JPS6045921A - Production of thin film magnetic head - Google Patents

Production of thin film magnetic head

Info

Publication number
JPS6045921A
JPS6045921A JP15449183A JP15449183A JPS6045921A JP S6045921 A JPS6045921 A JP S6045921A JP 15449183 A JP15449183 A JP 15449183A JP 15449183 A JP15449183 A JP 15449183A JP S6045921 A JPS6045921 A JP S6045921A
Authority
JP
Japan
Prior art keywords
conductive coil
thin film
coil pattern
forming
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15449183A
Other languages
Japanese (ja)
Inventor
Shigeru Shinkai
新海 茂
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Original Assignee
Renesas Semiconductor Manufacturing Co Ltd
Kansai Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Semiconductor Manufacturing Co Ltd, Kansai Nippon Electric Co Ltd filed Critical Renesas Semiconductor Manufacturing Co Ltd
Priority to JP15449183A priority Critical patent/JPS6045921A/en
Publication of JPS6045921A publication Critical patent/JPS6045921A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/31Structure or manufacture of heads, e.g. inductive using thin films
    • G11B5/3163Fabrication methods or processes specially adapted for a particular head structure, e.g. using base layers for electroplating, using functional layers for masking, using energy or particle beams for shaping the structure or modifying the properties of the basic layers

Landscapes

  • Magnetic Heads (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)

Abstract

PURPOSE:To prevent generation of a defective step owing to shrinkage of an insulating layer by forming a conductive coil pattern by prescribed stages via an org. resin and protective resist on a nonconductive thin film for forming a magnetic gap. CONSTITUTION:A nonmagnetic (SiO2) thin film 11 is deposited on a ferrite base plate 10 over the part for forming a conductive coil 17 from one end thereof and an org. polymer resin 12 is coated only on the part for forming said coil 17 thereon. Protective resist 13 is coated thereon over the entire part and is subjected to a baking treatment. A metallic (masking) film 14 is deposited thereon by evaporation. Photoresist 15 is formed in the region except the part intended for forming the conductive coil pattern thereon and the part of a window 16 is chemically etched away. The window 16 is then dug out by reactive dry etching and the conductive coil material is sputtered over the entire area. The resist 13 is removed by a solvent to form the conductive coil pattern 17. The generation of a defective step owing to shrinkage of an insulating layer 11 is thus prevented.

Description

【発明の詳細な説明】 技術分野 この発明は、薄膜磁気ヘッドのコイル形成波イホ1に関
するものである。
DETAILED DESCRIPTION OF THE INVENTION Technical Field The present invention relates to a coil forming wave Iho 1 of a thin film magnetic head.

背景技術 最近り、 A 、 T (デジタル・オーディオ・テー
プレコーダ)を初め磁気記録装置は、高記録密度変化が
要求されているが、線記録密度は限界に近づきつつあり
、今後これを飛躍的に改善することは期待できないため
、トラック密度を士けることによって高記録密度化を達
成することが考えられている。そこで、従来のバルク・
ヘッドに代り、高トランク密度化の容易な薄膜ヘッドが
賞月され始めた。しかしながら、薄膜ヘッドにおけるコ
イル形成技術は、未だ確立しておらず、次に述べる上部
コアの磁束乱れを惹起する欠点があった・すなわち、薄
膜ヘッドは、一般に第1図に示すように、下部コアとな
る基板1上に、磁気ギャップを形成するための非磁性体
薄膜2倉形成しておき、その薄膜2上に数回巻回する導
電コイルパターン3と、薄膜2以外で基板1と直接接合
し、かつ絶縁層4を介して導電コイルパターン8上へ乗
り上げて鎖交する上部コアとなる強磁性体薄膜5とを設
けている。この場合に、絶縁層4の上面は、導電コイル
パターン3の有無によって凸凹を生じる。
Background Art Recently, magnetic recording devices such as A and T (digital audio tape recorders) are required to have high recording densities, but the linear recording density is approaching its limit, and it is expected that this will be dramatically increased in the future. Since no improvement can be expected, it has been considered to achieve higher recording density by increasing the track density. Therefore, conventional bulk
Thin film heads, which can easily achieve high trunk densities, have begun to be used instead of conventional heads. However, the coil forming technology for thin film heads has not yet been established, and has the drawback of causing magnetic flux disturbance in the upper core, which will be described below. Two non-magnetic thin films for forming a magnetic gap are formed on the substrate 1, and a conductive coil pattern 3 is wound several times on the thin film 2, and the conductive coil pattern 3 is directly bonded to the substrate 1 with something other than the thin film 2. In addition, a ferromagnetic thin film 5 serving as an upper core is provided which rides on and interlinks with the conductive coil pattern 8 via the insulating layer 4. In this case, the upper surface of the insulating layer 4 is uneven depending on the presence or absence of the conductive coil pattern 3.

すると、強磁性体薄膜5を形成する際に、凸凹の段差境
界6.6.・・ の段差部5’、 5’、・・・・ で
磁束が集中し7、下部コアに磁束が漏れてし1い、問題
であった。
Then, when forming the ferromagnetic thin film 5, the uneven step boundaries 6.6. The problem was that the magnetic flux was concentrated at the stepped portions 5', 5', 7, and the magnetic flux leaked to the lower core1.

このように段差部5’、 5’、・・・ で磁束集中が
生じる原因は、絶縁層4の素材が、相当大きな体積収縮
を生じて、段差部5’、5’、 近傍で異常な粗面を形
成してしまうことにある。しかも最近のように絶縁層4
に耐熱性良好かつ外部よりの放射線等の侵入を阻止し誤
記録を防ぐことが可能なポリイミド樹脂等を使用する場
合、より一層上記欠点が顕著である。
The reason why magnetic flux concentration occurs at the stepped portions 5', 5', ... is that the material of the insulating layer 4 undergoes considerable volumetric contraction, causing abnormal roughness in the vicinity of the stepped portions 5', 5', etc. The problem lies in forming a surface. Moreover, recently, insulating layer 4
When a polyimide resin or the like, which has good heat resistance and is capable of blocking the intrusion of radiation from the outside and preventing erroneous recording, is used, the above-mentioned drawbacks are even more noticeable.

発明の開示 この発明は、上記の技術的背景を考慮して検討の結果提
唱するもので、゛薄膜へ、ドの導電コイルと上部コア薄
膜とを絶縁する絶縁層が、リフトオフ法の採用により、
絶縁層中に、導電コイルを即込み形成でき、収縮による
不良段差解消を図ることを目的としている。すなわち、
この発明は、導電コイル並びに絶縁層形成に関して、予
め磁気ギャップ形成用でコイルパターン11を成予定f
f1sを含む非磁性体薄膜上に有機ポリマ樹脂並びに保
護レジストを全面塗布し、フォトリングラフィ技術を利
用して、導電コイルパターン形成予定部W外を金属被膜
でマスキング処理して、導電コイルパターン形成予定部
上の有機ポリマ樹脂のみを工7チング除去した後導電コ
イル材料を全面に被着させ、リフトオフ法によって、導
電コイルパターン形成予定部以外の導電利料、金属被膜
、保護レジストを剥離して、導電コイルパターンを有機
ポリマ樹脂に平坦埋込み形成させる方法を採用するもの
である。したがって、この発明によれば、平坦埋込み形
成の後最上層絶縁層を形成することにより不良段差解消
が図れるばかりでなく、薄膜へ・ソド製作工数を著しく
低減することが可能となる優れた一長所がある。
DISCLOSURE OF THE INVENTION This invention has been proposed as a result of studies in consideration of the above technical background.
The purpose of this method is to enable immediate formation of a conductive coil in an insulating layer, and to eliminate defective steps caused by shrinkage. That is,
Regarding the formation of a conductive coil and an insulating layer, the present invention is designed to form a coil pattern 11 in advance for forming a magnetic gap.
An organic polymer resin and a protective resist are applied to the entire surface of the non-magnetic thin film containing f1s, and the outside of the area W where a conductive coil pattern is to be formed is masked with a metal film using photolithography technology to form a conductive coil pattern. After removing only the organic polymer resin on the planned area, a conductive coil material is applied to the entire surface, and the conductive material, metal coating, and protective resist are removed from the area other than the area where the conductive coil pattern is planned to be formed using a lift-off method. This method employs a method in which a conductive coil pattern is flatly embedded in an organic polymer resin. Therefore, according to the present invention, by forming the uppermost insulating layer after flat embedding, it is possible not only to eliminate the defective step difference, but also to significantly reduce the number of man-hours required for manufacturing thin films. There is.

発明を実施するだめの最良の形態 この発明を実施する場合には、次に示す実施例があり、
その最良の形態を容易に想起できる。
BEST MODE FOR CARRYING OUT THE INVENTION When carrying out this invention, there are the following embodiments.
Its best form can be easily recalled.

第2図〜第11図は、この発明の一実施例を示す薄膜へ
、ドの製造各工程における断面図である。
FIGS. 2 to 11 are cross-sectional views at various steps of manufacturing a thin film according to an embodiment of the present invention.

まず、第2図のように、Mn−2,、単結晶フェライト
基板10を用意しておき、その一方端より導電コイル形
成部分−帯止に非磁性体であるslo。
First, as shown in FIG. 2, a Mn-2, single crystal ferrite substrate 10 is prepared, and from one end of the substrate slo, which is a non-magnetic material, is connected to the conductive coil forming portion.

膜11を被着させる。つぎに、第8図のように、!9i
0.膜ll上の導電コイル形成部分のみに、絶縁材料で
耐熱性良好なポリイミド樹脂例えばデュポン社製PI−
2555樹脂12を全面塗布し、約450℃にてキユア
リングし、さらに、アセ1−ン等の溶剤に溶けylいポ
ジ型で全屈材料に対して接着性が良い保護レジスト18
を塗布して80℃〜150℃にてベーキング処理する。
A membrane 11 is applied. Next, as shown in Figure 8,! 9i
0. Only on the conductive coil forming part on the membrane 11, an insulating material and heat resistant polyimide resin such as DuPont's PI-
2555 resin 12 is applied to the entire surface, cured at about 450°C, and then a protective resist 18 is applied which is soluble in solvents such as acetone, positive type, and has good adhesion to fully flexed materials.
is applied and baked at 80°C to 150°C.

つぎに蒸着法を用いて、保護レジスト18上に第4図に
示す通り、Tiを数千A被着させてマスキング皮膜14
を形成する。その後、第5図に示すようにフォトリソグ
ラ技術を適用する目的で、紫外線感光性の環化ゴム系フ
ォトレジスト15を、導電コイルパターン形成予定部以
外に対応するマスキング皮膜14上に固着し、ついで、
第6図の通りマスキング皮膜14のフォトレジヌl−1
’5か固着されておらず露出している窓部16の部分を
化学工、チング処理して除去する。それから、窓+<l
! 16に対応している保護レジスト18及びポリイミ
1−′樹脂12を、酸素雰囲気中にてガスプラズマエツ
チング、すなわち、反応性ドライエツチング処理して、
第7図の通り窓16を掘り下げて除去する。この時、窓
16では、マスキング皮膜14は、保護レジヌ1−12
及びポリイミド樹脂12がエツチング処理に生じるアン
ダミカット現象によって窓の周縁部より窓内へ突出して
丁度庇を形成した状態となっている。そこで、第8図に
示すように、導電コイル枳料17であるA1!をスパリ
タリング法によって全域に被Mさせる。するとこの場合
、マスキング皮膜14が先述した通り庇状態となってい
るので、怒部16内では、M17は、底部の5ift膜
11から側壁部のポリイミド樹脂12及び保護レジスト
13の一部までしか被着していない。その後、アセトン
等の溶剤に浸漬すると、保護レジメ)18が膨潤し溶解
されるため、いわゆるリフトオフ法によって、保護レジ
スト12及びマスキング皮膜14とその上のAl!17
のみが、第9図に示す通りに除去される。つまり、この
時点で、導電コイル拐料であるAC17がポリイミド樹
脂12に平坦埋込み形成されるわけである。以上の処理
工程を経た後で、平坦埋込み面18上に、感光性ポリイ
ミド樹脂12′を最」二層絶縁層として第10図のよう
に塗布現像し、さらに第11図の通りF/−NI系会合
金利ヌパリタリング被着させて」二部コア19を形成す
ると所望の薄膜へ・、ドが得られ、る。
Next, using a vapor deposition method, several thousand amps of Ti is deposited on the protective resist 18 as shown in FIG.
form. Thereafter, as shown in FIG. 5, for the purpose of applying photolithographic technology, an ultraviolet-sensitive cyclized rubber photoresist 15 is fixed on the masking film 14 corresponding to the area other than the area where the conductive coil pattern is to be formed. ,
Photoresin l-1 of the masking film 14 as shown in FIG.
5. The exposed portion of the window 16 that is not fixed is removed by chemical processing or ching. Then window +<l
! The protective resist 18 and polyimide 1-' resin 12 corresponding to No. 16 were subjected to gas plasma etching, that is, reactive dry etching, in an oxygen atmosphere.
As shown in FIG. 7, the window 16 is dug down and removed. At this time, on the window 16, the masking film 14 is applied to the protective resin 1-12.
The polyimide resin 12 protrudes into the window from the periphery of the window due to an undercut phenomenon that occurs during the etching process, forming an eave. Therefore, as shown in FIG. 8, A1! which is the conductive coil material 17! M is applied over the entire area by the spattering method. In this case, since the masking film 14 is in the eaves state as described above, the M17 is covered only from the 5ift film 11 at the bottom to part of the polyimide resin 12 and protective resist 13 at the side wall in the angular part 16. I'm not wearing it. Thereafter, when immersed in a solvent such as acetone, the protective resist 18 swells and dissolves, so that the protective resist 12 and masking film 14 and the overlying Al! 17
only is removed as shown in FIG. That is, at this point, the conductive coil material AC17 is formed flat and embedded in the polyimide resin 12. After the above processing steps, photosensitive polyimide resin 12' is coated and developed as a two-layer insulating layer on the flat buried surface 18 as shown in FIG. The two-part core 19 is formed by depositing the agglomerate nucleator to form the desired thin film.

以上の薄膜へ・ノドの製造方法によれば、従来中じてい
た絶縁層の凸凹による問題が解決されるばかりでなく、
次に示すように薄膜へ、ド処即工数低減にも寄与できる
。すなわち、絶縁層拐料として、ポリイミド樹脂等を採
用する場合に、こノ1.らは・、キユアリング時に収縮
してその表面でも凸凹を形成し易いので、凸部を数回の
エツチング処理にて修正する必要がある。しかし、この
実施例では、1回のリフトオフ作業で導電コイルに絶縁
層が埋込みされ、その時の不要被着部分のみをエツチン
グ処理すればよいので、処理は1回で済み工数低減が図
れるのである。
According to the above-mentioned thin film/nod manufacturing method, not only the problems caused by the unevenness of the insulating layer, which conventionally existed, can be solved, but also
As shown below, it can also contribute to reducing the number of man-hours required for processing thin films. That is, when a polyimide resin or the like is used as the insulating layer material, the above 1. Since these tend to contract during curing and form unevenness on the surface, it is necessary to correct the protrusions by etching several times. However, in this embodiment, the insulating layer is embedded in the conductive coil in one lift-off operation, and only the unnecessary deposited portions need to be etched at that time, so the process can be performed only once, reducing the number of man-hours.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、一般的な薄膜磁気ヘッドのlfi誓を示す断
面図、第2図〜第11図は、この発明の一実施例を示す
各製造工程における薄膜へ、1・の断面図である。 10 ・ 基板(下部コア)、 11−・ ・非磁性体薄膜、 12.12’ ・有機ポリマ樹脂、 13・・・ ・ 保護レジスト、 14:・・・・・−・・金属被膜(マスキング皮膜)、
17 ・・・・ ・ 導電コイルパターン、1B−・・
・・・・・・平坦埋込み面、19 ・・ ・強磁性体薄
膜(上部コア)。 m ]o図 第1]図
FIG. 1 is a cross-sectional view showing the lfi ratio of a general thin-film magnetic head, and FIGS. 2 to 11 are cross-sectional views of the thin film in each manufacturing process showing an embodiment of the present invention. . 10: Substrate (lower core), 11-: Non-magnetic thin film, 12.12': Organic polymer resin, 13: Protective resist, 14: Metal coating (masking film) ,
17... Conductive coil pattern, 1B-...
...Flat buried surface, 19... -Ferromagnetic thin film (upper core). m]o figure 1] figure

Claims (2)

【特許請求の範囲】[Claims] (1)下部コアとなる強磁性体基板上に、磁気ギャップ
形成用の非磁性体薄膜を形成しておき、上記非磁性体薄
膜上に導電コイルパターンを設け、さらに非磁性体薄嗅
以外で基板と直接接合し、かつ絶に&層を介して導電コ
イルパターン上へ乗り上げて鎖交する上部コアとなる強
磁性体薄膜を形成する方法において、上記導電コイル並
びに絶縁層に関して、予めコイルパターン形成予定部を
含む非磁性体薄膜上に有機ポリマ樹脂並びに保護レジス
トを全1m倹布し、フォトリソグラフィ技術により、導
電コイルパターン形成予定部組外を金属被膜でマスキン
グ処理して、導電コイルパターン形成予定部上の有機ポ
リマ樹脂のみをエリチング除去l。 た後、導電コイル材料を全面に被着させ、リフト1オフ
によって、導電コイルパターン形成予定部組外の導電材
料、金属被膜、保護レジストを剥離して、導電コイルパ
ターンを有機ポリマ樹脂に平坦埋込み形成させることを
特徴とする薄膜磁気へノドの製造方法。
(1) A non-magnetic thin film for forming a magnetic gap is formed on a ferromagnetic substrate that will become the lower core, a conductive coil pattern is provided on the non-magnetic thin film, and a non-magnetic thin film is formed on the non-magnetic thin film. In a method of forming a ferromagnetic thin film which becomes an upper core which is directly bonded to a substrate and which rides on and interlinks with a conductive coil pattern through a layer, a coil pattern is formed in advance with respect to the conductive coil and the insulating layer. Spread organic polymer resin and protective resist for a total of 1 m on the non-magnetic thin film including the planned area, and use photolithography to mask the outside of the area where the conductive coil pattern is planned to be formed with a metal coating to form the conductive coil pattern. Remove only the organic polymer resin on the part by etching. After that, the conductive coil material is applied to the entire surface, and the conductive material, metal coating, and protective resist outside the area where the conductive coil pattern is to be formed are peeled off using lift 1-off, and the conductive coil pattern is flatly embedded in the organic polymer resin. A method for producing a thin film magnetic helix, characterized by forming a thin film magnetic helix.
(2)上記特許請求の範囲第1項の記載における有機ポ
リマ樹脂をポリイミド樹脂とすることを特徴とする薄膜
磁気ヘッドの製造方法。
(2) A method for manufacturing a thin-film magnetic head, characterized in that the organic polymer resin according to claim 1 is a polyimide resin.
JP15449183A 1983-08-23 1983-08-23 Production of thin film magnetic head Pending JPS6045921A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15449183A JPS6045921A (en) 1983-08-23 1983-08-23 Production of thin film magnetic head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15449183A JPS6045921A (en) 1983-08-23 1983-08-23 Production of thin film magnetic head

Publications (1)

Publication Number Publication Date
JPS6045921A true JPS6045921A (en) 1985-03-12

Family

ID=15585402

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15449183A Pending JPS6045921A (en) 1983-08-23 1983-08-23 Production of thin film magnetic head

Country Status (1)

Country Link
JP (1) JPS6045921A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63113812A (en) * 1986-10-30 1988-05-18 Hitachi Ltd Manufacture of thin film magnetic head
JPS63152010A (en) * 1986-12-16 1988-06-24 Hitachi Ltd Production of thin film magnetic head

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5542375A (en) * 1978-09-20 1980-03-25 Sharp Corp Manufacture of magnetic head
JPS5975420A (en) * 1982-10-22 1984-04-28 Hitachi Ltd Thin film magnetic head and its production

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5542375A (en) * 1978-09-20 1980-03-25 Sharp Corp Manufacture of magnetic head
JPS5975420A (en) * 1982-10-22 1984-04-28 Hitachi Ltd Thin film magnetic head and its production

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63113812A (en) * 1986-10-30 1988-05-18 Hitachi Ltd Manufacture of thin film magnetic head
JPS63152010A (en) * 1986-12-16 1988-06-24 Hitachi Ltd Production of thin film magnetic head

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