JPS6112239U - Measurement unit of IC test equipment - Google Patents
Measurement unit of IC test equipmentInfo
- Publication number
- JPS6112239U JPS6112239U JP9564184U JP9564184U JPS6112239U JP S6112239 U JPS6112239 U JP S6112239U JP 9564184 U JP9564184 U JP 9564184U JP 9564184 U JP9564184 U JP 9564184U JP S6112239 U JPS6112239 U JP S6112239U
- Authority
- JP
- Japan
- Prior art keywords
- sliding surface
- measurement unit
- auxiliary stopper
- test equipment
- stopper
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Special Conveying (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Chutes (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【図面の簡単な説明】
第１図はこの考案による測定子ニットの要部を示す側面
図、第２図はその正面図、第３図は滑走面と補助ストツ
パとの関係を示す斜視図、第４図は補助ストッパの各種
形状を示す図、第５図はＩＣ試験装置の一般的構成を示
す側面図、第６図は第５図の斜視図、第７図は従来のＩ
Ｃ試験装置の測定ユニットのこの考案に関連した部分を
示す．正面図である。
１６：ＩＣ素子、３１：レール、３１ａ：滑走面、５１
：測定位置、５３：ＩＣストツパ、６１：補助ストツパ
、６２：係合部、６４：回動アーム、６５：コイルスプ
リング、６６：空気シリンダ、６８：取付部、７１：基
板。[Brief Description of the Drawings] Fig. 1 is a side view showing the main parts of the measuring head knit according to this invention, Fig. 2 is a front view thereof, Fig. 3 is a perspective view showing the relationship between the sliding surface and the auxiliary stopper, Fig. 4 is a diagram showing various shapes of the auxiliary stopper, Fig. 5 is a side view showing the general configuration of the IC test device, Fig. 6 is a perspective view of Fig. 5, and Fig. 7 is a conventional I
This section shows the parts of the measurement unit of the C test device that are related to this invention. It is a front view. 16: IC element, 31: Rail, 31a: Sliding surface, 51
: measurement position, 53: IC stopper, 61: auxiliary stopper, 62: engaging part, 64: rotating arm, 65: coil spring, 66: air cylinder, 68: mounting part, 71: board.
Claims (1)
補助ストツパによりＩＣ素子を停止させた後、その補助
ストツパによる停止を解除して再び落下させてＩＣスト
ツパで所定の測定位置にＩＣ素子を停止させて測定を行
うＩＣ試験装置の測定ユニットにおいて、上記補助スト
ツパは上記レールのＩＣ滑走面と対向して斜めに延長し
、その上端に近づく程滑走面から離れ、その下端は上記
滑走面側に突出して係合部とされ、その保合部は上記滑
走面に形成された凹部内に位置されていることを特徴と
するＩＣ試験装置の測定ユニット。Drop the IC device along the rail, stop the IC device with an auxiliary stopper just before the measurement position, release the stop by the auxiliary stopper, drop it again, and place the IC device at the predetermined measurement position with the IC stopper. In a measurement unit of an IC testing device that performs measurements while stopped, the auxiliary stopper extends obliquely facing the IC sliding surface of the rail, and the closer it gets to its upper end, the farther away it is from the sliding surface, and its lower end is on the side of the sliding surface. A measuring unit for an IC testing apparatus, characterized in that the engaging part is protruded from the sliding surface, and the retaining part is located in a recess formed in the sliding surface.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9564184U JPS6112239U (en) | 1984-06-25 | 1984-06-25 | Measurement unit of IC test equipment |
| US06/747,560 US4691831A (en) | 1984-06-25 | 1985-06-21 | IC test equipment |
| EP85107793A EP0166409B1 (en) | 1984-06-25 | 1985-06-24 | Ic test equipment |
| DE8585107793T DE3582752D1 (en) | 1984-06-25 | 1985-06-24 | TEST DEVICE FOR INTEGRATED CIRCUITS. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9564184U JPS6112239U (en) | 1984-06-25 | 1984-06-25 | Measurement unit of IC test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6112239U true JPS6112239U (en) | 1986-01-24 |
Family
ID=30654871
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9564184U Pending JPS6112239U (en) | 1984-06-25 | 1984-06-25 | Measurement unit of IC test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6112239U (en) |
-
1984
- 1984-06-25 JP JP9564184U patent/JPS6112239U/en active Pending
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