JPS6050340B2 - semiconductor element - Google Patents
semiconductor elementInfo
- Publication number
- JPS6050340B2 JPS6050340B2 JP55023081A JP2308180A JPS6050340B2 JP S6050340 B2 JPS6050340 B2 JP S6050340B2 JP 55023081 A JP55023081 A JP 55023081A JP 2308180 A JP2308180 A JP 2308180A JP S6050340 B2 JPS6050340 B2 JP S6050340B2
- Authority
- JP
- Japan
- Prior art keywords
- cylindrical
- electrode
- electrode bodies
- section
- glass tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/04—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
- H01L23/043—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body
- H01L23/051—Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body another lead being formed by a cover plate parallel to the base plate, e.g. sandwich type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Joining Of Glass To Other Materials (AREA)
- Glass Melting And Manufacturing (AREA)
Description
【発明の詳細な説明】
本発明は、リード線を介することなく印刷回路のよう
な基板上の回路導体に容器外面の導電部を直接ろう付し
て用いる半導体素子に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor element that is used by directly brazing a conductive portion on the outer surface of a container to a circuit conductor on a substrate such as a printed circuit without using lead wires.
電子回路を構成するため、絶縁基板上の印刷回路に回
路部品を接続することは広く行われている。半導体素子
をそのように接続するには、従来は、素子のリード線を
基板の穴に挿入し、基板上の回路導体とろう付していた
。しかし実装技術、特に自動実装技術の進歩に伴ない、
リード線を介することなく回路導体に直接ろう付できる
いわゆるリードレス型の半導体素子の開発が望まれるに
至つた。 第1図は、この要求にこたえるため本発明者
等が考案したリードレス型ダイオードの一構造例である
。2. Description of the Related Art Connecting circuit components to printed circuits on insulating substrates to construct electronic circuits is widely practiced. Conventionally, to connect semiconductor devices in this way, the lead wires of the devices are inserted into holes in the board and brazed to circuit conductors on the board. However, with the advancement of mounting technology, especially automatic mounting technology,
It has become desirable to develop a so-called leadless type semiconductor element that can be directly brazed to a circuit conductor without using lead wires. FIG. 1 shows an example of the structure of a leadless diode devised by the present inventors to meet this demand.
このダイオードは半導体素体1と、その両J面にそれぞ
れ接触する2個の電極体2と、両電極体2間にまたがる
ガラス管体3とを備え、両電極体2は各々断面の大きい
円柱部21と断面の小さい凸部22(この楊合は円柱状
)とを同軸的に一体に結合してなつていて凸部の端面2
3において半導体素体1の各面に接触し、ガラス管体3
は両電極体2の断面大の円柱部21の内側端面24およ
び凸部の外周面25に密着して素体1を気密封止する構
造となつている。このダイオードは、円柱部21で直接
回路導体と接続でき、さらに構造、組立てが著しく簡易
であるという特徴を持つ。ただ、この場合、ガラス管体
の融着にあたり、次のような問題を生ずることが解つた
。即ちこの構造の半導体素子を封止するには、半導体素
体1、両電極体2およびガラス管体3を組合せて第2図
に示す組立治具4内に入れ両電極体2を押し合わせる力
を加えながら加熱してガラス管体3を電極体2の凸部2
2の外周面25に融着させる。このとき、両電極体2の
凸部端面23と半導体素体1の、両面の電極とを確実に
接触させるために大きなりを加えると、両電極体2の断
面大の円柱部の内側端面24がガラス管体3の端面に強
い力で押しつけられる状態になることがある。This diode includes a semiconductor body 1, two electrode bodies 2 in contact with both J surfaces of the semiconductor element body 1, and a glass tube body 3 spanning between the two electrode bodies 2, each of which is a cylindrical body with a large cross section. The end surface 2 of the convex part 21 is coaxially joined together with a convex part 22 having a small cross section (this joint is cylindrical).
3 in contact with each surface of the semiconductor body 1, and the glass tube body 3
is in close contact with the inner end surface 24 of the cylindrical portion 21 having a large cross section and the outer circumferential surface 25 of the convex portion of both electrode bodies 2, thereby hermetically sealing the element body 1. This diode is characterized in that it can be directly connected to a circuit conductor through the cylindrical portion 21, and that its structure and assembly are extremely simple. However, in this case, it has been found that the following problems occur when fusing the glass tubes. That is, in order to seal a semiconductor element having this structure, the semiconductor element 1, both electrode bodies 2, and the glass tube body 3 are assembled and put into an assembly jig 4 shown in FIG. 2, and a force is applied to press both electrode bodies 2 together. The glass tube body 3 is heated while adding
It is fused to the outer circumferential surface 25 of No. 2. At this time, if a large beam is added to ensure that the convex end faces 23 of both electrode bodies 2 and the electrodes on both sides of the semiconductor element 1 are in contact with each other, the inner end face 24 of the cylindrical part with a large cross section of both electrode bodies 2 may be pressed against the end face of the glass tube 3 with a strong force.
そのような圧力により、第2図のA部に示すようにガラ
ス管体3のガラスが外側にはみ出して素子の仕上り形状
を損ねたり、組立治具4にガラスが付着して作業性を低
下させたりする。本発明はこのような不都合のない、封
止後の外形寸法の精度の良好なリードレス型の半導体素
子を提供することを目的とする。Such pressure may cause the glass of the glass tube 3 to protrude outward, damaging the finished shape of the element, as shown in part A of FIG. 2, or may cause glass to adhere to the assembly jig 4, reducing work efficiency. or It is an object of the present invention to provide a leadless type semiconductor element which does not have such disadvantages and has good accuracy in external dimensions after sealing.
この目的は、両電極体の少くとも一方が、その円柱部の
内側端面および凸部の外周面に接する仮.想円筒面との
間に空隙を生ずるような状であることによつて達成され
る。The purpose of this is to provide a temporary structure in which at least one of both electrode bodies is in contact with the inner end surface of the cylindrical portion and the outer circumferential surface of the convex portion. This is achieved by having a shape that creates a gap between it and the imaginary cylindrical surface.
以下図面を引用して本発明の実施例について説明する。Embodiments of the present invention will be described below with reference to the drawings.
第3図aは本発明にもとづく電極体2の一例で、凸部2
2の根元にくびれ26を有し、鎖こ線で示す仮想円筒面
5との間に空隙6を生じている。第4図に示す組立治具
4の空洞7の下底8に一方の電極体2aを置き、その凸
部22aに第3図bに示すガラス管体3を嵌め、電極体
2aの凸部端面23aに半導体素体1を載せ、最後にも
うクーつの電極体2bの凸部22bをガラス管体3の穴
の中に円柱部21bの内側端面24bがガラス管体3の
端面に接するまで挿入する。次いてこの組立治具を不活
性ガスふん囲気中で加熱してガラス管体3を融解させる
と、電極体2bは自重で凸部端面23bが半導体素体1
の上部電極に接触するまで沈下する。この際溶融ガラス
の一部はB部に示したように凸部22aおよび22bの
根元のくびれ26a,26b内を埋めるので、ガラス管
体3は外径側にふくらむことがなく、組立封止の終つた
リードレス型ダイオードの外形に異常を生ずることがな
い。この場合、各部品に寸法のばらつきがあつて、くび
れ26が完全にガラスで溝た)されなかつたとしても格
別に支障は生じない。第5a図は電極体2の異なる実施
例で、円柱部21の内側端面24に溝27を設け、仮想
円筒面5との間に空隙6を生じさせている。この電極体
2を第5図bのガラス管体3に嵌め、第4図と同・様の
方法で封止すれば、第5図cに示すように過剰のガラス
は溝27を埋め、外径側にはみ出ることがない。第6図
aは電極体の別の実施例で、この場合には電極体2の円
柱部21の内側端面24を傾斜面としている。それ故、
仮想円筒面5の端゛面との間には空隙6が生する。この
電極体2と第6図bに示すガラス管体3を用いて第4図
と同様の方法で封止すれば、ガラス管体3は電極体2に
押されて第6図cのように電極体2の円柱部21の内側
端面24に密着し、外径側にははみ出ることがない。第
7図a1第8図aはそれぞれ本発明による電極体の別の
実施例で、この場合には凸部22が円錐体状を呈してい
る。従つ仮想円筒面5と凸部22の外周面25との間に
空隙6を生ずる形状てある。これらの電極体2とそれぞ
れ第7図b、第8図bに示すガラス管体3を用いて第4
図と同様の方法で封止すれば、第7図C1第8図Cに示
すように過剰のガラスは電極体2の凸部22の外周面2
5に密着し、外径側には異常が生じない。これらのいず
れの電極体においても、電極体と仮想円筒面との間の空
隙が完全に満たされないことがあつても、半導体素子と
しての実用性には何等問題を生じない。上の各例におい
ては、半導体素体の両側に同一の形状の電極体を用いて
いるが、ガラス融着時に下側になる電極体には第1図に
示すような径大の円柱部と径小の円柱部から成る電極体
を用い、上側になる電極体にのみ本発明に基いて形状を
変えた電極体を用いてもよい。FIG. 3a shows an example of the electrode body 2 based on the present invention, in which the convex portion 2
2 has a constriction 26 at the base thereof, and a gap 6 is created between it and the virtual cylindrical surface 5 shown by chain dotted lines. One electrode body 2a is placed on the bottom 8 of the cavity 7 of the assembly jig 4 shown in FIG. 4, and the glass tube body 3 shown in FIG. Place the semiconductor body 1 on 23a, and finally insert the convex portion 22b of another electrode body 2b into the hole of the glass tube 3 until the inner end surface 24b of the cylindrical portion 21b contacts the end surface of the glass tube 3. . Next, when this assembly jig is heated in an inert gas atmosphere to melt the glass tube body 3, the electrode body 2b will be caused by its own weight to cause the convex end surface 23b to bend over the semiconductor element body 1.
sink until it touches the upper electrode. At this time, a part of the molten glass fills the constrictions 26a and 26b at the bases of the protrusions 22a and 22b as shown in part B, so the glass tube 3 does not bulge outward, and the assembly and sealing is prevented. No abnormality occurs in the external shape of the finished leadless diode. In this case, even if the constriction 26 is not completely grooved with glass due to dimensional variations in each component, no particular problem will occur. FIG. 5a shows a different embodiment of the electrode body 2, in which a groove 27 is provided on the inner end surface 24 of the cylindrical portion 21 to create a gap 6 between it and the virtual cylindrical surface 5. FIG. If this electrode body 2 is fitted into the glass tube 3 shown in FIG. 5b and sealed in the same manner as shown in FIG. It does not protrude to the radial side. FIG. 6a shows another embodiment of the electrode body, in which the inner end surface 24 of the cylindrical portion 21 of the electrode body 2 is an inclined surface. Therefore,
A gap 6 is created between the virtual cylindrical surface 5 and the end surface. If this electrode body 2 and the glass tube body 3 shown in FIG. 6b are sealed in the same manner as shown in FIG. 4, the glass tube body 3 will be pushed by the electrode body 2 and as shown in FIG. It is in close contact with the inner end surface 24 of the cylindrical portion 21 of the electrode body 2 and does not protrude toward the outer diameter side. 7a and 8a each show another embodiment of the electrode body according to the invention, in which the convex portion 22 has a conical shape. Accordingly, the shape is such that a gap 6 is created between the virtual cylindrical surface 5 and the outer peripheral surface 25 of the convex portion 22. Using these electrode bodies 2 and the glass tube bodies 3 shown in FIGS. 7b and 8b, respectively, a fourth
If the sealing is performed in the same manner as shown in the figure, the excess glass will be removed from the outer circumferential surface of the convex portion 22 of the electrode body 2, as shown in FIG. 7 C1 and FIG. 8 C.
5, and no abnormality occurs on the outer diameter side. In any of these electrode bodies, even if the gap between the electrode body and the virtual cylindrical surface is not completely filled, there is no problem in practicality as a semiconductor device. In each of the above examples, electrode bodies of the same shape are used on both sides of the semiconductor body, but the electrode body that becomes the lower side when glass is fused has a cylindrical part with a large diameter as shown in Figure 1. An electrode body consisting of a cylindrical portion with a small diameter may be used, and only the upper electrode body may have an electrode body whose shape is changed based on the present invention.
また仮想円筒面との間に複数の空隙を備えた電極体を利
用することも可能てある。以上述べたように、本発明に
基づく半導体素子は、過剰なガラスの逃げ部を有する電
極体を用いたもので、融着時にガラス管体が外径側には
み出ることがないという特徴を有する。It is also possible to use an electrode body having a plurality of gaps between it and the virtual cylindrical surface. As described above, the semiconductor element according to the present invention uses an electrode body having an excessive glass relief part, and has the characteristic that the glass tube body does not protrude to the outer diameter side during fusion bonding.
この結果、リードレス型の半導体素子の仕上り形状の安
定化、作業性の向上、電極体と半導体素体の電極との完
全な電気的接触ならびに各部品の寸法のばらつきの吸収
など極めて大きな効果を得ることができる。As a result, extremely large effects such as stabilization of the finished shape of leadless semiconductor elements, improved workability, complete electrical contact between the electrode body and the electrode of the semiconductor body, and absorption of dimensional variations of each component have been achieved. Obtainable.
第1図はリードレス型ダイオードの従来例の縦断面図、
第2図は第1図のダイオードの組立作業状態を示す側断
面図、第3図aは本発明によるリードレス型ダイオード
の一実施例の電極体の縦断面図、第3図bはそのガラス
管体の縦断面図、第4図は第3図A,bの部品を使用し
たダイオードの組立作業状態を示す側断面図、第5図な
いし第8図はそれぞれ本発明の異なる実施例を示し、a
は電極体、bはガラス管体、cは仕上りダイオードのそ
れぞれの縦断面図である。
1・・・半導体素体、2・・・・・・電極体、21・・
・・円柱部、22・・・・・凸部、24・・・・・・円
柱部の内側端面、25・・・・凸部の外周、3・・・・
・・ガラス管体、5・・・仮想円筒面、6・・・・・・
空隙。Figure 1 is a vertical cross-sectional view of a conventional example of a leadless diode.
FIG. 2 is a side sectional view showing the state of assembly of the diode shown in FIG. 1, FIG. FIG. 4 is a longitudinal sectional view of the tube body, FIG. 4 is a side sectional view showing the state of assembly of the diode using the parts shown in FIGS. 3A and 3B, and FIGS. 5 to 8 each show different embodiments of the present invention. ,a
is a vertical cross-sectional view of an electrode body, b is a glass tube body, and c is a finished diode. 1... Semiconductor element body, 2... Electrode body, 21...
...Cylindrical part, 22...Convex part, 24...Inner end surface of columnar part, 25...Outer periphery of convex part, 3...
...Glass tube body, 5...Virtual cylindrical surface, 6...
void.
Claims (1)
電極体と、該両電極体間にまたがるガラス管体とを備え
、前記両電極体は各々断面の大きい円柱部と断面の小さ
い凸部とを同軸的に一体に結合してなつていて凸部の端
面において前記半導体素体の各面に接触し、前記ガラス
管体は前記両電極体の断面大の円柱部の内側端面および
凸部の側面に密着して前記素体を気密封止し、しかも前
記電極体の少くとも一方は、その円柱部の内側端面およ
び凸部の外周面に接する仮想円筒面との間に空隙が生ず
るような形状であることを特徴とする半導体素子。 2 特許請求の範囲第1項記載の素子において、電極体
の少くとも一方が凸部の側面にくびれを有することを特
徴とする半導体素子。 3 特許請求の範囲第1項記載の素子において、電極体
の少くとも一方が断面大の円柱部の内側端面に溝を有す
ることを特徴とする半導体素子。 4 特許請求の範囲第1項記載の素子において、電極体
の少くとも一方の断面大の円柱部の内側端面が傾斜面で
あることを特徴とする半導体素子。 5 特許請求の範囲第1項記載の素子において、電極体
の少くとも一方の凸部外周面が円錐面であることを特徴
とする半導体素子。[Claims] 1. A semiconductor body, two electrode bodies in contact with both surfaces of the body, and a glass tube body spanning between the two electrode bodies, each of which has a large cylindrical section. and a convex portion with a small cross section are coaxially coupled together, and the end surfaces of the convex portion contact each surface of the semiconductor body, and the glass tube body is a cylindrical portion having a large cross section of both electrode bodies. The element body is hermetically sealed by being in close contact with the inner end face of the cylindrical part and the side surface of the convex part, and at least one of the electrode bodies is in contact with the virtual cylindrical face which is in contact with the inner end face of the cylindrical part and the outer peripheral surface of the convex part. 1. A semiconductor element characterized by having a shape such that a void is formed between the elements. 2. A semiconductor device according to claim 1, wherein at least one of the electrode bodies has a constriction on the side surface of the convex portion. 3. A semiconductor device according to claim 1, wherein at least one of the electrode bodies has a groove on the inner end surface of a cylindrical portion having a large cross section. 4. The semiconductor device according to claim 1, wherein the inner end surface of at least one cylindrical section having a large cross section of the electrode body is an inclined surface. 5. A semiconductor device according to claim 1, wherein at least one outer circumferential surface of the convex portion of the electrode body is a conical surface.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55023081A JPS6050340B2 (en) | 1980-02-26 | 1980-02-26 | semiconductor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55023081A JPS6050340B2 (en) | 1980-02-26 | 1980-02-26 | semiconductor element |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56120150A JPS56120150A (en) | 1981-09-21 |
JPS6050340B2 true JPS6050340B2 (en) | 1985-11-08 |
Family
ID=12100460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55023081A Expired JPS6050340B2 (en) | 1980-02-26 | 1980-02-26 | semiconductor element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6050340B2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6010760A (en) * | 1983-06-30 | 1985-01-19 | Sumitomo Electric Ind Ltd | Electrode part for diode |
JPS61125160A (en) * | 1984-11-22 | 1986-06-12 | Toshiba Corp | Leadless type glass sealing diode |
JPS62128646U (en) * | 1986-02-06 | 1987-08-14 |
-
1980
- 1980-02-26 JP JP55023081A patent/JPS6050340B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS56120150A (en) | 1981-09-21 |
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