JPS60227423A - Adhering method of ingot - Google Patents

Adhering method of ingot

Info

Publication number
JPS60227423A
JPS60227423A JP8453884A JP8453884A JPS60227423A JP S60227423 A JPS60227423 A JP S60227423A JP 8453884 A JP8453884 A JP 8453884A JP 8453884 A JP8453884 A JP 8453884A JP S60227423 A JPS60227423 A JP S60227423A
Authority
JP
Japan
Prior art keywords
ingots
ingot
flat
wax
jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8453884A
Other languages
Japanese (ja)
Inventor
Yuji Oana
小穴 裕司
Akira Matsumoto
明 松本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP8453884A priority Critical patent/JPS60227423A/en
Publication of JPS60227423A publication Critical patent/JPS60227423A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • H01L21/3046Mechanical treatment, e.g. grinding, polishing, cutting using blasting, e.g. sand-blasting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • B28D5/0082Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)

Abstract

PURPOSE:To eliminate cracks generated on end faces by causing a plurality of ingots, which are provides with orientation flats on the end faces and planes perpendicular to the flats on their sides, are made to a rod-like body using a screw, and mounted on a slicing device as they are using wax. CONSTITUTION:Ingots 16 and 17 composed of piezo-electric materials, each of which provides an orientation flat on its end face and a plane perpendicular to the flat on its side are coupled with each other like one rod with each plane arranged as described in the following. In other words, the planes of the ingots 16 and 17 are arranged on a platen 18, the surface of the flat is made to strike against them, the both are surrounded by a flat rectangular frame metal fitting 13, and the surface of the flat is clamped via a push metal fitting 14 by a screw 15. After this, the ingots 16 and 17 are fixed to a slicing device 19 using wax 20 as they are and then remove the frame metal fitting 14 for slicing. In this way, an adhesive and the like are not applied to the surface of the flat, thereby to eliminate cracks generated on the surface of the flat perfectly.

Description

【発明の詳細な説明】 (a)発明の技術分野 本発明はインゴットの接着方法、特に圧電性材料にてな
る複数個のインゴットを一つのテーブルに接着する方法
に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to a method of bonding ingots, and more particularly to a method of bonding a plurality of ingots made of piezoelectric material to a single table.

Cb>技術の背景 単結晶の基板(チップ)に所望のパターン等を形成させ
るウェーハプロセスにおいて、ウェーハは単結晶のイン
ゴットにオリエンテーションフラット及び該フラットに
直交しインゴットの長さ方向に対向する双方の端面を加
工したのち、インゴット切断装置の台にワックスで接着
してカソクーやワイヤでスライスし、次いで該スライス
面を鏡面に仕上げてから、分割により採取できる素子の
複数個に相当する所望パターンが形成されるようになる
Cb>Technical background In a wafer process in which a desired pattern is formed on a single crystal substrate (chip), the wafer is attached to a single crystal ingot with an orientation flat and both end faces perpendicular to the flat and facing in the length direction of the ingot. After processing, the ingot is bonded with wax to the stand of an ingot cutting device and sliced with a cassock or wire.The sliced surface is then polished to a mirror finish, and a desired pattern corresponding to a plurality of elements that can be collected by division is formed. Become so.

(C)従来技術と問題点 第1図はワイヤー及び研磨剤を用いてインゴットを多数
枚のウェーハにスライスする方法を説明するための図で
ある。
(C) Prior Art and Problems FIG. 1 is a diagram for explaining a method of slicing an ingot into a large number of wafers using a wire and an abrasive.

第1図において、■は図示しないコイルから供給される
ピアノ線(ワイヤ) 、2,3. 4は所定(例えば0
.8mm) ピッチの溝が多数本削成されピアノ線1を
ガイドするローラであり、長尺のピアノ線1は ガイドローラ2→3→4−2→−一一一−−−−→2の
如く掛は渡しされ、駆動ガイドローラ2は例えば右方向
へ大きく回転し左方向へ小さく回転し、ガイドローラ3
と4はガイドローラ2に従動するように構成されている
In FIG. 1, ■ indicates piano wire (wire) supplied from a coil (not shown), 2, 3. 4 is a predetermined value (for example, 0
.. It is a roller that guides the piano wire 1 by cutting a large number of grooves at a pitch of 8 mm), and the long piano wire 1 is guided by the guide roller 2 → 3 → 4-2 → -111---→2. The hook is passed, and the drive guide roller 2 rotates, for example, largely to the right and slightly to the left, and the guide roller 3
and 4 are configured to follow the guide roller 2.

従って、矢印方向へ順次送り出されるピアノ線1はガイ
ドローラ2,3.4を手前から後方、又は後方から手前
へ掛は渡し移送したのち、図示しない巻き取りリールに
巻回されるようになる。一方、ガイドローラ2,3.4
の下方に上下動可能な台5が配設され、熱可塑性樹脂(
ワックス)にて台5に接着されたインゴット6は、台5
の上下動により適当な速度で上昇し、ピアノ線1の往復
動及びインゴット6に振り掛けられた研磨剤(例えばG
C#1000砥粒)による切断が終了すると、降下する
ようになる。
Therefore, the piano wire 1, which is sent out sequentially in the direction of the arrow, is passed through the guide rollers 2, 3, 3, 4 from the front to the rear, or from the rear to the front, and is then wound on a take-up reel (not shown). On the other hand, guide rollers 2, 3.4
A vertically movable table 5 is arranged below the thermoplastic resin (
The ingot 6 glued to the stand 5 with wax) is attached to the stand 5.
The abrasive (for example, G
When cutting with C#1000 abrasive grains is completed, it begins to descend.

このような装置において、インゴットの長さに対しガイ
ドローラ3と4に掛は渡しされたワイヤの掛は渡し長さ
が十分であり、複数個(例えば2個)のインゴットを同
時にスライス可能なときは、該複数個を直列状にスライ
ス台に接着してスライスされている。
In such a device, when the length of the wire passed between the guide rollers 3 and 4 is sufficient for the length of the ingot, and it is possible to slice a plurality of ingots (for example, two) at the same time. The plural pieces are glued in series to a slicing table and sliced.

そこで、例えば2個のインゴットを同時にスライスする
従来の前記接着は、第2図に示す如(、インゴット7と
8はそれぞれのオリエントフラ・ノドをスライス台9の
上面に当接させ、かつインゴット7と8の対向端面を接
着剤(例えば一般工作用の速乾性強力接着剤)10で接
着したのち、熱可塑性ワックス11を用いてスライス台
9に接着させていた。
Therefore, for example, in the conventional bonding method for slicing two ingots at the same time, as shown in FIG. The opposing end surfaces of and 8 were adhered with an adhesive (for example, a quick-drying strong adhesive for general work) 10, and then adhered to the slicing table 9 using thermoplastic wax 11.

しかし、かかる接着方法においてインゴ・ノドが圧電性
の単結晶であるとき、即ち振動子用素子を切り出すため
ニオブ酸リチウム(LiNbO3)等の圧電材にてなる
ときは、接着されたインゴ・ノドの端面間で放電がおこ
り、当該部にクラ、ツクや割れの発生することがあった
However, in this bonding method, when the ingo/nod is a piezoelectric single crystal, that is, when the piezoelectric material such as lithium niobate (LiNbO3) is used to cut out the vibrator element, the bonded ingo/nod Electric discharge occurred between the end faces, causing cracks, nicks, and cracks in the area.

(d)発明の目的 本発明の目的は、上記問題点を除去しインゴットのウェ
ーハ採取枚数を高めることである。
(d) Purpose of the Invention The purpose of the present invention is to eliminate the above-mentioned problems and increase the number of wafers to be collected from an ingot.

(e)発明の構成 上記目的は、オリエンテーションフラット及び該フラッ
トに直交し長さ方向に対向する端面が作成された複数個
のインゴットを定盤等の平面にそれぞれの該フラットが
接するように置き、複数個の該インゴットを直列状に当
接させ、該当接させた状態で複数個の該インゴットを治
具に固定し、次いで該治具に保持された複数個のインゴ
ットをインゴット接着テーブルに熱可塑性を有するワッ
クスで接着させてから該金具を取り外すことを特徴とす
る、インゴットの接着方法により達成される。
(e) Structure of the Invention The above object is to place a plurality of ingots each having an orientation flat and end faces orthogonal to the flat and facing each other in the length direction on a flat surface such as a surface plate so that each flat is in contact with the flat surface; A plurality of ingots are brought into contact with each other in series, and the plurality of ingots are fixed to a jig while in contact with each other, and then the plurality of ingots held in the jig are bonded to an ingot bonding table using thermoplastic resin. This is achieved by an ingot bonding method characterized by bonding the metal fittings with a wax having the following properties and then removing the metal fittings.

(f)発明の実施例 以下に、図面を用いて本発明に係わる実施例を説明する
(f) Embodiments of the invention Below, embodiments of the invention will be described with reference to the drawings.

第3図は本発明の一実施例になるインゴット接着用治具
の主要構成と該治具を用いて2個のインゴットの取り付
は方法を説明するための斜視図、第4図は2個の前記イ
ンゴットをスライシング装置の台に接着させた斜視図で
ある。
Fig. 3 is a perspective view for explaining the main structure of an ingot bonding jig according to an embodiment of the present invention and a method for attaching two ingots using the jig, and Fig. 4 is a perspective view for explaining the method of attaching two ingots using the jig. FIG. 3 is a perspective view of the ingot of FIG.

第3図において、12はインゴット接着用治具、16、
17は種結晶を成長させたのちオリエンテーションフラ
ット及び該フラットに直交し長さ方向に対向する双方の
端面並びに円筒外周面を研削、ラップ等で加工形成され
たインゴット、18はインゴットを治具12にクランプ
するための定盤である。
In FIG. 3, 12 is an ingot bonding jig, 16,
17 is an ingot formed by growing a seed crystal, and then grinding and lapping the orientation flat, both end faces perpendicular to the flat and facing each other in the length direction, and the cylindrical outer peripheral surface; 18, the ingot is placed in the jig 12; This is a surface plate for clamping.

治具12は平面視角形の枠金具13と押し金具14と押
しねじ15にて構成され、押し金具14は枠金具13の
一方に螺合されたねじ15の内側先端に回動自在に保持
されている。
The jig 12 is composed of a frame metal fitting 13 having a rectangular shape in plan view, a push metal fitting 14, and a push screw 15. The push metal fitting 14 is rotatably held at the inner tip of a screw 15 screwed into one side of the frame metal fitting 13. ing.

第4図において、19はスライシング装置のインゴット
接着用の台、20はインゴット接着用のワックスである
In FIG. 4, 19 is a table for adhering the ingot of the slicing device, and 20 is a wax for adhering the ingot.

以下に、治具12を用い2個のインゴソ目6,17を台
19に接着する具体的手法につき、第3図と第4図を用
いて説明する。
A specific method of bonding the two ingots 6 and 17 to the stand 19 using the jig 12 will be described below with reference to FIGS. 3 and 4.

インボッF 16.17を台19に接着する第1の段階
として、治具12にインゴット16.17を挟持させる
In the first step of adhering the ingot F 16.17 to the stand 19, the ingot 16.17 is held between the jig 12.

そのため、定盤18の上面にオリエンテーションフラッ
トが接するように、かつ、それぞれの一方の端面がほぼ
当接するように2個のインゴット16,17を置いたの
ち、そのインゴット16.17それぞれの他方の端面を
、治具12の枠金具13の一方の内側と押し金具14の
先端との間に挟み、押しねじ15を適当な力でねじ込む
ようにする。その結果、インゴット16.17はオリエ
ンテーションフラットが同一面に揃い、かつ、その長さ
方向へ直列状態で治具12に挟持される。
Therefore, after placing the two ingots 16 and 17 so that the orientation flat is in contact with the upper surface of the surface plate 18 and so that one end surface of each is almost in contact with the upper surface of the surface plate 18, the other end surface of each ingot 16 and 17 is placed. is sandwiched between the inside of one of the frame fittings 13 of the jig 12 and the tip of the push fitting 14, and the push screw 15 is screwed in with an appropriate force. As a result, the ingots 16 and 17 are held by the jig 12 with their orientation flats aligned on the same plane and in series in the length direction.

次いで、冶具12とともにインゴソ日6.17 、及び
予め適量のワックス20を上面に塗布した台19をワッ
クス20の軟化温度、例えば120℃で十分加熱したの
ち、オリエンテーションフラットが台19の上面にほぼ
接するようにインゴット16.17を押し付は後、冷却
させワックス20を固化させ、ねし15を緩め治具12
をインゴット16.17から取り除く。
Next, at 6.17 pm, the jig 12 and the table 19, whose upper surface has been coated with an appropriate amount of wax 20, are sufficiently heated to the softening temperature of the wax 20, for example, 120° C., and the orientation flat is brought into almost contact with the top surface of the table 19. After pressing the ingots 16 and 17 as shown, the wax 20 is cooled and the wax 20 is solidified, and the screw 15 is loosened and the jig 12
is removed from ingot 16.17.

その結果インゴット16.17は、第1図のインゴット
6と同様に、ワックス20にて台19の上面に接着され
2個が同時にスライスされ、多数枚のウェーハが一度に
得られることになるが、インゴット16と17の当接さ
れた端面間には接着材(電気的絶縁層)が形成されてな
いため、ワックス20を軟化させるために加熱しても該
端面にクラックの発生される心配がない。
As a result, ingots 16 and 17 are bonded to the top surface of table 19 with wax 20, and two of them are sliced at the same time, similar to ingot 6 in FIG. 1, and a large number of wafers are obtained at once. Since no adhesive (electrical insulating layer) is formed between the abutted end faces of the ingots 16 and 17, there is no risk of cracks occurring on the end faces even if the wax 20 is heated to soften it. .

(g)発明の詳細 な説明した如く本発明によれば、複数個のインゴットを
同時にスライスするため同一台板に接着するも、該イン
ゴットの当接端面を接着させる必要がないことにより、
該端面に従来方法で発生していたクラックを無くすこと
ができた。
(g) As described in detail, according to the present invention, although a plurality of ingots are bonded to the same base plate for simultaneous slicing, there is no need to bond the abutting end surfaces of the ingots.
It was possible to eliminate cracks that occurred on the end face in the conventional method.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はワイヤー及び研磨剤を用いてインゴットを多数
枚のウェーハにスライスする方法を説明するための図、
第2図は従来方法で接着された2個のインゴットを示す
斜視図、第3図は本発明の一実施例になるインゴット接
着用治具の主要構成と該治具を用いて2個のインゴット
の取り付は方法を説明するための斜視図、第4図は2個
の前記インゴットをスライシング装置の台に接着させた
斜視図である。 図中において、■はピアノ線(ワイヤ) 、2,3゜4
はピアノ線ガイトローラ、5.9.19はスライシング
装置のインゴット接着用台、6,7,8.16.17は
インゴット、11.20はワックス、12はインゴット
接着用治具、18は定盤である。 晃1 図
FIG. 1 is a diagram for explaining a method of slicing an ingot into a large number of wafers using a wire and an abrasive;
Fig. 2 is a perspective view showing two ingots bonded using a conventional method, and Fig. 3 is a perspective view showing the main structure of an ingot bonding jig according to an embodiment of the present invention, and how two ingots are bonded using the jig. FIG. 4 is a perspective view showing the two ingots bonded to the stand of the slicing device. In the figure, ■ is piano wire (wire), 2,3゜4
is a piano wire guide roller, 5.9.19 is an ingot adhesion table of the slicing device, 6, 7, 8.16.17 is an ingot, 11.20 is wax, 12 is an ingot adhesion jig, and 18 is a surface plate. be. Akira 1 figure

Claims (2)

【特許請求の範囲】[Claims] (1) オリエンテーションフラット及び該フラットに
直交し長さ方向に対向する端面が作成された複数個のイ
ンゴットを定盤等の平面にそれぞれの該フラットが接す
るように置き、複数個の該インゴットを直列状に当接さ
せ、該当接させた状態で複数個の該インゴットを治具に
固定し、次いで該治具に保持された複数個のインゴット
をインゴット接着テーブルに熱可塑性を有するワックス
で接着させてから該金具を取り外すことを特徴とするイ
ンゴットの接着方法。
(1) A plurality of ingots each having an orientation flat and an end face perpendicular to the flat and facing in the length direction are placed on a flat surface such as a surface plate so that the flats are in contact with each other, and the plurality of ingots are arranged in series. The plurality of ingots are fixed to a jig in the state of contact, and then the plurality of ingots held by the jig are bonded to an ingot bonding table with thermoplastic wax. A method for adhering an ingot, the method comprising removing the metal fitting from the ingot.
(2)前記インゴットが圧電性材料のインゴットである
ことを特徴とする特許 に記載したインゴットの接着方法。
(2) The ingot bonding method described in the patent, wherein the ingot is an ingot of a piezoelectric material.
JP8453884A 1984-04-26 1984-04-26 Adhering method of ingot Pending JPS60227423A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8453884A JPS60227423A (en) 1984-04-26 1984-04-26 Adhering method of ingot

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8453884A JPS60227423A (en) 1984-04-26 1984-04-26 Adhering method of ingot

Publications (1)

Publication Number Publication Date
JPS60227423A true JPS60227423A (en) 1985-11-12

Family

ID=13833420

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8453884A Pending JPS60227423A (en) 1984-04-26 1984-04-26 Adhering method of ingot

Country Status (1)

Country Link
JP (1) JPS60227423A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5100839A (en) * 1988-11-01 1992-03-31 Mitsubishi Denki Kabushiki Kaisha Method of manufacturing wafers used for electronic device
WO2001091981A1 (en) * 2000-05-31 2001-12-06 Memc Electronic Materials, S.P.A. Wire saw and process for slicing multiple semiconductor ingots
JP2010098307A (en) * 2008-10-15 2010-04-30 Siltronic Ag Method for simultaneously cutting compound rod of semiconductor material into multiplicity of wafers
CN102092102A (en) * 2010-10-08 2011-06-15 常州天合光能有限公司 Crystal-block bonding rod slicing process
CN102294757A (en) * 2011-08-08 2011-12-28 江西金葵能源科技有限公司 Method for splicing short mono-crystal rods cut by using diamond wire
CN114953225A (en) * 2022-05-17 2022-08-30 河北同光半导体股份有限公司 Method for directionally cutting silicon carbide by using monomer

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5100839A (en) * 1988-11-01 1992-03-31 Mitsubishi Denki Kabushiki Kaisha Method of manufacturing wafers used for electronic device
WO2001091981A1 (en) * 2000-05-31 2001-12-06 Memc Electronic Materials, S.P.A. Wire saw and process for slicing multiple semiconductor ingots
US6941940B1 (en) 2000-05-31 2005-09-13 Memc Electronic Materials, S.P.A. Wire saw and process for slicing multiple semiconductor ingots
JP2010098307A (en) * 2008-10-15 2010-04-30 Siltronic Ag Method for simultaneously cutting compound rod of semiconductor material into multiplicity of wafers
CN102092102A (en) * 2010-10-08 2011-06-15 常州天合光能有限公司 Crystal-block bonding rod slicing process
CN102294757A (en) * 2011-08-08 2011-12-28 江西金葵能源科技有限公司 Method for splicing short mono-crystal rods cut by using diamond wire
CN114953225A (en) * 2022-05-17 2022-08-30 河北同光半导体股份有限公司 Method for directionally cutting silicon carbide by using monomer

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