JPS6039045A - Table driving mechanism - Google Patents

Table driving mechanism

Info

Publication number
JPS6039045A
JPS6039045A JP58146357A JP14635783A JPS6039045A JP S6039045 A JPS6039045 A JP S6039045A JP 58146357 A JP58146357 A JP 58146357A JP 14635783 A JP14635783 A JP 14635783A JP S6039045 A JPS6039045 A JP S6039045A
Authority
JP
Japan
Prior art keywords
motor
rotation
clutch
drive
reverse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58146357A
Other languages
Japanese (ja)
Other versions
JPH06101420B2 (en
Inventor
Yasuhiro Koizumi
古泉 裕弘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58146357A priority Critical patent/JPH06101420B2/en
Publication of JPS6039045A publication Critical patent/JPS6039045A/en
Publication of JPH06101420B2 publication Critical patent/JPH06101420B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/25Movable or adjustable work or tool supports
    • B23Q1/44Movable or adjustable work or tool supports using particular mechanisms
    • B23Q1/56Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism
    • B23Q1/60Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism
    • B23Q1/62Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism with perpendicular axes, e.g. cross-slides
    • B23Q1/621Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism with perpendicular axes, e.g. cross-slides a single sliding pair followed perpendicularly by a single sliding pair

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Machine Tool Units (AREA)

Abstract

PURPOSE:To improve the rise-up action moving speed of a table when it is reciprocated, by providing a motor continuously rotated in the forward direction and that in the reverse direction so as to selectively transmit their rotation to a driving mechanism by a clutch. CONSTITUTION:In order to inspect a defect in a pattern of a photomask or the like used in the manufacturing process of a semiconductor device, the defect of the mask pattern is detected by placing a structure 26 to be inspected on X Y tables 3, 5 and reciprocating the structure in a direction X while moving it in a direction Y so as to be scanned by a detecting device. A moving direction of the X table 3 is switched by providing a motor 13 of forward rotation and a motor 15 of reverse rotation for reciprocating motion in the direction X so as to selectively transmit the rotation of the both motors to a feed screw 8 by electromagnetic clutches 17, 18. In this way, the accuracy of inspection is improved by improving the rise-up action of a moving speed.

Description

【発明の詳細な説明】 〔技術分野〕 本発明はテーブル駆動技術に関し、特に半導体製造装置
としてホトマスク及びレチクル等の試料の外観検査装置
に好適なテーブル駆動技術に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to table driving technology, and more particularly to table driving technology suitable for semiconductor manufacturing equipment, such as appearance inspection equipment for samples such as photomasks and reticles.

〔背景技術〕[Background technology]

半導体装置の製造工程の一つに、ホトリソグラフィ技術
にて形成されたホトマスクやレチクルのパターンに欠陥
が生じているか否かを検査する新開外観検査工程がある
。この外観横置は現在では殆んど自動化されており、被
検査体としてのホトマスクやレチクル等の試料なXYテ
ーブル上に載置してこれをX、 X方向に移動させる一
方、水銀灯光またはレーザ光等を利用したパターン検出
系をこの試料の移動によって相対的に走査することによ
り試料のパターンを検出し、検出したバターン情報をパ
ターン設計M/Tデータと比較してパターン(外観)の
検査を行なうように構成されている(例えば特開昭53
−117978号公報参照)。
2. Description of the Related Art One of the manufacturing processes for semiconductor devices is a new appearance inspection process for inspecting whether or not defects have occurred in patterns of photomasks and reticles formed using photolithography technology. This horizontal placement of the external appearance is now almost automated, and while the specimen to be inspected, such as a photomask or reticle, is placed on an XY table and moved in the X and X directions, it is The pattern of the sample is detected by relatively scanning the pattern detection system using light, etc. by moving the sample, and the detected pattern information is compared with pattern design M/T data to inspect the pattern (appearance). (For example, Japanese Patent Laid-Open No. 53
(Refer to Publication No.-117978).

ところで、この種の装置における前述のXYテーブルは
、通常X駆動部とX駆動部を有しており、前記パターン
検出系に対する試料の走査に際してはX方向に往復して
連続移動させる一方、Y方向に微小寸法でステップ移動
させる方法がとられている。そして、特にX方向の移動
に際しては、X駆動部に設けた駆動モータの回転方向を
正逆転制御することによりテーブルの往復移動を行ない
得るようになっている。
By the way, the aforementioned XY table in this type of device usually has an X drive section and an X drive section, and when scanning the sample with respect to the pattern detection system, it continuously moves back and forth in the A method of moving in small steps is used. Particularly when moving in the X direction, the table can be moved back and forth by controlling the rotation direction of a drive motor provided in the X drive section in forward and reverse directions.

しかしながら、このようなX方向の移動方式では、駆動
モータの正転と逆転との若干具なる回転速度によってテ
ーブルのX方向移動が往、復で夫々速度が相違すること
があり、また正逆転の切換時にモータ回転が停止される
ために立ち上り時、即ちテーブルの方向転換時の速度が
低くなる等、均一なテーブル速度が得られない。このよ
うな速度むらが生じていると、パターン検出系における
M/Tデータと検出データとの比較において、均一速度
で得られるM/Tデータに対する試料側のデータが時間
的に不揃いなものとなり、両者の比較タイミングが一致
せずに正確な比較、即ち精度の面いlA観検をが不可能
になる。
However, in such an X-direction movement method, the forward and reverse speeds of table movement in the X-direction may differ depending on the slightly different rotational speeds of the drive motor in forward and reverse rotations. Since the motor rotation is stopped at the time of switching, the speed at the time of start-up, that is, when the table changes direction, becomes low, and a uniform table speed cannot be obtained. If such speed unevenness occurs, when comparing the M/T data in the pattern detection system with the detected data, the data on the sample side will be inconsistent in time with respect to the M/T data obtained at a uniform speed. Since the timings of comparison between the two do not match, accurate comparison, that is, observation of accuracy becomes impossible.

このため、従来では正、逆転時の回転速度が等しくなる
ように駆動モータ回路の制御を行なっているが、正逆転
の切換が頻繁でかつ高速であるため応答遅れが生じる問
題があり、また切換時における立ち上り速度の安定化を
達成することは極めて困難である。
For this reason, in the past, the drive motor circuit was controlled so that the rotational speeds in forward and reverse directions were equal, but since the forward and reverse rotations were switched frequently and at high speeds, there was a problem in that a response delay occurred, and It is extremely difficult to achieve stabilization of the rise rate at times.

〔発明の目的〕[Purpose of the invention]

本発明の目的は往復移動されるテーブルの速度を一定に
かつこれを安定に保持することができるテーブル駆動機
構を提供することにある。
An object of the present invention is to provide a table drive mechanism that can keep the speed of a reciprocating table constant and stable.

また、本発明の目的はテーブルの往復速度の一定化、安
定化を図ることにより試料の外観検査を高精度に行なう
ことができる外観検査装置のテーブル駆動機構を提供す
ることにある。
Another object of the present invention is to provide a table drive mechanism for an appearance inspection apparatus that is capable of performing an appearance inspection of a sample with high precision by making the reciprocating speed of the table constant and stable.

本発明の前記7よらびにそのほかの目的と新規な特徴は
、本明細書の記述および添付図面からあきらかになるで
あろう。
The above seven objects and other objects and novel features of the present invention will become apparent from the description of this specification and the accompanying drawings.

〔発明の概要〕[Summary of the invention]

本願において開示される発明のうち代表的なものの概要
を簡単に説明すれば、下記のとおりである。
A brief overview of typical inventions disclosed in this application is as follows.

すなわち、往復移動されるテーブルに、正転モータと逆
転モータを夫々連結すると共に各モータには回転力の伝
達を遮断し得るクラッチを付設し、このクラッチを選択
的に作動し得るよう構成することにより、各モータを連
続回転させながらもテーブルの往復移動を可能とし、こ
れによりテーブル移動速度の一定化、安定化を容易に実
現するものである。
That is, a forward rotation motor and a reverse rotation motor are respectively connected to a table that is reciprocated, and each motor is provided with a clutch that can cut off transmission of rotational force, and the clutch is configured to be selectively activated. This makes it possible to reciprocate the table while continuously rotating each motor, thereby easily achieving constant and stable table movement speed.

〔実施例〕〔Example〕

第1図および第2図は本発明をホトマスクの外観検査装
置に適用した実施例で、第1図は平面図、第2図は正面
図である。図において、1は基盤であり、上面にはX方
向に延設した一対のレール2゜2を敷設してその上には
Xテーブル3をX方向に移動できるように搭載する一方
、Xテーブル3上にはY方向に一対のレール4.4を延
設してYテーブル5をY方向に移動できるように搭載し
ている。
FIGS. 1 and 2 show an embodiment in which the present invention is applied to a photomask appearance inspection apparatus, with FIG. 1 being a plan view and FIG. 2 being a front view. In the figure, reference numeral 1 denotes a base, on which a pair of rails 2゜2 extending in the X direction are laid, on which an X table 3 is mounted so that it can move in the X direction. A pair of rails 4.4 extend in the Y direction on top, and a Y table 5 is mounted so as to be movable in the Y direction.

前記Xテーブル3はその一側に一体形成した駆動片6を
有17ており、この駆動片6には前記基盤1に固設した
軸受7.7によって両端部を軸支されたウオーム軸8が
螺合されている。このウオーム軸8は前記Xテーブル3
の一側に沿ってX方向に延設されており、したがってウ
オーム軸8が軸転されればこれに螺合した駆動片6、即
ちXテーブル3がウオーム軸の軸転方向に応じて往動或
いは復動される。また、前記ウオーム軸8は各両端に大
径のギヤ9.10を夫々固着しており、これらのギヤ9
.10には夫々小径の駆動ギヤ11゜12を噛合させて
いる。そして、一方の駆動ギヤ】1には正転モータ13
の回転出力軸14を連結し、他方の駆動ギヤ12には前
記正転モータ13と逆方向に回転する逆転モータ15の
回転出力軸16を連結し、更に各モータの回転出力軸1
4゜16の中間には回転力の伝達をオン、オフし得る電
磁クラッチ17.18を介装し、各モータ13゜15の
回転力を各駆動ギヤ11.12に伝達し或いは伝達でき
ないようにしている。
The X-table 3 has a drive piece 6 integrally formed on one side thereof 17, and the drive piece 6 has a worm shaft 8 supported at both ends by bearings 7.7 fixed to the base 1. They are screwed together. This worm shaft 8 is connected to the X table 3.
It extends in the X direction along one side, and therefore, when the worm shaft 8 is rotated, the drive piece 6, that is, the X table 3 screwed thereon, moves forward according to the direction of rotation of the worm shaft. Or it will be returned. Further, the worm shaft 8 has large-diameter gears 9 and 10 fixed to each end thereof, and these gears 9 and 10 are connected to each other.
.. 10 are meshed with small-diameter drive gears 11 and 12, respectively. One drive gear [1] is a forward rotation motor 13.
The rotation output shaft 14 of each motor is connected to the other drive gear 12, and the rotation output shaft 16 of a reverse rotation motor 15 that rotates in the opposite direction to the normal rotation motor 13 is connected to the other drive gear 12.
An electromagnetic clutch 17.18 that can turn on and off the transmission of rotational force is interposed between 4.16 and 13.16, so that the rotational force of each motor 13.15 can be transmitted or not transmitted to each drive gear 11.12. ing.

一方、前記Yテーブル5にも同様に駆動片19が設けら
れ、前記Xテーブル3上にY方向に支持したウオーム軸
20に螺合されている。ウオーム軸20は軸受21,2
1により軸転可能とされると共に一端に固着したギヤ2
2にはモータ23によって回動されるギヤ24が噛合さ
れている。このモータ23には例えばパルスモータが使
用される。
On the other hand, a drive piece 19 is similarly provided on the Y table 5, and is screwed onto a worm shaft 20 supported on the X table 3 in the Y direction. The worm shaft 20 has bearings 21, 2
A gear 2 that can be rotated by 1 and is fixed to one end.
2 is meshed with a gear 24 rotated by a motor 23. For example, a pulse motor is used for this motor 23.

そして、前記正転モータ13.逆転モータ15゜クラッ
チ17,18.モータ23は制御回路25に接続され、
ここで電気的制御が行なわれる。
The normal rotation motor 13. Reverse motor 15° clutch 17, 18. The motor 23 is connected to a control circuit 25,
Electrical control is performed here.

他方、外観検査される試料、例えばホトマスク26は前
記Yテーブル5上に載置され、その上方には光学手段を
利用(−タパターン検出系27が図外の装置固定部圧固
定支持されて前記系トマスク26表面に可視光を投射し
、その透過光でホトマスクパターンを検出するようにな
っている。なお、パターン横用系27はM/Tデータと
の比較部を有1.ており、検出したパターンをこのM/
Tデータと比較することによりパターンの良、不良を検
査することができる。
On the other hand, a sample to be visually inspected, for example, a photomask 26, is placed on the Y table 5, above which a pattern detection system 27 is fixedly supported by an apparatus fixing part (not shown) using an optical means. The system projects visible light onto the surface of the photomask 26 and detects the photomask pattern using the transmitted light.The pattern horizontal use system 27 has a comparison section with the M/T data, and the detection This pattern is M/
By comparing with the T data, it is possible to inspect whether the pattern is good or bad.

以上の構成によれば、制御回路25では正転モータ13
と逆転モータ15が常に一定の速度で連続回転されるよ
うに制御を行なっている。この場合、各モータは連続回
転されるために応答性等の問題が生ずることはなく、し
たがって各モータ13.15の回転数の一致、一定化を
制御するこ−とは容易である。そして、制御回路25で
はクラッチ17.18を選択的にオン或いはオフ作動し
得るよう圧制御を行なえば、例えば正転モータ13のク
ラッチ17のみオンすれば、正転モータ13の回転出力
軸14によってギヤ11.9を介してウオーム軸8が正
転されXテーブル3を図示左方のX方向へ往動させる。
According to the above configuration, in the control circuit 25, the normal rotation motor 13
The reverse rotation motor 15 is controlled so that it always rotates continuously at a constant speed. In this case, since each motor is continuously rotated, problems such as responsiveness do not occur, and therefore it is easy to control the rotational speed of each motor 13, 15 to match and to be constant. If the control circuit 25 performs pressure control so that the clutches 17 and 18 can be selectively turned on or off, for example, if only the clutch 17 of the normal rotation motor 13 is turned on, the rotation output shaft 14 of the normal rotation motor 13 The worm shaft 8 is rotated forward through the gear 11.9, and the X table 3 is moved forward in the X direction to the left in the figure.

Xテーブル3が左方いっばいに移動した時点で、今度は
クラッチ17をオフしてクラッチ18をオンに切換えれ
ば、逆転モータ15の回転出力軸16の回転力がギヤ1
2゜10を介してウオーム軸8に伝達されウオーム軸8
を逆転する。これにより、Xテーブル3は図示右方のX
方向へ復動される。この動作により、モータの回転停止
に伴なう立ち上り時の速度むらやモータの正転、逆転時
の速度差による速度むら等を防止でき、一定でかつ安定
な速度での往復移動効果を得ることができる。
When the X table 3 has moved all the way to the left, if the clutch 17 is turned off and the clutch 18 is turned on, the rotational force of the rotational output shaft 16 of the reversing motor 15 is transferred to gear 1.
2°10 to the worm shaft 8.
Reverse. As a result, the X table 3 is
It will be moved back in the direction. This operation prevents speed unevenness during start-up due to the motor stopping rotation, speed unevenness due to speed differences between forward rotation and reverse rotation of the motor, and achieves the effect of reciprocating movement at a constant and stable speed. I can do it.

一方、Xテーブル3の往復移動に同期させて、方向の切
換時にモータ(パルスモータ)23を作動すれば、モー
タ23は微小回転し、これによりギヤ24.22を介し
てウオーム軸20を軸転し、更にYテーブル5をY方向
に微小移動させる。この結果、Yテーブル5上のホトマ
スク26は、前記Xテーブルの移動と相俟って第3図の
ように移動され、パターン検出系27に対して全面が走
査されてパターンの検査ないし外観の検査が行なわれる
。したがって、パターン検出系に対し′て一定かつ安定
した速度でホトマスクを走査できるので、M/Tデータ
との重ね合せ比較を好適に行なうことができ、正確かつ
高精度の検査を行なうことができる。
On the other hand, if the motor (pulse motor) 23 is operated at the time of direction switching in synchronization with the reciprocating movement of the Then, the Y table 5 is further moved slightly in the Y direction. As a result, the photomask 26 on the Y table 5 is moved as shown in FIG. 3 together with the movement of the X table, and the entire surface is scanned by the pattern detection system 27 for pattern inspection or appearance inspection. will be carried out. Therefore, since the photomask can be scanned at a constant and stable speed with respect to the pattern detection system, overlay comparison with M/T data can be suitably performed, and accurate and highly accurate inspection can be performed.

〔効果〕〔effect〕

(1)連続回転される正転モータと逆転モータとをクラ
ッチで切換えてテーブルに連結させかつ回転力を伝達で
きるように構成しているので、モータの回転速度の制御
を容易なものにできると共K、モータの立ち上り速度の
むら等が影響することもなく、一定かつ安定した速度で
テーブルを往復移動することができる。
(1) Since the continuously rotating forward motor and reverse motor are connected to the table by switching between them using a clutch and configured to transmit rotational force, the rotational speed of the motor can be easily controlled. In both cases, the table can be reciprocated at a constant and stable speed without being affected by uneven startup speed of the motor.

(21正転モータと逆転モータとをクラッチで切換える
ので、テーブルの移動方向の切換もクラッチへの制御信
号を切換えるだけでよくテーブルの制御を簡単に行なう
ことができる。
(21) Since the normal rotation motor and the reverse rotation motor are switched by a clutch, the table movement direction can be easily controlled by simply switching the control signal to the clutch.

(3)テーブルの往復移動速度を一定かつ安定に保持で
きるので、M/Tデータとの比較においてテーブル上の
試料の外観を走査して検査する方式の横歪装置では、正
確かつ高精度の外観検査を行なうことができる。
(3) Since the reciprocating speed of the table can be kept constant and stable, a transverse strain device that scans and inspects the external appearance of the sample on the table can achieve accurate and highly accurate external appearance when compared with M/T data. Tests can be carried out.

以上本発明者によってなされた発明を実施例にもとづき
具体的に説明したが、本発明は上記実施例に限定される
ものではなく、その要旨を逸脱しない範囲で種々変更可
能であることはいうまでもない。たとえば、ウオーム軸
に代えてベルト手段を使用してもよく、捷た電磁クラッ
チに代えて機械式、流体式のクラッチを使用してもよい
。また、XテーブルとYテーブルを交換した配置にして
もよい。また、テーブルの一側及びそれに対した側にそ
れぞれウオーム軸を設け、それにギヤ等を介しズ正転方
向に回転するモータまたは逆転方向に回転するモータを
接続してウオーム軸方向に作動するようにしてもよい。
Although the invention made by the present inventor has been specifically explained above based on Examples, it goes without saying that the present invention is not limited to the above Examples and can be modified in various ways without departing from the gist thereof. Nor. For example, a belt means may be used in place of the worm shaft, and a mechanical or hydraulic clutch may be used in place of the disengaged electromagnetic clutch. Further, the arrangement may be such that the X table and the Y table are exchanged. In addition, a worm shaft is provided on one side of the table and the other side, and a motor that rotates in the forward direction or a motor that rotates in the reverse direction is connected to the worm shaft through a gear etc. to operate in the direction of the worm shaft. It's okay.

〔利用分野〕[Application field]

以上の説明では主として本発明者によってなされた発明
をその背景となった利用分野である半導体装置の外観検
査装置に適用した場合について説明したが、それに限定
されるものではなく、−精密なテーブル制御を必要とす
る装置の往復テーブル機構に適用できる。
In the above explanation, the invention made by the present inventor was mainly applied to the visual inspection equipment for semiconductor devices, which is the background field of application, but the invention is not limited thereto. It can be applied to the reciprocating table mechanism of equipment that requires

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の平面図、 第2図はその正面図、 第3図はホトマスク(試料)の走査を説明するための模
式的平面図、 3・・・Xテーブル、5・・・Yテーブル、8・・・ウ
オーム軸、9〜12・・・ギヤ、13山正転モータ、1
5・・・逆転モータ、17.18・・・電磁クラッチ、
2゜・・・ウオーム軸、23・・・モータ、25・・・
制御回路、26・・・試料(ホトマスク)、27・・・
パターン検出系。 マ 255
FIG. 1 is a plan view of an embodiment of the present invention, FIG. 2 is a front view thereof, and FIG. 3 is a schematic plan view for explaining scanning of a photomask (sample). 3...X table, 5 ...Y table, 8...worm shaft, 9-12...gear, 13-gear forward rotation motor, 1
5... Reverse motor, 17.18... Electromagnetic clutch,
2゜...Worm shaft, 23...Motor, 25...
Control circuit, 26... Sample (photomask), 27...
Pattern detection system. Ma 255

Claims (1)

【特許請求の範囲】 1、駆動モータによりテーブルを往復移動し得るように
構成したテーブル駆動機構において、正転方向に連続回
転されるモータと、逆転方向に連続回転されるモータと
を夫々設けると共に前記各モータとテーブルとの間には
動力の伝達を遮断し得るクラッチを夫々設け、このクラ
ッチを選択的に作動し得るように構成したことを特徴と
するテーブル駆動機構。 2、各モータの回転軸には夫々電磁クラッチを介装する
と共に、各回転軸はテーブルを移動するウオーム軸とギ
ヤ結合してなる特許請求の範囲第1項記載のテーブル駆
動機構。 3、テーブルは外観検査装置の試料を載着するテーブル
であり、X方向に往復移動させるX駆動部に前記各モー
タ、クラッチ等を内装してなる特許請求の範囲第1項又
は第2項記載のテーブル駆動機構。 4、テーブルにはテーブルなY方向にステップ移動させ
るX駆動部を有1〜”(なる特許請求の範囲第3項記載
のテーブル駆動機構。
[Claims] 1. In a table drive mechanism configured to reciprocate the table by a drive motor, a motor that continuously rotates in the forward direction and a motor that continuously rotates in the reverse direction are provided, respectively. A table drive mechanism characterized in that a clutch capable of interrupting power transmission is provided between each of the motors and the table, and the clutch is configured to be selectively actuated. 2. The table drive mechanism according to claim 1, wherein an electromagnetic clutch is interposed on each rotating shaft of each motor, and each rotating shaft is gear-coupled with a worm shaft for moving the table. 3. The table is a table on which a sample of the visual inspection device is placed, and the motors, clutches, etc. are incorporated in an X drive unit that reciprocates in the X direction, as described in claim 1 or 2. table drive. 4. The table has an X drive unit that moves the table stepwise in the Y direction.
JP58146357A 1983-08-12 1983-08-12 Appearance inspection device for semiconductor photomask or reticle Expired - Lifetime JPH06101420B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58146357A JPH06101420B2 (en) 1983-08-12 1983-08-12 Appearance inspection device for semiconductor photomask or reticle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58146357A JPH06101420B2 (en) 1983-08-12 1983-08-12 Appearance inspection device for semiconductor photomask or reticle

Publications (2)

Publication Number Publication Date
JPS6039045A true JPS6039045A (en) 1985-02-28
JPH06101420B2 JPH06101420B2 (en) 1994-12-12

Family

ID=15405882

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58146357A Expired - Lifetime JPH06101420B2 (en) 1983-08-12 1983-08-12 Appearance inspection device for semiconductor photomask or reticle

Country Status (1)

Country Link
JP (1) JPH06101420B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102502304A (en) * 2011-09-05 2012-06-20 河北科技大学 Stripped marker based soft material positioning device and positioning method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57166612U (en) * 1981-04-09 1982-10-20

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57166612U (en) * 1981-04-09 1982-10-20

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102502304A (en) * 2011-09-05 2012-06-20 河北科技大学 Stripped marker based soft material positioning device and positioning method

Also Published As

Publication number Publication date
JPH06101420B2 (en) 1994-12-12

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