JPS6072415A - Synchronism fault detecting circuit of phase locked loop - Google Patents

Synchronism fault detecting circuit of phase locked loop

Info

Publication number
JPS6072415A
JPS6072415A JP58181503A JP18150383A JPS6072415A JP S6072415 A JPS6072415 A JP S6072415A JP 58181503 A JP58181503 A JP 58181503A JP 18150383 A JP18150383 A JP 18150383A JP S6072415 A JPS6072415 A JP S6072415A
Authority
JP
Japan
Prior art keywords
circuit
voltage
pll
output
output voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58181503A
Other languages
Japanese (ja)
Inventor
Kazuharu Chiba
千葉 一治
Toshio Hashi
橋 利雄
Yoshibumi Nakajima
義文 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58181503A priority Critical patent/JPS6072415A/en
Publication of JPS6072415A publication Critical patent/JPS6072415A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03LAUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00Automatic control of frequency or phase; Synchronisation
    • H03L7/06Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08Details of the phase-locked loop
    • H03L7/085Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
    • H03L7/095Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal using a lock detector

Landscapes

  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)

Abstract

PURPOSE:To eliminate the defect that a PLL lock fault detecting circuit responds too much to the operation of a switch by providing a voltage discriminating device detecting a prescribed level of an output voltage of a phase comparator in a phase locked circuit, an integration circuit integrating an output voltage of the voltage discriminating device and a memory circuit storing an output of the integration circuit. CONSTITUTION:The voltage discriminating device 12 and the memory circuit 14 correspond to the voltage discriminating device 10 and the memory circuit 11 of a conventional circuit. Moreover, the integration circuit 13 consists of a simple CR circuit having a time constant tau or the like. The integration circuit 13 suppresses a very fast change in the output voltage of the voltage discriminating device 12 and selects a comparatively slow change and gives the result to the memory circuit 14. The time required for the switching operation of the switch 8 is very short normally and the relocking of the PLL as the result is finished in a very short time. An output voltage change of PD based on a fault of the PLL is normally slow against the result. Thus, the discrimination of fault at the operation of the switch is made ineffective by utilizing this point.

Description

【発明の詳細な説明】 〔発明の技術分野〕 一本7Iし明は、位相同期回路(以下1)Ll、という
)の同期異常検出回路に関し、特に切替器を介して複鎖
の信号源に選択的に結合されるPLLにおいて、切替器
の動作には無感応に構成した同期異常検出回路に関する
[Detailed Description of the Invention] [Technical Field of the Invention] This article 7I relates to a synchronization abnormality detection circuit for a phase-locked circuit (hereinafter referred to as 1) Ll, and particularly relates to a synchronization abnormality detection circuit for a phase-locked circuit (hereinafter referred to as 1) Ll, and particularly for detecting a synchronization abnormality in a phase-locked circuit (hereinafter referred to as 1)Ll. The present invention relates to a synchronization abnormality detection circuit configured to be insensitive to the operation of a switch in a selectively coupled PLL.

〔技術の背景〕[Technology background]

PLLは、入力信号に位相同期した出力信号を発生する
機能をもつ回路であシ、入力(g−QのS/Nを改善し
たシ、また分周器を導入して入力信号の周波数に同期し
た他の周波数に変換すること智を目的として、通信装置
をはじめとして、各かII民生機器に広く用いられてい
る。
A PLL is a circuit that has the function of generating an output signal that is phase-synchronized with an input signal. It is widely used in various types of consumer equipment, including communication equipment, for the purpose of converting it to other frequencies.

PLLは、一般に第1図に示すような構成を有している
。図中、1はl/n分周器、2は位相比較器(PD)、
3は低域P波器(LP’F)、4は電圧制御発振器(v
CO)、5はx/m分周器である。ここで、ル、mは自
然数である。
A PLL generally has a configuration as shown in FIG. In the figure, 1 is an l/n frequency divider, 2 is a phase comparator (PD),
3 is a low-pass P wave generator (LP'F), 4 is a voltage controlled oscillator (v
CO), 5 is an x/m frequency divider. Here, r and m are natural numbers.

PD2は、入力信号(ωL)をl/n分周器1でl/n
に分周した信号とvCO4の出力信号(ω0)をl/m
分周器5で1/rnに分周した信号の各位相を比較し、
その位相差に応じた誤差電圧を出力する。PD 2の出
力電圧はLPF3で平滑されてvCO4に対する制御電
圧と々シ、VCO4の発振Jjd波数を制御する。
PD2 divides the input signal (ωL) into l/n by l/n frequency divider 1.
The signal frequency-divided into l/m and the output signal (ω0) of vCO4
Compare each phase of the signal frequency-divided to 1/rn by frequency divider 5,
It outputs an error voltage according to the phase difference. The output voltage of PD 2 is smoothed by LPF 3, and the control voltage for vCO4 controls the oscillation Jjd wave number of VCO4.

PD2、LPF3、vC04が、閉ルーフヲ構成シてい
るため、VCO4の発振周波数は、入力信号周波数に対
して常に一定の関係を保つように自動制御される。
Since PD2, LPF3, and vC04 constitute a closed roof, the oscillation frequency of VCO4 is automatically controlled so as to always maintain a constant relationship with the input signal frequency.

近年、高い周波数安定度が要求される通信装置や放送装
置等では、基準周波数源として、従来の高安定水晶発振
器に代シ、原子発振器を使用するよう釦なっている。原
子発振器の出力周波数は、通常、5 MHz ’、 1
0MI(z等の標準周波数値に定まっているので、各装
置において都合のよい周波数を得るためには、原子発振
器の周波数安定度を維持しながら所要の(司波数に変換
する手段が必要となる。PLLは、このような目的に使
用されるのに適した手段の1つである。
In recent years, communication devices, broadcasting devices, and the like that require high frequency stability have begun to use atomic oscillators as reference frequency sources instead of conventional highly stable crystal oscillators. The output frequency of an atomic oscillator is typically 5 MHz', 1
Since the standard frequency value such as 0 MI (z) is determined, in order to obtain a convenient frequency for each device, a means to convert it to the required frequency while maintaining the frequency stability of the atomic oscillator is required. .PLL is one suitable means to be used for such purpose.

一方、原子発振器は、回路構成上、従来の水晶発振器に
較べると、信頼度が劣るという欠点をもっている。この
ため、高い周波数安定度と高M頼性2が両方必要とされ
る場合には、心臓部である原子発振器を2重化Tる等、
冗長構成が採られるも少くない。
On the other hand, atomic oscillators have the drawback of being less reliable than conventional crystal oscillators due to their circuit configuration. Therefore, if both high frequency stability and high M reliability are required, the core atomic oscillator may be duplicated, etc.
There are many cases in which redundant configurations are adopted.

第2図は、上記した冗長構成の発振器をもつ周波数変換
回路の1例を示、したものである。図中、6および7が
原子発振器であって、便宜上、6が現用(N)で、7は
予備(K)と°する。また、8は切替器、9は切替制御
回路モあり、1乃至5で示すPLL回路は、第1図に示
したものと同じものである。
FIG. 2 shows an example of a frequency conversion circuit having the above-described redundant oscillator configuration. In the figure, 6 and 7 are atomic oscillators, and for convenience, 6 is the current (N) and 7 is the reserve (K). Further, 8 is a switch, 9 is a switching control circuit, and PLL circuits 1 to 5 are the same as those shown in FIG.

第2図に示す構成においては、現用の原子発振器(N)
の出力は切替器8によシ選択され、PLLに印加され。
In the configuration shown in Figure 2, the current atomic oscillator (N)
The output of is selected by the switch 8 and applied to the PLL.

、他方、各原子発振器に異常が生じた場合には、異常信
号ALMが切替制御回路9に送られる。切替制御回路9
は、現用原子発振器(N)に異常が検出されz3合、正
市な予備発振器(E)を選択する切替制御信号を出力す
る論理機能をもっている。これによシ、切替器8からは
、常に正常な信号が得られるようになっている。しかし
、PLL自身に異常が生じた場合には、このような発振
器の冗長構成が意味をなさなくなるため、PLLの異常
、即ち、PLLが非同期状態にあることを検出すること
が特に重要になってくる。
On the other hand, if an abnormality occurs in each atomic oscillator, an abnormality signal ALM is sent to the switching control circuit 9. Switching control circuit 9
has a logic function that outputs a switching control signal to select a valid standby oscillator (E) when an abnormality is detected in the active atomic oscillator (N). As a result, a normal signal can always be obtained from the switch 8. However, if an abnormality occurs in the PLL itself, such a redundant oscillator configuration becomes meaningless, so it is especially important to detect an abnormality in the PLL, that is, when the PLL is out of synchronization. come.

PLLの同期・非同期の状態判定は、位相比較器PDの
出力電圧を監視することにより可能である。
The synchronous/asynchronous state of the PLL can be determined by monitoring the output voltage of the phase comparator PD.

第3図(−)は、PLLの非同期状態におけるPD出力
電圧の例であるd PL、Lの非同期状態においては、
PDの出力1に圧は図示のように上限電圧または下限電
圧で一定となるか、ろるいは入力周波数′のx/nと7
00周波数の1/mとの間の差周波数(ビート)で、上
限*昆と下限電圧間を振動する。前者はPLLに入力信
号がない場合に生じ、後者は入力信号はあるものの、V
C・0の発振異常等によシ、引込みが不完全な場合に・
生じる。 ・ 従来のPLL同期異常検出回路は、上記したPD%圧の
上限および下限功内側に閾値を設定して1PD出力を監
視するものである。
Figure 3 (-) is an example of the PD output voltage in the asynchronous state of PLL.d In the asynchronous state of PL,L,
The pressure at output 1 of the PD is constant at the upper limit voltage or lower limit voltage as shown in the figure, or it is slow or depends on x/n of the input frequency' and 7
It oscillates between the upper limit voltage and the lower limit voltage at the difference frequency (beat) between 1/m of the 00 frequency. The former occurs when there is no input signal to the PLL, and the latter occurs when there is an input signal but V
If the retraction is incomplete due to an oscillation abnormality of C.0, etc.
arise. - The conventional PLL synchronization abnormality detection circuit monitors 1 PD output by setting a threshold value within the upper and lower limits of the PD% pressure described above.

第3図(h)にその回路例を示す。図中、10は電圧判
定器であって上記□閾値が設定されているもの、llに
メモリ回路であって電圧判定器10の出□力な一ボール
ドするものである。 ・ PD電圧が一度でも閾値な超えると、電圧判定器10が
動作し、その:出力がメモリ回路11にホールドされる
。このメモリ回路が設けられているユ、VCより、pb
電圧が上限、下限間ヶ振動1〜6□ ような異常時にも、検出回路の出力のチャタリングが防
止される。: しかるに、あ企図に示すような周波数変換回路上 に、第3図(A)にホT従来のPLL同期異常検出回路
□ を適用した場合 、現用の原子発振器(N)の異常によ
り切替器7Z動作して、予備の原子発振器□ (E)に切替えたときにも、PD出力電圧が過渡的に変
動す−ること41ら、異常と判定される欠点がある。こ
れは、切暮器の動作特に、入力が瞬間的に□ 切替えられることによJ、PLLが再度引込み制御を開
始し、過渡的にPD出力電圧が、その上限あるいは下限
にま↓変化することによっている。
An example of the circuit is shown in FIG. 3(h). In the figure, reference numeral 10 denotes a voltage determiner to which the above-mentioned □ threshold value is set, and 11 denotes a memory circuit, which is the output of the voltage determiner 10 (marked in bold). - If the PD voltage exceeds the threshold even once, the voltage determiner 10 operates, and its output is held in the memory circuit 11. From the VC where this memory circuit is installed, pb
Chattering of the output of the detection circuit is prevented even in the event of an abnormality such as an oscillation between 1 and 6□ between the upper and lower voltage limits. However, if the conventional PLL synchronization abnormality detection circuit shown in Fig. 3 (A) is applied to the frequency conversion circuit as shown in the plan, the switching device 7Z will fail due to an abnormality in the current atomic oscillator (N). Even when the atomic oscillator □ (E) is activated and switched to the spare atomic oscillator (E), the PD output voltage fluctuates transiently (41), which is a drawback that it is determined to be abnormal. This is due to the operation of the switching device, in particular, when the input is switched momentarily, the PLL starts pulling control again, and the PD output voltage transiently changes to its upper or lower limit. I am by.

そのため、入り一切替え後のある引込み時間の後にはP
LLが正常=作状態になっていても、一旦はPLL同期
異常検 回路の電圧判定器lOにより非同1期状態と判
定4<するため、メモリ回路11のホ□ −ルド機能によル、:異常検出状態がjli絖すること
にな□る。特に1図に示した周波数変換回路が複数系統
設けられていて、現用の系のPLL同期、異常検出回路
が同期異常を検出した場合に予備系に切替えが行なわれ
るシステムでは、実際上、原子発振器の予備側を使用す
ることが出来ない場合が多くなシ、冗長構成が有効に機
能しないという不合理が生じる。
Therefore, after a certain draw-in time after the entry change, P
Even if LL is in the normal = operating state, the voltage judge lO of the PLL synchronization abnormality detection circuit will determine that it is in the asynchronous 1st period state, so the hold function of the memory circuit 11 will hold the : The abnormality detection state will be abnormal. In particular, in a system where multiple frequency conversion circuits are provided as shown in Figure 1, and the PLL synchronization and abnormality detection circuit in the active system switches to the backup system when a synchronization abnormality is detected, in practice, the atomic oscillator In many cases, it is not possible to use the spare side of the system, resulting in an unreasonable situation in which the redundant configuration does not function effectively.

〔発明の目的および構成〕[Object and structure of the invention]

本発明の目的は、上述したように、複数信号源を選択す
る切替器の後段K PLLが置かれている場合のように
、PLL同期異常検出回路が切替器の動作に過剰に反応
する欠点を改善することにあシ、そのため、切替器動作
に伴うPLLの再引込みが完了するまでの時間だけ、P
LLの同期異常検出機能を制限する手段を提供するもの
である。
As described above, an object of the present invention is to eliminate the drawback that the PLL synchronization abnormality detection circuit overreacts to the operation of the switch, as in the case where the K PLL is placed after the switch that selects multiple signal sources. Therefore, the PLL is only used for the time until the re-drawing of the PLL is completed due to switching
This provides a means to limit the synchronization abnormality detection function of the LL.

本発明の構成は、それによシ複数の信号源と、該複数の
信号源の一つを選択する切替器と、該切替器の後段に配
置された位相同期回路とをそなえたシステムにおいて、
上記位相同期回路内の位相比較器の出力電圧における所
定のレベルを検出する電圧判定器と、該電圧判定器の出
力電圧を積分する積分回路と、該積分回路の出力を保持
するメモリ回路とを有することを特徴としている。
Accordingly, the configuration of the present invention provides a system including a plurality of signal sources, a switch for selecting one of the plurality of signal sources, and a phase synchronization circuit disposed after the switch.
A voltage determiner that detects a predetermined level of the output voltage of the phase comparator in the phase-locked circuit, an integrating circuit that integrates the output voltage of the voltage determiner, and a memory circuit that holds the output of the integrating circuit. It is characterized by having

〔発明の実施例〕[Embodiments of the invention]

以下に、本発明の詳細を実施例にしたかつで説明する。 The details of the present invention will be explained below with reference to examples.

第4図は、本発明によるPLL同期異常検出回路の1実
施例のブロック図であシ、第5図(a)乃至(C)はそ
のタイムチャートである。
FIG. 4 is a block diagram of one embodiment of the PLL synchronization abnormality detection circuit according to the present invention, and FIGS. 5(a) to 5(C) are time charts thereof.

第4図において、12は電圧判定器、13は積分回路、
14はメモリ回路である。電圧判定器12およびメモリ
回路14は第3図Cb)に示した従来例回路の電圧判定
器10およびメモリ回路11に相当するものである。ま
た積分回路13は、たとえば時定数τの簡単なCR1路
等で構成できる。
In FIG. 4, 12 is a voltage judger, 13 is an integration circuit,
14 is a memory circuit. The voltage determiner 12 and the memory circuit 14 correspond to the voltage determiner 10 and the memory circuit 11 of the conventional circuit shown in FIG. 3Cb). Further, the integrating circuit 13 can be configured, for example, by a simple CR1 path having a time constant τ.

積分回路13は、電圧判定器12の出力電圧における極
めて速い変化を阻止し、比較的遅い変化をよシ分けて、
メモリ回路14へ伝達する。通常、切替器8(第2図)
の切替え動作に要する時間は極めて短く、その結果のP
LLの再引込み動作も極〈短時間で終了する。これに対
して、PLLの異常に基づ(PDの出力電圧変化は緩シ
しているのが普通である。したがって、この点を利用す
ることによシ、切替器動作時の異常判定を無効化するこ
とができる。
The integrating circuit 13 blocks extremely fast changes in the output voltage of the voltage determiner 12 and separates relatively slow changes.
It is transmitted to the memory circuit 14. Normally, switch 8 (Figure 2)
The time required for the switching operation is extremely short, and the resulting P
The LL retraction operation also ends in a very short time. On the other hand, based on PLL abnormalities (PD output voltage changes are normally slow), by utilizing this point, it is possible to invalidate the abnormality judgment when the switching device operates. can be converted into

次に、第5図のタイムチャートにしたがって、回路動作
を詳述する。なお、第5図(α)は電圧判定器12の出
力信号波形、同図(h)はη(分回路13の出力信号波
形、同図(C)はメモリ回路14の出力信号波形を対応
的に示したタイムチャートである。
Next, the circuit operation will be explained in detail according to the time chart shown in FIG. In addition, FIG. 5(α) shows the output signal waveform of the voltage judger 12, FIG. 5(h) shows the output signal waveform of the η(divider circuit 13), and FIG. This is the time chart shown in .

@H#は正常時のレベル、′L”は異常時のレベルを表
わす。
@H# represents the normal level, and 'L'' represents the abnormal level.

図中の領域■は、切替器の動作時におけるもので、切替
器の動作によシ、PLLの入力が切替るため、PLLの
引込み完了までの時間の間、電圧判定器12の出力電圧
は、極めて速く”■1″、”L″レベル間交互に変化す
る。ところで、積分回路130時定数τは、この変化時
間に対して十分に大きいイ直に設定されている。このた
め、(b)に示すように、積分回路13の出力レベルは
、メモリ回路14に予め定められている動作閾値よシも
下ることができない。その結果、メモリ回路14は動作
を阻止され、(C)に示すように、メモリ回路14から
は、異常判定を表わす信号レベル”L″が出力されるこ
とがない。
Region ■ in the figure is when the switching device is operating. Since the input of the PLL is switched depending on the operation of the switching device, the output voltage of the voltage determiner 12 is , changes extremely rapidly between "■1" and "L" levels. Incidentally, the time constant τ of the integrating circuit 130 is set to be sufficiently large for this change time. Therefore, as shown in (b), the output level of the integrating circuit 13 cannot fall below the operating threshold value predetermined for the memory circuit 14. As a result, the memory circuit 14 is prevented from operating, and as shown in (C), the memory circuit 14 does not output a signal level "L" indicating abnormality determination.

領域◎は、PD出力電圧が、上限あるいは下限のレベル
で一定となる異常現象が生じている場合を示す。この場
合には、積分回路13の積分作用による時間遅れ(τ)
が生じるものの、積分回路13の出力電圧はやがてメモ
リ回路の動作閾値を超え、メモリ回路14は動作して、
その出力レベルは異常判定を表わす”L″レベルなる。
A region ◎ indicates a case where an abnormal phenomenon occurs in which the PD output voltage remains constant at the upper limit or lower limit level. In this case, the time delay (τ) due to the integration action of the integration circuit 13
However, the output voltage of the integrating circuit 13 eventually exceeds the operating threshold of the memory circuit, and the memory circuit 14 operates.
The output level is "L" level indicating abnormality determination.

なお、この状態は回路始動時にも現われるが、このとき
はリセット操作を行なって異常判定を取消す。
Note that this state also appears when the circuit is started, but in this case a reset operation is performed to cancel the abnormality determination.

領域のは、760周波数が入力周波数に同期する周波数
から離れすぎ、周波数引込みが不能となって、PD出力
電圧が上限および下限の間を振動する場合を示す。この
場合にも、領域(ロ)のときと同様に、第1回目の変化
で積分回路13の出力レベルは閾値な超え(即ち、時定
数τの値が適切に設定されているため)、メモリ回路1
4が動作して、異常判定を表わす信号レベル゛L″が出
力される。
The region indicates the case where the 760 frequency is too far away from the frequency synchronized to the input frequency, making frequency pull-in impossible and causing the PD output voltage to oscillate between the upper and lower limits. In this case, as in the case of region (B), the output level of the integrating circuit 13 exceeds the threshold value at the first change (that is, because the value of the time constant τ is appropriately set), and the memory circuit 1
4 operates, and a signal level "L" representing an abnormality determination is output.

このように、PLLにおける幾つかの異常現象のモード
に対応するPD出力電圧変化の形態の違いにより、異常
および正常の識別が行なわれる。即す、 vcoとして
高安定な発振器を用いる場合には、vco17)周波数
変化量が小ぜいため、PD出力電圧門化、)JEJ期、
よ、切替器動作時よおけうP9電工変柁の周期に比べて
充分長くなるから、積分回路130時定数τを両者の中
間値に設定することによシ、2つの異常現象の弁別が可
能となる。なお、本実施例においては、積分回路が電圧
判定器の後盲に配置されているが、これを逆転して配置
しても同等の動作を行なわせることができる。
In this way, abnormality and normality are distinguished from each other based on the difference in the form of PD output voltage change corresponding to the mode of some abnormal phenomena in the PLL. In other words, when using a highly stable oscillator as the VCO, the VCO17) frequency change is small, so the PD output voltage is gated,) the JEJ period,
Since the cycle is sufficiently long compared to the period of P9 electrician change when the switch is activated, it is possible to distinguish between the two abnormal phenomena by setting the time constant τ of the integrating circuit 130 to an intermediate value between the two. becomes. In this embodiment, the integrating circuit is placed at the rear of the voltage determiner, but the same operation can be achieved even if the integrating circuit is placed in reverse.

〔発明の効果〕〔Effect of the invention〕

□以上のように、本発明によれば、簡単な回路構成によ
シ、切替器動作の場合の異常判定を排除す茗ことかでき
、冗長構成の信号源と組合わされたPLL回路に適合す
るPLL同期異常検出回路が得られ、システムの信頼性
な著しく向上させることができる。
□As described above, according to the present invention, it is possible to eliminate abnormality determination in the case of switch operation with a simple circuit configuration, and it is suitable for a PLL circuit combined with a redundant configuration signal source. A PLL synchronization abnormality detection circuit is obtained, and the reliability of the system can be significantly improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はPLLの一般的な構成例を示す図、第2図は冗
長構成を含む周波数変換回路の構成例を示す図、第3図
(a)は非同期状態にあるPLLの出方電圧の例を示す
図、第3図(h)は従来のPLL異常同期検出回路の構
成か示す図、第4図は本発明の1実施例回路の構成を示
す図、第5図(α)、(b)、(c)はそれぞれ第4図
に示す実施例回路のタイムチャートである。 図中、lは1/ル分周器、2は位相比較器PD。 3は低域F波器LPF、 4は電圧制御発振器VCO。 5はx/m分周器、6および7は原子発振器、8は切替
器、9は切替制御回路、12は電圧判定器、13は積分
回路、14はメモリ回路を示す。
Figure 1 shows a general configuration example of a PLL, Figure 2 shows an example configuration of a frequency conversion circuit including a redundant configuration, and Figure 3 (a) shows the output voltage of a PLL in an asynchronous state. 3(h) is a diagram showing the configuration of a conventional PLL abnormal synchronization detection circuit, FIG. 4 is a diagram showing the configuration of an embodiment of the circuit of the present invention, and FIG. 5(α), ( b) and (c) are time charts of the embodiment circuit shown in FIG. 4, respectively. In the figure, l is a 1/L frequency divider, and 2 is a phase comparator PD. 3 is a low frequency F wave generator LPF, and 4 is a voltage controlled oscillator VCO. 5 is an x/m frequency divider, 6 and 7 are atomic oscillators, 8 is a switch, 9 is a switching control circuit, 12 is a voltage determiner, 13 is an integration circuit, and 14 is a memory circuit.

Claims (1)

【特許請求の範囲】[Claims] 複数の信号源と、該複数の信号源の一つを選択する切替
器と、該切替器の後段に配置された位相同期回路とをそ
なえたシステムにおいて、上記位相同期回路内の位相比
較器の出力電圧における所定のレベルを検出する電圧判
定器と、該電圧判定器の出力電圧を積分する積分回路と
、該積分回路の出力を保持するメモリ回路とを有するこ
とを特徴とする位相同期回路の同期異常検出回路。
In a system comprising a plurality of signal sources, a switch for selecting one of the plurality of signal sources, and a phase-locked circuit disposed after the switch, a phase comparator in the phase-locked circuit may A phase-locked circuit comprising: a voltage determiner that detects a predetermined level in an output voltage; an integrating circuit that integrates the output voltage of the voltage determiner; and a memory circuit that holds the output of the integrating circuit. Synchronization abnormality detection circuit.
JP58181503A 1983-09-29 1983-09-29 Synchronism fault detecting circuit of phase locked loop Pending JPS6072415A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58181503A JPS6072415A (en) 1983-09-29 1983-09-29 Synchronism fault detecting circuit of phase locked loop

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58181503A JPS6072415A (en) 1983-09-29 1983-09-29 Synchronism fault detecting circuit of phase locked loop

Publications (1)

Publication Number Publication Date
JPS6072415A true JPS6072415A (en) 1985-04-24

Family

ID=16101894

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58181503A Pending JPS6072415A (en) 1983-09-29 1983-09-29 Synchronism fault detecting circuit of phase locked loop

Country Status (1)

Country Link
JP (1) JPS6072415A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0440104A (en) * 1990-06-06 1992-02-10 Agency Of Ind Science & Technol Phase locked loop circuit of ultra high frequency diode oscillator

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0440104A (en) * 1990-06-06 1992-02-10 Agency Of Ind Science & Technol Phase locked loop circuit of ultra high frequency diode oscillator

Similar Documents

Publication Publication Date Title
US6359945B1 (en) Phase locked loop and method that provide fail-over redundant clocking
US5642069A (en) Clock signal loss detection and recovery apparatus in multiple clock signal system
US5459435A (en) Frequency synchronous circuit for obtaining original clock signal by removing noise components
JPH022722A (en) Clock hold over circuit
JP3274639B2 (en) Data signal switching device
JPS6072415A (en) Synchronism fault detecting circuit of phase locked loop
JPH02183642A (en) Digital transmission terminal station equipment
JPH06104882A (en) Network synchronizing clock supply device
JPH0247899B2 (en)
JPS6226605B2 (en)
JPS6334659B2 (en)
JP2677039B2 (en) Phase locked oscillator
JPH0267820A (en) Standard frequency clock generator
JPS59225617A (en) Phase locked loop
JPH10290161A (en) Pll circuit
JP2003264460A (en) Frequency monitor circuit, clock supply device and frequency monitor method
JPH11196073A (en) Clock switching system
JPS6341314B2 (en)
JP2519887Y2 (en) Phase locked oscillator
JPH1127247A (en) System switching method
JP3160904B2 (en) Phase-locked oscillation circuit device
JPH09116427A (en) Phase locked loop circuit
JP2621257B2 (en) PLL circuit adjustment inspection device
JPH04291819A (en) Phase locked loop circuit
JPH04148403A (en) Clock signal skew circuit