JPS60186704A - Angle measuring instrument - Google Patents

Angle measuring instrument

Info

Publication number
JPS60186704A
JPS60186704A JP4191584A JP4191584A JPS60186704A JP S60186704 A JPS60186704 A JP S60186704A JP 4191584 A JP4191584 A JP 4191584A JP 4191584 A JP4191584 A JP 4191584A JP S60186704 A JPS60186704 A JP S60186704A
Authority
JP
Japan
Prior art keywords
angle
angle measuring
measured
measurement
end surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4191584A
Other languages
Japanese (ja)
Inventor
Katsunobu Ueda
上田 勝宣
Kiyoshi Kamiya
神谷 聖志
Mitsuo Sumiya
住谷 充夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP4191584A priority Critical patent/JPS60186704A/en
Publication of JPS60186704A publication Critical patent/JPS60186704A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Abstract

PURPOSE:To calculate a surface tilt error with high precision and efficiency by providing the 1st angle measuring part which measures the arrangement angle of eah flank of a body to be measured and the 2nd angle measuring part which measures the arrangement angle of the upper end surface of the body to be measured to a reference surface. CONSTITUTION:The angle measuring instrument has the 1st angle measuring part 4 which measures arrangement angles of respective flanks 3... of the body 1 to be measured and the 2nd angle measuring part 6 which measures the arrangement angle of the upper end surface 5 of the objective body 1 to the reference surface. Those measuring parts have position sensors 15 and 21 which have photodetection surfaces 15a and 21a. Then, deviations of photodetection points on the photodetection surfaces 15a and 21a from center positions correspond to surface tilt errors, and surface tilt extents of the flanks 3... and end surface 5 are shown by the same unit through an amplifier. Consequently, the surface tilt errors are calculated with high precision and efficiently.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は1例えばレーザプリンタの走査光学系などに用
いられている回転多面鏡の面倒れ精度を測定するための
角度測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an angle measuring device for measuring the surface tilt accuracy of a rotating polygon mirror used, for example, in a scanning optical system of a laser printer.

〔発明の技術的背景とその間照点〕[Technical background of the invention and points of interest]

近時、レーザ技術と電子写真技術との組合せによる印字
方式であるレーザプリンタが実用化されている。このレ
ーザプリンタは、レーザ光源から回転多面鏡にレーザ光
を照射して光偏向させたのち、光学系を介して感光体ド
ラム上に所望のビームスポットを得るようになっている
。ところで。
2. Description of the Related Art Recently, laser printers have been put into practical use as a printing method that uses a combination of laser technology and electrophotography technology. This laser printer irradiates a rotating polygon mirror with laser light from a laser light source, deflects the light, and then obtains a desired beam spot on a photoreceptor drum via an optical system. by the way.

回転多面鏡は、多角柱をなしていて、その複数の側面が
レーザ光の反射面となっている。そして。
The rotating polygon mirror has the shape of a polygonal prism, and its multiple side surfaces serve as reflective surfaces for laser light. and.

上記各側面と基準面となる一端面とがなす角度の精度、
つまシ面倒れ精度は、レーザプリンタの印写性能の良否
を決定する重要な要素の一つである。
Accuracy of the angle between each side surface and one end surface serving as the reference surface,
The accuracy of the tab head inclination is one of the important factors that determines the printing performance of a laser printer.

そこで1回転多面鏡は1面倒れ精度誤差が数秒以内とな
るように加工した後1面倒れ精度を検査している。この
場合、基準面となる一端面側を下にして回転多面鏡を高
精度回転テーブル上に載置して一定位置に固定されたオ
ートコリメータなどの光学式角度測定器によシ測定する
か、あるいは逆に、高精度回転テーブル上に載置された
光学式角度測定器により一定位置に基準面となる一端面
側を下にして[ml定でれた回転多面鏡の面倒れ精度を
検査している。しかし彦から、上述の従来の面倒れ精度
検査方法は1回転テーブルの回転精度が測定値に含まれ
てしまうことと、基準面とその載置面との間に介在する
油膜、塵埃等の異物の影響を受けることが相俟って、高
精度に面倒れ精度を測定することが困難であった。
Therefore, single-rotation polygon mirrors are machined so that the error in single-side tilting accuracy is within a few seconds, and then the single-sided tilting accuracy is inspected. In this case, the rotating polygon mirror is placed on a high-precision rotary table with one end surface side facing down, and the measurement is performed using an optical angle measuring device such as an autocollimator fixed at a fixed position. Or, conversely, with an optical angle measuring device placed on a high-precision rotary table, the accuracy of the surface inclination of the rotary polygon mirror is inspected with one end surface facing down, which will serve as the reference surface, at a fixed position. ing. However, Hiko pointed out that the above-mentioned conventional surface inclination accuracy inspection method includes the rotational accuracy of the single-turn table in the measurement value, and that there are foreign substances such as oil film and dust interposed between the reference surface and the mounting surface. Combined with the influence of

〔発明の目的〕[Purpose of the invention]

本発明け、上記事情を参酌してなされたもので、二面間
の測定を、被測定物の設置状態に影響されず、安定して
高精度で行うことのできる角度測定装置を提供すること
を目的とする。
The present invention has been made in consideration of the above circumstances, and an object of the present invention is to provide an angle measuring device that can stably and accurately measure between two surfaces without being affected by the installation state of an object to be measured. With the goal.

〔発明の概要〕[Summary of the invention]

被測定物の角度測定される二面のそれぞれにレーザ光を
照射してそれらのレーザ反射光を受光して受光位置を示
す二つの電気信号に変換するとともに、これらの二つの
電気信号の差を演算し、この差によシ二つの測定面がな
す角度の基準角度に対する角度誤差をめるようにしたも
のである。
Laser light is irradiated onto each of the two surfaces of the object to be measured, and the reflected laser light is received and converted into two electrical signals indicating the receiving position, and the difference between these two electrical signals is calculated. This difference is used to calculate the angular error of the angle formed by the two measurement surfaces with respect to the reference angle.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の一実施例を図面を参照して詳述する。 Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.

第1図及び第2図は、本実施例の角度測定装置を示して
いる。この角度測定装置は、正8角柱をなす回転多面鏡
である被測定物(1)を載置して回転させる被測定物保
持部(2)と、被測定物(1)の各側面(3)・・・の
配設角度を測定する第1の角変測定部(4)と、被測定
物(1)の基準面をなす上端面(5)の配設角度を測定
する第2の角度測定部(6)と、被測定物(2)の回転
角を検出する回転角検出部(カと、上記第1及び第2の
角度測定部(4)i6)及び回転角検出部(7)に電気
的に接続され各側面(3)・・・の端面(5)に対する
面倒れ精度を演算する演算処理部(8)(第3図参照)
とから構成されている。しかして、被測定物保持部(2
)は、円筒状の基台(9)と、この基台(9)の上部に
回転自在に軸支された円板状のテーブル(10)と、こ
のテーブル000回転軸Cl0B”)に連結されテーブ
ルallを回転駆動するモータaυとからなっている。
1 and 2 show the angle measuring device of this embodiment. This angle measuring device consists of a workpiece holder (2) on which a workpiece (1), which is a rotating polygon mirror in the form of a regular octagonal prism, is placed and rotated; )... A first angular change measuring section (4) that measures the arrangement angle of the object (1), and a second angle that measures the arrangement angle of the upper end surface (5) that forms the reference surface of the object to be measured (1). A measurement unit (6), a rotation angle detection unit (F), and the first and second angle measurement units (4) i6 that detect the rotation angle of the object to be measured (2), and a rotation angle detection unit (7). an arithmetic processing unit (8) that is electrically connected to and calculates the surface tilt accuracy of each side surface (3) with respect to the end surface (5) (see Fig. 3);
It is composed of. However, the object holding part (2
) is connected to a cylindrical base (9), a disc-shaped table (10) rotatably supported on the upper part of this base (9), and this table 000 rotation axis Cl0B''). It consists of a motor aυ that rotationally drives the table all.

そうして被測定物(1)は、各側面(3)・・・と両端
面とが、正確に直角をなすように機械加工されていて、
下端面側がチーブルミQ上に同軸釦載置されるようにな
っている。さらに、モータaηには回転角検出部(力を
なす四−タリエンコーダが連結されている。この四−タ
リエンコーダは1分局器に接続され45度ととK ハル
ス信号が出力されるようになっている。
The object to be measured (1) is machined so that each side surface (3)... and both end surfaces form exactly right angles.
The coaxial button is placed on the Chee Lumi Q on the lower end surface side. Furthermore, the motor aη is connected to a rotation angle detection section (a four-tary encoder that generates force. This four-tary encoder is connected to a 1-branch unit and outputs 45 degrees and K Hals signals. ing.

一方、第1の角度測定部(4)は、テーブルOQに載置
されている被測定物(1)の側面(3)にレーザ光Qり
を照射するレーザ発振器(13と、側面(3)からのレ
ーザ反射光(14を受光して受光位置を示す信号に変換
するホシシ胃ンセンサα9とからなっている。ボジシ冒
ンセンサ(L!19は、受光面(15a)を有していて
、この受光面(1511)の中心位置からの矢印θe力
方向テーブルCI+1の回転軸線と平行な方向)に沿っ
た偏位量に対応した大きさの電圧が誘起されるようにな
っている。また、第2の角度測定部(6)は、レーザ光
alを発振するレーザ発振器α力と、テーブルOGに載
置されている被測定物(11の端面(5)に向ってレー
ザ光aQを反射させる第1の反射鏡08と、端面(5)
からのレーザ反射光aIを横方向に反射させる第2の反
射鏡−と、この第2の反射光(イ)にて反射されたレー
ザ反射光α値を受光して受光位置を示す信号に変換する
ボジシ冒ンセンサl2I)とからなっている。このボジ
シ萱ンセンサ(2+)は、受光面(21a)を有してい
て、この受光面(21JI)の中心位置からの矢印θ乃
方向(矢印(IQ方向と平行)に沿った偏位量に対応し
た大きさの電圧が誘起されるようになっている。
On the other hand, the first angle measurement unit (4) includes a laser oscillator (13) that irradiates the side surface (3) of the object to be measured (1) placed on the table OQ with a laser beam Q; The body sensor α9 receives the laser reflected light (14) from the camera and converts it into a signal indicating the light receiving position.The body temperature sensor (L!19) has a light receiving surface (15a), A voltage corresponding to the amount of deviation along the arrow θe (direction parallel to the rotational axis of the force direction table CI+1) from the center position of the light receiving surface (1511) is induced. The angle measuring unit (6) 2 uses a laser oscillator α force that oscillates the laser beam al, and a second angle measuring unit that reflects the laser beam aQ toward the end surface (5) of the object to be measured (11) placed on the table OG. 1 reflecting mirror 08 and end face (5)
A second reflecting mirror that laterally reflects the laser reflected light aI from the second reflected light (a), and receives the laser reflected light α value reflected by this second reflected light (a) and converts it into a signal indicating the light receiving position. It consists of a physical detection sensor l2I). This position sensor (2+) has a light-receiving surface (21a), and the amount of deviation along the arrow θ direction (parallel to the IQ direction) from the center position of the light-receiving surface (21JI) A voltage of a corresponding magnitude is induced.

しかして、ボジシ目ンセンサo啼の受光面(15a)及
びボジシ璽ンセンサ(2])の受光面(21a)におけ
る受光位置は、測面(3)及び端面(5)が、基準状態
つまり面倒れ角度誤差がゼロのときに、それぞれ中心位
置となるように設定されている。そうして、各受光面(
158)、 (21M)における受光位置の中心位置か
らの偏位量は、とシもなおさず面倒れ角度誤差を示して
いる。しかして、各ボジシ日ンセンサ(151゜(21
)は、それぞれ増幅器(至)、 124)に接続され、
これら増幅器(23+、+24)にて側面(3)・・・
及び端面(5)の面倒れ量を同一単位で示す信号となる
ように増幅される。
Therefore, the light receiving position on the light receiving surface (15a) of the center sensor (2) and the light receiving surface (21a) of the center sensor (2) is such that the measurement surface (3) and the end surface (5) are in the reference state, that is, the surface is tilted. They are each set to be at the center position when the angular error is zero. Then, each light receiving surface (
158) and (21M), the amount of deviation of the light receiving position from the center position shows the surface tilt angle error. Therefore, each position sun sensor (151° (21
) are connected to amplifiers (to), 124), respectively;
At these amplifiers (23+, +24), the side (3)...
and the amount of surface tilt of the end surface (5) is amplified to become a signal indicating the amount of surface inclination in the same unit.

これら増幅器(ハ)、Q(イ)の出力側は、減算器(ハ
)の入力側に接続されている。さらに、減算器(ハ)の
出力側は、比較器弼の入力側に接続されている。この比
較器(至)Kは、上限閾値VTI及び下限閾値VTlが
設定されていて、この比較器(イ)に入力した減算器(
29からの信号が上限閾値VTIと下限閾値VTIとの
範囲外であるときに1面倒れ異常検出信号が記憶表示器
(財)に出力されるようになっている。この記憶表示器
(財)は、RAM (Random Access M
emory )及びCRT (Cathode几ay 
Tube )からなシ、各測面(3)の面倒れ角度誤差
の測定結果が記憶されるとともに、適時に測定結果を表
示できるようになっている。
The output sides of these amplifiers (C) and Q (A) are connected to the input side of the subtracter (C). Further, the output side of the subtracter (c) is connected to the input side of the comparator 2. This comparator (to) K has an upper threshold value VTI and a lower threshold value VTl set, and the subtracter (
When the signal from 29 is outside the range between the upper limit threshold value VTI and the lower limit threshold value VTI, a single side tilt abnormality detection signal is output to the storage display. This memory display device (Foundation) is RAM (Random Access M
memory ) and CRT (Cathode)
The measurement results of the surface tilt angle error of each measurement surface (3) are stored, and the measurement results can be displayed in a timely manner.

さらに、減算器Q!5の入力側及び記憶表示器c17)
の入力側には1回転角検出部(7)が接続され、各側面
(3)・・・が測定位置にきたとき信号を出力するよう
になりている。かくて、増幅器c、i、ca、減算器(
2つ、比較器(イ)及び記憶表示器(27)は、減算処
理部(8)を構成している。
Furthermore, subtractor Q! 5 input side and memory display c17)
A one-rotation angle detection section (7) is connected to the input side of the sensor, and outputs a signal when each side surface (3)... comes to a measurement position. Thus, amplifiers c, i, ca, subtractor (
The two, the comparator (a) and the storage display (27), constitute a subtraction processing section (8).

つぎに1本実施例の角度測定装置の使い方について述べ
る。
Next, how to use the angle measuring device of this embodiment will be described.

まず、テーブル(10)上に被測定物O)を基準面でな
い端面を下にして同軸となるように載置する。ついで、
レーザ発振器α■、a7)からレーザ光α2)、θ6)
を発振させるとともに、モータ圓を起動してテープfi
/QIを毎分1回の速度で回転させる。すると、レーザ
光(12)は、側面(3)・・・にて反射され、レーザ
反射光0滲がボジシ璽ンセンサ(iにて受光される。ま
た、レーザ光αeは、第1の反射鏡0樟、端面、第2の
反射鏡−にて反射された後、レーザ反射光(19がボジ
シ冒ンセンサ01)にて受光される。そうして、これら
ボジシッンセンサ(1句、(2υからは、レーザ反射光
α菊、αlの受光位置の中心位置からの偏位量を示す信
号8A、 8Bが、それぞれ増幅器(2階、 t24)
に出力される。ついで、この増幅器(2階、(財)にて
は、信号SA、、 SBは各側面(3)・・・及び端面
(5)の面倒れ角度誤差を示す信号8C,8Dに増幅さ
れる。これら信号SC,SBは、減算器(ハ)K出力さ
れ両者の差が演算される。この差は、ある側面(3)の
端面(5)に対する面倒れ誤差を示している。したがっ
て、ある側面(3)と端面(5)との角度が正確に90
度に形成されているとき、上記差はゼロとなるようにあ
らかじめ校正しておく。
First, the object to be measured O) is placed coaxially on the table (10) with the end surface that is not the reference surface facing down. Then,
Laser light α2), θ6) from laser oscillator α■, a7)
oscillates and starts the motor circle to release the tape fi.
/QI is rotated at a speed of once per minute. Then, the laser beam (12) is reflected by the side surface (3)..., and the laser reflected beam 0 is received by the front sensor (i).The laser beam αe is reflected by the first reflecting mirror After being reflected by the laser beam, the end face, and the second reflecting mirror, it is received by the laser reflected light (19 is the body sensor 01). Signals 8A and 8B indicating the amount of deviation from the center position of the receiving position of the laser reflected beams α and αl are transmitted to the amplifier (second floor, t24), respectively.
is output to. Then, in this amplifier (2nd floor, Ltd.), the signals SA, SB are amplified into signals 8C and 8D indicating the surface tilt angle error of each side surface (3) . . . and end surface (5). These signals SC and SB are output to a subtracter (c) K and the difference between them is calculated. This difference indicates the surface tilt error of a certain side surface (3) with respect to the end surface (5). Therefore, a certain side surface The angle between (3) and end face (5) is exactly 90
The above difference is calibrated in advance so that it becomes zero when it is formed at the same time.

このとき、被測定物(1)の下端面とテーブルa0の上
面との間に異物が存在していても、この異物の存在が側
面(3)及び端面(5)に与える誤差量捻回−であるの
で、減算処理によシ相殺される。一方1回転角検出部(
7)からは、各側面(3)・・・が測定位置にくるたび
にタイミング信号STが減算器(イ)に出力される。
At this time, even if a foreign object exists between the lower end surface of the object to be measured (1) and the upper surface of the table a0, the presence of this foreign object causes an error amount of twisting on the side surface (3) and end surface (5). Therefore, it is canceled out by the subtraction process. On the other hand, one rotation angle detection part (
From 7), a timing signal ST is output to the subtractor (A) every time each side surface (3)... comes to the measurement position.

そして、減算器(2[有]からは、面倒れ誤差信号SF
Iが。
Then, from the subtracter (2 [present]), the surface tilt error signal SF
I.

タイミング信号STを入力するたびに順次、比較器06
)に出力される。この比較器(イ)にては2面倒れ誤差
信号8Eの電圧値Vが、上限閾値vTI及び下限閾値V
TIとの間にあるか否かが比較処理される。上記上限閾
値VTIは、例えば角度で5秒、同じく上記下限閾値■
TIは、例えば角度で一5秒に対応して設定されている
。しかして1面倒れ誤差信号SEが上限閾値VTIと下
限閾値VTIとの間の範囲外にある場合は、面倒れ異常
検出信号SFが記憶表示器(5)に出力される。そして
、この記憶表示器(5)にては、タイミング信号ST及
び面倒れ異常検出信号8Eに基づき各側面(3)・・・
ごとに面倒れ精度の良否データを記憶するとともにCR
T表示する。
Each time the timing signal ST is input, the comparator 06
) is output. In this comparator (a), the voltage value V of the double-sided tilt error signal 8E is the upper limit threshold vTI and the lower limit threshold V
Comparison processing is performed to determine whether or not there is a difference with TI. The above upper limit threshold VTI is, for example, 5 seconds in angle, and the above lower limit threshold is
TI is set to correspond to, for example, 15 seconds in angle. If the single side tilt error signal SE is outside the range between the upper limit threshold VTI and the lower limit threshold VTI, the side tilt abnormality detection signal SF is output to the storage display (5). Then, in this storage display (5), each side (3)...
It memorizes the quality data of surface tilt accuracy and CR.
Display T.

このように、本実施例の角度測定装置は、被測定物(1
)の上端面(5)を基準とした各側面(3)・・・の相
対的角度誤差である面倒れ誤差の良否を迅速かつ正確に
めることができる。ことに、被測定物(1)が載置され
ている被測定物保持部(2)の回転精度及び組立精度の
誤差が大きい場合、あるいはテーブルOn上面と被測定
物(1)との間に異物(塵埃、油膜等)が介在している
場合でも1本実施例においては端面(5)と各側面(3
)・・・の相対的角度誤差をめるようにしているので、
上記誤差要因の影響を全く受けることがない。
In this way, the angle measuring device of this embodiment can be used for the object to be measured (1
) It is possible to quickly and accurately determine whether the surface inclination error, which is a relative angular error of each side surface (3)... with respect to the upper end surface (5) of the device, is good or bad. In particular, if there are large errors in the rotational accuracy and assembly accuracy of the workpiece holder (2) on which the workpiece (1) is placed, or if there is a problem between the top surface of the table On and the workpiece (1). Even when foreign matter (dust, oil film, etc.) is present, in this embodiment, the end face (5) and each side face (3)
)... Since we are trying to take into account the relative angle error,
It is completely unaffected by the above error factors.

なお、上記実施例において減算器(2ツからの信号をマ
イクロコンピュータに印加され、とのマイクロコンピュ
ータにて1面倒れ角度誤差の絶対値を記憶かつ表示する
とともに1面倒れ精度の良否判定を行わせてもよい。さ
らに、上記実施例においては、被測定物として2面間の
角度が90°の回転多面鏡を例示しているが、これに制
約されることなく%2面間の角度誤差を測定するもので
あれば。
In the above embodiment, the signals from the two subtracters are applied to the microcomputer, and the microcomputer stores and displays the absolute value of the single-sided tilt angle error, and also determines the quality of the single-sided tilt angle error. Furthermore, in the above embodiment, a rotating polygon mirror with an angle of 90° between two surfaces is exemplified as the object to be measured, but the angle error between the two surfaces is not limited to this. If it's something you want to measure.

どのような角度の被測定物にも適用できる。また。It can be applied to objects to be measured at any angle. Also.

被測定物は1回転テーブルでなく固定テーブルに載置し
て測定するようにしてもよい。さらにまた。
The object to be measured may be placed on a fixed table instead of a one-turn table for measurement. Yet again.

レーザ発振器(13)、(17)及びボジシ璽ンセンサ
(ls、onの配役位置は、任意に設定してよい。さら
に、ボジシ曹ンセンサの代りに例えば3次元フォトアレ
イ等他のセンサを用いてもよい。
The positions of the laser oscillators (13), (17) and the position sensor (ls, on) may be set arbitrarily.Furthermore, other sensors such as a three-dimensional photo array may be used instead of the position sensor. good.

〔発明の効果〕〔Effect of the invention〕

本発明の角度測定装置は、被測定物に形成された二つの
測定面の相対的角度誤差である面倒れ誤差を高精度かつ
高能率でめることができる。とりわけ、被測定物の載置
状態、たとえば被測定物が保持されている保持部の配役
誤差、あるいは被測定物が載置面上に介在している異物
の影響を全く受けることがない顕著な効果を奏する。
The angle measuring device of the present invention can measure surface inclination error, which is a relative angular error between two measurement surfaces formed on an object to be measured, with high precision and high efficiency. In particular, it is remarkable that the measured object is completely unaffected by the mounting condition of the measured object, such as placement error of the holding part that holds the measured object, or foreign objects interposed on the mounting surface. be effective.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の角度測定装置の平面図、第
2図は同じく正面図、第3図は同じく電気回路系統図で
ある。 (1):被測定物、 (2):被測定物保持部。 (3):側面(測定間)、(4B第1の角度測定部。 (5):端面(測定面)、(6):第2の角度測定部。 (8):演算処理部、 α邊、α0:レーザ光。 代理人 弁理士 則 近 憲 佑 (ほか1名) 第1図 第3図 (7
FIG. 1 is a plan view of an angle measuring device according to an embodiment of the present invention, FIG. 2 is a front view thereof, and FIG. 3 is a diagram of an electric circuit system. (1): Object to be measured, (2): Object to be measured holding section. (3): Side surface (between measurements), (4B first angle measurement section. (5): End surface (measurement surface), (6): Second angle measurement section. (8): Arithmetic processing section, α side , α0: Laser light. Agent Patent attorney Noriyuki Chika (and 1 other person) Figure 1 Figure 3 (7

Claims (1)

【特許請求の範囲】[Claims] 角度測定される二つの測定面が形成された被測定物を保
持する被測定物保持部と、上記二つの測定面のうち一方
の測定面にレーザ光を照射するとともにこの一方の測定
面にて反射したレーザ光を受光して受光位置に対応する
電気信号に変換する第1の角度測定部と、上記他方の沖
ト定面にレーザ光を照射するとともにこの他方の測定面
にて反射したレーザ光を受光して受光位置に対応する電
気信号に変換する第2の角度測定部と、上記第1の角度
測定部からの電気信号及び上記第2の角度測定部からの
電気信号を入力して減算処理し上記二つの測定面がなす
角度の基準角度に対する角度誤差を算出する演算処理部
とを具備することを特徴とする角度測定装置。
A measurement object holding part that holds a measurement object on which two measurement surfaces for angle measurement are formed; a first angle measuring section that receives the reflected laser beam and converts it into an electrical signal corresponding to the light receiving position; and a laser beam that is irradiated onto the other flat surface and reflected at the other measurement surface. a second angle measuring section that receives light and converts it into an electrical signal corresponding to the light receiving position; and inputting an electrical signal from the first angle measuring section and an electrical signal from the second angle measuring section. An angle measuring device comprising: an arithmetic processing section that performs subtraction processing to calculate an angular error of the angle formed by the two measurement surfaces with respect to a reference angle.
JP4191584A 1984-03-07 1984-03-07 Angle measuring instrument Pending JPS60186704A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4191584A JPS60186704A (en) 1984-03-07 1984-03-07 Angle measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4191584A JPS60186704A (en) 1984-03-07 1984-03-07 Angle measuring instrument

Publications (1)

Publication Number Publication Date
JPS60186704A true JPS60186704A (en) 1985-09-24

Family

ID=12621548

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4191584A Pending JPS60186704A (en) 1984-03-07 1984-03-07 Angle measuring instrument

Country Status (1)

Country Link
JP (1) JPS60186704A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01210815A (en) * 1987-02-04 1989-08-24 Michel Paramythioti Method and apparatus for 3-d bakclight survey
JP2006229213A (en) * 2005-01-20 2006-08-31 Kyocera Corp High-frequency device mounting board, communication equipment, and characteristic evaluation method for high-frequency device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01210815A (en) * 1987-02-04 1989-08-24 Michel Paramythioti Method and apparatus for 3-d bakclight survey
JP2006229213A (en) * 2005-01-20 2006-08-31 Kyocera Corp High-frequency device mounting board, communication equipment, and characteristic evaluation method for high-frequency device

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