JPS6078456A - 投影露光装置 - Google Patents
投影露光装置Info
- Publication number
- JPS6078456A JPS6078456A JP58186266A JP18626683A JPS6078456A JP S6078456 A JPS6078456 A JP S6078456A JP 58186266 A JP58186266 A JP 58186266A JP 18626683 A JP18626683 A JP 18626683A JP S6078456 A JPS6078456 A JP S6078456A
- Authority
- JP
- Japan
- Prior art keywords
- pressure
- lens
- air
- gap
- temp
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70241—Optical aspects of refractive lens systems, i.e. comprising only refractive elements
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
- G03F7/70891—Temperature
Landscapes
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Atmospheric Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Variable Magnification In Projection-Type Copying Machines (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58186266A JPS6078456A (ja) | 1983-10-05 | 1983-10-05 | 投影露光装置 |
| US06/656,746 US4690528A (en) | 1983-10-05 | 1984-10-01 | Projection exposure apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58186266A JPS6078456A (ja) | 1983-10-05 | 1983-10-05 | 投影露光装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6078456A true JPS6078456A (ja) | 1985-05-04 |
| JPH04588B2 JPH04588B2 (https=) | 1992-01-08 |
Family
ID=16185274
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58186266A Granted JPS6078456A (ja) | 1983-10-05 | 1983-10-05 | 投影露光装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6078456A (https=) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6167036A (ja) * | 1984-09-10 | 1986-04-07 | ゼネラルシグナルジャパン株式会社 | 投影露光装置における投影倍率の補償方法及びその装置 |
| JPS63164212A (ja) * | 1986-12-26 | 1988-07-07 | Hitachi Ltd | 縮小投影露光装置 |
| JPH0542970U (ja) * | 1991-11-15 | 1993-06-11 | 三菱重工業株式会社 | 冷凍装置の乾燥剤 |
| JPH0855792A (ja) * | 1995-07-17 | 1996-02-27 | Canon Inc | 素子製造方法 |
| JPWO2003025987A1 (ja) * | 2001-09-14 | 2005-01-06 | 株式会社ニコン | 鏡筒及び露光装置並びにデバイスの製造方法 |
| JP2005303303A (ja) * | 2004-04-09 | 2005-10-27 | Carl Zeiss Smt Ag | 結像性能の最適化方法 |
-
1983
- 1983-10-05 JP JP58186266A patent/JPS6078456A/ja active Granted
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6167036A (ja) * | 1984-09-10 | 1986-04-07 | ゼネラルシグナルジャパン株式会社 | 投影露光装置における投影倍率の補償方法及びその装置 |
| JPS63164212A (ja) * | 1986-12-26 | 1988-07-07 | Hitachi Ltd | 縮小投影露光装置 |
| JPH0542970U (ja) * | 1991-11-15 | 1993-06-11 | 三菱重工業株式会社 | 冷凍装置の乾燥剤 |
| JPH0855792A (ja) * | 1995-07-17 | 1996-02-27 | Canon Inc | 素子製造方法 |
| JPWO2003025987A1 (ja) * | 2001-09-14 | 2005-01-06 | 株式会社ニコン | 鏡筒及び露光装置並びにデバイスの製造方法 |
| JP2005303303A (ja) * | 2004-04-09 | 2005-10-27 | Carl Zeiss Smt Ag | 結像性能の最適化方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH04588B2 (https=) | 1992-01-08 |
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