JPS60217325A - エピダ−ク用対物レンズ - Google Patents

エピダ−ク用対物レンズ

Info

Publication number
JPS60217325A
JPS60217325A JP7424584A JP7424584A JPS60217325A JP S60217325 A JPS60217325 A JP S60217325A JP 7424584 A JP7424584 A JP 7424584A JP 7424584 A JP7424584 A JP 7424584A JP S60217325 A JPS60217325 A JP S60217325A
Authority
JP
Japan
Prior art keywords
ring
shaped
objective lens
refractive power
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7424584A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0448202B2 (enrdf_load_stackoverflow
Inventor
Eiji Nakamura
英治 中村
Yutaka Suenaga
豊 末永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
Nippon Kogaku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp, Nippon Kogaku KK filed Critical Nikon Corp
Priority to JP7424584A priority Critical patent/JPS60217325A/ja
Priority to US06/721,403 priority patent/US4626079A/en
Publication of JPS60217325A publication Critical patent/JPS60217325A/ja
Publication of JPH0448202B2 publication Critical patent/JPH0448202B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/10—Condensers affording dark-field illumination

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Microscoopes, Condenser (AREA)
JP7424584A 1984-04-13 1984-04-13 エピダ−ク用対物レンズ Granted JPS60217325A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP7424584A JPS60217325A (ja) 1984-04-13 1984-04-13 エピダ−ク用対物レンズ
US06/721,403 US4626079A (en) 1984-04-13 1985-04-09 Dark field illumination apparatus for epi-illumination system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7424584A JPS60217325A (ja) 1984-04-13 1984-04-13 エピダ−ク用対物レンズ

Publications (2)

Publication Number Publication Date
JPS60217325A true JPS60217325A (ja) 1985-10-30
JPH0448202B2 JPH0448202B2 (enrdf_load_stackoverflow) 1992-08-06

Family

ID=13541580

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7424584A Granted JPS60217325A (ja) 1984-04-13 1984-04-13 エピダ−ク用対物レンズ

Country Status (1)

Country Link
JP (1) JPS60217325A (enrdf_load_stackoverflow)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63133045A (ja) * 1986-11-25 1988-06-04 Matsushita Electric Works Ltd 検査用照明器具
EP1617274A1 (de) * 2004-07-16 2006-01-18 CARL ZEISS JENA GmbH Anordnung zur mikroskopischen Beobachtung und/oder Detektion in einem Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
JP2010532468A (ja) * 2007-07-05 2010-10-07 ホフマン、クルト 低容積で静的錯乱光および動的錯乱光を測定するための装置および方法
JP2011167992A (ja) * 2010-02-21 2011-09-01 Seed Co Ltd 環状医療具の成形型及びこの成形型を用いて成形された環状医療具
JP2017522603A (ja) * 2014-07-22 2017-08-10 ライカ マイクロシステムズ シーエムエス ゲゼルシャフト ミット ベシュレンクテル ハフツングＬｅｉｃａ Ｍｉｃｒｏｓｙｓｔｅｍｓ ＣＭＳ ＧｍｂＨ 試料を顕微鏡検査する方法及び装置
JP2021131427A (ja) * 2020-02-18 2021-09-09 オリンパス株式会社 暗視野コンデンサ

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63133045A (ja) * 1986-11-25 1988-06-04 Matsushita Electric Works Ltd 検査用照明器具
EP1617274A1 (de) * 2004-07-16 2006-01-18 CARL ZEISS JENA GmbH Anordnung zur mikroskopischen Beobachtung und/oder Detektion in einem Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
JP2010532468A (ja) * 2007-07-05 2010-10-07 ホフマン、クルト 低容積で静的錯乱光および動的錯乱光を測定するための装置および方法
JP2011167992A (ja) * 2010-02-21 2011-09-01 Seed Co Ltd 環状医療具の成形型及びこの成形型を用いて成形された環状医療具
JP2017522603A (ja) * 2014-07-22 2017-08-10 ライカ マイクロシステムズ シーエムエス ゲゼルシャフト ミット ベシュレンクテル ハフツングＬｅｉｃａ Ｍｉｃｒｏｓｙｓｔｅｍｓ ＣＭＳ ＧｍｂＨ 試料を顕微鏡検査する方法及び装置
JP2021131427A (ja) * 2020-02-18 2021-09-09 オリンパス株式会社 暗視野コンデンサ

Also Published As

Publication number Publication date
JPH0448202B2 (enrdf_load_stackoverflow) 1992-08-06

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