JPS61129179U - - Google Patents
Info
- Publication number
- JPS61129179U JPS61129179U JP1223285U JP1223285U JPS61129179U JP S61129179 U JPS61129179 U JP S61129179U JP 1223285 U JP1223285 U JP 1223285U JP 1223285 U JP1223285 U JP 1223285U JP S61129179 U JPS61129179 U JP S61129179U
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- short circuit
- test
- gate
- applying
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims description 7
- 230000002950 deficient Effects 0.000 claims 2
- 238000010998 test method Methods 0.000 claims 2
- 238000001514 detection method Methods 0.000 claims 1
- 238000011990 functional testing Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1223285U JPS61129179U (enExample) | 1985-02-01 | 1985-02-01 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1223285U JPS61129179U (enExample) | 1985-02-01 | 1985-02-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61129179U true JPS61129179U (enExample) | 1986-08-13 |
Family
ID=30495100
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1223285U Pending JPS61129179U (enExample) | 1985-02-01 | 1985-02-01 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61129179U (enExample) |
-
1985
- 1985-02-01 JP JP1223285U patent/JPS61129179U/ja active Pending
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