JPS5817551U - Ultrasonic flaw detection equipment - Google Patents
Ultrasonic flaw detection equipmentInfo
- Publication number
- JPS5817551U JPS5817551U JP11254381U JP11254381U JPS5817551U JP S5817551 U JPS5817551 U JP S5817551U JP 11254381 U JP11254381 U JP 11254381U JP 11254381 U JP11254381 U JP 11254381U JP S5817551 U JPS5817551 U JP S5817551U
- Authority
- JP
- Japan
- Prior art keywords
- signal
- output
- synchronizer
- generates
- transmitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来の超音波探傷装置の構成図、第2 。
図はこの考案の一実施例を示す超音波探傷装置の゛ ブ
ロック図、第3図はこの考案による残響エコー検出器9
の詳細図、第4図は表示器3の表示例を示す図である。
図中1は同期部、2は掃引部、4は送信機、5は受信機
、6は探触子、7はゲート発生器、8はサンプリング回
路、9は残響エコー検出器、10はコンパレータ、11
はレベル設定器、12はカウンタ、13は自動ホールド
回路、14はD/A変換器である。尚、図中同一または
相当部分には同一符号を付して示しである。Fig. 1 is a block diagram of a conventional ultrasonic flaw detection device; The figure is a block diagram of an ultrasonic flaw detection device showing one embodiment of this invention, and Figure 3 is a reverberant echo detector 9 according to this invention.
FIG. 4 is a diagram showing an example of the display on the display 3. In the figure, 1 is a synchronization section, 2 is a sweep section, 4 is a transmitter, 5 is a receiver, 6 is a probe, 7 is a gate generator, 8 is a sampling circuit, 9 is a reverberation echo detector, 10 is a comparator, 11
1 is a level setter, 12 is a counter, 13 is an automatic hold circuit, and 14 is a D/A converter. It should be noted that the same or corresponding parts in the figures are indicated by the same reference numerals.
Claims (1)
らの出力信号をもとにして送信信号を発生する送信機と
、上記送信機から生ずる送信信号を超音波信号に変換し
て被検材に超音波を入射させるとともに、上記被検材か
らの反射波を電気信号に変換する探触子と、上記探触子
からの電気信号を増幅する受信機と、上記同期部からの
出力信号をもとにしてゲート信号を発生するゲート発生
器と、上記受信機の出力を上記ゲート信号によりサンプ
リングするサンプリング回路と、上記サンプリング回路
の出力によって残響エコーを検出する残響エコー検出器
とを備え、上記残響エコー検出器の出力を上記同期部に
与えて上記残響エコー検出器の出力に応じた繰返し周波
数を同期部により発生するように構成したことを特徴と
する超音波探傷装置。A synchronizer that generates a predetermined repetition frequency; a transmitter that generates a transmission signal based on the output signal from the synchronizer; and a transmitter that converts the transmission signal generated from the transmitter into an ultrasonic signal and transmits the signal to the specimen. A probe that injects ultrasonic waves into the sample and converts the reflected waves from the sample into an electrical signal, a receiver that amplifies the electrical signal from the probe, and an output signal from the synchronizer. a gate generator that generates a gate signal based on the gate signal; a sampling circuit that samples the output of the receiver using the gate signal; and a reverberant echo detector that detects a reverberant echo using the output of the sampling circuit; An ultrasonic flaw detection apparatus characterized in that the output of the reverberant echo detector is applied to the synchronizer so that the synchronizer generates a repetition frequency corresponding to the output of the reverberant echo detector.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11254381U JPS5817551U (en) | 1981-07-29 | 1981-07-29 | Ultrasonic flaw detection equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11254381U JPS5817551U (en) | 1981-07-29 | 1981-07-29 | Ultrasonic flaw detection equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5817551U true JPS5817551U (en) | 1983-02-03 |
Family
ID=29906868
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11254381U Pending JPS5817551U (en) | 1981-07-29 | 1981-07-29 | Ultrasonic flaw detection equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5817551U (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5310266A (en) * | 1976-07-16 | 1978-01-30 | Mitsubishi Electric Corp | Production of soldred semiconductor wafers |
-
1981
- 1981-07-29 JP JP11254381U patent/JPS5817551U/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5310266A (en) * | 1976-07-16 | 1978-01-30 | Mitsubishi Electric Corp | Production of soldred semiconductor wafers |
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