JPS61105473A - レ−ザ−ダイオ−ド検査装置 - Google Patents

レ−ザ−ダイオ−ド検査装置

Info

Publication number
JPS61105473A
JPS61105473A JP22748684A JP22748684A JPS61105473A JP S61105473 A JPS61105473 A JP S61105473A JP 22748684 A JP22748684 A JP 22748684A JP 22748684 A JP22748684 A JP 22748684A JP S61105473 A JPS61105473 A JP S61105473A
Authority
JP
Japan
Prior art keywords
laser diode
bottom plate
holder
upper lid
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22748684A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0431067B2 (enExample
Inventor
Keiichi Morishita
森下　恵市
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daito Denshi Kogyo Kk
Original Assignee
Daito Denshi Kogyo Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daito Denshi Kogyo Kk filed Critical Daito Denshi Kogyo Kk
Priority to JP22748684A priority Critical patent/JPS61105473A/ja
Publication of JPS61105473A publication Critical patent/JPS61105473A/ja
Publication of JPH0431067B2 publication Critical patent/JPH0431067B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP22748684A 1984-10-29 1984-10-29 レ−ザ−ダイオ−ド検査装置 Granted JPS61105473A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22748684A JPS61105473A (ja) 1984-10-29 1984-10-29 レ−ザ−ダイオ−ド検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22748684A JPS61105473A (ja) 1984-10-29 1984-10-29 レ−ザ−ダイオ−ド検査装置

Publications (2)

Publication Number Publication Date
JPS61105473A true JPS61105473A (ja) 1986-05-23
JPH0431067B2 JPH0431067B2 (enExample) 1992-05-25

Family

ID=16861638

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22748684A Granted JPS61105473A (ja) 1984-10-29 1984-10-29 レ−ザ−ダイオ−ド検査装置

Country Status (1)

Country Link
JP (1) JPS61105473A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63281078A (ja) * 1987-05-13 1988-11-17 Daito Denshi Kogyo Kk 半導体素子のエ−ジング検査装置
JPH03104965U (enExample) * 1990-02-13 1991-10-30
JP2005121625A (ja) * 2003-09-24 2005-05-12 Sharp Corp バーンイン装置
JP2012237645A (ja) * 2011-05-11 2012-12-06 Sharp Corp 半導体検査装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5128190A (enExample) * 1974-07-01 1976-03-09 Snam Progetti
JPS56128590U (enExample) * 1980-02-29 1981-09-30
JPS5815837U (ja) * 1981-07-22 1983-01-31 中尾　重春 コンクリ−トブロツク煙筒

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5128190A (enExample) * 1974-07-01 1976-03-09 Snam Progetti
JPS56128590U (enExample) * 1980-02-29 1981-09-30
JPS5815837U (ja) * 1981-07-22 1983-01-31 中尾　重春 コンクリ−トブロツク煙筒

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63281078A (ja) * 1987-05-13 1988-11-17 Daito Denshi Kogyo Kk 半導体素子のエ−ジング検査装置
JPH03104965U (enExample) * 1990-02-13 1991-10-30
JP2005121625A (ja) * 2003-09-24 2005-05-12 Sharp Corp バーンイン装置
JP2012237645A (ja) * 2011-05-11 2012-12-06 Sharp Corp 半導体検査装置

Also Published As

Publication number Publication date
JPH0431067B2 (enExample) 1992-05-25

Similar Documents

Publication Publication Date Title
US4352061A (en) Universal test fixture employing interchangeable wired personalizers
US4647124A (en) Electrical connector for interconnecting arrays of conductive areas
US6220870B1 (en) IC chip socket and method
US4746861A (en) Test fixture for printed circuit board assembly
US7566237B2 (en) Actuator member for socket connector
KR100221951B1 (ko) Ic핸들러의 테스트부
EP0258312B1 (en) Mounting arrangement for solid state devices
US5180974A (en) Semiconductor testing and shipping system
CN109690328B (zh) 测试装置
US4222622A (en) Electrical connector for circuit board
WO1983002527A1 (en) Holding device for an integrated circuit chip
US5057904A (en) Socket unit for package having pins and pads
US7161805B2 (en) Latch means for socket connector assembly
US10903618B2 (en) Fixture assembly for testing edge-emitting laser diodes and testing apparatus having the same
US4986760A (en) Socket for tab burn-in and test
EP0138325B1 (en) Chip carrier connector
JPS5950551A (ja) 集積回路素子テスト用のソケット
JPS61105473A (ja) レ−ザ−ダイオ−ド検査装置
TWI808165B (zh) 用於測試邊射型雷射二極體之治具組件及具備該組件之測試設備
JPS62128463A (ja) コネクタ
CA2015757C (en) Tool for semiconductor chip removal
US7121858B2 (en) Socket for ball grid array devices
JPWO2001073869A1 (ja) バッテリ
US4986778A (en) Carrier for use in testing circuit boards
US4693303A (en) Liquid cooling module with springy contact elements and an aperture plate slidable thereover

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term