JPS6059152U - Ultrasonic flaw detection equipment - Google Patents

Ultrasonic flaw detection equipment

Info

Publication number
JPS6059152U
JPS6059152U JP14974583U JP14974583U JPS6059152U JP S6059152 U JPS6059152 U JP S6059152U JP 14974583 U JP14974583 U JP 14974583U JP 14974583 U JP14974583 U JP 14974583U JP S6059152 U JPS6059152 U JP S6059152U
Authority
JP
Japan
Prior art keywords
signal
section
output signal
transmission
converts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14974583U
Other languages
Japanese (ja)
Inventor
枦木 和弘
Original Assignee
三菱電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱電機株式会社 filed Critical 三菱電機株式会社
Priority to JP14974583U priority Critical patent/JPS6059152U/en
Publication of JPS6059152U publication Critical patent/JPS6059152U/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の超音波探傷装置の構成図、第2図はこの
考案による一実施例を示す超音波探傷装置のブロック図
、第3図はこの考案による超音波探傷装置の動作信号波
形図である。 図中1は同期部、2は掃引部、3は表示器、4は送信部
、5は受信部、6は探触子、7はゲート発生器、10は
比較レベル設定器、11は比較回路、13はカウンタ一
部、14はデコーダ一部、  ”15は第1のフリップ
フロップ、16−は第1のNORゲート、17は第1の
モノマルチ、18は第2のフリップフロップ、19は第
3のモノマルチ、20は第2のNORゲート、21は第
3のモノフルf、22は第3のフリップフロップ、23
は第3のNORゲート、24はサンプリング部である。 尚図中、同一または相当部分には同一符号を付して示し
である。
Fig. 1 is a block diagram of a conventional ultrasonic flaw detection device, Fig. 2 is a block diagram of an ultrasonic flaw detection device showing an embodiment of this invention, and Fig. 3 is an operating signal waveform diagram of the ultrasonic flaw detection device of this invention. It is. In the figure, 1 is a synchronization section, 2 is a sweep section, 3 is a display, 4 is a transmitter, 5 is a receiver, 6 is a probe, 7 is a gate generator, 10 is a comparison level setter, and 11 is a comparison circuit , 13 is part of the counter, 14 is part of the decoder, 15 is the first flip-flop, 16- is the first NOR gate, 17 is the first monomulti, 18 is the second flip-flop, and 19 is the second flip-flop. 3 mono multi, 20 the second NOR gate, 21 the third mono full f, 22 the third flip-flop, 23
is a third NOR gate, and 24 is a sampling section. In the drawings, the same or corresponding parts are designated by the same reference numerals.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 同期信号を発生する同期部と、この同期部からの出力信
号をもとにして送信信号を発生する送信部と、上記送信
部から生ずる送信信号を超音波信号に変換して被検材に
超音波を入射させるとともに、上記被検材からの反射波
を電気信号に変換する探触子と、上記探触子からの電気
信号を増巾する受信部と、上記受信部の出力信号を所定
のレベルと比較しパルス波形として出力する比較回路と
、上記比較回路の出力信号により複数個のゲート信号を
発生するゲート発生部と、上記ゲート発生部の出力信号
により上記受信部の出力信号をサンプリングするサンプ
リング部とを備えた事を特徴とする超音波探傷装置。
A synchronization section that generates a synchronization signal, a transmission section that generates a transmission signal based on the output signal from the synchronization section, and a transmission section that converts the transmission signal generated from the transmission section into an ultrasonic signal and transmits the ultrasonic wave to the specimen. A probe that injects a sound wave and converts the reflected wave from the test material into an electrical signal, a receiver that amplifies the electrical signal from the probe, and an output signal of the receiver that converts the output signal into a predetermined signal. a comparison circuit that compares the level with the signal and outputs it as a pulse waveform; a gate generation section that generates a plurality of gate signals based on the output signal of the comparison circuit; and an output signal of the reception section that samples the output signal of the reception section using the output signal of the gate generation section. An ultrasonic flaw detection device characterized by comprising a sampling section.
JP14974583U 1983-09-28 1983-09-28 Ultrasonic flaw detection equipment Pending JPS6059152U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14974583U JPS6059152U (en) 1983-09-28 1983-09-28 Ultrasonic flaw detection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14974583U JPS6059152U (en) 1983-09-28 1983-09-28 Ultrasonic flaw detection equipment

Publications (1)

Publication Number Publication Date
JPS6059152U true JPS6059152U (en) 1985-04-24

Family

ID=30332321

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14974583U Pending JPS6059152U (en) 1983-09-28 1983-09-28 Ultrasonic flaw detection equipment

Country Status (1)

Country Link
JP (1) JPS6059152U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52104285A (en) * 1976-02-27 1977-09-01 Hitachi Ltd Ultrasonic reflectoscope
JPS57108658A (en) * 1980-12-26 1982-07-06 Teitsuu Denshi Kenkyusho:Kk Circuit having plurality of ultrasonic wave echo gates

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52104285A (en) * 1976-02-27 1977-09-01 Hitachi Ltd Ultrasonic reflectoscope
JPS57108658A (en) * 1980-12-26 1982-07-06 Teitsuu Denshi Kenkyusho:Kk Circuit having plurality of ultrasonic wave echo gates

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