JPS6043762A - Measurement system for maximum transfer capacity of transfer device - Google Patents

Abstract

PURPOSE:To measure the accurate transfer capacity of a transfer device with no use of a measuring instrument but by measuring the transfer capacity after programming it by a processor. CONSTITUTION:A processor writes data alpha of an optional area X of a memory 2 and starts a pseudo I/O device 4 to transfer the data different from the data alpha which is previously written to the area X from the device 4. Then the time during which the area X is rewritten by the data transferred from the device 4 is measured. That is, the time is measured between a time point when a byte X1 at the head of the area X of the memory 2 is rewritten by the data transferred from the device 4 and a time point when a byte X2 at the end of the area X is rewritten by the data transferred from the device 4 for said measurement.

Description

DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention provides a computer system that includes a transfer device and a pseudo I10 device connected to the transfer device and has a large transfer capacity. The present invention relates to a method for measuring the maximum transfer capacity of a transfer device, which measures the maximum transfer capacity of the transfer device by activating the transfer device with an instruction to transfer a certain length of data.

[Prior art and problems]

FIG. 1 is a diagram illustrating the passage of time from the activation of the transfer device to the completion report.

The conventional method for measuring the maximum transfer capacity of a transfer device such as a channel device by starting and monitoring it from a central processing unit (CPU) is as shown in Figure 1.
The time A from the time when the I10 device is successfully started by the start command (SIO) from the PU) to the time when the I10100 completion report is made is measured, and the start-up is calculated theoretically in advance from this time A. The maximum transfer time was calculated by calculating the time (A-B-C) obtained by subtracting the delay time B at the time and the delay time C at the end. here,
The delay time B at the time of startup is the time from the time point a of startup to the time point when the actual data transfer is performed, and the delay time C at the time of termination is the time I10 from the time C when the data transfer is completed.
This is the time until time d when the 100 completion report is made.

In such conventional methods, there is no guarantee that the values of delay times B and C calculated in advance are the true values in the actual system, so the measured maximum transfer capacity lacks accuracy. there were.

Another method is to use a measuring instrument to directly measure the speed of the signal of the transferred load, but although it is accurate, there is a problem in that the measuring instrument must be prepared.

[Purpose of the invention]

The present invention is based on the above consideration, and an object of the present invention is to provide a method for measuring the maximum transfer capacity of a transfer device that can obtain accurate measurement values without using a measuring device. be.

[Structure of the invention]

For this purpose, the method for measuring the maximum transfer capacity of a transfer device according to the present invention includes a processing device, a storage device, a transfer device, and a pseudo input/output device connected to the transfer device and having a larger transfer capacity than the transfer device. In the computer system, the processing device starts up the pseudo input/output device by instructing it to transfer data to a specific area of the storage device, and then transfers data from the pseudo input/output device to a specific area of the storage device. The total amount obtained by measuring the time from when the first 1 byte of data in the specified area is rewritten to when the last 1 byte of data in the specified area is rewritten, and further measuring the above time a predetermined number of times. The present invention is characterized in that the maximum transfer capacity of the transfer device is calculated based on the time, the size of the specific area, and the value of the predetermined number of times.

[Embodiments of the invention]

Embodiments of the present invention will be described below with reference to the drawings.

FIG. 2 is a diagram showing the system configuration to which the present invention is applied, FIG. 3 is a diagram explaining the measurement time according to the present invention, and FIG. 4 is a diagram explaining the procedure for measuring the transfer capacity by the processing device according to the present invention. be. In FIG. 2, 1 is a processing device, 2 is a storage device, 3 is a transfer device to be measured, and 4 is a pseudo I10 device. The pseudo I10 device 4 connected to the transfer device under test 3 clearly has a larger transfer capacity than the transfer device under test 3. The processing device is a C"PU or the like of the main system, and is used to measure the maximum transfer capacity of the transfer device 3 to be measured. In the present invention, the processing device 1 can access any area (X) of the storage device 2. By activating the pseudo I10 device 4 after writing the data (α) that becomes is transferred, and area (X) of storage device 2 becomes pseudo I.
10 to measure the time required for rewriting data transferred from the device 4. To measure the time, the first byte (xt) of the area (X) of the storage device 2 is
This is done by measuring the time from when the area (X) is rewritten with the data transferred from the device 4 to when the last byte (X2) of the area (X) is rewritten with the same data. The processing procedure will be explained below with reference to FIG.

■ Set the measurement time to 0. Next, perform the process (■).

(2) Write data (α) different from the data transferred by the pseudo I10 device 4 into an arbitrary area (X) of the storage device 2;

Next, perform the process (■).

■ For the pseudo I10 device 4, the storage device 2 area (X
) is started with instructions to transfer data. Next, perform the process (■).

(2) Check whether the data of the first byte (Xl) of the area (X) of the storage device 2 is (α), that is, whether it has been rewritten with data transferred from the pseudo I10 device 4.

In the case of Yes, wait until the result becomes No, and in the case of No, perform the process (2).

(2) Measure the time (Ta) during which the data (α) of the first byte (X, ) of the area (X) of the storage device 2 is rewritten with the data transferred from the pseudo I10 device 4. Next, perform the process (■).

■ Last one (item (X2)) of area (X) of storage device 2
It is checked whether the data (α) has not been rewritten by the data transferred from the pseudo I10 device 4 (X,=α).

In the case of Yes, wait until the result becomes No, and in the case of No, perform the process (2).

■ Last 1 byte) (X2) data (α) is pseudo I10
The time Tb during which the data transferred from the device is rewritten is measured. Next, perform the process (■).

■ Measure the time required for data transfer and add it to the measurement time T. That is, the process (2) is performed on the 0th order where T=T+(Tb-Ta).

■ Check whether the specified port 4 (tL) has been reached.

In the case of Yes, the process of [phase] is performed, and in the case of NO, the process returns to the process of ■.

[Phase] Calculate the maximum transfer capacity of the transfer device under test 3.

The maximum transfer capacity (number of bytes in 7 seconds) is (bytes of area (X) × 1).The measurement time T is the number of times (n) of processes from ■ to ■ are executed as described above. This is the total time (Tb-4'a) obtained by this method, and it is desirable that the unit is the unit of seconds or more.

FIG. 3 shows the passage of time according to the present invention. Third
As is clear from the measurement time T shown in the figure, the processing device (C
It is possible to accurately measure the transfer time, which does not include the delay time from the activation from the PU (PU) to the actual data transfer.

Further, as an application of the present invention, by using a real I10 device, the transfer ability of the device (which usually has a smaller transfer ability than the transfer device) can be measured.

[Effects of the Invention] As is clear from the above explanation, according to the present invention, by converting the data into a siprogram using the processing device and measuring the transfer ability, it is possible to Accurate information regarding the transfer capability of the transfer device under test can be measured. Also,
There is no need to investigate delay times and other matters regarding the third-party transfer device as in the past.

[Brief explanation of drawings]

Fig. 1 is a diagram explaining the time elapsed from the startup of the I10 device to the completion report, Fig. 2 is a diagram showing the system configuration used in the present invention 75, and Fig. 3 is a diagram showing the measurement time according to the present invention. The explanatory diagram, FIG. 4, is a diagram illustrating the procedure for measuring the transfer ability by the processing device of the present invention. DESCRIPTION OF SYMBOLS 1... Processing device, 2... Storage device, 3-... Transfer device to be measured, 4... Pseudo I10 equipment. Patent Applicant: Fujitsu Ltd. Representative Patent Attorney Kyotani Yotsubu 11 car f 3 diagram 4 m

Claims (1)

[Claims] In an electronic computer system comprising a processing device, a storage device, a transfer device, and a pseudo input device connected to the transfer device and having a larger transfer capacity than the transfer device, the processing device includes the pseudo input/output device. is started with an instruction to transfer data to a specific area of the storage device, and then the first 1 byte of data in the specific area is rewritten with the data transferred from the pseudo input/output device. The maximum transfer capacity of the transfer device is characterized in that the transfer device is configured to calculate the maximum transfer capacity of the transfer device based on the size of the write area and the value of the predetermined number of times based on the data of the last 1 byte of the specific area after A method of measuring ability.