JPS6074254A - Mass spectroscope - Google Patents

Abstract

PURPOSE:To obtain spectra with high resolution by providing a slit between the first and second mass spectrometric systems of a mass spectroscope and then a collision area of ions and neutral gas particles at the side facing the first mass spectrometric system. CONSTITUTION:A parent ion that is generated from the ion source 1 of an MS/ MS device and passes through a principal slit 2 is diffused by a double convergence mass spectrometric system 3 in accordance with a mass-to-change ratio and then a dauthter ion is generated by dissociating the ion by the collision with helium in a collision room 7. Subsequently, the daughter ion is taken out through an exceedingly, narrowly set intermediate slit 6 and is guided to a second double convergence mass spectrometric system 4, then is incident on an ion detector 5. As a result, the second mass spectrometric system 4 is made compact and high resolution spectra are made possible by providing the collision room 7 at the first mass spectrometric system 3 side of the intermediate slit 6 and reducing the beam width of the daughter ion.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention [1. A so-called MS/MS system combining two trade h1 analysis devices.

'di II! , a so-called MS/MS device is attracting attention, in which a second mass spectrometry system is placed after the conventional mass spectrometry system, for example, an electric field and a magnetic field.
(This MS/MSν2 position C is shown in Figure 1 by Bob J
, -), the first mass spectrometry system M SI M J, -) (
The selected specific parent ion is placed on the ion i+D path 1-! i
``i' L-11 molecules in C in collision chamber CC collide IL
Ru. 251-, J, front part 1♂U, born daughter, A''
/ori) 2 so 6, 29 people to FT inno 1 system MS2, the MS 2 k: more daughter (,, 4 n L) I 7ti
7i1 and or ■Measure the energy-) of b (there is).

On the contrary, the conventional MS, MS device (as shown in Fig.
:,! Ni placement I'X Sai'l middle school! J7h
It is possible to separate the parent ion from the MSI with high resolution by separating the parent ion from the MSI (Fig. 31). , 1. Place the sea urchin collider at various places in C, 1. 1. Directly hang analysis from the mausoleum projecting room to the 2nd direct hanging analysis i?l M
S 2 towards iJ (The width of the ion used is b' and the width is 2,) The resolution decreased and the ion beam width of the 6th daughter IA became more noticeable. ) is required, which is extremely disadvantageous in terms of price. 3. The present invention (,1 This I': ij was made in view of G54m, and it is necessary to close the intermediate slit S to the side facing MSl. Then, the ions collide with the gas molecules, and the MS2 is small in size. The present invention is described below with reference to the drawings.

FIG. 3 is a block diagram showing one embodiment of the present invention.

(In the text (j3-C1 is the ion source, 2 is the main slot 1~.
31. J For example, the first 7 (7 suspensions 41i system) consisting of a 2 medium convergent matter 1n analytical system with an electric field and a magnetic field, 4 is an analogy (J electric field and magnetic field are made into a white text device) lii field and 1.j superimposed field A second suspended analysis system consisting of an ion analysis system, 5 (an ion detector, 6) is placed at an ion intermediate convergence point between the first mass spectrometry system and the second mass spectrometry system. Intermediate Surin 1-17
8 is a collision chamber arranged close to the side facing the first mass spectrometry system 3 of the intermediate sulphurs 1 to 6, and 8 is a helium gas for storing collision gas, for example, helium, which is supplied to the collision chamber 7. 1, which is the source, d'3 in the above configuration (, ion i'l!ii 1
The parent ion that passed through 1 and 2 to the main slit is 17
l'H11v, Zhu Y'i hanging analysis system 3, J,
Air loading (according to J 1.1 minute 11 (compromise, intermediate sleeve 1
The spectrum is placed at position -6 for 114 seconds. At this time, since the collision chamber of the present invention is provided in front of the intermediate sleeve 1, the parent (A) becomes M'/factor 1 due to the iΦ1 collision of the collision chamber C, and the daughter ions are generated.

The generated daughter A is taken out through intermediate sleeves 1 to 4 which are set very narrowly and is introduced into the second analysis system 4, so that the 11'j F,'1 analysis system Kakoe (
Rino'P-i, 7Y minute 1+fi system Cil? >7)
t t＞Example (,LFigure 4(a) tShow 'JJ, -
) to daughter Ion (J Seki Rir.!'!, minute h'(1ift SHEKU (Hell 1!) can be C cut 1, subordinate (,!t
It is possible to determine the mass of the ion based on the high-resolution scale (, it).

DoroC, ions enter collision chamber 7! Jill'l should be set sufficiently wide so that the range from 1 to 6 is large enough that the parent ions in a certain mass range will enter the collision 7. In the collision chamber 7 (due to the collision of the parent ions, the f of the parent ion beam 11 is affected by the collision, i.e., the f of the parent ions) - it is inevitable that the resolution of the parent ions will be reduced. 8, a high-resolution spectrum related to the daughter ion Δn can be obtained as described in 1, but all the peaks in the spectrum are not derived from the same parent ion. Since it is unavoidable that the resolution riL for the parent ion decreases, there is no need to operate the first mass spectrometry system 3 at y% resolution of 7-1-, and the main slit 2 It is best to operate in a low-resolution mode with a sufficient amount of collision chamber 7.
As the amount of parent ions entering the cell increases, and the amount of daughter ions generated increases, the daughter ions become more sensitive to Iα (Iα). Giru.

a15) The figure shows the (16 configuration) of another embodiment of the present invention,
1x! What is different from the embodiment shown in Fig. 3 is that a collision chamber 9 is also installed on the fall/υC opposite side of the intermediate sleeve h6, and a collision chamber 9 is installed on the
This is the point where the collision gas is selectively supplied from the gas source 8 to the collision chambers 7 and 9 via the gas source 8.

If the configuration shown in Fig. 5 is different from d3 (if the collision gas is supplied only to the iΦj bulge chamber 7 via the switch if 10, the inside of the llj bulge throat 5) will be kept at a negative emptiness, and the collision (31) will not occur. 4Y Ino (
, it is completely equivalent to the configuration of the blind'i3 diagram, and the high-resolution spectrum of the eel girl in Δn with J reduced to (a>) in Figure 3 (a>
＾１(゛shir(!W will be.

Next, the C thin and thick waste is passed through the switching valve 10.
EJ is supplied only to the side, t3 in the collision chamber 7 ↓ is maintained at high purity and collision does not occur. 1. Follow (
This state (゛) is equivalent to the conventional configuration shown in Figure 11.
j, the parent ion is placed in the intermediate sleeve l C5, ``, -) and (
(Since the selection is strict, high resolution is possible.)
The spectrum of the daughter IA is shown in Figure 4 ([)), <0).
The spectrum shown in Fig. 4 (b) is the first quality of 111 minutes (Ha yarn 3 selected the parent ion △).
．． 1 is 11 times /;: b q) r, and the spectrum shown in (C) is the parent ion [3 with the first 'j'j When Rin analysis system 3 is selected, 447 I:I (if available, Figure 4 (a) and Figure 4 (E)), ((',::
), we will compare the peaks pa1.1 and a2. ..., j〕a
7 has C derived from the parent ion △, P 111,
January) 2°..., it is possible to determine that Pb5 is derived from the parent A>B, and to determine the attribution of the peak in the high-resolution spectrum.

As mentioned above, according to the present invention, it is possible to perform IL on a high-resolution spectrum related to daughter ions.
Historically, it has been difficult to determine the attribution of each peak in the spectrum. , the present invention is-
limited to the embodiments described above; <many variations are possible; 1.
It is not necessarily necessary to create a region where parent ions and colliding gas cause dissociation. For example, if the collision gas is passed from the nostle to the parent ion path,
It is better to create a collision area, and if you do this, there will be no need for the part that forms the collision.

[Brief explanation of the drawing]

1 and 2 are diagrams showing a conventional example, Figure 133 is a diagram showing an embodiment of the present invention, Figure 4 is a diagram showing a spectrum for explaining the movement f+, and Figure 5 is a diagram showing a spectrum for explaining the movement f+. ) 1 source, 12 Another embodiment of the present invention is shown in Figure C 1, 1: Input source, 2
: Satsuri 1-1 3 : 'A 1 ノ￥'il#j)411 series, /'I
: No. I:J) Ylt; 1 minute 411 system, 5: In ∆ detector, 6: Intermediate sleeve 1-17.9 Niji III protrusion °,
ε31＼Rium sword source, 10, switching valve. Special a′ [Applicant 1] Tree? Hiko Co., Ltd. Representative Iju - person

Claims (1)

[Claims] an ion source, a first quality analysis system into which ions generated by the ion source are introduced, and an ion detector for detecting ions passing through the mass spectrometry system; and the mass spectrometry system;
an analysis system and the second Ylf I'? r analysis system and the first
A trade I'ft analyzer is equipped with a slit 1 head located at an intermediate focusing point between the slit 1 and the slit 1 on the side facing the first mass spectrometry system. Close to]B
(A mass spectrometer that is uniquely characterized by the creation of a collision region between ions and neutral gas molecules.