JPS61110064A - 回路定数測定器 - Google Patents

回路定数測定器

Info

Publication number
JPS61110064A
JPS61110064A JP59232224A JP23222484A JPS61110064A JP S61110064 A JPS61110064 A JP S61110064A JP 59232224 A JP59232224 A JP 59232224A JP 23222484 A JP23222484 A JP 23222484A JP S61110064 A JPS61110064 A JP S61110064A
Authority
JP
Japan
Prior art keywords
voltage
amplifier
terminal
sample
resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59232224A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0456949B2 (en:Method
Inventor
Giyuntaa Batsuha Haintsu
ハインツ・ギユンター・バツハ
Doresuraa Borufugangu
ボルフガング・ドレスラー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Priority to JP59232224A priority Critical patent/JPS61110064A/ja
Priority to US06/792,939 priority patent/US4733173A/en
Priority to EP85113911A priority patent/EP0183996B1/en
Priority to DE8585113911T priority patent/DE3580836D1/de
Publication of JPS61110064A publication Critical patent/JPS61110064A/ja
Publication of JPH0456949B2 publication Critical patent/JPH0456949B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP59232224A 1984-11-02 1984-11-02 回路定数測定器 Granted JPS61110064A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP59232224A JPS61110064A (ja) 1984-11-02 1984-11-02 回路定数測定器
US06/792,939 US4733173A (en) 1984-11-02 1985-10-30 Electronic component measurement apparatus
EP85113911A EP0183996B1 (en) 1984-11-02 1985-10-31 Apparatus for measuring an ac electrical parameter of a device
DE8585113911T DE3580836D1 (de) 1984-11-02 1985-10-31 Apparatur zum messen eines wechselstromparameters einer anordnung.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59232224A JPS61110064A (ja) 1984-11-02 1984-11-02 回路定数測定器

Publications (2)

Publication Number Publication Date
JPS61110064A true JPS61110064A (ja) 1986-05-28
JPH0456949B2 JPH0456949B2 (en:Method) 1992-09-10

Family

ID=16935922

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59232224A Granted JPS61110064A (ja) 1984-11-02 1984-11-02 回路定数測定器

Country Status (4)

Country Link
US (1) US4733173A (en:Method)
EP (1) EP0183996B1 (en:Method)
JP (1) JPS61110064A (en:Method)
DE (1) DE3580836D1 (en:Method)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63168868U (en:Method) * 1987-04-23 1988-11-02
JPH026268U (en:Method) * 1988-06-28 1990-01-16
JP2945015B2 (ja) * 1988-07-06 1999-09-06 日本ヒューレット・パッカード株式会社 直流バイアス印加装置
JP3119335B2 (ja) * 1994-03-08 2000-12-18 横河電機株式会社 Ｉｃ試験装置
JP5774386B2 (ja) * 2011-06-28 2015-09-09 日置電機株式会社 インピーダンス測定装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE224956C (en:Method) *
SU473131A1 (ru) * 1973-03-23 1975-06-05 Ленинградский Ордена Ленина Институт Инженеров Железнодорожного Транспорта Им. Академика В.Н.Образцова Устройство дл измерени и контрол максимально допустимого тока полупроводниковых приборов в режиме лавинного пробо
JPS5717032A (en) * 1980-07-07 1982-01-28 Hitachi Ltd Load testing system of direct current power supply device
SU970263A1 (ru) * 1981-04-10 1982-10-30 Предприятие П/Я Р-6891 Устройство дл допускового контрол емкости конденсатора и активного сопротивлени
US4438498A (en) * 1981-07-13 1984-03-20 Tektronix, Inc. Power supply output monitoring method and apparatus
JPS59119283A (ja) * 1982-12-27 1984-07-10 Toshiba Corp 半導体素子の評価装置

Also Published As

Publication number Publication date
JPH0456949B2 (en:Method) 1992-09-10
EP0183996A2 (en) 1986-06-11
DE3580836D1 (de) 1991-01-17
EP0183996B1 (en) 1990-12-05
EP0183996A3 (en) 1987-09-02
US4733173A (en) 1988-03-22

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