JPS61134683A - 集積化テスト回路 - Google Patents

集積化テスト回路

Info

Publication number
JPS61134683A
JPS61134683A JP59256419A JP25641984A JPS61134683A JP S61134683 A JPS61134683 A JP S61134683A JP 59256419 A JP59256419 A JP 59256419A JP 25641984 A JP25641984 A JP 25641984A JP S61134683 A JPS61134683 A JP S61134683A
Authority
JP
Japan
Prior art keywords
counter
output
signal
decoder
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59256419A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0518067B2 (OSRAM
Inventor
Toshiyuki Tanabe
田辺　俊行
Minoru Noguchi
稔 野口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Toshiba AVE Co Ltd
Original Assignee
Toshiba Corp
Toshiba Audio Video Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Audio Video Engineering Co Ltd filed Critical Toshiba Corp
Priority to JP59256419A priority Critical patent/JPS61134683A/ja
Publication of JPS61134683A publication Critical patent/JPS61134683A/ja
Publication of JPH0518067B2 publication Critical patent/JPH0518067B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP59256419A 1984-12-06 1984-12-06 集積化テスト回路 Granted JPS61134683A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59256419A JPS61134683A (ja) 1984-12-06 1984-12-06 集積化テスト回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59256419A JPS61134683A (ja) 1984-12-06 1984-12-06 集積化テスト回路

Publications (2)

Publication Number Publication Date
JPS61134683A true JPS61134683A (ja) 1986-06-21
JPH0518067B2 JPH0518067B2 (OSRAM) 1993-03-10

Family

ID=17292404

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59256419A Granted JPS61134683A (ja) 1984-12-06 1984-12-06 集積化テスト回路

Country Status (1)

Country Link
JP (1) JPS61134683A (OSRAM)

Also Published As

Publication number Publication date
JPH0518067B2 (OSRAM) 1993-03-10

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