JPS6111920B2 - - Google Patents
Info
- Publication number
- JPS6111920B2 JPS6111920B2 JP57050032A JP5003282A JPS6111920B2 JP S6111920 B2 JPS6111920 B2 JP S6111920B2 JP 57050032 A JP57050032 A JP 57050032A JP 5003282 A JP5003282 A JP 5003282A JP S6111920 B2 JPS6111920 B2 JP S6111920B2
- Authority
- JP
- Japan
- Prior art keywords
- pressure
- melt
- gaas
- single crystal
- crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 claims description 61
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims description 54
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 53
- 239000012535 impurity Substances 0.000 claims description 24
- 239000000155 melt Substances 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 20
- 238000004519 manufacturing process Methods 0.000 claims description 15
- 238000007789 sealing Methods 0.000 claims description 7
- 230000008018 melting Effects 0.000 claims description 6
- 238000002844 melting Methods 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 5
- 239000000565 sealant Substances 0.000 claims description 5
- 229910052810 boron oxide Inorganic materials 0.000 claims description 3
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 claims description 3
- 239000003795 chemical substances by application Substances 0.000 claims 1
- 229910052804 chromium Inorganic materials 0.000 description 9
- 239000011651 chromium Substances 0.000 description 9
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 8
- 239000000463 material Substances 0.000 description 6
- 229910052785 arsenic Inorganic materials 0.000 description 5
- 229910052733 gallium Inorganic materials 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 3
- 229910052796 boron Inorganic materials 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 238000000746 purification Methods 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000005693 optoelectronics Effects 0.000 description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000036772 blood pressure Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000009828 non-uniform distribution Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000007670 refining Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B27/00—Single-crystal growth under a protective fluid
- C30B27/02—Single-crystal growth under a protective fluid by pulling from a melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/42—Gallium arsenide
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57050032A JPS58167500A (ja) | 1982-03-30 | 1982-03-30 | ガリウム砒素単結晶の製造方法 |
US06/455,734 US4496424A (en) | 1982-03-30 | 1983-01-05 | Method for manufacture of III-V compound semiconducting single crystal |
GB08302441A GB2120954B (en) | 1982-03-30 | 1983-01-28 | Reducing impurity levels in pulled single crystals |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57050032A JPS58167500A (ja) | 1982-03-30 | 1982-03-30 | ガリウム砒素単結晶の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58167500A JPS58167500A (ja) | 1983-10-03 |
JPS6111920B2 true JPS6111920B2 (ko) | 1986-04-05 |
Family
ID=12847650
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57050032A Granted JPS58167500A (ja) | 1982-03-30 | 1982-03-30 | ガリウム砒素単結晶の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58167500A (ko) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4941088B2 (ja) * | 2007-05-14 | 2012-05-30 | 住友金属工業株式会社 | 単結晶の製造方法および製造装置 |
JP5052493B2 (ja) * | 2008-12-29 | 2012-10-17 | ジャパンスーパークォーツ株式会社 | シリコン単結晶の製造方法 |
JP5480036B2 (ja) * | 2010-03-03 | 2014-04-23 | グローバルウェーハズ・ジャパン株式会社 | シリコン単結晶の製造方法 |
-
1982
- 1982-03-30 JP JP57050032A patent/JPS58167500A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58167500A (ja) | 1983-10-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4147599B2 (ja) | シリコン単結晶及びその製造方法 | |
JPS61163188A (ja) | シリコン単結晶引上法における不純物のド−プ方法 | |
US4496424A (en) | Method for manufacture of III-V compound semiconducting single crystal | |
US4637854A (en) | Method for producing GaAs single crystal | |
JPS6111920B2 (ko) | ||
EP0355833B1 (en) | Method of producing compound semiconductor single crystal | |
JPH0246560B2 (ko) | ||
JP2720274B2 (ja) | 単結晶引上げ方法 | |
JPS606918B2 (ja) | 3−5族化合物単結晶の製造方法 | |
Kremer et al. | Low dislocation density GaAs grown by the vertical Bridgman technique | |
JPH0825835B2 (ja) | 単結晶引上げ装置 | |
JP4200690B2 (ja) | GaAsウェハの製造方法 | |
JPH0341432B2 (ko) | ||
JPS59131597A (ja) | 高品質ガリウム砒素単結晶の製造方法 | |
JPS6117489A (ja) | シリコン単結晶の製造方法 | |
JPH0124760B2 (ko) | ||
JPH0735319B2 (ja) | 珪素添加ガリウム砒素単結晶の製造方法 | |
JPH0527500Y2 (ko) | ||
JPS6058198B2 (ja) | 単結晶の製造方法 | |
JPS58167499A (ja) | ガリウム砒素単結晶の製造方法 | |
Talyzin et al. | The Preparation and Properties of Indium Phosphide | |
JPS6065794A (ja) | 高品質ガリウム砒素単結晶の製造方法 | |
JPH0615439B2 (ja) | ▲iii▼−▲v▼族化合物半導体単結晶の製造方法 | |
JPS60127287A (ja) | GaAs単結晶の製造方法 | |
JPH0359039B2 (ko) |