JPS61132832A - Semiconductor pressure sensor - Google Patents

Semiconductor pressure sensor

Info

Publication number
JPS61132832A
JPS61132832A JP59254700A JP25470084A JPS61132832A JP S61132832 A JPS61132832 A JP S61132832A JP 59254700 A JP59254700 A JP 59254700A JP 25470084 A JP25470084 A JP 25470084A JP S61132832 A JPS61132832 A JP S61132832A
Authority
JP
Japan
Prior art keywords
base
pedestal
fixed
sensor
sensor body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59254700A
Other languages
Japanese (ja)
Inventor
Isao Nakano
中野 勇男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP59254700A priority Critical patent/JPS61132832A/en
Publication of JPS61132832A publication Critical patent/JPS61132832A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L19/00Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
    • G01L19/14Housings
    • G01L19/147Details about the mounting of the sensor to support or covering means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L19/00Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
    • G01L19/0007Fluidic connecting means
    • G01L19/0038Fluidic connecting means being part of the housing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L19/00Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
    • G01L19/0061Electrical connection means
    • G01L19/0084Electrical connection means to the outside of the housing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Measuring Fluid Pressure (AREA)
  • Pressure Sensors (AREA)

Abstract

PURPOSE:To absorb and soften a distortion caused by a temperature variation, to deteriorate no output characteristic of a sensor, and also to reduce the cost of manufacture and parts by providing a cylindrical supporting base and an annular pedestal on a base, and suspending and fixing a sensor body to this pedestal. CONSTITUTION:A cylindrical supporting base 3 consisting of stainless steel is fixed by using an adhesive agent onto a base 11 of a case 1 of a semiconductor pressure sensor, and thereafter, an annular pedestal 4 consisting of silicon is fixed to the upper end face of the supporting base 3. Subsequently, a sensor body 2 which has formed a piezo-resistance element 2c consisting of P type silicon is fixed in a suspending state by sticking the upper face of a base part 2b to the pedestal 4. In this way, even if a fluid to be measured or an ambient temperature is varied and the base 11 is brought to thermal expansion, a distortion transmitted to the sensor body 2 through the pedestal 4 is absorbed and softened remarkably, and also it is not required to provide a compensating resistance.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はピエゾ抵抗素子等の感圧素子を利用して主に気
体、液体等の流体圧力を検出する半導体圧力センサに関
するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a semiconductor pressure sensor that mainly detects the pressure of fluid such as gas or liquid using a pressure sensitive element such as a piezoresistive element.

〔従来技術〕[Prior art]

一般にこの種半導体圧力センサはシリコン製のダイヤフ
ラム部にピエゾ抵抗素子を設け、ダイヤフラム部の両側
領域の圧力差に起因してダイヤフラム部に生じた変形に
応じピエゾ抵抗素子の抵抗値が変化することを利用する
構成となっている。
Generally, this type of semiconductor pressure sensor has a piezoresistive element installed in a silicon diaphragm, and the resistance value of the piezoresistive element changes in response to deformation of the diaphragm due to a pressure difference between the two sides of the diaphragm. It is configured to be used.

第2図は従来の半導体圧力センナを示す断面構造図であ
り、ケース1を構成する基台11上に接着剤8を用いて
設置台9を固定し、この設置台9上にセンサ本体2を固
定し、このセンサ本体2をリード線4a、4bを介して
リードピン5a、5bに接続すると共に、これらを覆う
態様でキャップ12を基台11に嵌合固定しである。
FIG. 2 is a cross-sectional structural diagram showing a conventional semiconductor pressure sensor. An installation base 9 is fixed on a base 11 constituting a case 1 using an adhesive 8, and a sensor main body 2 is mounted on this installation base 9. The sensor main body 2 is connected to the lead pins 5a, 5b via the lead wires 4a, 4b, and the cap 12 is fitted and fixed to the base 11 so as to cover these.

基台11にはダイヤフラム部2aの片側領域Aに面する
部分に、圧力導入口11aが、またキャップ12の頂部
にはダイヤフラム部2aの他側の領域Bに面して圧力導
入管12aが連結せしめられている。
A pressure introduction port 11a is connected to the base 11 at a portion facing region A on one side of the diaphragm portion 2a, and a pressure introduction pipe 12a is connected to the top of the cap 12 facing region B on the other side of the diaphragm portion 2a. I'm being forced to do it.

−万センチ本体2は中央部を薄肉としてダイヤフラム部
2aを、また周縁部は厚肉として円環状基部2bを備え
たn型シリコン半導体基板におけるMit記ダイヤフラ
ム部2a表面の複数個所に不純物を拡散せしめてp型シ
リコンからなるピエゾ抵抗素子2cを形成して構成して
あり、円環状基部2bの下面を設置台9上に固定し、設
置台9と共に基台11上に固定されている。設置台9は
シリコン製であって、環状に形成され、温度変化に伴う
基台11とセンサ本体2との熱膨張係数の差による歪を
接着剤8と共に吸収緩和すべく設けられるものである(
特開昭59−102131号、特公昭55−1714号
)。
- In an n-type silicon semiconductor substrate, the main body 2 has a diaphragm part 2a with a thinner center part and an annular base part 2b with a thicker peripheral part, and impurities are diffused into multiple locations on the surface of the diaphragm part 2a. The lower surface of the annular base 2b is fixed on a mounting base 9, and together with the mounting base 9, it is fixed on a base 11. The installation stand 9 is made of silicon and has an annular shape, and is provided to absorb and alleviate strain caused by the difference in thermal expansion coefficient between the base 11 and the sensor body 2 due to temperature changes together with the adhesive 8.
JP-A-59-102131, JP-A-55-1714).

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところで上述した如き従来の半導体圧力センサにあって
は基台11とセンサ本体2との間の熱的歪の吸収緩和機
能が充分でな(センサ本体2の出力特性に変化が生じ検
出精度に著しい影響を与える不都合があった。
However, in the conventional semiconductor pressure sensor as described above, the function of absorbing and alleviating thermal strain between the base 11 and the sensor body 2 is insufficient (the output characteristics of the sensor body 2 change, resulting in a significant drop in detection accuracy). There were some inconveniences that affected me.

このため従来にあっては、ピエゾ抵抗素子と同様の圧力
特性を示す補償用抵抗をケース1の外部へ配設し、温度
変化による歪に基づく出力変動を解消する方法が採用さ
れている。
For this reason, a conventional method has been adopted in which a compensating resistor exhibiting pressure characteristics similar to those of the piezoresistive element is disposed outside the case 1 to eliminate output fluctuations due to distortion due to temperature changes.

しかしこのような方法を採用すると、部品コストが高く
なり、製造上の工数も増すなど、製品のコストアップは
免れないという問題があった。
However, when such a method is adopted, there are problems in that the cost of parts increases, the number of manufacturing steps increases, and the cost of the product inevitably increases.

〔問題点を解決するための手段〕[Means for solving problems]

本発明はかかる事情に鑑みなされたものであって、その
目的とするところは基台上に円筒状の支持台、または環
状の台座を介在させてセンサ本体を支持することにより
、熱的歪の吸収緩和機能を増大し、熱的歪が出力特性に
与える影響を格段に低減し得るようにした半導体圧力セ
ンサを提供するにある。
The present invention has been made in view of the above circumstances, and its purpose is to support the sensor body by interposing a cylindrical support stand or an annular support stand on the base, thereby reducing thermal strain. An object of the present invention is to provide a semiconductor pressure sensor that has an increased absorption and relaxation function and can significantly reduce the influence of thermal strain on output characteristics.

本発明に係る半導体圧力センサの特徴は、ピエゾ抵抗効
果を備える感圧素子を形成したダイヤフラム部を有する
センサ本体をケース内に固定した半導体圧力センサにお
いて、前記ケースの基台上に一端部を固定して立設され
た円筒状の支持台と、該支持台の他端に同心状に固定さ
れた環状の台座とを備え、前記センサ本体は、前記台座
の下面に吊下固定したことを特徴とする。
The semiconductor pressure sensor according to the present invention is characterized in that the semiconductor pressure sensor has a sensor main body having a diaphragm portion formed with a pressure-sensitive element having a piezoresistance effect fixed in a case, and one end portion is fixed on the base of the case. The sensor comprises a cylindrical support stand standing upright, and an annular pedestal concentrically fixed to the other end of the support stand, and the sensor body is suspended and fixed to the lower surface of the pedestal. shall be.

〔実施例〕〔Example〕

以下本発明をその実施例を示す図面に基づき具体的に説
明する。第1図は本発明に係る半導体圧力センサ(以下
本発明品という)の断面構造図であり、図中1はケース
、2はセンサ本体を示している・ ケース1は基台11.キャップ12からなり基台il上
に支持台39台Wi4を介在させてセンサ本体2を配設
すると共にこのセンサ本体2をリード線5a。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be specifically described below based on drawings showing embodiments thereof. FIG. 1 is a cross-sectional structural diagram of a semiconductor pressure sensor according to the present invention (hereinafter referred to as a product of the present invention), in which 1 indicates a case and 2 indicates a sensor body. Case 1 is a base 11. The sensor main body 2 is disposed on a base il consisting of a cap 12 with a support stand Wi4 interposed therebetween, and the sensor main body 2 is connected to a lead wire 5a.

5bを介してリードピン6a、5bに接続し、この状態
でセンサ本体2を覆うべくキャップ12を被せ、キャン
プ12の下端部周縁を基台11に外嵌固着して、相互に
一体的に結合されている。
5b to lead pins 6a and 5b, and in this state, cap 12 is placed to cover sensor body 2, and the lower end periphery of camp 12 is externally fitted and fixed to base 11, so that they are integrally connected to each other. ing.

基台11の中央部にはセンサ本体2のダイヤフラム部2
aで隔てられた一側領域Aに面して圧力導入孔11aが
開口され、また周縁部には気密状恕に複数のリードピン
6a、6bが貫通立設されている。
The diaphragm part 2 of the sensor body 2 is located in the center of the base 11.
A pressure introduction hole 11a is opened facing one side area A separated by a, and a plurality of lead pins 6a and 6b are erected through the peripheral edge in an airtight manner.

一方キャンプ12の頂部中央にはダイヤフラム部2aで
隔てられた他側の領域Bに面して圧力導入口12aが、
開口せしめられている。
On the other hand, in the center of the top of the camp 12, there is a pressure introduction port 12a facing the area B on the other side separated by the diaphragm part 2a.
It is forced to open.

支持台3はステンレス鋼を素材にして円筒状に形成され
ており、下端部は接着剤を用いて基台11の上面中央に
固定されている。また台座4はシリコンを素材にして円
環状に形成され外径は前記支持台3の外径とは略等しく
、また内径は支持台3のそれよりも小さく、−シかも軸
方向の下端から上端に向かうに従って拡径して構成され
下端面を接着剤を用いて支持台3の上端面に固定されて
いる。
The support stand 3 is made of stainless steel and has a cylindrical shape, and its lower end is fixed to the center of the upper surface of the base stand 11 using an adhesive. The pedestal 4 is made of silicon and is formed into an annular shape, and has an outer diameter that is approximately equal to the outer diameter of the support 3 and an inner diameter that is smaller than that of the support 3. The diameter of the support base 3 increases as the diameter increases towards the end, and the lower end surface is fixed to the upper end surface of the support base 3 using an adhesive.

センサ本体2は、n型シリコンを素材にして中央部を薄
肉に形成してダイヤフラム部2aを、また周縁部は厚肉
にして円環状基部2bを備えた半導体基板における前記
ダイヤフラム2aの表面の複数個所に不純物を拡散せし
めてp型シリコンからなるピエゾ抵抗素子2Cを形成し
て構成してあり、円環状基部2bの上面周縁部を台座4
に接着されて、台座3下に8垂した状態で固定されてい
る。
The sensor main body 2 is made of n-type silicon and has a thin center part to form a diaphragm part 2a, and a thick peripheral part to form a circular base part 2b. A piezoresistance element 2C made of p-type silicon is formed by diffusing impurities into locations, and the upper peripheral edge of the annular base 2b is connected to the pedestal 4.
It is glued to the pedestal 3 and fixed in a hanging state below the pedestal 3.

而して上述した如き本発明品にあっては、センサ本体2
におけるダイヤフラム部2aの両側領域A。
Therefore, in the product of the present invention as described above, the sensor body 2
Both side areas A of the diaphragm part 2a in .

8における圧力に差が生じると、これに伴ってダイヤフ
ラム部2aが変形し、この変形に応じてピエゾ抵抗素子
2cの抵抗値が変化し、この変化がリード線5a、5b
+リードピン6a、6bを通じて、圧力差として検出さ
れるようになっている。
When a difference occurs in the pressure at 8, the diaphragm portion 2a deforms accordingly, and the resistance value of the piezoresistive element 2c changes in accordance with this deformation, and this change causes the lead wires 5a, 5b to change.
It is detected as a pressure difference through the + lead pins 6a and 6b.

そしてこのような本発明品において被測定流体である気
体、液体、或いは周辺雰囲気の温度が変化したような場
合、これに伴って基台11は熱膨張するがその厚さ方向
への変化はセンサ本体2の上。
In such a product of the present invention, when the temperature of the fluid to be measured, such as gas or liquid, or the surrounding atmosphere changes, the base 11 thermally expands, but the change in the thickness direction is not detected by the sensor. On top of main body 2.

下方向位置を変化させるのみで何ら出力特性に影響を与
えることがなく、また基台11の直径方向への変化は、
支持台3の下端部に拡径又は縮径する力を及ぼすが、支
持台3は円形をなしているため、このような一端部への
拡径、又は縮径する向きの外力に対する変形抵抗は強く
、しかもたとえ変形が生じたとしても他端部側では、そ
の変形が著しく低減される結果、台座4を通じてセンサ
本体2に伝わる歪は大幅に吸収緩和されセンサ本体2の
出力特性に与える影響を格段に低減し得ることとなり、
従来の如き補償抵抗を必要としない。
Changing only the downward position does not affect the output characteristics in any way, and changing the base 11 in the diametrical direction
A force to expand or contract the diameter is exerted on the lower end of the support base 3, but since the support base 3 has a circular shape, the deformation resistance against such an external force in the direction of expanding or contracting the diameter at one end is Moreover, even if deformation occurs, the deformation is significantly reduced on the other end side, and as a result, the strain transmitted to the sensor body 2 through the pedestal 4 is largely absorbed and alleviated, and its influence on the output characteristics of the sensor body 2 is reduced. This can be significantly reduced,
No compensation resistor is required as in the prior art.

〔効果〕〔effect〕

以上の如く本発明品にあっては、基台上に円筒状の支持
台を立設し、この支持台上に環状の台座を固定し、台座
の下部にセンサ本体を吊型固定する構成としてから、基
台とセンサ本体との熱膨張係数に差が存在し、温度変化
に伴って基台に変形が生じても、支持台1台座を経てセ
ンサ本体に伝達される歪は著しく吸収緩和され、センサ
本体の出力特性を劣化させることがなく補償抵抗が不要
で製造コスト、部品コストの低減が図れ、しかも測定精
度に何ら影響を与えないなど、本発明は優れた効果を奏
するものである。
As described above, the product of the present invention has a structure in which a cylindrical support is erected on the base, an annular pedestal is fixed on the support, and the sensor body is fixed in a suspended manner at the bottom of the pedestal. Therefore, there is a difference in the coefficient of thermal expansion between the base and the sensor body, and even if the base deforms due to temperature changes, the strain transmitted to the sensor body through the support base is significantly absorbed and alleviated. The present invention has excellent effects such as not deteriorating the output characteristics of the sensor body, eliminating the need for a compensation resistor, reducing manufacturing costs and component costs, and having no effect on measurement accuracy.

4、  [ii!1面の簡単な説明 第1図は本発明品の断面構造図、第2図は従来品の断面
構造図である。
4, [ii! Brief Explanation of Part 1 FIG. 1 is a cross-sectional structural diagram of the product of the present invention, and FIG. 2 is a cross-sectional structural diagram of a conventional product.

■・・・ケース 2・・・センナ本体 2a・・・ダイ
ヤフラム部 2b・・・円環状基部 2c・・・ピエゾ
抵抗素子3・・・支持台 4・・・台座 5a、5b・
・・リード線6a、6b・・・リードピン 11・・・
基台 11a・・・圧力導入口 12・・・キャップ 
12a・・・圧力導入ロ特 許 出願人  三洋電機株
式会社 代理人 弁理士  河 野  登 夫 第 l 図 第 2 図
■...Case 2...Senna main body 2a...Diaphragm portion 2b...Annular base 2c...Piezo resistance element 3...Support stand 4...Pedestal 5a, 5b.
...Lead wires 6a, 6b...Lead pin 11...
Base 11a...Pressure inlet 12...Cap
12a...Pressure introduction patent Applicant: Sanyo Electric Co., Ltd. Agent Patent attorney: Noboru Kono Figure 2

Claims (1)

【特許請求の範囲】[Claims] 1、ピエゾ抵抗効果を備える感圧素子を形成したダイヤ
フラム部を有するセンサ本体をケース内に固定した半導
体圧力センサにおいて、前記ケースの基台上に一端部を
固定して立設された円筒状の支持台と、該支持台の他端
に同心状に固定された環状の台座とを備え、前記センサ
本体は、前記台座の下面に吊下固定したことを特徴とす
る半導体圧力センサ。
1. In a semiconductor pressure sensor in which a sensor body having a diaphragm portion formed with a pressure-sensitive element having a piezoresistance effect is fixed in a case, a cylindrical pressure sensor with one end fixed to the base of the case is provided. 1. A semiconductor pressure sensor comprising a support stand and an annular pedestal concentrically fixed to the other end of the support stand, wherein the sensor main body is suspended and fixed to the lower surface of the pedestal.
JP59254700A 1984-11-30 1984-11-30 Semiconductor pressure sensor Pending JPS61132832A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59254700A JPS61132832A (en) 1984-11-30 1984-11-30 Semiconductor pressure sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59254700A JPS61132832A (en) 1984-11-30 1984-11-30 Semiconductor pressure sensor

Publications (1)

Publication Number Publication Date
JPS61132832A true JPS61132832A (en) 1986-06-20

Family

ID=17268639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59254700A Pending JPS61132832A (en) 1984-11-30 1984-11-30 Semiconductor pressure sensor

Country Status (1)

Country Link
JP (1) JPS61132832A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000033047A1 (en) * 1998-12-02 2000-06-08 Impella Cardiotechnik Ag Pressure sensor
WO2004057290A1 (en) 2002-12-19 2004-07-08 Robert Bosch Gmbh (high) pressure sensor featuring pressure loading of the fastening element
JP2009218606A (en) * 1992-04-08 2009-09-24 Taiwan Semiconductor Manufacturing Co Ltd Manufacture of membrane dielectric insulation ic

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009218606A (en) * 1992-04-08 2009-09-24 Taiwan Semiconductor Manufacturing Co Ltd Manufacture of membrane dielectric insulation ic
JP4648979B2 (en) * 1992-04-08 2011-03-09 台湾積體電路製造股▲ふん▼有限公司 Insulating layer separation IC manufacturing
WO2000033047A1 (en) * 1998-12-02 2000-06-08 Impella Cardiotechnik Ag Pressure sensor
AU758052B2 (en) * 1998-12-02 2003-03-13 Impella Cardiotechnik Ag Pressure sensor
US6644125B1 (en) 1998-12-02 2003-11-11 Impella Cardiotechnik Ag Pressure sensor
WO2004057290A1 (en) 2002-12-19 2004-07-08 Robert Bosch Gmbh (high) pressure sensor featuring pressure loading of the fastening element
US7343806B2 (en) 2002-12-19 2008-03-18 Robert Bosch Gmbh Pressure sensor featuring pressure loading of the fastening element

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