JPS61132814A - マ−キング検査方法 - Google Patents
マ−キング検査方法Info
- Publication number
- JPS61132814A JPS61132814A JP25440184A JP25440184A JPS61132814A JP S61132814 A JPS61132814 A JP S61132814A JP 25440184 A JP25440184 A JP 25440184A JP 25440184 A JP25440184 A JP 25440184A JP S61132814 A JPS61132814 A JP S61132814A
- Authority
- JP
- Japan
- Prior art keywords
- light
- marking
- sensor
- fixed position
- diode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 3
- 239000003973 paint Substances 0.000 claims abstract description 5
- 230000002093 peripheral effect Effects 0.000 claims abstract description 5
- 238000007689 inspection Methods 0.000 claims description 2
- 239000011521 glass Substances 0.000 abstract description 11
- 238000009826 distribution Methods 0.000 abstract description 3
- 238000001514 detection method Methods 0.000 abstract 1
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 239000008188 pellet Substances 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 3
- 238000003909 pattern recognition Methods 0.000 description 2
- 238000011179 visual inspection Methods 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000740 bleeding effect Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25440184A JPS61132814A (ja) | 1984-11-30 | 1984-11-30 | マ−キング検査方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25440184A JPS61132814A (ja) | 1984-11-30 | 1984-11-30 | マ−キング検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61132814A true JPS61132814A (ja) | 1986-06-20 |
JPH0449888B2 JPH0449888B2 (enrdf_load_stackoverflow) | 1992-08-12 |
Family
ID=17264463
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25440184A Granted JPS61132814A (ja) | 1984-11-30 | 1984-11-30 | マ−キング検査方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61132814A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0575656U (ja) * | 1992-03-17 | 1993-10-15 | 太陽誘電株式会社 | 電子部品の外観検査装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58216906A (ja) * | 1983-05-12 | 1983-12-16 | Toyo Glass Kk | びん方向自動検査方法 |
-
1984
- 1984-11-30 JP JP25440184A patent/JPS61132814A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58216906A (ja) * | 1983-05-12 | 1983-12-16 | Toyo Glass Kk | びん方向自動検査方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0575656U (ja) * | 1992-03-17 | 1993-10-15 | 太陽誘電株式会社 | 電子部品の外観検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0449888B2 (enrdf_load_stackoverflow) | 1992-08-12 |
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