JPS609347B2 - Method for separating chipped pellets around semiconductor wafers - Google Patents

Method for separating chipped pellets around semiconductor wafers

Info

Publication number
JPS609347B2
JPS609347B2 JP56136540A JP13654081A JPS609347B2 JP S609347 B2 JPS609347 B2 JP S609347B2 JP 56136540 A JP56136540 A JP 56136540A JP 13654081 A JP13654081 A JP 13654081A JP S609347 B2 JPS609347 B2 JP S609347B2
Authority
JP
Japan
Prior art keywords
pellets
semiconductor wafer
semiconductor
chipped
adhesive tape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56136540A
Other languages
Japanese (ja)
Other versions
JPS5837932A (en
Inventor
逸雄 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON INTAANASHONARU SEIRYUKI KK
Original Assignee
NIPPON INTAANASHONARU SEIRYUKI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON INTAANASHONARU SEIRYUKI KK filed Critical NIPPON INTAANASHONARU SEIRYUKI KK
Priority to JP56136540A priority Critical patent/JPS609347B2/en
Publication of JPS5837932A publication Critical patent/JPS5837932A/en
Publication of JPS609347B2 publication Critical patent/JPS609347B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices

Description

【発明の詳細な説明】 本発明は、スクラィビングあるいはダィシングした半導
体ウヱハの間辺べレツトを効率良く分離する方法に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for efficiently separating edge pellets of a scribed or diced semiconductor wafer.

所定のP−N嬢合部を作り込んだ円板状半導体ゥェハを
互いに直角になるようにX軸方向及びY軸方向にスクラ
ィビングあるいはダィシングし矩形状の小片べレットに
分割する方法が一般に採用されている。
Generally, a method is adopted in which a disk-shaped semiconductor wafer with a predetermined P-N joint is scribed or diced in the X-axis direction and the Y-axis direction at right angles to each other to divide it into rectangular small pellets. ing.

この場合、半導体ゥェハは円板状であるために周辺部は
完全な矩形状の小片べレットとならず、所定の大きさを
有さないことからこの部分を分離、除去して使用してい
る。すなわち、第1図に示すように例えば、トランジス
タやダイオードのような小型の半導体素子を製造する場
合、円板状の半導体ウヱハに全体的に所定のP−N接合
を作り込み、その後上記の半導体ウェハ1を粘着テープ
2に貼着する。
In this case, since the semiconductor wafer is disk-shaped, the peripheral part does not form a perfectly rectangular pellet, and because it does not have a predetermined size, this part is separated and removed before use. . That is, as shown in FIG. 1, for example, when manufacturing small semiconductor elements such as transistors and diodes, a predetermined P-N junction is formed throughout the disk-shaped semiconductor wafer, and then the above-mentioned semiconductor A wafer 1 is attached to an adhesive tape 2.

この粘着テープ2を所定の機械等により互いに直角にな
るように×軸万向及びY軸方向にスクライビングあるい
はダイシングし小片の半導体べレット3を形成する。
This adhesive tape 2 is scribed or diced in the X-axis direction and the Y-axis direction so as to be perpendicular to each other using a predetermined machine or the like to form a semiconductor pellet 3 in the form of a small piece.

この場合、ハッチングで示す周辺の欠けべレツト4は使
用できないので除去しなければならないが一般に次のよ
うな方法を探っている。すなわち、粘着テープ2上で切
断した半導体ウェハ1を粘着テープ2ごとトリクレン等
の有機溶剤中に浸損させ、個々の半導体べレット3及び
欠けべレット4を粘着テープ2から分離した後、適当な
トレイ上に広げ、毛筆等を用い、手作業で角形の半導体
べレツト3と、異形の欠けべレツトとを選別する方法や
、所定のメッシュのふるいを用いて選別する方法、さら
には、第1図のように半導体べレット3が整列された状
態で真空チャックやピンセット等で前記の半導体べレッ
ト3と欠けべレット4とを分離する方法等がある。
In this case, the surrounding chipped pellets 4 shown by hatching cannot be used and must be removed, but the following method is generally being explored. That is, the semiconductor wafer 1 cut on the adhesive tape 2 is soaked together with the adhesive tape 2 in an organic solvent such as trichloride, and after separating the individual semiconductor pellets 3 and chipped pellets 4 from the adhesive tape 2, an appropriate There is a method of spreading the pellets on a tray and manually sorting the square semiconductor pellets 3 from irregularly shaped chipped pellets using a brush or the like, or a method of sorting them using a sieve with a predetermined mesh. There is a method of separating the semiconductor pellets 3 and chipped pellets 4 using a vacuum chuck, tweezers, etc. in a state where the semiconductor pellets 3 are aligned as shown in the figure.

しかしながら、第一の方法では、毛筆等を用いて手作業
で行うため、作業が繁雑でかつ時間が掛ること、また第
二の方法では、ふるいに振動を与えるため半導体べレッ
ト同士の衝突によって特に隅角部に損傷を与え易くかつ
異形べレットと角形べレツトとを完全に選別することは
困難であること、さらに第三の方法、すなわち、真空チ
ャックやピンセット等を使用し、ベレツトを1つずつ分
離するため、作業時間を要し、非能率的である等の欠点
を有する。
However, in the first method, the work is complicated and time-consuming because it is carried out manually using a brush, etc., and in the second method, vibration is applied to the sieve, which causes collisions between semiconductor pellets. It is easy to damage the corners and it is difficult to completely separate odd-shaped pellets from square pellets. Since the method is separated into individual parts, it takes a lot of time and is inefficient.

本発明は、上記の事情に基づきなされたもので角形の半
導体べレツトと異形の欠けべレットとを損傷を与えるこ
となく容易かつ確実に分離し得るようにした半導体ウェ
ハの周辺欠けべレットの分離方法を提供することを目的
とする。
The present invention has been made based on the above-mentioned circumstances, and the present invention is a method for separating chipped pellets around a semiconductor wafer, in which a square semiconductor pellet and an irregularly shaped chipped pellet can be easily and reliably separated without causing damage. The purpose is to provide a method.

以下に、本発明の一実施例を図面を参照して説明する。An embodiment of the present invention will be described below with reference to the drawings.

第2図において、半導体ゥヱハーの直径Dは、一般に高
精度に仕上られており、従って一つ半導体べレット3の
寸法が設計段階で決定されれば、この半導体ウヱハ1か
らの取り個数及び配列パターンは目から決定されてしま
い、複数枚の半導体ウェハ間においてもそれらの誤差は
きわめて小さい。そこで、角形の半導体べレット3の最
大取り個数の配列パターンに合せ、すなわち、半導体ゥ
ヱハーの周辺部の欠けべレツト4を除いた形状のマスク
板5を用意する。
In FIG. 2, the diameter D of the semiconductor wafer is generally finished with high precision. Therefore, once the dimensions of one semiconductor pellet 3 are determined at the design stage, the number and arrangement pattern of the semiconductor wafer 1 can be determined. are determined visually, and their errors are extremely small even between multiple semiconductor wafers. Therefore, a mask plate 5 is prepared in a shape that matches the arrangement pattern of the maximum number of rectangular semiconductor pellets 3, that is, with the chipped pellets 4 at the periphery of the semiconductor wafer removed.

第3図は、このマスク板5の外形を示し、板厚が0.1
肌以下の薄いステンレス板等で形成する。次に、このマ
スク板5を第4図に示すように半導体ウェハーが貼着さ
れる粘着テープ2よりも粘着力の強い粘着テープ6に貼
着した後、第5図に示すように半導体ウェハ1のべレツ
ト3の配列パターンに合せて重ねる。このようにすると
、マスク板5の外形から外れた半導体ウェハ1の周辺の
欠けベレット4,4は粘着力の強い粘着テープ6に矢印
方向の加圧力を付与することにより貼着され、その後、
粘着テープ2及び6を離間する方向に剥離すれば第6図
に示すようになる。
FIG. 3 shows the outer shape of this mask plate 5, and the plate thickness is 0.1
It is formed from a thin stainless steel plate, etc. that is thinner than the skin. Next, as shown in FIG. 4, this mask plate 5 is attached to an adhesive tape 6 having a stronger adhesive strength than the adhesive tape 2 to which the semiconductor wafer is attached, and then the semiconductor wafer 1 is attached as shown in FIG. Lay them out according to the arrangement pattern of Novelette 3. In this way, the chipped pellets 4, 4 on the periphery of the semiconductor wafer 1 that deviate from the outer shape of the mask plate 5 are attached by applying pressure in the direction of the arrow to the adhesive tape 6 with strong adhesive strength, and then,
If the adhesive tapes 2 and 6 are peeled apart in the direction of separation, the result will be as shown in FIG.

すなわち、マスク板5が重ね合された角形の半導体べレ
ットの配列部分を除き、周辺の欠けべレット4,4は粘
着力の強い粘着テープ6側に吸着され、一方の粘着力の
弱い粘着テープ2側には、欠けべレット4を除いた角形
の半導体べレット3のみが残存する。
That is, except for the arrayed part of the rectangular semiconductor pellets on which the mask plate 5 is superimposed, the chipped pellets 4, 4 in the periphery are attracted to the adhesive tape 6 side with strong adhesive strength, and the adhesive tape 6 with weak adhesive strength is attached to one side. On the second side, only the square semiconductor pellet 3 except the chipped pellet 4 remains.

上記の説明から明らかなように本発明によれば、禾だ分
離されていない半導体ゥェハの状態で、周辺の欠けベレ
ツトを容易かつ短時間に除去することができ、しかも半
導体べレット同士の衝突がないので損傷を与えることも
なく収率の向上に寄与し得る。
As is clear from the above description, according to the present invention, chipped pellets around the semiconductor wafer can be easily and quickly removed in a state where the semiconductor wafer has not been separated, and moreover, collisions between the semiconductor pellets can be avoided. Since no damage is caused, it can contribute to improving the yield.

なお、本発明の実施例では、粘着テープ2及び6の材質
について言及しなかったが位置合せのために透明性を有
するものが便利であり、特に材質に限定されないことは
いうまでもない。
Although the materials of the adhesive tapes 2 and 6 are not mentioned in the embodiments of the present invention, it is convenient to use transparent adhesive tapes for alignment purposes, and it goes without saying that the materials are not particularly limited.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、半導体ウェハを粘着テープに貼着した状態の
平面図、第2図は、半導体ゥヱハ上の半導体べレットの
配列状態を示す拡大平面図、第3図は、本発明に使用す
るマスク板の平面図、第4図は、上記マスク板を粘着テ
ープに貼着し、他方の粘着テープ上の半導体ウェハと対
向させた状態の側面図、第5図は、マスク板を半導体ウ
ェハ上に重ね合せた状態の側面図、第6図は、マスク板
の貼着された粘着テープ側に貼着された粘着テーフ。 側に除去すべき欠けべレットが残存した状態を示す側面
図である。1・・・半導体ウェハ、2,6・・・粘着テ
ープ、3・・・半導体べレツト、4・・・欠けべレット
、5・・・マスク板。 多′函 多2図 衆3図 第4図 多0図 挙り図
Fig. 1 is a plan view of a semiconductor wafer attached to an adhesive tape, Fig. 2 is an enlarged plan view showing the arrangement of semiconductor pellets on the semiconductor wafer, and Fig. 3 is a plan view of a semiconductor wafer attached to an adhesive tape. A plan view of the mask plate, FIG. 4 is a side view of the mask plate attached to an adhesive tape and facing a semiconductor wafer on the other adhesive tape, and FIG. 5 is a side view of the mask plate attached to the semiconductor wafer. FIG. 6 is a side view of the mask plate superimposed on the adhesive tape attached to the adhesive tape side. It is a side view which shows the state in which the chipped bullet which should be removed remains on the side. DESCRIPTION OF SYMBOLS 1... Semiconductor wafer, 2, 6... Adhesive tape, 3... Semiconductor pellet, 4... Chipped pellet, 5... Mask plate. Multi-function 2 drawings 3 drawings 4th drawing 0 drawings

Claims (1)

【特許請求の範囲】[Claims] 1 半導体ウエハ上の個々に分離すべき矩形状の半導体
ペレツトの配列パターンに合せてマスク板を形成し、こ
のマスク板を前記半導体ウエハが貼着される粘着テープ
の粘着力よりも強い粘着力を有する粘着テープに貼着後
、前記マスク板を半導体ペレツトの配列パターンに合せ
て重ね合せ、前記半導体ウエハの周辺欠けペレツトを粘
着力の強い粘着テープ側に吸着させて分離することを特
徴とする半導体ウエハの周辺欠けペレツトを分離する方
法。
1. A mask plate is formed in accordance with the arrangement pattern of rectangular semiconductor pellets to be individually separated on a semiconductor wafer, and this mask plate is coated with adhesive force stronger than the adhesive force of the adhesive tape to which the semiconductor wafer is attached. After adhering to the adhesive tape having the semiconductor wafer, the mask plate is overlapped in accordance with the arrangement pattern of the semiconductor pellets, and chipped pellets around the semiconductor wafer are adsorbed to the side of the adhesive tape with strong adhesive strength and separated. A method for separating chipped pellets from the periphery of a wafer.
JP56136540A 1981-08-31 1981-08-31 Method for separating chipped pellets around semiconductor wafers Expired JPS609347B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56136540A JPS609347B2 (en) 1981-08-31 1981-08-31 Method for separating chipped pellets around semiconductor wafers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56136540A JPS609347B2 (en) 1981-08-31 1981-08-31 Method for separating chipped pellets around semiconductor wafers

Publications (2)

Publication Number Publication Date
JPS5837932A JPS5837932A (en) 1983-03-05
JPS609347B2 true JPS609347B2 (en) 1985-03-09

Family

ID=15177574

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56136540A Expired JPS609347B2 (en) 1981-08-31 1981-08-31 Method for separating chipped pellets around semiconductor wafers

Country Status (1)

Country Link
JP (1) JPS609347B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01161485A (en) * 1987-12-17 1989-06-26 Nichiden Mach Ltd Method for recognizing small work piece
US4914601A (en) * 1988-02-25 1990-04-03 Hewlett-Packard Company Method for profiling wafers and for locating dies thereon
JP2010114117A (en) * 2008-11-04 2010-05-20 Sinfonia Technology Co Ltd Ic chip sorting method and ic chip sorter

Also Published As

Publication number Publication date
JPS5837932A (en) 1983-03-05

Similar Documents

Publication Publication Date Title
US4138304A (en) Wafer sawing technique
US6140151A (en) Semiconductor wafer processing method
DE102015216619B4 (en) Method for processing a wafer
KR100380389B1 (en) Method of preventing the transfer of adhesive material to dicing ring frame, Wafer processed sheet with pressure-sensitive adhesive sheet and pressure-sensitive adhesive sheet used in the method
TWI385767B (en) Sheet for die sorting and process for transporting chips having adhesive layer
JPS609347B2 (en) Method for separating chipped pellets around semiconductor wafers
EP1316992B1 (en) Method for processing a semiconductor wafer using a laminate substrate as a support for said semiconductor wafer
JP2013247136A (en) Tape and method for processing plate-like object using the tape
JPH02265258A (en) Dicing apparatus
JPS6222439A (en) Protective tape for wafer
JP2013021109A (en) Adhesive sheet and method for processing disk-like workpiece using adhesive sheet
JPH0430558A (en) Manufacture of semiconductor device
JPH03239346A (en) Manufacture of semiconductor device
JPS6323655B2 (en)
JPH04336448A (en) Fabrication of semiconductor device
JPH04249343A (en) Substrate separating method
JPS59134849A (en) Dicing method and adhesive sheet
JPH02191358A (en) Processing of semiconductor device
JP2513751B2 (en) Wafer holder adhesive removal method
JPS60249346A (en) Method of elongating semiconductor wafer
JPS608012A (en) Manufacture of semiconductor device
JPH03177050A (en) Manufacture of semiconductor device
JP2009260047A (en) Sheet for die sort
JP2798274B2 (en) Manufacturing method of chip-shaped parts
JPH0447960Y2 (en)