JPH053535B2 - - Google Patents

Info

Publication number
JPH053535B2
JPH053535B2 JP59098425A JP9842584A JPH053535B2 JP H053535 B2 JPH053535 B2 JP H053535B2 JP 59098425 A JP59098425 A JP 59098425A JP 9842584 A JP9842584 A JP 9842584A JP H053535 B2 JPH053535 B2 JP H053535B2
Authority
JP
Japan
Prior art keywords
optical path
path difference
plate
sample
sensitive color
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP59098425A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60242309A (ja
Inventor
Kan Kishii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Techno Glass Co Ltd
Original Assignee
Toshiba Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Glass Co Ltd filed Critical Toshiba Glass Co Ltd
Priority to JP9842584A priority Critical patent/JPS60242309A/ja
Publication of JPS60242309A publication Critical patent/JPS60242309A/ja
Publication of JPH053535B2 publication Critical patent/JPH053535B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/18—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge using photoelastic elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP9842584A 1984-05-16 1984-05-16 小さい光路差の測定に適したひずみ測定器 Granted JPS60242309A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9842584A JPS60242309A (ja) 1984-05-16 1984-05-16 小さい光路差の測定に適したひずみ測定器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9842584A JPS60242309A (ja) 1984-05-16 1984-05-16 小さい光路差の測定に適したひずみ測定器

Publications (2)

Publication Number Publication Date
JPS60242309A JPS60242309A (ja) 1985-12-02
JPH053535B2 true JPH053535B2 (enrdf_load_stackoverflow) 1993-01-18

Family

ID=14219453

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9842584A Granted JPS60242309A (ja) 1984-05-16 1984-05-16 小さい光路差の測定に適したひずみ測定器

Country Status (1)

Country Link
JP (1) JPS60242309A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06148005A (ja) * 1992-04-07 1994-05-27 Internatl Business Mach Corp <Ibm> 光学ひずみマッピング装置ならびに方法
JP6794727B2 (ja) * 2016-09-06 2020-12-02 コニカミノルタ株式会社 構造色変化型材料及び歪み検出装置
JP2018105665A (ja) * 2016-12-26 2018-07-05 コニカミノルタ株式会社 歪センサー及び歪量測定方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5558428A (en) * 1978-10-27 1980-05-01 Toshiba Corp Photoelastic device

Also Published As

Publication number Publication date
JPS60242309A (ja) 1985-12-02

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees