JPS60242309A - 小さい光路差の測定に適したひずみ測定器 - Google Patents

小さい光路差の測定に適したひずみ測定器

Info

Publication number
JPS60242309A
JPS60242309A JP9842584A JP9842584A JPS60242309A JP S60242309 A JPS60242309 A JP S60242309A JP 9842584 A JP9842584 A JP 9842584A JP 9842584 A JP9842584 A JP 9842584A JP S60242309 A JPS60242309 A JP S60242309A
Authority
JP
Japan
Prior art keywords
optical path
plate
path difference
sample
sensitive color
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9842584A
Other languages
English (en)
Japanese (ja)
Other versions
JPH053535B2 (enrdf_load_stackoverflow
Inventor
Kan Kishii
岸井　貫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Techno Glass Co Ltd
Original Assignee
Toshiba Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Glass Co Ltd filed Critical Toshiba Glass Co Ltd
Priority to JP9842584A priority Critical patent/JPS60242309A/ja
Publication of JPS60242309A publication Critical patent/JPS60242309A/ja
Publication of JPH053535B2 publication Critical patent/JPH053535B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/18—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge using photoelastic elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP9842584A 1984-05-16 1984-05-16 小さい光路差の測定に適したひずみ測定器 Granted JPS60242309A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9842584A JPS60242309A (ja) 1984-05-16 1984-05-16 小さい光路差の測定に適したひずみ測定器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9842584A JPS60242309A (ja) 1984-05-16 1984-05-16 小さい光路差の測定に適したひずみ測定器

Publications (2)

Publication Number Publication Date
JPS60242309A true JPS60242309A (ja) 1985-12-02
JPH053535B2 JPH053535B2 (enrdf_load_stackoverflow) 1993-01-18

Family

ID=14219453

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9842584A Granted JPS60242309A (ja) 1984-05-16 1984-05-16 小さい光路差の測定に適したひずみ測定器

Country Status (1)

Country Link
JP (1) JPS60242309A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06148005A (ja) * 1992-04-07 1994-05-27 Internatl Business Mach Corp <Ibm> 光学ひずみマッピング装置ならびに方法
CN107796322A (zh) * 2016-09-06 2018-03-13 柯尼卡美能达株式会社 结构色变化型材料和应变检测装置
CN108240799A (zh) * 2016-12-26 2018-07-03 柯尼卡美能达株式会社 形变传感器及形变量测定方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5558428A (en) * 1978-10-27 1980-05-01 Toshiba Corp Photoelastic device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5558428A (en) * 1978-10-27 1980-05-01 Toshiba Corp Photoelastic device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06148005A (ja) * 1992-04-07 1994-05-27 Internatl Business Mach Corp <Ibm> 光学ひずみマッピング装置ならびに方法
CN107796322A (zh) * 2016-09-06 2018-03-13 柯尼卡美能达株式会社 结构色变化型材料和应变检测装置
CN107796322B (zh) * 2016-09-06 2020-08-18 柯尼卡美能达株式会社 结构色变化型材料和应变检测装置
CN108240799A (zh) * 2016-12-26 2018-07-03 柯尼卡美能达株式会社 形变传感器及形变量测定方法

Also Published As

Publication number Publication date
JPH053535B2 (enrdf_load_stackoverflow) 1993-01-18

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees