JPS6059152U - Ultrasonic flaw detection equipment - Google Patents
Ultrasonic flaw detection equipmentInfo
- Publication number
- JPS6059152U JPS6059152U JP14974583U JP14974583U JPS6059152U JP S6059152 U JPS6059152 U JP S6059152U JP 14974583 U JP14974583 U JP 14974583U JP 14974583 U JP14974583 U JP 14974583U JP S6059152 U JPS6059152 U JP S6059152U
- Authority
- JP
- Japan
- Prior art keywords
- signal
- section
- output signal
- transmission
- converts
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の超音波探傷装置の構成図、第２図はこの
考案による一実施例を示す超音波探傷装置のブロック図
、第３図はこの考案による超音波探傷装置の動作信号波
形図である。
図中１は同期部、２は掃引部、３は表示器、４は送信部
、５は受信部、６は探触子、７はゲート発生器、１０は
比較レベル設定器、１１は比較回路、１３はカウンタ一
部、１４はデコーダ一部、 ”１５は第１のフリップ
フロップ、１６−は第１のＮＯＲゲート、１７は第１の
モノマルチ、１８は第２のフリップフロップ、１９は第
３のモノマルチ、２０は第２のＮＯＲゲート、２１は第
３のモノフルｆ、２２は第３のフリップフロップ、２３
は第３のＮＯＲゲート、２４はサンプリング部である。
尚図中、同一または相当部分には同一符号を付して示し
である。Fig. 1 is a block diagram of a conventional ultrasonic flaw detection device, Fig. 2 is a block diagram of an ultrasonic flaw detection device showing an embodiment of this invention, and Fig. 3 is an operating signal waveform diagram of the ultrasonic flaw detection device of this invention. It is. In the figure, 1 is a synchronization section, 2 is a sweep section, 3 is a display, 4 is a transmitter, 5 is a receiver, 6 is a probe, 7 is a gate generator, 10 is a comparison level setter, and 11 is a comparison circuit , 13 is part of the counter, 14 is part of the decoder, 15 is the first flip-flop, 16- is the first NOR gate, 17 is the first monomulti, 18 is the second flip-flop, and 19 is the second flip-flop. 3 mono multi, 20 the second NOR gate, 21 the third mono full f, 22 the third flip-flop, 23
is a third NOR gate, and 24 is a sampling section. In the drawings, the same or corresponding parts are designated by the same reference numerals.
Claims (1)
号をもとにして送信信号を発生する送信部と、上記送信
部から生ずる送信信号を超音波信号に変換して被検材に
超音波を入射させるとともに、上記被検材からの反射波
を電気信号に変換する探触子と、上記探触子からの電気
信号を増巾する受信部と、上記受信部の出力信号を所定
のレベルと比較しパルス波形として出力する比較回路と
、上記比較回路の出力信号により複数個のゲート信号を
発生するゲート発生部と、上記ゲート発生部の出力信号
により上記受信部の出力信号をサンプリングするサンプ
リング部とを備えた事を特徴とする超音波探傷装置。A synchronization section that generates a synchronization signal, a transmission section that generates a transmission signal based on the output signal from the synchronization section, and a transmission section that converts the transmission signal generated from the transmission section into an ultrasonic signal and transmits the ultrasonic wave to the specimen. A probe that injects a sound wave and converts the reflected wave from the test material into an electrical signal, a receiver that amplifies the electrical signal from the probe, and an output signal of the receiver that converts the output signal into a predetermined signal. a comparison circuit that compares the level with the signal and outputs it as a pulse waveform; a gate generation section that generates a plurality of gate signals based on the output signal of the comparison circuit; and an output signal of the reception section that samples the output signal of the reception section using the output signal of the gate generation section. An ultrasonic flaw detection device characterized by comprising a sampling section.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14974583U JPS6059152U (en) | 1983-09-28 | 1983-09-28 | Ultrasonic flaw detection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14974583U JPS6059152U (en) | 1983-09-28 | 1983-09-28 | Ultrasonic flaw detection equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6059152U true JPS6059152U (en) | 1985-04-24 |
Family
ID=30332321
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14974583U Pending JPS6059152U (en) | 1983-09-28 | 1983-09-28 | Ultrasonic flaw detection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6059152U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52104285A (en) * | 1976-02-27 | 1977-09-01 | Hitachi Ltd | Ultrasonic reflectoscope |
| JPS57108658A (en) * | 1980-12-26 | 1982-07-06 | Teitsuu Denshi Kenkyusho:Kk | Circuit having plurality of ultrasonic wave echo gates |
-
1983
- 1983-09-28 JP JP14974583U patent/JPS6059152U/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52104285A (en) * | 1976-02-27 | 1977-09-01 | Hitachi Ltd | Ultrasonic reflectoscope |
| JPS57108658A (en) * | 1980-12-26 | 1982-07-06 | Teitsuu Denshi Kenkyusho:Kk | Circuit having plurality of ultrasonic wave echo gates |
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