JPS6071593A - Growing method of crystal - Google Patents

Growing method of crystal

Info

Publication number
JPS6071593A
JPS6071593A JP17725583A JP17725583A JPS6071593A JP S6071593 A JPS6071593 A JP S6071593A JP 17725583 A JP17725583 A JP 17725583A JP 17725583 A JP17725583 A JP 17725583A JP S6071593 A JPS6071593 A JP S6071593A
Authority
JP
Japan
Prior art keywords
crystal
shaft
melt
seed
laser beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17725583A
Other languages
Japanese (ja)
Inventor
Ritsuo Takizawa
滝沢 律夫
Nobuo Toyokura
豊蔵 信夫
Akira Osawa
大沢 昭
Koichiro Honda
耕一郎 本田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP17725583A priority Critical patent/JPS6071593A/en
Publication of JPS6071593A publication Critical patent/JPS6071593A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20Controlling or regulating
    • C30B15/22Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
    • C30B15/26Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal using television detectors; using photo or X-ray detectors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To obtain a changing point with high dependability when a parameter relating to crystal growth is changed by marking a crystal ingot under crystal growth with the irradiation of a laser beam. CONSTITUTION:A seed crystal 4 attached to a seed shaft 3 is brought into contact with the core part of crystal melt 2 in a quartz crucible 1 at the core part of a furnace, and a thermal equilibrium is attained. Then the shaft 3 is slowly rotated by a seed shaft motor 15, and the shaft 3 is pulled up while cooling slowly the temp. of the free surface of the melt 2. When the lifting speed of the shaft 3 and rotating speed as the parameters of the lifted crystal or the rotating speed of the crucible 1 are changed, a laser beam 14 is irradiated toward the solid and liquid interface 12 from a laser beam source 10 to melt the grown crystal body 11 and the cut a streaky mark.

Description

【発明の詳細な説明】 (a)発明の技術分野 本発明は結晶成長方法に関する。[Detailed description of the invention] (a) Technical field of the invention The present invention relates to a crystal growth method.

(b)技術の背景 本発明は結晶成長中の結晶インゴットに目印を付す方法
に係る。
(b) Background of the Technology The present invention relates to a method of marking a crystal ingot during crystal growth.

(C)従来技術の問題点 例えばシリコン等の単結晶成長を行う所謂、チョクラル
スキー法と呼ばれる結晶引上法に於いて。
(C) Problems with the Prior Art For example, in the so-called Czochralski method, a crystal pulling method for growing a single crystal of silicon or the like.

例えばシード軸の引上げ速度、或いは坩堝の回転速度環
、結晶育成に係るパラメータを変化させた時、該変化点
を結晶インゴット完成後正確に知ることが必要となるこ
とがある。
For example, when changing the pulling speed of the seed shaft, the rotation speed ring of the crucible, or parameters related to crystal growth, it may be necessary to accurately know the point of change after the crystal ingot is completed.

係る際、従来、結晶成長中の種結晶装着のシード軸の重
さく引上げ重さ)或いは、シード軸の引上げ距離から換
算して、インゴ・ノド位置を推定していた。然し、結晶
インゴ・ノド完成後、成長条件の変化点を高い信頼性で
めるのは至難である。
In this case, conventionally, the ingo/nod position has been estimated by converting from the weight of the seed shaft attached to the seed crystal during crystal growth (pulling weight) or the pulling distance of the seed shaft. However, it is extremely difficult to reliably determine the point at which the growth conditions change after the crystal ingot is completed.

(d)発明の目的 本発明の目的は前記の難点を解決する事、即ち。(d) Purpose of the invention The object of the present invention is to solve the above-mentioned difficulties, namely.

成長中の結晶インゴットに目印(マーク)を付与する方
法を提示するものである。
A method for adding marks to a growing crystal ingot is presented.

(e)発明の構成 前記目的は、結晶成長中の結晶インゴ・ノドにレーザビ
ームを照射して該結晶インゴットに印を付けることによ
り達成される。
(e) Structure of the Invention The above object is achieved by irradiating a laser beam onto the nodule of the crystal ingot during crystal growth to mark the crystal ingot.

(「)発明の実施例 以下9本発明の結晶成長方法実施例を図面に従って詳細
に説明する。
(') Embodiments of the Invention Nine embodiments of the crystal growth method of the present invention will be described in detail below with reference to the drawings.

添付図面はチョクラルスキー法による抵抗加熱型引上げ
炉の構造を示す断側面図である。
The attached drawing is a cross-sectional side view showing the structure of a resistance heating type pulling furnace using the Czochralski method.

図に於いて、1は炉心部にある石英坩堝、2は前記石英
坩堝1中の多結晶とドープ材とを熔解した結晶メルト 
3は前記メルト2の6部に種結晶4を浸漬して引上げる
シード軸、5は坩堝1を取り囲む抵抗体内蔵の円筒形黒
鉛発熱体、6はステンレスからなる前記発熱体5外周の
熱遮蔽体(炉筺体)、7と8は炉筺体6に設けられた結
晶成長の状態を監視する覗き窓、9は結晶メルトの温度
計測等をなす輻射温度針、及び10は本発明の要部手段
に係る例えばNd”: YAGレーザまたはCOzレー
ザ光源、該光源10は図示の様に成長結晶体11と結晶
メルト2との境界面12に向は照射される様に配置され
る。
In the figure, 1 is a quartz crucible in the reactor core, and 2 is a crystal melt in which the polycrystal and dope in the quartz crucible 1 are melted.
3 is a seed shaft for dipping and pulling up the seed crystal 4 into 6 parts of the melt 2; 5 is a cylindrical graphite heating element with a built-in resistor that surrounds the crucible 1; 6 is a heat shield around the outer periphery of the heating element 5 made of stainless steel. 7 and 8 are viewing windows provided in the furnace casing 6 to monitor the state of crystal growth; 9 is a radiation temperature needle for measuring the temperature of the crystal melt; and 10 is a main means of the present invention. For example, a Nd'':YAG laser or a COz laser light source, the light source 10 is arranged so as to irradiate the interface 12 between the growing crystal 11 and the crystal melt 2 as shown in the figure.

尚1図中の13は前記メルト2の攪拌と温度を一定とす
る坩堝回転用モータ、及び15は前記シード軸3の回転
並びに引上げ駆動用モータである。
Reference numeral 13 in FIG. 1 is a crucible rotation motor for stirring the melt 2 and keeping the temperature constant, and 15 is a motor for driving the rotation and pulling up of the seed shaft 3.

結晶成長時は2例えばArガス約10)−ル程度の炉内
雰囲気となし、温度14oo℃強(シリコン)の結晶メ
ルト6部に目的方位の種結晶4を接触させ熱平衡状態と
なした後、前記シード軸モータ15によりシード軸3を
徐回転させ、この場合、結晶メルト自由面の温度を徐冷
しながらシード軸を引上げる。
During crystal growth, the atmosphere in the furnace is about 2, for example, Ar gas (about 10) -L, and after bringing the seed crystal 4 in the desired orientation into contact with 6 parts of the crystal melt (silicon) at a temperature of just over 140° C., a state of thermal equilibrium is established. The seed shaft 3 is slowly rotated by the seed shaft motor 15, and in this case, the seed shaft is pulled up while slowly cooling the temperature of the free surface of the crystal melt.

本発明の結晶成長方法は、前記引上げ中に於いて、引上
げ結晶のパラメータとして例えばシード軸の引上げ速度
1回転速度を変えた時、あるいは坩堝の回転速度を変え
た時5.同時に固液境面12に向はレーザ光源10から
のビーム14を照射する。該照射ビームを当てることに
よりその部分での結晶が溶融し、スジが形成され、直接
、結晶体(成長中結晶インゴット)11に対して前記生
成のパラメータ変化の目印が刻入される。
In the crystal growth method of the present invention, during the above-mentioned pulling, when a parameter of the pulled crystal is changed, for example, the pulling speed of the seed shaft per revolution, or the rotation speed of the crucible is changed.5. At the same time, the solid-liquid interface 12 is irradiated with a beam 14 from the laser light source 10. By applying the irradiation beam, the crystal in that part is melted, a streak is formed, and a mark of the parameter change of the generation is directly engraved on the crystal body (growing crystal ingot) 11.

レーザビームは位相が揃い良好な指向性を有するので局
部的に鮮明な目印を付すことが出来る。
Since the laser beam is in phase and has good directivity, it is possible to make a clear mark locally.

然もそのビームはエネルギ強度、断面形状、更に指向位
置等の制御が精度高く且つ容易になされる。
However, the energy intensity, cross-sectional shape, pointing position, etc. of the beam can be controlled with high accuracy and ease.

(g)発明の効果 前記実施例により詳細に説明した本発明の結晶成長方法
によれば、引上げの結晶成長インゴット11に直接、マ
ーキングを正確な位置に付与することが可能となる。係
る観点から本発明の実用的価値が大きい。
(g) Effects of the Invention According to the crystal growth method of the present invention, which has been explained in detail in the above embodiments, markings can be directly applied to the pulled crystal growth ingot 11 at accurate positions. From this point of view, the present invention has great practical value.

【図面の簡単な説明】[Brief explanation of the drawing]

KW図は1本発明の結晶成長装置構成実施例を示す断側
面図である。
The KW diagram is a cross-sectional side view showing an embodiment of the structure of a crystal growth apparatus according to the present invention.

Claims (1)

【特許請求の範囲】[Claims] 結晶成長中の結晶インゴットにレーザビームを照射して
該結晶インゴットに印を付けることを特徴とする結晶成
長方法。
A crystal growth method characterized by irradiating a crystal ingot during crystal growth with a laser beam to mark the crystal ingot.
JP17725583A 1983-09-26 1983-09-26 Growing method of crystal Pending JPS6071593A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17725583A JPS6071593A (en) 1983-09-26 1983-09-26 Growing method of crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17725583A JPS6071593A (en) 1983-09-26 1983-09-26 Growing method of crystal

Publications (1)

Publication Number Publication Date
JPS6071593A true JPS6071593A (en) 1985-04-23

Family

ID=16027873

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17725583A Pending JPS6071593A (en) 1983-09-26 1983-09-26 Growing method of crystal

Country Status (1)

Country Link
JP (1) JPS6071593A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992019797A1 (en) * 1991-04-26 1992-11-12 Mitsubishi Materials Corporation Process for pulling up single crystal
CN1314080C (en) * 1993-01-18 2007-05-02 株式会社半导体能源研究所 MIS semiconductor device manufacture method
KR101287275B1 (en) * 2005-06-10 2013-07-17 제너럴 일렉트릭 캄파니 Free-formed quartz glass ingots and method for making the same

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992019797A1 (en) * 1991-04-26 1992-11-12 Mitsubishi Materials Corporation Process for pulling up single crystal
US5408952A (en) * 1991-04-26 1995-04-25 Mitsubishi Materials Corporation Single crystal growth method
CN1314080C (en) * 1993-01-18 2007-05-02 株式会社半导体能源研究所 MIS semiconductor device manufacture method
KR101287275B1 (en) * 2005-06-10 2013-07-17 제너럴 일렉트릭 캄파니 Free-formed quartz glass ingots and method for making the same

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