erect a plurality of supports on a substrate, to mount susceptors in multiple stages between the supports, and to place a plurality of susceptors on each susceptor. By mounting the wafers, it is possible to perform vapor phase growth on a large number of wafers at the same time, and the efficiency is high (in addition, the wafer is uniformly heated by radiation, and the quality of the epitaxially grown film itself can be improved. To provide a vapor phase growth apparatus that

本発明に得る気相成長装置はベルジャに内装した水平回
転板上に架台を用いて複数のサセプタを相互の間に所要
の間隔を隔てて多段に配設し、各サセプタ上面に半導体
ウェーハ載置し得るようにしたことを特徴とする。
In the vapor phase growth apparatus obtained in the present invention, a plurality of susceptors are arranged in multiple stages with a required interval between them using a frame on a horizontal rotary plate installed in a bell jar, and a semiconductor wafer is placed on the top surface of each susceptor. It is characterized by being made possible.

〔実施例〕〔Example〕

以下本発明をその実施例を示す図面に基づき具体的に説
明する。第1図は本発明に係る気相成長装置(以下本発
明装置という°)の模式的横断面図、第2図は第1図の
■−…線による縦断面図であり図中1は基台、2はベル
ジャ、を示している。ベルジャ2は石英等の耐熱材を用
いて上端部を閉じた円筒状に形成されており、下端部を
基台I上に固定されている。ベルジャ2の外方にはこれ
と略同径で若干大きい水冷ジャケット3が、またベルジ
ャ2の内部には回転板4、架台5、サセプタ6、ウェー
ハ7、主ヒータ8、補助ヒータ9等が配設されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be specifically described below based on drawings showing embodiments thereof. FIG. 1 is a schematic cross-sectional view of a vapor phase growth apparatus according to the present invention (hereinafter referred to as the present invention apparatus), and FIG. The stand, 2, indicates Belljar. The bell jar 2 is formed into a cylindrical shape with a closed upper end using a heat-resistant material such as quartz, and has a lower end fixed on a base I. Outside the bell jar 2, a water cooling jacket 3 having approximately the same diameter and slightly larger size is arranged, and inside the bell jar 2, a rotary plate 4, a pedestal 5, a susceptor 6, a wafer 7, a main heater 8, an auxiliary heater 9, etc. are arranged. It is set up.

水冷ジャケット3は耐熱性の金属、例えばステンレス等
を素材にして形成した円筒状の内殻3aの外周に水冷管
3bt−巻着して構成されており、上面は冷却ガスの導
入口3cを除いて閉鎖され、下部周面には複数の排気口
3eが開口されている。水冷ジャケット3の内殻3aの
円径は前記ベルジャ2の外径よりも若干大きく、ベルジ
ャ2との間゛に冷却ガス用の通流路3dを構成する隙間
を隔ててベルジャ2の外方を囲うよう配設され、その下
端部は基台1上にベルジャ2と同心状に位置決めされて
いる。水冷管3bには冷却水を、また導入口3cからは
窒素ガスを通流路3d内に通流させることによってベル
ジャ2の冷却が行なうようにしである。
The water cooling jacket 3 is constructed by wrapping a water cooling tube 3b around the outer periphery of a cylindrical inner shell 3a made of a heat-resistant metal such as stainless steel. A plurality of exhaust ports 3e are opened on the lower circumferential surface. The diameter of the inner shell 3a of the water cooling jacket 3 is slightly larger than the outer diameter of the bell jar 2, and the outside of the bell jar 2 is separated from the bell jar 2 by a gap that constitutes a cooling gas passage 3d. It is arranged so as to surround it, and its lower end is positioned on the base 1 concentrically with the belljar 2. The bell jar 2 is cooled by passing cooling water through the water cooling pipe 3b and flowing nitrogen gas through the passage 3d from the inlet 3c.

回転板4はその耐熱性の素材、例えば炭化珪素、或いは
他の耐熱材を素材にして円盤状に形成され、下面中央に
は同じ素材にて軸部4aが一体に形成され、この軸部4
aを基台”lを通してその下方に突出させ、図示しない
駆動部に連繋せしめてあり、所定の速度で回転されるよ
うになっている。
The rotating plate 4 is formed into a disk shape using a heat-resistant material such as silicon carbide or other heat-resistant material, and a shaft portion 4a is integrally formed with the same material at the center of the lower surface.
A is made to protrude downward through the base "l" and is connected to a drive unit (not shown) so that it can be rotated at a predetermined speed.

回転板4の上面には複数の架台5が周方向に一定間隔で
立設され、相隣する架台5に渡して複数のサセプタ6が
上、下方向に所要の間隔を隔てて積層載架されており、
また回転テーブル4の回動域の外方にはベルジャ2の周
壁との間に複数の主ヒータ8が、また回転デープル4の
回動中心部には複数の補助ヒータ9及び原料ガス用の給
気管10が夫々立設配置されている。架台5は炭化珪素
又は他の耐熱素材を用いて平面視で第1図に示す如く扇
形部分5a及びこれからの延在部5bを備えており、扇
形部分5aを回転板4の周縁部側に延在部5bを、回転
中心側に位置させた状態で所要高さに立設されている。
A plurality of mounts 5 are erected on the upper surface of the rotary plate 4 at regular intervals in the circumferential direction, and a plurality of susceptors 6 are stacked and stacked on the adjacent mounts 5 at required intervals in the upper and lower directions. and
Further, a plurality of main heaters 8 are provided outside the rotation range of the rotary table 4 between the peripheral wall of the bell jar 2, and a plurality of auxiliary heaters 9 and a raw material gas supply are provided at the rotation center of the rotary table 4. The tracheas 10 are arranged upright. The pedestal 5 is made of silicon carbide or other heat-resistant material, and has a fan-shaped portion 5a and an extending portion 5b extending therefrom, as shown in FIG. The existing portion 5b is erected at a required height with the existing portion 5b positioned on the rotation center side.

この状態では相隣する架台5の扇形部分5aの両側面は
相互に平行となっており、この部分を含む架台5の両側
面には上、下方向に所定の間隔を隔ててサセプタ6の厚
さよりも若干大きい幅寸法の凹溝5cが多数形成されて
おり、相隣する架台5の凹溝5cに渡してサセプタ6が
回転板4の周縁部側から挿税可能に挿入載置せしめられ
ている。サセプタ6は6角板状に形成されており、両側
縁部を相隣する架台5.5の対応する凹溝5cに係入せ
しめた状態で架台5に載架され、その上面には円形のウ
ェーハ7が載置されるようになっている。
In this state, both side surfaces of the fan-shaped portions 5a of adjacent frames 5 are parallel to each other, and on both sides of the frame 5 including these portions, susceptors 6 with a thickness of A large number of recessed grooves 5c having a width slightly larger than that of the rotary plate 4 are formed, and the susceptor 6 is inserted and placed thereon from the peripheral edge side of the rotary plate 4 across the recessed grooves 5c of the adjacent frames 5. There is. The susceptor 6 is formed into a hexagonal plate shape, and is mounted on the pedestal 5 with both side edges engaged in the corresponding grooves 5c of the adjacent pedestals 5. A wafer 7 is placed thereon.

主ヒータ8は前記回転板4及びこの上に立設した架台5
の回動域とベルジャ2の内周壁との間にこれに沿うよう
弧状に形成されており、夫々周方向に一定の間隔を隔て
て複数個立設配置され、また補助ヒータ9は回転板4上
の架台5の回動域の内側に同じく円周上であって、且つ
周方向に一定の間隔を隔てて複数個立設配置されている
。各主ヒータ8は基台1を貫通して架台5の高さと略同
じ高さに立設されており、主ヒータ8間の基台lには複
数の原料ガスの排気口1aが開口せしめられている。
The main heater 8 includes the rotary plate 4 and a pedestal 5 erected thereon.
A plurality of auxiliary heaters 9 are formed in an arc shape along the rotation range of the bell jar 2 and the inner peripheral wall of the bell jar 2, and a plurality of auxiliary heaters 9 are arranged upright at regular intervals in the circumferential direction. A plurality of them are also arranged circumferentially inside the rotation area of the upper frame 5 and spaced apart from each other at regular intervals in the circumferential direction. Each main heater 8 penetrates the base 1 and is erected at approximately the same height as the pedestal 5, and a plurality of raw material gas exhaust ports 1a are opened in the base l between the main heaters 8. ing.

また各補助ヒータ9は回転板4の軸部4a内を通してベ
ルジャ2内に導入され、架台5の高さと略同じ高さに立
設されており、補助し−タ9間には、夫々高さを異にし
た複数の原料ガス用給気管10が配設されている。
Each auxiliary heater 9 is introduced into the bell jar 2 through the shaft portion 4a of the rotary plate 4, and is erected at approximately the same height as the pedestal 5. A plurality of raw material gas supply pipes 10 having different gas supply pipes are arranged.

各給気管10は上端を閉じたパイプの上端部近傍周壁に
吹出口10aを開口して構成され、吹出口10aを架台
5の回動域側に向け、且つ夫々のベルジャ2内における
高さを変えて全サセプタ6に対し均一に原料ガスを供給
し得るよう設定しである。
Each air supply pipe 10 is constructed by opening an air outlet 10a in the circumferential wall near the upper end of a pipe whose upper end is closed. In other words, the setting is such that the raw material gas can be uniformly supplied to all the susceptors 6.

而して上述の如く構成された本発明装置にあっては、各
サセプタ6上にウェーハ7を載置し、この状態で各サセ
プタ6を架台5の凹溝5cに両側縁を挿入載架する0図
示しないモータを駆動して回転板4をその軸4a回りに
回動させつつ主ヒータ8、補助ヒータ9を駆動し、サセ
プタ6、ウェーハ7を所定温度にまで加熱する。
In the apparatus of the present invention configured as described above, the wafer 7 is placed on each susceptor 6, and in this state, each susceptor 6 is mounted by inserting both side edges into the groove 5c of the pedestal 5. 0 A motor (not shown) is driven to rotate the rotary plate 4 around its axis 4a, and the main heater 8 and auxiliary heater 9 are driven to heat the susceptor 6 and wafer 7 to a predetermined temperature.

間冷却ジャケット3の水冷管3bには水を、また導入口
3cからは通流路3d内に窒素等の冷却ガスを通し、ベ
ルジャ2を冷却維持する。サセプタ6、ウェーハ7が所
定温度にまで加熱されると給気管10から原料ガスをベ
ルジャ2内に供給する。原料ガスは高さの異なる各給気
管10から段積みされた各サセプタ6間に通流せしめら
れ、ウェーハ7上にエピタキシャル膜が気相成長せしめ
られることとなる。
Water is passed through the water cooling pipe 3b of the intercooling jacket 3, and cooling gas such as nitrogen is passed through the inlet 3c into the passage 3d to keep the bell jar 2 cool. When the susceptor 6 and wafer 7 are heated to a predetermined temperature, raw material gas is supplied into the bell jar 2 from the air supply pipe 10. The raw material gas is made to flow between the stacked susceptors 6 from the air supply pipes 10 having different heights, and an epitaxial film is grown on the wafer 7 in a vapor phase.

而して上述の如く構成した本発明装置にあっては各架台
5間に渡して多数のサセプタ6を積層配置することが出
来、夫々にウェーハ7を載置することが可能となって、
同時に多数のウェーハ7に対し均一なエピタキシャル成
長を行なわせ得、作業能率が格段に向上し、また多数の
サセプタ6を多数段積配置し、しかも生ヒータ8、補助
ヒータ9を配し、両者の制御によってウェーハの均一な
加熱が可能となって、均質なエピタキシャル膜が得られ
膜品質の向上も図れ、そのうえサセプタ6自体は架台に
対し容易に着膜し得るため作業の能率もよい。
In the apparatus of the present invention configured as described above, a large number of susceptors 6 can be stacked and arranged between each mount 5, and a wafer 7 can be placed on each susceptor 6.
It is possible to perform uniform epitaxial growth on a large number of wafers 7 at the same time, greatly improving work efficiency, and by arranging a large number of susceptors 6 in multiple stacks, and also arranging a raw heater 8 and an auxiliary heater 9, they can be controlled. This makes it possible to uniformly heat the wafer, thereby obtaining a homogeneous epitaxial film and improving the film quality.Furthermore, the susceptor 6 itself can easily deposit a film on the pedestal, improving work efficiency.

なお本発明装置として、外径800鶴、高さ500龍の
大きさの場合、6インチ径のウェーハを一度に100〜
150枚程度にエピタキシャル成長せしめることが可能
であることが確認された。
In addition, in the case of an apparatus of the present invention having an outer diameter of 800 mm and a height of 500 mm, it is possible to handle 100 to 6 inch diameter wafers at a time.
It was confirmed that it was possible to epitaxially grow about 150 sheets.

また気相成長を50 Torr〜600 Torr程度
の減圧状態で行うとより効果的であることも確認された
It has also been confirmed that vapor phase growth is more effective when carried out at a reduced pressure of about 50 Torr to 600 Torr.

第3図は本発明に他の実施例を示すベルジャ内の構造の
一部を示す模式図であり、第1〜3図に示したのと同様
の回転板上の周縁部であって、且つ周方向の4箇所に、
炭化珪素等の耐熱材を素材として断面矩形状で一側面に
横向きの多数の凹溝15aを形成した架台たる支柱15
を、その凹溝15aを形成した側面を回転板の回動中心
側に向けて立設し、この複数の支柱15に渡す態様で円
環状のサセプタ16を多数段積みし、各サセプタ16上
にウェーハ17をilfせしめである。主ヒータ、補助
ヒータ、原料ガス用給気管、並びに回転板、ベルジャ等
の構成は第1〜3図に示す実施例と略同様であり、説明
を省略する。
FIG. 3 is a schematic diagram showing a part of the structure inside the bell jar showing another embodiment of the present invention, and is a peripheral portion on the rotary plate similar to that shown in FIGS. 1 to 3, and At four locations in the circumferential direction,
A support column 15 is made of a heat-resistant material such as silicon carbide and has a rectangular cross section with a large number of horizontal grooves 15a formed on one side.
is erected with the side surface on which the groove 15a is formed facing toward the center of rotation of the rotating plate, and a large number of annular susceptors 16 are stacked in such a manner that they extend over the plurality of supports 15, and each susceptor 16 is placed on top of each susceptor 16. The wafer 17 is subjected to ILF. The configurations of the main heater, auxiliary heater, raw material gas supply pipe, rotary plate, bell jar, etc. are substantially the same as those in the embodiment shown in FIGS. 1 to 3, and their explanation will be omitted.

このような実施例にあっては第1〜3図に示した実施例
の効果に加えてサセプタ面積が大きくなり、それだけ個
数が低減されて取扱いが容易となり、構成も簡略化され
る効果が得られる。
In addition to the effects of the embodiments shown in FIGS. 1 to 3, such an embodiment has the effect that the susceptor area is increased, the number of susceptors is reduced, and handling becomes easier, and the configuration is simplified. It will be done.

なお上述の各実施例はいずれもエピタキシャル成長装置
に本発明を通用した構成を示したが、何らこれに限るも
のではなく、例えば各種CVD(Chemical V
apor  旦apossition)にも適用し得る
ことは言うまでもない。
Although each of the above-mentioned embodiments shows a configuration in which the present invention is applied to an epitaxial growth apparatus, the present invention is not limited to this in any way.
Needless to say, it can also be applied to apor (apor position).

〔効果〕〔effect〕

以上の如く本発明装置にあっては多数のサセプタを段積
みすることができて一度に処理し得るウェーハ数が大幅
に増大し、作業効率が向上すると共に、サセプタ相互の
段積みによって輻射による均熱効果が高まり、例えばエ
ピタキシャル膜自体の品質向上も図れるなど本発明は優
れた効果を奏するものである。
As described above, in the apparatus of the present invention, a large number of susceptors can be stacked, and the number of wafers that can be processed at one time is greatly increased, improving work efficiency. The present invention has excellent effects such as enhanced thermal effects and improved quality of the epitaxial film itself, for example.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明装置の模式的横断面図、第2図は第1図
の■−■線による縦断面図、第3図は本発明の他の実施
例のベルジャ内の構成を示す部分斜視図、第4.5図は
いずれも従来装置の模式的縦断面図である。 1・・・基台 2・・・ベルジャ 3・・・水冷ジャケ
ット4・・・回転板 4a・・・軸部 5・・・架台 
5a・・・扇形部5c・・−凹溝 6・・・・・・サセ
プタ 7・・・ウェーハ8・・・主ヒータ 9・・・補
助ヒータ 10・・・給気管10a・・・吹出口 15
・・・支柱 17・・・サセプタ特 許 出願人  住
友金属工業株式会社代理人 弁理士  河  野  登
  夫=437= 穂牛l 第 5 口
FIG. 1 is a schematic cross-sectional view of the apparatus of the present invention, FIG. 2 is a vertical cross-sectional view taken along the line ■-■ in FIG. 1, and FIG. 3 is a portion showing the structure inside the bell jar of another embodiment of the present invention. Both the perspective view and FIG. 4.5 are schematic vertical sectional views of the conventional device. 1... Base 2... Bell jar 3... Water cooling jacket 4... Rotating plate 4a... Shaft part 5... Frame
5a...Sector-shaped portion 5c...-Concave groove 6...Susceptor 7...Wafer 8...Main heater 9...Auxiliary heater 10...Air supply pipe 10a...Blowout port 15
... Pillar 17 ... Susceptor patent Applicant Sumitomo Metal Industries Co., Ltd. Agent Patent attorney Noboru Kono = 437 = Hogyu l No. 5

Claims (1)

【特許請求の範囲】 1、ベルジヤに内装した水平回転板上に架台を用いて複
数のサセプタを相互の間に所要の間隔を隔て多段に配設
し、各サセプタ上面に半導体ウェーハを載置し得るよう
にしたことを特徴とする気相成長装置。 2、ベルジヤに内装した水平回転板上に架台を用いて複
数のサセプタを相互の間に所要の間隔を隔てて多段に配
設し、各サセプタ上面に半導体ウェーハを載置可能とす
ると共に、サセプタの回動域に臨ませて、原料ガス吹出
高さ位置を異ならせた複数の給気管を配設したことを特
徴とする気相成長装置。 3、ベルジヤに内装した水平回転板上に架台を用いて複
数の環状の、又は環状に並べたサセプタを相互の間に所
要の間隔を隔てて多段に配設し、各サセプタ上面に半導
体ウェーハを載置可能とすると共に、前記サセプタの回
動域に臨ませてその内、外に夫々ヒータを配設したこと
を特徴とする気相成長装置。
[Claims] 1. A plurality of susceptors are arranged in multiple stages with a required interval between them using a frame on a horizontal rotary plate installed in a bell gear, and a semiconductor wafer is placed on the top surface of each susceptor. A vapor phase growth apparatus characterized by: 2. A plurality of susceptors are arranged in multiple stages with a required interval between them using a frame on a horizontal rotary plate installed in the bell gear, and a semiconductor wafer can be placed on the top surface of each susceptor, and the susceptor A vapor phase growth apparatus characterized in that a plurality of air supply pipes facing the rotation range of the material gas and having different raw material gas blowing height positions are arranged. 3. A plurality of annular or annularly arranged susceptors are arranged in multiple stages with a required interval between them using a frame on a horizontal rotary plate installed in a bell gear, and a semiconductor wafer is placed on the top surface of each susceptor. A vapor phase growth apparatus characterized in that the susceptor can be placed on the susceptor, and heaters are disposed inside and outside the susceptor so as to face the rotation area of the susceptor.
JP25977784A 1984-12-07 1984-12-07 Vapor growth device Granted JPS61136676A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25977784A JPS61136676A (en) 1984-12-07 1984-12-07 Vapor growth device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25977784A JPS61136676A (en) 1984-12-07 1984-12-07 Vapor growth device

Publications (2)

Publication Number Publication Date
JPS61136676A true JPS61136676A (en) 1986-06-24
JPH037752B2 JPH037752B2 (en) 1991-02-04

Family

ID=17338826

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25977784A Granted JPS61136676A (en) 1984-12-07 1984-12-07 Vapor growth device

Country Status (1)

Country Link
JP (1) JPS61136676A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100269754A1 (en) * 2009-04-28 2010-10-28 Mitsubishi Materials Corporation Polycrystalline silicon reactor
JP2014500626A (en) * 2010-12-01 2014-01-09 北京北方▲微▼▲電▼子基地▲設▼▲備▼工▲芸▼研究中心有限▲責▼任公司 Tray device and crystal film growth apparatus
KR20160102897A (en) * 2015-02-23 2016-08-31 도쿄엘렉트론가부시키가이샤 Film formation device
US11390950B2 (en) * 2017-01-10 2022-07-19 Asm Ip Holding B.V. Reactor system and method to reduce residue buildup during a film deposition process

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5364682A (en) * 1976-11-19 1978-06-09 Rca Corp Chemical evaporation method and apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5364682A (en) * 1976-11-19 1978-06-09 Rca Corp Chemical evaporation method and apparatus

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20100269754A1 (en) * 2009-04-28 2010-10-28 Mitsubishi Materials Corporation Polycrystalline silicon reactor
US8540818B2 (en) * 2009-04-28 2013-09-24 Mitsubishi Materials Corporation Polycrystalline silicon reactor
JP2014500626A (en) * 2010-12-01 2014-01-09 北京北方▲微▼▲電▼子基地▲設▼▲備▼工▲芸▼研究中心有限▲責▼任公司 Tray device and crystal film growth apparatus
KR20160102897A (en) * 2015-02-23 2016-08-31 도쿄엘렉트론가부시키가이샤 Film formation device
JP2016157724A (en) * 2015-02-23 2016-09-01 東京エレクトロン株式会社 Deposition device
US10604837B2 (en) 2015-02-23 2020-03-31 Tokyo Electron Limited Film deposition apparatus
US11390950B2 (en) * 2017-01-10 2022-07-19 Asm Ip Holding B.V. Reactor system and method to reduce residue buildup during a film deposition process

Also Published As

Publication number Publication date
JPH037752B2 (en) 1991-02-04

Similar Documents

Publication Publication Date Title
US5595604A (en) Wafer supporting boat
JPS61136676A (en) Vapor growth device
KR940011099B1 (en) Vapour deposition apparatus
JPS63150912A (en) Formation of thin film and apparatus therefor
JP2003183098A (en) METHOD AND APPARATUS FOR PRODUCING SiC SINGLE CRYSTAL
JPS58169906A (en) Vapor growth device
JPH0246558B2 (en)
JP2012175020A (en) Substrate processing device
JPH0727870B2 (en) Low pressure vapor deposition method
JP2537563Y2 (en) Vertical vacuum deposition equipment
JPS59207622A (en) Semiconductor thin film vapor phase growth apparatus
JPH06349738A (en) Vertical low-pressure cvd device
JPH04154117A (en) Low pressure cvd system
JPS60152675A (en) Vertical diffusion furnace type vapor growth device
JP7417722B2 (en) Heating element for epitaxial growth equipment
JPH02146725A (en) Organic metal vapor growth device
JPH0736385B2 (en) Vapor phase growth equipment
JPH02212393A (en) Vapor growth method and its device
JPH09129553A (en) Vapor epitaxial growth method and device
JPH06349748A (en) Vapor growth device for semiconductor
JPS63300512A (en) Chemical vapor deposition apparatus
JPH0461117A (en) Single-wafer cvd device
JPS5972721A (en) Vapor phase growth device
JPH0614475Y2 (en) Semiconductor manufacturing equipment
JPH0627945Y2 (en) Thin film vapor deposition equipment