JPS61132814A - マ−キング検査方法 - Google Patents

マ−キング検査方法

Info

Publication number
JPS61132814A
JPS61132814A JP25440184A JP25440184A JPS61132814A JP S61132814 A JPS61132814 A JP S61132814A JP 25440184 A JP25440184 A JP 25440184A JP 25440184 A JP25440184 A JP 25440184A JP S61132814 A JPS61132814 A JP S61132814A
Authority
JP
Japan
Prior art keywords
light
marking
sensor
fixed position
diode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP25440184A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0449888B2 (enrdf_load_stackoverflow
Inventor
Takanobu Miura
三浦 孝信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Original Assignee
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Semiconductor Manufacturing Co Ltd, Kansai Nippon Electric Co Ltd filed Critical Renesas Semiconductor Manufacturing Co Ltd
Priority to JP25440184A priority Critical patent/JPS61132814A/ja
Publication of JPS61132814A publication Critical patent/JPS61132814A/ja
Publication of JPH0449888B2 publication Critical patent/JPH0449888B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP25440184A 1984-11-30 1984-11-30 マ−キング検査方法 Granted JPS61132814A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25440184A JPS61132814A (ja) 1984-11-30 1984-11-30 マ−キング検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25440184A JPS61132814A (ja) 1984-11-30 1984-11-30 マ−キング検査方法

Publications (2)

Publication Number Publication Date
JPS61132814A true JPS61132814A (ja) 1986-06-20
JPH0449888B2 JPH0449888B2 (enrdf_load_stackoverflow) 1992-08-12

Family

ID=17264463

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25440184A Granted JPS61132814A (ja) 1984-11-30 1984-11-30 マ−キング検査方法

Country Status (1)

Country Link
JP (1) JPS61132814A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0575656U (ja) * 1992-03-17 1993-10-15 太陽誘電株式会社 電子部品の外観検査装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58216906A (ja) * 1983-05-12 1983-12-16 Toyo Glass Kk びん方向自動検査方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58216906A (ja) * 1983-05-12 1983-12-16 Toyo Glass Kk びん方向自動検査方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0575656U (ja) * 1992-03-17 1993-10-15 太陽誘電株式会社 電子部品の外観検査装置

Also Published As

Publication number Publication date
JPH0449888B2 (enrdf_load_stackoverflow) 1992-08-12

Similar Documents

Publication Publication Date Title
US4555635A (en) Surface flaw inspection apparatus for a convex body
US3814946A (en) Method of detecting defects in transparent and semitransparent bodies
KR100363150B1 (ko) 용기끝치수파라미터의광학적검사
CN1199040C (zh) 容器密封表面区域的检测
CA1245200A (en) Lighting device for inspecting objects for flaws
US4483615A (en) Method and apparatus for detecting checks in glass tubes
US4775889A (en) Bottle mouth defect inspection apparatus
US4025202A (en) Method and apparatus for inspecting the bottoms of hollow glass articles
CN101952712A (zh) 用于光学检测圆线材表面缺陷的设备和方法
JPH01253642A (ja) ガラス容器の密閉面を光学的に検査する装置
MXPA01000658A (es) Inspeccion del area superficial de sellado de un recipiente.
JPH0520150B2 (enrdf_load_stackoverflow)
JP4630945B1 (ja) 欠陥検査装置
JPS61132814A (ja) マ−キング検査方法
JPH11304724A (ja) 光透過性シートの穴検出装置及び穴検出方法
KR0147600B1 (ko) 음극선관 패널의 결함 검사장치
KR0183713B1 (ko) 음극선관 패널 결함 검사장치
JP3505655B2 (ja) ガラス容器検査装置
JP2006242814A (ja) 表面検査装置
KR0150990B1 (ko) 음극선관의 패널 검사장치
JP3142494U (ja) 暗視野照明検出装置
JP2000193607A (ja) 壜の欠陥検査方法および装置
CA1061879A (en) Glassware bottom inspector
JP3938310B2 (ja) 検査用画像処理装置
JPH0431753A (ja) 異物検査装置