JPS6027119A - Vapor growth device of semiconductor - Google Patents
Vapor growth device of semiconductorInfo
- Publication number
- JPS6027119A JPS6027119A JP13411483A JP13411483A JPS6027119A JP S6027119 A JPS6027119 A JP S6027119A JP 13411483 A JP13411483 A JP 13411483A JP 13411483 A JP13411483 A JP 13411483A JP S6027119 A JPS6027119 A JP S6027119A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- pressure
- reaction tube
- growth
- gas pressure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45557—Pulsed pressure or control pressure
Abstract
Description
【発明の詳細な説明】
本発明は半導体の気相成長装置、特に半導体の気相成長
における成長基板と成長層、あるいは成長層間のドーピ
ング用ガス、組成制御用ガス及びその他の送入ガスの送
入時のガス流量変動を無くした半導体の気相成長装置に
関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor vapor phase growth apparatus, and particularly to a semiconductor vapor phase growth apparatus for supplying doping gas, composition control gas, and other feed gases between a growth substrate and a growth layer, or between growth layers in semiconductor vapor phase growth. This invention relates to a semiconductor vapor phase growth apparatus that eliminates gas flow rate fluctuations during input.
半導体を用いた各種デバイスでは、複雑な不純物分布を
有する多層構造であって、しかも成長層間で不純物の種
類、組成および濃度が急峻な変化を有する成長層が要求
される。気相成長において、これらを実現するために最
も重要なことは、成長領域に供給されるガス流量が急峻
に変化し、ただちに定常状態になることである。Various devices using semiconductors require growth layers that have a multilayer structure with a complex impurity distribution, and in which the type, composition, and concentration of impurities change sharply between the growth layers. In vapor phase growth, the most important thing to achieve these is that the gas flow rate supplied to the growth region changes rapidly and immediately returns to a steady state.
従来の気相成長装置では、例えは、ドーピング用ガスの
成長反応管内への送入は、切替えバルブにより行なわれ
る。この場合、一般にドーピング用ガス圧と、成長反応
管内のガス圧とに岸があるため切替パルプを開閉する際
に、ガスの流量変動カ起キる。マスフローコントローラ
ー(電気的な流量制御q置)を使用し7た場合は、ガス
圧力が変動した場合にも、流量が一定となるように制御
されるが完全に安定するまでには数分を要する。また、
フロートメーターの使用の場合は、流量は圧力によシ変
化する。このため、成長反応管内に送入されるドーピン
グ用ガスの流量は設定値と異なるものとなり成長層間で
の濃度変化は緩慢となったり、流量変動に応じた異常な
ものとなる。In conventional vapor phase growth apparatuses, for example, doping gas is introduced into the growth reaction tube using a switching valve. In this case, since there is generally a difference between the doping gas pressure and the gas pressure in the growth reaction tube, gas flow rate fluctuations occur when the switching pulp is opened and closed. If a mass flow controller (electronic flow rate control) is used, the flow rate will be controlled to be constant even if the gas pressure fluctuates, but it will take several minutes for it to become completely stable. . Also,
When using a float meter, the flow rate varies with pressure. Therefore, the flow rate of the doping gas fed into the growth reaction tube differs from the set value, and the concentration change between the growth layers becomes slow or abnormal depending on the flow rate fluctuation.
組成制御用ガス及びその他の送入ガスの場合も全く同じ
であり、基板と成長層間及び成長層間での急峻性が緩慢
となったり組成変動が起きる。The same is true for the composition control gas and other gases to be supplied, and the steepness between the substrate and the growth layer and between the growth layers becomes slow, and compositional fluctuations occur.
第1図は従来の熱分解法による気相成長装置の模式図で
ある。ドーピング用ガス、組成制御用ガス及びその他の
ガスは、切替パルプ5.6および7を閉め、8.9およ
び10を開けて成長反応管11の外へ排出された状態で
マス70−コントローラまたはフロートメータ1.2.
3及び4により流量が設定される。次にパルプ8.9お
よびl。FIG. 1 is a schematic diagram of a conventional vapor phase growth apparatus using the pyrolysis method. The doping gas, composition control gas, and other gases are discharged from the growth reaction tube 11 by closing the switching pulps 5.6 and 7 and opening the switching pulps 8.9 and 10. Meter 1.2.
3 and 4 set the flow rate. Then pulp 8.9 and l.
を閉め5.6および7を開ければ成長反応管11内ニド
−ピング用ガス、組成制御用ガスおよびその他のガスが
送入され基板12上へ所望の不純物濃度および組成を有
する成長層を得る。成長反応管内へ送入されたガスは成
長領域を通過した後、ガス排気口13から排ガス処理装
置14を通過1−7て一括して排出される。When 5.6 and 7 are opened, a doping gas, a composition control gas and other gases are introduced into the growth reaction tube 11 to form a growth layer having a desired impurity concentration and composition on the substrate 12. After passing through the growth region, the gas introduced into the growth reaction tube passes through the exhaust gas treatment device 14 through the gas exhaust port 13 and is discharged all at once.
このような従来の装置では、切替バルブ5と8、(5と
9及び7と10それぞれの組合わせ操作により各ライン
のガスを排出状態から反応管内への送入状態へと切替え
るが、この場合排出時のガス圧と成長反応管11内のガ
ス圧とに差かを)るため、成長領域に供給されるガス流
量が変動する。この一時的圧力変動にもとづく流量変化
は、成長層界面の急峻性を損なわせるばかりでなく、切
替直披のドーピング濃度や組成の制御を不可能とする問
題を発生させる。In such a conventional device, the gas in each line is switched from the discharge state to the supply state into the reaction tube by the combined operation of the switching valves 5 and 8, (5 and 9, and 7 and 10), but in this case, Since there is a difference between the gas pressure at the time of discharge and the gas pressure inside the growth reaction tube 11, the gas flow rate supplied to the growth region varies. The flow rate change based on this temporary pressure fluctuation not only impairs the steepness of the interface between the growth layers, but also causes a problem in that it is impossible to control the doping concentration and composition immediately after switching.
本発明は上記の従来の装置の欠点を除去し、成長反応管
内に安定したガス流量が供給されるようにした半導体気
相生長装置を提供することを目的とするものである。SUMMARY OF THE INVENTION An object of the present invention is to provide a semiconductor vapor phase growth apparatus that eliminates the drawbacks of the conventional apparatus described above and allows a stable gas flow rate to be supplied into a growth reaction tube.
本発明によれば半導体の気相成長において成長反応管内
にドーピング用ガス、組成制御用ガス泣びその他のガス
を切替えパルプにより送入する際、送入する前の前記ガ
スの排気ガス圧を成長反応管内のガス圧と実質的に同圧
にすることを特徴とする半導体の気相成長装置が得ら扛
る。According to the present invention, when a doping gas, a composition control gas, and other gases are fed into a growth reaction tube in the vapor phase growth of semiconductors by a switching pulp, the exhaust gas pressure of the gases before being fed is controlled during the growth reaction tube. A semiconductor vapor phase growth apparatus is obtained, which is characterized in that the gas pressure in the reaction tube is maintained at substantially the same pressure.
以下本発明を熱分解法イ気相成長に適用した実施例によ
り説明する。第2図は本発明の第1の実施例を示す模式
図である。マスフローコントロー25および26を閉め
、27.28及び29を開けることにより装置外へ排出
さハるが、この時に排出管30内のガス圧を圧力計31
Vcよシ検出しガス圧調整器32によシ、圧力計34に
より検出された成長反応管33内のガス圧と同圧に制御
する。この場合には成長反応管33内に、ドーピング用
ガス、組成制御用ガスおよびその他のガスを切替バルブ
24と27.25と28および26と29それ゛ぞれの
組合わせの開閉によって送入する際、送入する前の送入
ガス圧と成長反応管内のガス圧とが同圧であるから、き
わめて安定したガス流量が保たれる又模式図では、3種
の送入ガスの圧力を同一系の圧力計および圧力調整器に
より制御したが、各ラインを別々に制御することも可能
である。The present invention will be explained below with reference to an example in which the present invention is applied to pyrolysis vapor phase growth. FIG. 2 is a schematic diagram showing a first embodiment of the present invention. By closing mass flow controllers 25 and 26 and opening 27, 28 and 29, the gas is discharged to the outside of the apparatus.
Vc is detected and the gas pressure is controlled by the gas pressure regulator 32 to be the same as the gas pressure inside the growth reaction tube 33 detected by the pressure gauge 34. In this case, doping gas, composition control gas, and other gases are introduced into the growth reaction tube 33 by opening and closing the switching valves 24 and 27, 25 and 28, and 26 and 29, respectively. At this time, the pressure of the gas to be fed before feeding and the gas pressure inside the growth reaction tube are the same, so an extremely stable gas flow rate is maintained. Although controlled by a system pressure gauge and pressure regulator, it is also possible to control each line separately.
第3図は本発明の第2の実施例を示す模式図である。本
実施例では成長前の送入ガスの一時排気の出口が成長反
応管51内の板52の後流部53に接続される。この場
合ガス圧は自動的に反応管内の圧力と等しくなり、成長
反応管51内にドーピング用ガス、組成制御用ガスおよ
びその他のガスを切替バルブ45と48.46と49お
よび47と50そ九ぞnの組合わせ操作により切替える
際、送入する前の送入ガス圧と成長反応管内のガス圧が
自動的に同圧となり切替時においてもきわめて〆安定し
たガス流量が保たれる。なお図では、成長基板52の後
流部53に接続している構造を示したが、排気の接続は
、基板から処理装器に流れまての間で、成長反応管内の
ガス圧と同圧になる場所であノ1.ばどこでもよい。FIG. 3 is a schematic diagram showing a second embodiment of the present invention. In this embodiment, the outlet for temporarily exhausting the gas introduced before growth is connected to the downstream part 53 of the plate 52 in the growth reaction tube 51. In this case, the gas pressure automatically becomes equal to the pressure inside the reaction tube, and the switching valves 45, 48, 46, 49, 47, and 50 switch the doping gas, composition control gas, and other gases into the growth reaction tube 51. When switching by a combination operation, the pressure of the fed gas before feeding and the gas pressure inside the growth reaction tube automatically become the same pressure, and an extremely stable gas flow rate is maintained even during the switching. Although the figure shows a structure in which the growth substrate 52 is connected to the downstream part 53, the exhaust connection is made so that the gas pressure is the same as the gas pressure inside the growth reaction tube between the substrate and the processing equipment. In the place where it becomes No. 1. Anywhere is fine.
第4図は、ドーピング用ガスを切替た時の流量変化を示
したもので実線1は従来の方法でマスフローコントロー
ラを使用、実線2はフロートメーターを使用した場合を
示し、本発明の装置で流した場合を破線3で示す。なお
、縦軸はガスを排気ラインに流して設定した流量を10
0%とした。Figure 4 shows the change in flow rate when the doping gas is switched. Solid line 1 shows the case when a mass flow controller is used in the conventional method, solid line 2 shows the case when a float meter is used, and the flow rate with the device of the present invention is shown. The broken line 3 shows the case where The vertical axis indicates the flow rate set by flowing gas into the exhaust line.
It was set to 0%.
本発明によると半導体気相成長装置において、成長反応
管内に安定したガス流量が供給される効果がある。According to the present invention, in a semiconductor vapor phase growth apparatus, a stable gas flow rate is supplied into the growth reaction tube.
第1図は、従来の気相成長装置の一例の模式図、第2図
、第3図は本発明の2つの実施例の気相成長装置の模式
図、第4図は、従来の気相成長装置と本発明の気相成長
装置についてガスを切替えた場合の横軸を時間(分)に
、縦軸を設定値に対する割合(チ)で示した流量変化図
である。
20.21.22.23および41,42.43゜44
・・・・・・マスフローコントローラ又はフロートメー
ター、24.25.26.27.2B、29゜および4
5,46,47.48,49.50・・・・・・切替バ
ルブ、30・・・・・・一時排気管、31・・・・・・
排気のガス圧力計、32・・・・・・排気系のガス圧調
整器、33.51・・・・・・成長反応管、34・・・
−・・成長反応管内のガス圧力計、35.54・・・・
・・排ガス処理装置。FIG. 1 is a schematic diagram of an example of a conventional vapor phase growth apparatus, FIGS. 2 and 3 are schematic diagrams of two embodiments of the vapor phase growth apparatus of the present invention, and FIG. 4 is a schematic diagram of an example of a conventional vapor phase growth apparatus. It is a flow rate change diagram in which the horizontal axis is time (minutes) and the vertical axis is a ratio (ch) to a set value when gases are switched for the growth apparatus and the vapor phase growth apparatus of the present invention. 20.21.22.23 and 41,42.43°44
...Mass flow controller or float meter, 24.25.26.27.2B, 29° and 4
5, 46, 47.48, 49.50...Switching valve, 30...Temporary exhaust pipe, 31...
Exhaust gas pressure gauge, 32... Exhaust system gas pressure regulator, 33.51... Growth reaction tube, 34...
- Gas pressure gauge in the growth reaction tube, 35.54...
・Exhaust gas treatment equipment.
Claims (1)
びその他のガスを切替バルブにより、送入する半導体の
気相成長装置において、送入する前の前記ガスの排気ガ
ス圧を成長反応管内のガス圧と実質的に同圧にする構造
を備えたことを特徴とする半導体の気相成長装置。Doping gas and composition control gas 9j in the growth reaction tube
A semiconductor vapor phase growth apparatus in which gas and other gases are fed by a switching valve, is provided with a structure in which the exhaust gas pressure of the gas before being fed is made to be substantially the same pressure as the gas pressure in the growth reaction tube. A semiconductor vapor phase growth apparatus characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13411483A JPS6027119A (en) | 1983-07-22 | 1983-07-22 | Vapor growth device of semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13411483A JPS6027119A (en) | 1983-07-22 | 1983-07-22 | Vapor growth device of semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6027119A true JPS6027119A (en) | 1985-02-12 |
Family
ID=15120784
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13411483A Pending JPS6027119A (en) | 1983-07-22 | 1983-07-22 | Vapor growth device of semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6027119A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6276718A (en) * | 1985-09-30 | 1987-04-08 | Toshiba Corp | Vapor-phase crystal growing apparatus |
JPS6320824A (en) * | 1986-07-14 | 1988-01-28 | Matsushita Electronics Corp | Manufacture of thin film |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5513922A (en) * | 1978-07-14 | 1980-01-31 | Matsushita Electric Ind Co Ltd | Vapor phase growthing method and its device |
JPS5827637A (en) * | 1981-08-11 | 1983-02-18 | Toshiba Corp | Gas supply circuit in gas pahse growing furnace |
-
1983
- 1983-07-22 JP JP13411483A patent/JPS6027119A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5513922A (en) * | 1978-07-14 | 1980-01-31 | Matsushita Electric Ind Co Ltd | Vapor phase growthing method and its device |
JPS5827637A (en) * | 1981-08-11 | 1983-02-18 | Toshiba Corp | Gas supply circuit in gas pahse growing furnace |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6276718A (en) * | 1985-09-30 | 1987-04-08 | Toshiba Corp | Vapor-phase crystal growing apparatus |
JPS6320824A (en) * | 1986-07-14 | 1988-01-28 | Matsushita Electronics Corp | Manufacture of thin film |
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